Focused ion beam treatment of ZnO nanowires in the scanning electron microscope

We investigated vapor phase epitaxy-grown ZnO nanowires on a Si substrate by scanning electron microscopy. These investigations show that there are single nanowires and ensembles of nanowires, among which we found straight and bend, perfect and non-perfect nanowires, as well as nanowires with clean surfaces and surfaces with the dark spots and features. After focused ion beam polishing and milling we found that nanowires are homogeneous. The sizes of the nanowires were determined: the length is about 2–24 μm, and the width and height are about 200–500 nm.     

A transmission electron microscopy study of the deformation behavior underneath nanoindents in nanoscale Al–TiN multilayered composites

Nanoscale multilayered Al–TiN composites were deposited using the dc magnetron sputtering technique in two different layer thickness ratios, Al : TiN = 1 : 1 and Al : TiN = 9 : 1. The Al layer thickness varied from 2 nm to 450 nm. The hardness of the samples was tested by nanoindentation using a Berkovich tip. Cross-sectional transmission electron microscopy (TEM) was carried out on samples extracted with focused ion beam from below the nanoindents. The results of the hardness tests on the Al–TiN multilayers with two different thickness ratios are presented, together with observations from the cross-sectional TEM studies of the regions underneath the indents. These studies revealed remarkable strength in the multilayers, as well as some very interesting deformation behavior in the TiN layers at extremely small length scales, where the hard TiN layers undergo co-deformation with the Al layers.     

Nucleation and growth of bubbles in He ion-implanted V/Ag multilayers

Microstructures of He ion-implanted pure Ag, pure V and polycrystalline V/Ag multilayers with individual layer thickness ranging from 1?nm to 50?nm were investigated by transmission electron microscopy (TEM). The bubbles in the Ag layer were faceted and larger than the non-faceted bubbles in the V layer under the same implantation conditions for both pure metals and multilayers. The substantially higher single defects surviving the spike phase and lower mobility of trapped He in bcc than those in fcc could account for this difference. For multilayers, the bubbles nucleate at interfaces but grow preferentially in Ag layers due to high mobility of trapped He in fcc Ag. In addition, the He concentration above which bubbles can be detected in defocused TEM images increases with decreasing layer thickness, from 0 for pure Ag to 4–5 at. % for 1?nm V/1?nm Ag multilayers. In contrast, the bubble size decreases with decreasing layer thickness, from approximately 4?nm in diameter in pure Ag to 1?nm in the 1?nm V/1?nm Ag multilayers. Elongated bubbles confined in the Ag layer by the V–Ag interfaces were observed in 1?nm multilayers. These observations show that bubble nucleation and growth can be suppressed to high He concentrations in nanoscale composites with interfaces that have high He solubility.     

Integration of correlative Raman microscopy in a dualbeam FIB SEM

We present an integrated confocal Raman microscope in a focused ion beam scanning electron microscope (FIB SEM). The integrated system enables correlative Raman and electron microscopic analysis combined with focused ion beam sample modification on the same sample location. This provides new opportunities, for example the combination of nanometer resolution with Raman advances the analysis of sub‐diffraction‐sized particles. Further direct Raman analysis of FIB engineered samples enables in situ investigation of sample changes. The Raman microscope is an add‐on module to the electron microscope. The optical objective is brought into the sample chamber, and the laser source, and spectrometer are placed in a module attached onto and outside the chamber. We demonstrate the integrated Raman FIB SEM function with several experiments. First, correlative Raman and electron microscopy is used for the investigation of (sub‐)micrometer‐sized crystals. Different crystals are identified with Raman, and in combination with SEM the spectral information is combined with structurally visible polymorphs and particle sizes. Analysis of sample changes made with the ion beam is performed on (1) structures milled in a silicon substrate and (2) after milling with the FIB on an organic polymer. Experiments demonstrate the new capabilities of an integrated correlative Raman–FIB–SEM. Copyright © 2016 John Wiley & Sons, Ltd.     

Estimation of diffusion coefficient by photoemission electron microscopy in ion-implanted nanostructures

We have fabricated parallel stripes of nanostructures in an n-type Si substrate by implanting 30 keV Ga⁺ ions from a focused ion beam (FIB) source. Two sets of implantation were carried out. In one case, during implantation the substrate was held at room temperature and in the other case at 400 °C. Photoemission electron microscopy (PEEM) was carried out on these samples. The implanted parallel stripes, each with a nominal dimension of 4000 nm × 100 nm, appear as bright regions in the PEEM image. Line scans of the intensities from the PEEM image were recorded along and across these stripes. The intensity profile at the edges of a line scan is broader for the implantation carried out at 400 °C compared to room temperature. From the analysis of this intensity profile, the lateral diffusion coefficient of Ga in silicon was estimated assuming that the PEEM intensity is proportional to Ga concentration. The diffusion coefficient at 400 °C has been estimated to be ∼1.3 × 10⁻¹⁵ m²/s. Across the stripes an asymmetric diffusion profile has been observed, which has been related to the sequence of implantation of these stripes and the associated defect distribution due to lateral straggling of the implanted ions.     

A matrix approach to grazing-incidence X-ray diffraction in multilayers

A method for computation of X-ray grazing-incidence diffraction (GID) in multilayers and superlattices is presented. The method is based on X-ray dynamical diffraction theory and a matrix from a boundary equations and provides a simple numerical solution of the problem. The application of the method to simulating GID measurements taken from A1As/GaAs superlattice (20 periods of 14.6 nm A1As and 6.8 nm GaAs) demonstrates the principal validity of the theory. A perfect matching between the theory and the experiment requires the real-structure effects of sample to be taken into account.     

Beam profile measurement with CR-39 track detector for low-energy ions

A CR-39 track detector was successfully used to measure the outline of thin low-energy ion beams. After the etching, the surface of the detector was examined with an observation system composed of a Normarski microscope, a CCD camera and a digital image processing computer. Beam images obtained with the system were in good agreement on the outline of the beam formed with a beam aperture. Also, the resolving power in the beam outline measurement was roughly explained from the consideration of the ion range and the etch-pit growth in the chemical etching for the CR-39 detector.     

XUV成像系统中像传递函数研究用的Si刻蚀膜

研制具有网格或条状图形的Si刻蚀膜靶,用于XUV系统中像传递函数的研究。在自截止腐蚀工艺制备Si平面薄膜的基础上,结合离子束刻蚀工艺,获得刻蚀深度为1.0 μm左右,网格尺寸为25 μm×25 μm,或条状线宽为5 μm的Si刻蚀膜;测量了Si刻蚀膜的形貌和刻蚀深度;研究了离子束刻蚀参数对图形形貌的影响。并介绍采用两种靶型获得的像传递函数信息。     

A method to accurately measure and respond to an underwater sound pulse in a wide dynamic range

I.IntroductionTomeasurethesound1evelofanundcrwatersoundpulsewithunknownamplitudeisofimportanceinunderwaterapp1ication.Forinstancc,asimu1ationsystemusedtointerfcresomesonarmusthavesuchfunction,whichhastobeabIctomeasurethesoundlcvelatreceivingpointandretransmitasimulatcdsignalwithrequircdsoundlcvelafterpropcrprocessing.Itisdifficultforanorma1peakorthresho1ddetectortocompletethistask.Thereasonforthisisthattherangeofthesignalamp1itudercaches7O-8odBandthereissomedistortionofsignalwaveform,inaddit…     

A net-exchange Monte Carlo approach to radiation in optically thick systems

A Monte Carlo approach to radiative transfer in participating media is described and tested. It solves to a large extent the well known problem of Monte Carlo simulation of optically thick absorption configurations. The approach which is based on a net-exchange formulation and on adapted optical path sampling procedures is carefully designed to insure satisfactory convergence for all types of optical thicknesses. The need for such adapted algorithms is mainly related to the problem of gaseous line spectra representation in which extremely large ranges of optical thicknesses may be simultaneously encountered. The algorithm is tested against various band average computations for simple geometries using the Malkmus statistical narrow band model.     

人工神经网络在HL-2A装置汤姆逊散射数据处理中的应用

人工神经网络是一种强大的非线性数据分析算法,其中的感知器神经网络第一次被用于处理HL-2A装置上汤姆逊散射系统的电子温度数据。采用输入层、隐藏层和输出层等三层神经网络结构,输入层为标定数据或测量数据,隐藏层使用sigmoid函数作为传递函数,输出层为电子温度值。从数据处理结果可以看出,该计算方法与传统的χ²最小值方法计算的结果吻合,能够得到可靠的电子温度数据。而且由于计算温度时采用矩阵计算,计算速度比使用χ²最小值法提高20倍以上,为将来利用汤姆逊散射测量的电子温度数据实现等离子体剖面实时反馈控制提供了可能。     

A new approach for preventing charging up of soft material samples by coating with conducting polymers in SIMS analysis

Dynamic secondary ion mass spectroscopy (SIMS) analysis of soft materials such as polymer or biomaterial is one of challenging subjects due to the charge up effect brought from the irradiation of a primary ion beam, hampering the collection of secondary ions. Conventional methods against the charging up are the electron beam irradiation for charge compensation and surface coating with metal, normally gold. Those methods require a compromise analytical condition, reducing the primary ion beam current to suppress the range of the charging, which degrading the performances of the SIMS analyses. We have proposed that a thicker conductive layer, capable of delocalizing the charge onto the surface, should be put on a soft insulator sample to avoid charging up. The depth profile of the hair sample coated wholly with a polythiophen-based conducting polymer was successfully measured in longer time without any charging up even in the maximum current of the oxygen primary ion beam (O₂⁺: 7.5 keV, 400 nA) or using an electron beam compensation system. Thus, the proposed method coating with a conductive organic polymer against the charging issue would be expected as a breakthrough on SIMS analysis.     

A Raman spectroscopic and combined analytical approach to the restoration of severely damaged frescoes: the Palomino project

The deterioration of art objects is normally relatively minor, controllable and attributable to environmental changes or bacterial invasion, and until now there has not been any recorded attempt to analyse an artwork that has been deliberately and significantly destroyed. The analytical problems are correspondingly larger but the potential reward from any information that can be forthcoming is thereby proportionately greater. The 17th Century Palomino frescoes on the vaulted ceiling of the Church of Sant Joan del Mercat in Valencia were largely destroyed by insurgents in the Spanish Civil War in 1936. The ensuing gunfire and a series of seven conflagrations inside the church had a devastating effect upon the artwork, and the surviving areas were also rendered unstable with respect to their detachment from the substrate. During the current restoration project being undertaken on these frescoes, an opportunity was provided for the application of several analytical techniques to secure information about the original pigment palette employed, the technology of application used by Palomino and the changes consequent upon the destruction process. Here, we report for the first time the use of analytical Raman spectroscopy, supported by scanning electron microscopy (SEM) and voltammetry of microparticles, for the combined identification of pigments, binders, substrate treatments and pigment alteration in an important, although badly damaged, wall painting for the informing of the ongoing conservation and restoration strategy. Copyright © 2008 John Wiley & Sons, Ltd.     

A method to measure the nonlinear force caused emittance growth in a RF photoinjector

Based on the multi-slit method, a new method is introduced to measure the non linear force caused emittance growth in a RF photoinjector. It is possible to reconstruct the phase space of a beam under some conditions by the multi-slit method. Based on the reconstructed phase space, besides the emittance, the emittance growth from the distortion of the phase space can also be measured. The emittance growth results from the effects of nonlinear force acting on electron, which is very important for the high quality beam in a RF photoinjector.     

A self-consistent approach to measure preferential attachment in networks and its application to an inherent structure network

Preferential attachment is one possible way to obtain a scale-free network. We develop a self-consistent method to determine whether preferential attachment occurs during the growth of a network, and to extract the preferential attachment rule using time-dependent data. Model networks are grown with known preferential attachment rules to test the method, which is seen to be robust. The method is then applied to a scale-free inherent structure (IS) network, which represents the connections between minima via transition states on a potential energy landscape. Even though this network is static, we can examine the growth of the network as a function of a threshold energy (rather than time), where only those transition states with energies lower than the threshold energy contribute to the network. For these networks we are able to detect the presence of preferential attachment, and this helps to explain the ubiquity of funnels on potential energy landscapes. However, the scale-free degree distribution shows some differences from that of a model network grown using the obtained preferential attachment rules, implying that other factors are also important in the growth process.     

A correlative optical microscopy and scanning electron microscopy approach to locating nanoparticles in brain tumors

The growing use of nanoparticles in biomedical applications, including cancer diagnosis and treatment, demands the capability to exactly locate them within complex biological systems. In this work a correlative optical and scanning electron microscopy technique was developed to locate and observe multi-modal gold core nanoparticle accumulation in brain tumor models. Entire brain sections from mice containing orthotopic brain tumors injected intravenously with nanoparticles were imaged using both optical microscopy to identify the brain tumor, and scanning electron microscopy to identify the individual nanoparticles. Gold-based nanoparticles were readily identified in the scanning electron microscope using backscattered electron imaging as bright spots against a darker background. This information was then correlated to determine the exact location of the nanoparticles within the brain tissue. The nanoparticles were located only in areas that contained tumor cells, and not in the surrounding healthy brain tissue. This correlative technique provides a powerful method to relate the macro- and micro-scale features visible in light microscopy with the nanoscale features resolvable in scanning electron microscopy.     

Low-energy EDX – A novel approach to study stress corrosion cracking in SUS304 stainless steel via scanning electron microscopy

Intergranular stress corrosion cracking (IGSCC) in type SUS304 stainless steels, tested under pressurized water reactor (PWR) primary water conditions, has been characterized with unprecedented spatial resolution using scanning electron microscopy (SEM) and novel low-energy (∼3 kV) energy dispersive X-ray spectroscopy (EDX). An advancement of the large area silicon drift detector (SDD) has enhanced its sensitivity for X-rays in the low-energy part of the atomic spectrum. Therefore, it was possible to operate the SEM at lower accelerating voltages in order to reduce the interaction volume of the beam with the material and achieve higher spatial resolution and better signal-to-noise ratio. In addition to studying the oxide chemistry at the surface of intergranular stress corrosion cracks, the technique has proven capable of resolving Ni enrichment ahead of some crack tips. Active cracks could be distinguished from inactive ones due to the presence of oxides in the open crack and Ni-rich regions ahead of the crack tip. Furthermore, it has been established that SCC features can be better resolved with low-energy (3 kV) than high-energy (12 kV) EDX. The low effort in sample preparation, execution and data analysis makes SEM the ideal tool for initial characterization and selection of the most important SCC features such as dominant cracks and interesting crack tips, later to be studied by transmission electron microscopy (TEM) and atom probe tomography (APT).     

Correlative microscopy: a powerful tool for exploring neurological cells and tissues

Imaging tools for exploring the neurological samples have seen a rapid transformation over the last decade. Approaches that allow clear and specific delineation of targeted tissues, individual neurons, and their cell–cell connections as well as subcellular constituents have been especially valuable. Considering the significant complexity and extent to which the nervous system interacts with every organ system in the body, one non-trivial challenge has been how to identify and target specific structures and pathologies by microscopy. To this end, correlative methods enable one to view the same exact structure of interest utilizing the capabilities of typically separate, but powerful, microscopy platforms. As such, correlative microscopy is well-positioned to address the three critical problems of identification, scale, and resolution inherent to neurological systems. Furthermore, the application of multiple imaging platforms to the study of singular biological events enables more detailed investigations of structure–function relationships to be conducted, greatly facilitating our understanding of relevant phenomenon. This comprehensive review provides an overview of methods for correlative microscopy, including histochemistry, transgenic markers, immunocytochemistry, photo-oxidation as well as various probes and tracers. An emphasis is placed on correlative light and electron microscopic strategies used to facilitate relocation of neurological structures. Correlative microscopy is an invaluable tool for neurological research, and we fully anticipate developments in automation of the process, and the increasing availability of genomic and transgenic tools will facilitate the adoption of correlative microscopy as the method of choice for many imaging experiments.