EDXRF and multivariate statistical analysis of fragments from Marajoara ceramics

In this work, 102 fragments of Marajoara ceramics, belonging to the National Museum collection (Rio de Janeiro, Brazil), were analyzed using energy dispersive X‐ray fluorescence (EDXRF) and principal component analysis (PCA) in order to identify possible groups of samples that present similar behaviors or different characteristics. This information will give an important aid to a more accurate classification of these artifacts. The EDXRF measurements were carried out with a portable system developed in the Nuclear Instrumentation Laboratory consisting of an Oxford TF3005 X‐ray tube, with W anode, and an Si‐PIN XR‐100CR detector from Amptek, working at 25 kV and 100 µA, acquisition time of 600 s and a beam collimation of 2 mm. PCA applied to the X‐ray fluorescence results revealed a clear cluster separation to the samples. Copyright © 2009 John Wiley & Sons, Ltd.     

Thickness and composition of gold and silver alloys determined by combining EDXRF‐analysis and transmission measurements

Energy‐dispersive X‐ray fluorescence (EDXRF)‐analysis is a technique which in the case of metals analyzes thin surface layers. For example, when gold and silver alloys are analyzed, it typically interests a depth of microns up to a maximum of tens of microns. Therefore, it can give wrong results or be affected by a large indetermination when the sample composition is altered because of surface processes, as often happens when silver alloys are oxidated, and sometimes in the case of gold alloys rich on copper or silver. A complementary technique was therefore developed, of bulk analysis, which uses the same equipment employed for EDXRF‐analysis; the X‐ray beam from the X‐ray tube is monochromatized by means of a tin secondary target, which K lines bracket the silver‐K discontinuity. The sample to be analyzed is positioned between the secondary target and the detector. This technique is able to determine (by measuring the attenuation of tin‐K rays) thickness and/or composition of gold and silver alloys having a thickness of less than about 120 µm for gold and about 0.7 mm for silver. The method was tested with Au–Ag–Cu alloys of known composition and thickness and then applied to gold and silver artifacts from the tomb of the Lady of Cao, which belongs to the Moche pre‐hispanic culture from the North of Peru, and dates about 300 A.D. Copyright © 2014 John Wiley & Sons, Ltd.     

Use of the CEARXRF GUI‐Based Monte Carlo–Library Least‐Squares (MCLLS) Code for the Micro‐Focused EDXRF analyzer

The CEARXRF GUI‐Based Monte Carlo–Library Least‐Squares (MCLLS) Code is demonstrated with results from a micro‐focused EDXRF analyzer, which can be used to calculate elemental weight fractions in metal alloys or rock samples accurately by library least‐squares regression of the measured X‐ray spectrum with computer‐generated elemental library spectra. An elemental stratified sampling variance reduction technique has been implemented in the CEARXRF5 code, which equalizes the statistical precision of the elemental libraries within the measured sample independent of the relative elemental amounts that are present. Also, an improved Si(Li) detector response function (DRF) has been obtained for micro‐focused X‐ray fluorescence (XRF) analyzers, and the DRF parameters are obtained based on regression from pure elemental experimental spectra. It is demonstrated that the resulting MCLLS approach can greatly improve the accuracy of elemental XRF analysis results. Copyright © 2011 John Wiley & Sons, Ltd.     

Determination of cobalt marker in cow ruminal fluid by EDXRF and SRTXRF

This article describes a comparison of conventional energy‐dispersive X‐ray fluorescence (EDXRF) and synchrotron radiation total‐reflection X‐ray fluorescence (SRTXRF) for Co determination in ruminal fluid from Holstein cow. This element is used as marker for animal nutrition studies. For EDXRF, 200 µl of the sample were dried on 6.35 µm Mylar film at 60 °C. The excitation was carried out using an X‐ray tube with Mo target and Zr filter operated at 30 kV/20 mA. For SRTXRF, 10 µl of the sample were pipetted on a Lucite carrier and dried at 60 °C. In both the techniques, Ga was used as internal standard and the acquisition time was 200 s. The trueness of both techniques was evaluated through the standard addition method, the recoveries obtained by SRTXRF and EDXRF were 76 and 99%, and the limits of detection, 13 and 240 µg l^?1, respectively. Copyright © 2011 John Wiley & Sons, Ltd.     

EDXRF with an audio digitizer

We utilized an audio digitizer in energy‐dispersive X‐ray fluorescence (EDXRF) with a silicon drift detector and achieved a full width at half maximum (FWHM) of 178 eV at Mn Kα (92‐µs peaking time). To confirm the ability of EDXRF with an audio digitizer, we also examined energy versus channel number linearity and output count rate. We applied it to EDXRF analysis of (ZnCd)S : Ag and showed a proper energy versus channel number linearity from 5.9 keV (Mn Kα) to 26.1 keV (Cd Kβ). And, the maximum output count rate of more than 10 kcps was obtained with 23‐µs peaking time (296‐eV FWHM). Copyright © 2011 John Wiley & Sons, Ltd.     

Background estimation based on Fourier Transform in the energy‐dispersive X‐ray fluorescence analysis

This paper discusses a new method of background estimation in the energy‐dispersive X‐ray fluorescence (EDXRF) analysis, which is based on Fourier Transform (in this paper, we call it Fourier Transform background estimation method). Compared with the Sensitive Nonlinear Iterative Peak method, the new method has the feature of FWHM independence. It has been proved that a background can be estimated automatically and accurately by the new method in the synthesized spectrum and the spectra from measurement. Fourier Transform background estimation method can estimate the background accurately in the EDXRF spectrum using an X‐ray tube source. Copyright © 2011 John Wiley & Sons, Ltd.     

Elemental mapping of frozen‐hydrated cells with cryo‐scanning X‐ray fluorescence microscopy

Visualizing the elemental distributions of cells and tissues is of growing importance in biology and medical science because such data deepen our understanding of the behavior of metal‐binding proteins and ions. Elemental mapping by X‐ray fluorescence analysis with a hard X‐ray nanobeam is very well suited for this purpose owing to its high sensitivity and high resolution. Using this technique, samples must be prepared without artifacts that are caused by treatments such as chemical fixation and staining procedures. In many studies of elemental mapping, sample preparation is not explicitly considered. To overcome this deficiency, we developed a cryo‐scanning X‐ray fluorescence microscope and installed it in the second experimental hutch of BL29XUL of SPring‐8. We used it to observe frozen‐hydrated cells that had been fixed by a quick‐freezing technique to preserve elemental data of the living state at an X‐ray energy of 11.5 keV. The distributions of K, Ca, Fe, Cu and Zn were successfully visualized. The distributions of these elements (especially those of K, Ca and Fe) differed from those in cells fixed with paraformaldehyde. Copyright © 2010 John Wiley & Sons, Ltd.     

A background subtraction approach based on complex wavelet transforms in EDXRF

Subtracting the background accurately is one of the most important issues in energy‐dispersive X‐ray fluorescence (EDXRF) spectra processing. This paper presents a novel approach to perform background subtraction based on dual‐tree complex wavelet transform. Compared with real wavelet transform, the proposed method has some attractive properties, including a smooth, nonoscillating, and nearly shift‐invariant magnitude with a simple near‐linear phase encoding of signal shifts. Therefore, it outperforms real wavelet transform to decompose background into low‐frequency components. The effectiveness of the proposed approach is demonstrated via two simulated spectra with different kinds of backgrounds and one measured spectrum from an energy‐dispersive X‐ray spectrometer. Both simulated and experimental results prove that the proposed approach can subtract background in EDXRF spectra effectively. Copyright © 2014 John Wiley & Sons, Ltd.     

EDXRF determination of impurities in potassium dihydrogenphosphate single crystals and raw materials

A fast and simple preconcentration procedure for recovering various cation impurities from potassium dihydrogenphosphate (KDP) single crystals and raw materials, followed by energy‐dispersive X‐ray fluorescence analysis (EDXRF), is described. The technique is based on the adsorption of metal 8‐hydroxyquinoline complexes from aqueous solutions of KDP on activated carbon, separation of the concentrate on a Nuclepore filter and subsequent determination by EDXRF. To fix activated carbon powder on a filter surface, an amount of 1‐hexadecanol is added to the KDP solution during the preconcentration procedure. The optimum conditions for the best recovery of the impurities were established. It was shown that a preconcentration factor of 100 can be achieved and the detection limit for a number of elements was down to 0.01 µg g^?1. The relative standard deviations were 6–17% for element concentrations of 0.2 µg g^?1. The method was successfully applied to the determination of Fe, Co, Cu, Ni, Zn, Mn, Ti and Bi in KDP single crystals and raw materials. Copyright © 2005 John Wiley & Sons, Ltd.     

Synchrotron‐induced EDXRF determination of uranium and thorium in mixed uranium–thorium oxide pellets

Uranium and thorium in their mixed oxides were determined by synchrotron‐induced energy dispersive X‐ray fluorescence (EDXRF) spectrometry. Mixed oxide calibration mixtures containing uranium and thorium in different relative amounts and approximately fixed amount of yttrium were prepared in the form of pellets. The EDXRF spectra of the pellets were measured at the microfocus XRF (BL‐16) beam line of Indus‐2 synchrotron radiation facility (Raja Ramanna Centre of Advanced Technology, Indore, India). Characteristic X‐ray lines U Lα, Th Lα, and Y Kα were used as analyte lines. Calibration plot for the determination of uranium was prepared by plotting amount ratios of U and Y against the intensity ratios of U Lα and Y Kα. Similarly, a calibration plot for thorium analysis was also made. The amounts of uranium and thorium in the sample mixtures prepared in similar way as the calibration mixtures were determined using the aforementioned calibration plots. The precision values obtained for uranium and thorium determinations were found to be 0.3 and 0.2% (relative standard deviation, 1σ), respectively. The EDXRF results deviated from the expected values by 1% for uranium and 0.9% for thorium determinations. These analytical features are much superior compared with laboratory‐based analysis results. Copyright © 2012 John Wiley & Sons, Ltd.     

Recent Advances in TXRF

Abstract

Total reflection X‐ray fluorescence analysis (TXRF) is a special method of energy‐dispersive X‐ray fluorescence analysis extending EDXRF to the ultra trace element level. The achievable detection limits depend on the excitation source and are in the range of picograms to femtograms. Only small amounts of sample are required and the quantification by adding one element as an internal standard is easy as thin film approximation is valid. In this article, the recent advances in TXRF are reviewed with over 80 references. The principles, advantages, instrumentation, improvements with X‐ray optics, synchrotron radiation as excitation sources as well as various fields of application, wafer surface analysis, depth profiling, absorption spectroscopy, medical samples, biological samples, environmental monitoring, archeological and polymer samples are described. Related techniques are also mentioned and discussed.     

A comparative study on determination of uranium and thorium in their mixed oxides by EDXRF using tube and radioisotope X‐ray sources

Studies on the matrix effects of uranium and thorium on the determinations of each other in their mixed oxides using energy dispersive X‐ray fluorescence (EDXRF) spectrometry with tube and radioisotope excitations of U Lα and Th Lα are reported. An internal standard method for the determination of uranium and thorium in these mixed oxides is found suitable. Comparison of the analytical results of EDXRF determinations of uranium and thorium using tube and radioisotope excitation sources has been made. The analytical methodology involves preparation of mixed oxide calibration/sample mixtures of uranium and thorium oxides, mixing of internal standard yttrium in these mixtures, pelletizing the mixtures after thorough mixing and grinding using boric acid binder and measuring EDXRF spectra of the specimens thus prepared using Rh X‐ray tube as well as ¹⁰⁹Cd radioisotope source. The samples were analyzed for uranium and thorium on the basis of the calibration plots obtained by plotting the intensity ratios of the analyte and internal standard characteristic X‐ray lines and their corresponding amount ratios. An average precision of 1.2% (1 s RSD) was observed for the determination of U and Th and the results deviated from the corresponding expected values by 3% on average. Due to the refractory nature of thorium oxide, comparatively more grinding time was required for thorium determinations. Copyright © 2011 John Wiley & Sons, Ltd.     

Sulfur determination on stone monuments with a transportable EDXRF system

An important part of the world's cultural heritage is represented by stone monuments. A very dangerous weathering process that deteriorates stone monuments and is caused by human activity is air pollution. One of the worst pollutants for stone monuments is associated with sulfur compounds, especially with gypsum. Gypsum is a rather soluble compound that may be washed away by rain. It leaves the surface of the stone clean but eroded and open to new corrosive processes. With transportable energy dispersive x‐ray fluorescence (EDXRF) instruments it is possible to conduct in situ investigations, mappings, registrations and evaluations of the stone‐degradation phenomena related to sulfate formation on stone and stone‐like materials by quantifying sulfur concentrations directly associated with the presence of gypsum. The EDXRF instrument used in this project is a commercial system comprising a miniaturized low‐power, air‐cooled tungsten x‐ray tube and a silicon drift detector (SDD) Peltier‐cooled detector. The EDXRF instrument was calibrated using a series of standard samples specifically developed for this project with a sulfur content ranging from 0.5 to 15%. Correlating the sulfur peak counts with sulfur concentrations, a straight calibration line (R² = 0.9985) was obtained. Several high voltage levels of the x‐ray tube were tried to define the best operating conditions. The silicon escape peak of calcium had to be accounted for owing to its interference with the sulfur peak. In this paper we shall discuss the working method adopted and the results achieved following the examination of a number of stone monuments such as the “Fanciulla di Anzio” and other ancient Roman statues housed in the Roman National Museum, and the Sarcophagus of Pope Boniface VIII sculpted by Arnolfo di Cambio and situated in the Crypt of the Vatican Basilica. Copyright © 2007 John Wiley & Sons, Ltd.     

Accurate standard‐based quantification of X‐ray fluorescence data using metal‐contaminated plant tissue

Quantitative X‐ray fluorescence (XRF) measurements have been conducted on naturally lead‐contaminated samples. The calibration procedure using the ratio of fluorescence to Compton scattered radiation was investigated using Monte Carlo simulation. Experimental results with low‐energy photons (14 keV) and simulations show a very good linearity of the fluorescence to Compton ratio as a function of metal concentration. Lead (Pb), iron (Fe) and zinc (Zn) are measured in samples of Phaseolus vulgaris (bean seeds) that have been grown using a nutritive solution with different Pb dopings. Naturally contaminated samples are thus obtained. The calibration must be done for fixed conditions of X‐ray energy and scattering angle, while X‐ray beam intensity and detector to sample distance can change from one sample to another. Simulation allows to evaluate the matrix effect on the calibration curve, and shows that linearity is preserved even in the presence of other heavy elements in the fluorescence spectrum. However, calibration must be done using samples with similar matrix as it affects the slope of the curve. Copyright © 2010 John Wiley & Sons, Ltd.     

The multi‐purpose hard X‐ray beamline BL10 at the DELTA storage ring

The layout and the characteristics of the hard X‐ray beamline BL10 at the superconducting asymmetric wiggler at the 1.5 GeV Dortmund Electron Accelerator DELTA are described. This beamline is equipped with a Si(111) channel‐cut monochromator and is dedicated to X‐ray studies in the spectral range from ～4 keV to ～16 keV photon energy. There are two different endstations available. While X‐ray absorption studies in different detection modes (transmission, fluorescence, reflectivity) can be performed on a designated table, a six‐axis kappa diffractometer is installed for X‐ray scattering and reflectivity experiments. Different detector set‐ups are integrated into the beamline control software, i.e. gas‐filled ionization chambers, different photodiodes, as well as a Pilatus 2D‐detector are permanently available. The performance of the beamline is illustrated by high‐quality X‐ray absorption spectra from several reference compounds. First applications include temperature‐dependent EXAFS experiments from liquid‐nitrogen temperature in a bath cryostat up to ～660 K by using a dedicated furnace. Besides transmission measurements, fluorescence detection for dilute sample systems as well as surface‐sensitive reflection‐mode experiments are presented.     

Combining CdTe and Si detectors for Energy‐Dispersive X‐Ray Fluorescence

Most energy‐dispersive X‐ray fluorescence (EDXRF) instruments use Si diodes as X‐ray detectors. These provide very high energy resolution, but their sensitivity falls off at energies of 10–20 keV. They are well suited for measuring the K lines of elements with Z < 40, but for heavier elements, one must use K lines at low efficiency or use L or M lines that often overlap other lines. Either is a challenge for accurate quantitative analysis. CdTe detectors offer much higher efficiency at high energy but poorer energy resolution compared with Si diodes. In many important EDXRF measurements, both high and low Z elements are present. In this paper, we will compare the precision and accuracy of systems using the following: (1) a high resolution Si detector, (2) a high efficiency CdTe detector, and (3) a composite system using both detectors. We will show that CdTe detectors generally offer better analytical results than even a high resolution silicon drift detectors for K lines greater than 20 or 25 keV, whereas the high resolution Si detectors are much better at lower energies. We will also show the advantages of a combined system, using both detectors. Although a combined system would be more expensive, the increased accuracy, precision, and throughput will often outweigh the small increase in cost and complexity. The systems will be compared for representative applications that include both high and low Z elements. Copyright © 2012 John Wiley & Sons, Ltd.     

Measuring partial fluorescence yield using filtered detectors

Typically, X‐ray absorption near‐edge structure measurements aim to probe the linear attenuation coefficient. These measurements are often carried out using partial fluorescence yield techniques that rely on detectors having photon energy discrimination improving the sensitivity and the signal‐to‐background ratio of the measured spectra. However, measuring the partial fluorescence yield in the soft X‐ray regime with reasonable efficiency requires solid‐state detectors, which have limitations due to the inherent dead‐time while measuring. Alternatively, many of the available detectors that are not energy dispersive do not suffer from photon count rate limitations. A filter placed in front of one of these detectors will make the energy‐dependent efficiency non‐linear, thereby changing the responsivity of the detector. It is shown that using an array of filtered X‐ray detectors is a viable method for measuring soft X‐ray partial fluorescence yield spectra without dead‐time. The feasibility of this technique is further demonstrated using α‐Fe₂O₃ as an example and it is shown that this detector technology could vastly improve the photon collection efficiency at synchrotrons and that these detectors will allow experiments to be completed with a much lower photon flux reducing X‐ray‐induced damage.     

Measurement of relative line intensities for L‐shell X‐rays from selected elements between Z = 68 (Er) and Z = 79 (Au)

Relative line intensities of L1, L2 and L3 sub‐shell X‐rays were measured for Er, Tm, Yb, Hf, Ta, W, Pt and Au. The L‐shell X‐ray spectra were recorded by exciting pure element samples (eight cases) and oxide samples (two cases) with approximately 17‐keV exciting radiation from a filtered X‐ray tube source, and measuring the fluorescence spectra with a silicon drift detector. The spectra were carefully fitted to determine line energies and intensities, accounting for Lorentzian line broadening, incomplete charge collection and escape effects. A Monte Carlo approach was used to calculate attenuation and detector efficiency corrections. We report up to 15 line intensity ratios for each element and compare these to Scofield's theoretical predictions and Elam's extrapolated experimental database. Our measured relative line intensities agree best with Elam's data, but overall we find significant discrepancies with previously reported results. For the element Ta, we also find significant errors in the accepted L‐shell line energies in the widely used National Institute of Standard and Technology (NIST) database. Our results highlight the need for an experimental and theoretical re‐evaluation of L‐shell intensity databases to support high‐accuracy X‐ray analysis methods such as X‐ray fluorescence and particle‐induced X‐ray emission. Copyright © 2016 John Wiley & Sons, Ltd.     

A high‐resolution X‐ray fluorescence spectrometer and its application at SSRF

A high‐resolution X‐ray fluorescence spectrometer based on Rowland circle geometry was developed and installed at BL14W1 XAFS beamline of Shanghai Synchrotron Radiation Facility. The spectrometer mainly consists of three parts: a sample holder, a spherically curved Si crystal, and an avalanche photodiode detector. The simplicity of the spectrometer makes it easily assembled on the general purpose X‐ray absorption beamline. X‐ray emission spectroscopy and high‐resolution X‐ray absorption near edge spectroscopy can be carried out by using this spectrometer. X‐ray emission preliminary results with high‐resolution about 3 eV of Mn compounds were obtained, which confirmed the feasibility of the spectrometer. The application about Eu (III) retention on manganese dioxide was also studied using this spectrometer. Compared with conventional X‐ray absorption fine structure spectroscopy technique, the fluorescence peak of probed element [Eu (III) Lα] and matrix constituents (Mn Kα) were discriminated using this technique, indicating its superiority in fluorescence detection. Copyright © 2013 John Wiley & Sons, Ltd.