X射线光电子能谱

X射线光电子能谱（X-ray photoelectron spectroscopy，XPS）技术也被称作用于化学分析的电子能谱（electron spectroscopy for chemical analysis，ESCA）．XPS属表面分析法，它可以给出固体样品表面所含的元素种类、化学组成以及有关的电子结构重要信息，在各种固体材料的基础研究和实际应用中起着重要的作用．文章简要介绍了XPS仪器的工作原理和分析方法，并给出了XPS在科学研究工作中的应用实例．     

X射线光电子能谱

X射线光电子能谱（X-ray photoelectron spectroscopy, XPS）技术也被称作用于化学分析的电子能谱（electron spectroscopy for chemical analysis,ESCA）.XPS属表面分析法,它可以给出固体样品表面所含的元素种类、化学组成以及有关的电子结构重要信息,在各种固体材料的基础研究和实际应用中起着重要的作用.文章简要介绍了XPS仪器的工作原理和分析方法,并给出了XPS在科学研究工作中的应用实例.     

X-ray photoelectron and X-ray Auger electron spectroscopy studies of heavy ion irradiated C60 films

The influence of 200 MeV Au ion irradiation on the surface properties of polycrystalline fullerene films has been investigated. The X-ray photoelectron and X-ray Auger electron spectroscopies are employed to study the ion-induced modification of the fullerene, near the surface region. The shift of C 1s core level and decrease in intensity of shake-up satellite were used to investigate the structural changes (like sp² to sp³ conversion) and reduction of π electrons, respectively, under heavy ion irradiation. Further, X-ray Auger electron spectroscopy was employed to investigate hybridization conversion qualitatively as a function of ion fluence.     

Background subtraction: I. General behaviour of Tougaard-style backgrounds in AES and XPS

An analysis is made of Tougaard-style backgrounds for homogeneous materials to show how parameters interact together and comprise the general inelastic scattering background in electron spectroscopy. It is shown that insight is usefully gained by rewriting the Tougaard universal loss function in terms of two parameters, the characteristic energy, E₁, of the exponential decay observed in multiple self-convolutes of the Tougaard universal single loss function, and the centroid energy of the single loss function. Close fits to the measured background may be made over a wide energy range for only one value of E₁ which defines a unique relation between Tougaard’s B and C values but does not give the unique values themselves. For the single value of E₁, the centroid energy may be varied such that the background subtracted spectra range from those shown by Tougaard, where the intrinsic shake-up and losses may constitute two thirds of the peak intensity, to spectra similar to those of Jo in which all of the intrinsic losses are removed. Studies of Al X-ray excited Sc, Cu, Sm and Au photoelectron spectra, each of which has an extensive range of peaks, show that the relative intensities of the peaks are unaffected by the choice of the value of even though the absolute peak areas may change by a factor of 3.     

X-ray photoelectron spectroscopy studies on core-shell structured nanocomposites

Core-shell nanostructures were grown in silica-based glasses. Copper-copper oxide and iron-iron oxide structures had diameters in the range 3-6 nm, with shell thicknesses ∼1-2 nm. Silver-lithium niobate core-shell nanostructures had diameters in the range 4.2-46 nm and thicknesses varying from 2.2 to 22 nm. X-ray photoelectron spectroscopy studies were carried out on all these specimens. The analyses of these results show the presence of Cu⁺/Cu²⁺, Fe²⁺/Fe³⁺ and Nb⁴⁺/Nb⁵⁺ valence states in the above three systems. Electrical resistivity data were fitted satisfactorily to the small polaron hopping model in the case of copper and iron-containing specimens. The presence of ions in the lithium niobate shell provides direct evidence of the formation of localized states between which variable range hopping conduction can be effected.     

X-ray photoelectron spectroscopy for surface film analysis in corrosion research

Surface films on metals and alloys often protect them from reaction with the environment, and hence a knowledge of their protective properties and composition could be invaluable for predicting their corrosion behaviour. XPS (x-ray photoelectron spectroscopy) could provide a quantitative analysis of the chemical composition, the nature of valence states and elemental distribution within the surface films. The present paper reviews the potential of this technique in corrosion studies. A brief review of the work done on the passivation of iron and iron-chromium alloys and on the inhibition studies on copper base alloys has been given. A few examples of investigations carried out at authors’ laboratory are also included. An attempt has been made to establish a correlation between the compositions of the films formed and corrosion behaviour of carbon steel in 10.5 pH lithium hydroxide solution and of Cu-Ni alloys and sacrificial Al-Zn-Sn alloys in synthetic sea-water.     

A multiple-scattering approach to X-ray photoelectron diffraction

We present an alternative method for multiple scattering calculations of X-ray photoelectron diffraction from periodic surfaces. The technique uses a time-reversed RHEED wave function as the final state in a one-step model of the photoemission process. We apply the method to the Ni(001)c(2×2)S system and find an excellent agreement with the experimental data for vertical height of the S overlayer of 1.35±0.05 Å above the top Ni layer. Our calculations display a much better agreement with the experimental data than has been previously reported.     

双原子填充式skutterudite化合物的结构及X射线光电子能谱分析

用高温熔融、淬火、扩散退火结合放电等离子烧结(SPS)法合成了Ca和Ce复合填充的单相Ca_mCe_nFe_xCo_4-xSb₁₂(m=0.17—0.27，n=0.05—0.25，x=1.5)化合物，并结合Rietveld结构解析以及X射线光电子能谱(XPS)分析研究了两种原子复合填充skutterudite化合物的结构与填充状态.Rietveld结构解析表明，Ca_mCe_nFe_1.5Co_2.5Sb₁₂化合物具有skutterudite结构，Ca和Ce原子填充到了Sb的二十面体空洞中，填充原子热振动参数B_Ca/Ce远大于框架原子的热振动参数B_Fe/Co和B_Sb.XPS元素窄区谱分析结果表明，Sb原子在结构中有五种化学状态，每种化学状态的相对含量主要由总填充分数决定，填充原子Ca在Sb的二十面体空洞出现概率有三种可能，但在中心位置出现的概率最大. 关键词： skutterudite化合物 双原子复合填充 结构 X射线光电子能谱分析     

Secondary electron emission control in X-ray photoelectron spectroscopy

Secondary electron emission (SEE) is a major player in surface charging during X-ray photoelectron spectroscopy (XPS); its characteristics and applicability as a current source for electrical measurements are studied. We employ sample biasing and a top retarding grid to control the photoelectron current, and further compare their I–V characteristics with direct spectroscopy of the secondary electrons. Using silica-coated gold substrates, the effect of sample work function on the emitted secondary electrons is shown and fine control over the surface potential gradients, in the range of 10–100 meV, is achieved. XPS-based chemically resolved electrical measurements (CREM) can thus be extended to the positive current regime.     

Near surface composition of some alloys by X-ray photoelectron spectroscopy

Chemical compositions of the alloys of CuNi (Cu_0.10Ni_0.90, Cu_0.30Ni_0.70, Cu_0.70Ni_0.30) and BiSb (Bi_0.80Sb_0.20, Bi_0.64Sb_0.34, Bi_0.55Sb_0.45) are determined by X-ray photoelectron spectroscopy. The stoichiometries are determined and are compared with the bulk compositions. Possible sources of systematic errors contributing to the results are discussed. Errors arising out of preferential etching in these alloys have been investigated. It has been inferred from such studies that the preferential etching does not enrich the surface composition with a particular component for the two systems reported here. Quantitative results of CuNi system indicate that the surface regions of the Cu_0.70Ni_0.30 alloy is Cu-rich, although no such evidence is observed in case of BiSb system.     

沉积态铀薄膜表面氧化的X射线光电子能谱

含铀(U)薄膜在激光惯性约束聚变的实验研究中有重要的用途.研究其在不同气氛下的氧化性能可以为微靶制备、储存及物理实验提供关键的实验数据.通过超高真空磁控溅射技术制备了纯U薄膜及金-铀(Au-U)复合平面膜,将其在大气、高纯氩(Ar)气及超高真空度环境中暴露一段时间后,利用X射线光电子能谱仪结合Ar~+束深度剖析技术考察U层中氧(O)元素分布及价态,分析氧化产物及机理.结果显示,初始状态的U薄膜中未检测到O的存在.Au-U复合薄膜中的微观缺陷减弱了Au防护层的屏蔽效果,使其在3周左右时间内严重氧化,产物为U表面致密的氧化膜及缺陷周围的点状腐蚀物,主要成分均为二氧化铀(UO_2).在高纯Ar气中纯U薄膜仅暴露6 h后表面即被严重氧化,生成厚度不均匀的UO_2.在超高真空度环境下保存12 h后,纯U薄膜表面也发生明显氧化,生成厚度不足1 nm的UO_2.Ar~+束对铀氧化物的刻蚀会因择优溅射效应而使UO_2被还原成非化学计量的UO_(2-x),但这种效应受O含量的影响.     

Identifying a perovskite phase in rare-earth nickelates using X-ray photoelectron spectroscopy

We demonstrate a practical way to identify the presence of a perovskite phase in rare-earth nickelates (RNiO₃) using X-ray photoelectron spectroscopy (XPS). By varying the calcination temperature, we prepared RNiO₃ powders with different degrees of chemical reaction. We found that perovskite RNiO₃ becomes predominant after high-temperature calcination (≥1,000 °C) in X-ray diffraction and XPS (at Ni 3p and O 1s edges) measurements. While the observed spectra at the Ni 3p edge are similar for all powders, a sizable difference was observed in the O 1s-edge spectra depending on the calcination temperature. With the formation of a perovskite phase with a trivalent Ni³⁺ state, an XPS peak corresponding to oxygen ions in the perovskite lattice distinctly emerges. Our work shows that the Ni³⁺ state cannot be determined by analyzing the Ni 3p edge solely and rather, the O 1s edge should be simultaneously monitored for explicit identification.     

NiTi合金薄膜厚度对相变温度影响的X射线光电子能谱分析

采用X射线衍射和X射线光电子能谱实验手段对不同厚度的NiTi薄膜相变温度的变化进行了分析.结果表明在相同衬底温度和退火条件下,3?μm厚度的薄膜晶化温度高于18?μm厚度的薄膜.衬底温度越高,薄膜越易晶化,退火后薄膜奥氏体相转变温度As越低.薄膜的表面有TiO₂氧化层形成,氧化层阻止了Ni原子渗出;膜与基片的界面存在Ti₂O₃和NiO.由于表面和界面氧化层的存在,不同厚度的薄膜内层的厚度也不同,因而薄膜越薄,Ni原子的含量就越高.Ni原子的含量的不同会影响薄膜的相变温度. 关键词： NiTi合金薄膜 X射线衍射 相变 X射线光电子能谱     

Valence-band offset of p-NiO/n-ZnO heterojunction measured by X-ray photoelectron spectroscopy

X-ray photoelectron spectroscopy was used to measure the valence-band offset (VBO) of the NiO/ZnO heterojunction grown on quartz substrate by radio frequency (RF) magnetron sputtering. Core levels of Ni 2p and Zn 2p were used to align the VBO of p-NiO/n-ZnO heterojunction. The valence-band offset (ΔEV) is determined to be 1.47 eV. According to the band gap of 3.7 eV for NiO and 3.37 eV for ZnO, the conduction-band offset (ΔEC) in the structure was calculated to be 1.8 eV, and it has a type-II band alignment.     

Silicidation in Ni/Si thin film system investigated by X-ray diffraction and Auger electron spectroscopy

Silicide formation induced by thermal annealing in Ni/Si thin film system has been investigated using glancing incidence X-ray diffraction (GIXRD) and Auger electron spectroscopy (AES). Silicide formation takes place at 870 K with Ni₂Si, NiSi and NiSi₂ phases co-existing with Ni. Complete conversion of intermediate silicide phases to the final NiSi₂ phase takes place at 1170 K. Atomic force microscopy measurements have revealed the coalescence of pillar-like structures to ridge-like structures upon silicidation. A comparison of the experimental results in terms of the evolution of various silicide phases is presented.     

Influence of an electrostatic potential at the metal/electrolyte interface on the electron binding energy of adsorbates as probed by X-ray photoelectron spectroscopy

We present a study of the influence of an electrostatic potential across the Au(1 1 1)/4,4′-dithiodipyridine (PySSPy)-SAM/0.01 M NaOH interface on the electron binding energies of the N 1s and S 2p orbitals of the adsorbate, as probed by X-ray photoelectron spectroscopy (XPS). The observed systematic binding energy shift for N(1s) with electrode potential of −0.9 eV/V has been assigned to a so-called electrochemical shift, i.e., an apparent shift of the binding energy due to the potential drop in the electric double layer. No systematical shift was observed for the S(2p) core level of the thiol with electrode potential. The results are contrasted by measurements in 0.1 M H₂SO₄, where no electrochemical shift was found for the protonated nitrogen.     

First stages of surface steel nitriding: X-ray photoelectron spectroscopy and electrical measurements

Quantitative and qualitative analysis techniques were employed to study the first stages of ultra-high vacuum plasma nitriding of the 42CrMo4 steel. At constant treatment temperature, maintained for all samples at about 360 °C, we have established the influence of treatment time on the chemical composition, thickness and electrical properties of the nitrided layer.In this purpose it was used a stacking atomic layer model describing the sample surface, which takes into account the attenuation depth of photoelectrons by the atomic monolayers. So, we have found that after 2 h of nitriding in laboratory conditions, 70% of the nitrided layer was composed of iron oxide. Also, I–V measurements indicate an influence of the nitride overlayer with increasing treatment time.     

Surface analysis for LiBq4 growing on ITO and CuPc film using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS)

We have investigated the morphology and surface electron states of LiBq₄ deposited on ITO and CuPc/ITO, using atomic force microscopy (AFM) and X-ray photoelectron spectroscopy (XPS). The AFM observations indicate that LiBq₄ can form a much more uniform film on CuPc than that on ITO. Furthermore, X-ray photoelectron spectroscopy (XPS) is utilized to further demonstrate the AFM results. From the analysis of XPS, we found that LiBq₄ molecules have poor thermal stability, they are seriously oxidized during depositing; but when a CuPc layer is inserted between LiBq₄ and ITO film, the oxidation and surface contamination of LiBq₄ are significantly reduced. It is then concluded that the introduction of a CuPc buffer layer under the LiBq₄ film can improve the film quality of LiBq₄.The XPS results also testified the fact that no coordination bonds between N atoms and B atoms are formed in LiBq₄ molecules, which make LiBq₄ to be potential blue organic light-emitting material.     

Valence band and core level X-ray photoelectron spectroscopy of lead sulfide nanoparticle-polymer composites

Valence band and core level X-ray photoelectron spectroscopy (XPS) were used to probe lead sulfide (PbS) nanoparticle-polymer nanocomposites. Composite materials were prepared by trapping commercially available monodisperse 3 and 10 nm PbS nanoparticles in two polymers, the non-conducting polymer, polystyrene, and the conjugated polymer, poly(2-methoxy-5-(2′-ethyl-hexyloxy)-p-phenylene vinylene (referred to below as MEH-PPV). The nanocomposites prepared from commercial nanoparticles underwent oxidation, mainly to form lead sulfate. However, the narrow size distributions of the commercial nanoparticles allowed observation of distinct changes in the valence band from the 3 to 10 nm nanoparticles. Nanocomposites of 2-5 and 4-7 nm PbS nanoparticles were synthesized by growing the particles in poly(vinyl alcohol) (referred to below as PVA) and MEH-PPV, respectively. These composites both indicated the formation of lead sulfide nanoparticles. Furthermore, the XP spectra for the PVA/PbS composite displayed bonding between the PbS nanoparticles and the polymer while MEH-PPV showed no PbS-polymer bonding. The nanoparticles synthesized in MEH-PPV did not undergo oxidation. The particle size distributions of the synthesized nanoparticles were too broad to display size-dependent changes in the valence band.