Subwavelength grating Fourier‐transform interferometer array in silicon‐on‐insulator

A planar waveguide Fourier‐transform spectrometer with densely arrayed Mach‐Zehnder interferometers is demonstrated. Subwavelength gratings are used to produce an optical path difference without waveguide bends. The fabricated device comprises of an array of 32 Mach‐Zehnder interferometers, which produce a spatial interferogram without any moving parts, yielding a spectral resolution of 50 pm and a free‐spectral range of 0.78 nm. As a result of similar propagation losses in subwavelength grating waveguides and conventional strip waveguides, loss imbalance is minimized and high interferometic extinction ratio of −25 to −30 dB is obtained. Furthermore, phase and amplitude errors arising from normal fabrication variation are compensated by the spectral retrieval process using calibration measurements.     

DESIRS: a state‐of‐the‐art VUV beamline featuring high resolution and variable polarization for spectroscopy and dichroism at SOLEIL

DESIRS is a new undulator‐based VUV beamline on the 2.75 GeV storage ring SOLEIL (France) optimized for gas‐phase studies of molecular and electronic structures, reactivity and polarization‐dependent photodynamics on model or actual systems encountered in the universe, atmosphere and biosphere. It is equipped with two dedicated endstations: a VUV Fourier‐transform spectrometer (FTS) for ultra‐high‐resolution absorption spectroscopy (resolving power up to 10⁶) and an electron/ion imaging coincidence spectrometer. The photon characteristics necessary to fulfill its scientific mission are: high flux in the 5–40 eV range, high spectral purity, high resolution, and variable and well calibrated polarizations. The photon source is a 10 m‐long pure electromagnetic variable‐polarization undulator producing light from the very near UV up to 40 eV on the fundamental emission with tailored elliptical polarization allowing fully calibrated quasi‐perfect horizontal, vertical and circular polarizations, as measured with an in situ VUV polarimeter with absolute polarization rates close to unity, to be obtained at the sample location. The optical design includes a beam waist allowing the implementation of a gas filter to suppress the undulator high harmonics. This harmonic‐free radiation can be steered toward the FTS for absorption experiments, or go through a highly efficient pre‐focusing optical system, based on a toroidal mirror and a reflective corrector plate similar to a Schmidt plate. The synchrotron radiation then enters a 6.65 m Eagle off‐plane normal‐incidence monochromator equipped with four gratings with different groove densities, from 200 to 4300 lines mm^?1, allowing the flux‐to‐resolution trade‐off to be smoothly adjusted. The measured ultimate instrumental resolving powers are 124000 (174 µeV) around 21 eV and 250000 (54 µeV) around 13 eV, while the typical measured flux is in the 10¹⁰–10¹¹ photons s^?1 range in a 1/50000 bandwidth, and 10¹²–10¹³ photons s^?1 in a 1/1000 bandwidth, which is very satisfactory although slightly below optical simulations. All of these features make DESIRS a state‐of‐the‐art VUV beamline for spectroscopy and dichroism open to a broad scientific community.     

Sub‐picosecond Raman spectrometer for time‐resolved studies of structural dynamics in heme proteins

We describe a pump–probe Raman spectrometer based on a femtosecond Ti:sapphire laser, an optical parametric generator and two optical parametric amplifiers for time‐resolved studies, with emphasis on the structural dynamics in heme proteins. The system provides a 100‐fs pump pulse tunable in the range 500–600 nm and a transform‐limited sub‐picosecond probe pulse tunable in the range 390–450 nm. The spectrometer has spectral (25 cm⁻¹) and temporal (∼0.7 ps) resolutions which constitute an effective compromise for identifying transient heme protein species and for following their structural evolution by spontaneous Raman scattering in the time range 0.5 ps to 2 ns. This apparatus was applied to time‐resolved studies of a broad range of heme proteins, monitoring the primary dynamics of photoinduced heme coordination state and structural changes, its interaction with protein side‐chains and diatomic gaseous ligands, as well as heme vibrational cooling. The treatment of transient Raman spectra is described in detail, and the advantages and shortcomings of spontaneous resonance Raman spectroscopy for ultrafast heme proteins studies are discussed. We demonstrate the efficiency of the constructed spectrometer by measuring Raman spectra in the sub‐picosecond and picosecond time ranges for the oxygen‐storage heme protein myoglobin and for the oxygen‐sensor heme protein FixLH in interaction with the diatomic gaseous ligands CO, NO, and O₂. Copyright © 2010 John Wiley & Sons, Ltd.     

A three‐crystal spectrometer for high‐energy resolution fluorescence‐detected X‐ray absorption spectroscopy and X‐ray emission spectroscopy at SSRF

A Johann‐type spectrometer for the study of high‐energy resolution fluorescence‐detected X‐ray absorption spectroscopy, X‐ray emission spectroscopy and resonant inelastic X‐ray scattering has been developed at BL14W1 X‐ray absorption fine structure spectroscopy beamline of Shanghai Synchrotron Radiation Facility. The spectrometer consists of three crystal analyzers mounted on a vertical motion stage. The instrument is scanned vertically and covers the Bragg angle range of 71.5–88°. The energy resolution of the spectrometer ranges from sub‐eV to a few eV. The spectrometer has a solid angle of about 1.87 × 0^?3 of 4π sr, and the overall photons acquired by the detector could be 10⁵ counts per second for the standard sample. The performances of the spectrometer are illustrated by the three experiments that are difficult to perform with the conventional absorption or emission spectroscopy. Copyright © 2016 John Wiley & Sons, Ltd.     

Highly efficient beamline and spectrometer for inelastic soft X‐ray scattering at high resolution

The design, construction and commissioning of a beamline and spectrometer for inelastic soft X‐ray scattering at high resolution in a highly efficient system are presented. Based on the energy‐compensation principle of grating dispersion, the design of the monochromator–spectrometer system greatly enhances the efficiency of measurement of inelastic soft X‐rays scattering. Comprising two bendable gratings, the set‐up effectively diminishes the defocus and coma aberrations. At commissioning, this system showed results of spin‐flip, d–d and charge‐transfer excitations of NiO. These results are consistent with published results but exhibit improved spectral resolution and increased efficiency of measurement. The best energy resolution of the set‐up in terms of full width at half‐maximum is 108 meV at an incident photon energy tuned about the Ni L₃‐edge.     

Multiple‐element spectrometer for non‐resonant inelastic X‐ray spectroscopy of electronic excitations

A multiple‐analyser‐crystal spectrometer for non‐resonant inelastic X‐ray scattering spectroscopy installed at beamline ID16 of the European Synchrotron Radiation Facility is presented. Nine analyser crystals with bending radii R = 1 m measure spectra for five different momentum transfer values simultaneously. Using a two‐dimensional detector, the spectra given by all analysers can be treated individually. The spectrometer is based on a Rowland circle design with fixed Bragg angles of about 88°. The energy resolution can be chosen between 30–2000 meV with typical incident‐photon energies of 6–13 keV. The spectrometer is optimized for studies of valence and core electron excitations resolving both energy and momentum transfer.     

A multiplexed high‐resolution imaging spectrometer for resonant inelastic soft X‐ray scattering spectroscopy

The optical design of a two‐dimensional imaging soft X‐ray spectrometer is described. A monochromator will produce a dispersed spectrum in a narrow vertical illuminated stripe (～2 µm wide by ～2 mm tall) on a sample. The spectrometer will use inelastically scattered X‐rays to image the extended field on the sample in the incident photon energy direction (vertical), resolving the incident photon energy. At the same time it will image and disperse the scattered photons in the orthogonal (horizontal) direction, resolving the scattered photon energy. The principal challenge is to design a system that images from the flat‐field illumination of the sample to the flat field of the detector and to achieve sufficiently high spectral resolution. This spectrometer provides a completely parallel resonant inelastic X‐ray scattering measurement at high spectral resolution (～30000) over the energy bandwidth (～5 eV) of a soft X‐ray absorption resonance.     

Small‐angle scattering of polychromatic X‐rays: effects of bandwidth,spectral shape and high harmonics

Polychromatic X‐ray sources can be useful for photon‐starved small‐angle X‐ray scattering given their high spectral fluxes. Their bandwidths, however, are 10–100 times larger than those using monochromators. To explore the feasibility, ideal scattering curves of homogeneous spherical particles for polychromatic X‐rays are calculated and analyzed using the Guinier approach, maximum entropy and regularization methods. Monodisperse and polydisperse systems are explored. The influence of bandwidth and asymmetric spectra shape are explored via Gaussian and half‐Gaussian spectra. Synchrotron undulator spectra represented by two undulator sources of the Advanced Photon Source are examined as an example, as regards the influence of asymmetric harmonic shape, fundamental harmonic bandwidth and high harmonics. The effects of bandwidth, spectral shape and high harmonics on particle size determination are evaluated quantitatively.     

Non‐invasive time‐course imaging of apoptotic cells by confocal Raman micro‐spectroscopy

Confocal Raman micro‐spectroscopy (CRMS) was used to measure time‐course spectral images of live cells undergoing apoptosis without using molecular labels or other invasive procedures. Human breast cancer cells (MDA‐MB‐231) were exposed to 300 µM etoposide to induce apoptosis, and Raman spectral images were acquired from the same cells at 2‐h intervals over a period of 6 h. The purpose‐built inverted confocal Raman micro‐spectrometer integrated an environmental enclosure and wide‐field fluorescence imaging. These key instrumental elements allowed the cells to be maintained under sterile physiological conditions (37 °C, 5% CO₂) and enabled viability and apoptosis assays to be carried out on the cells at the end of CRMS measurements. The time‐course spectral images corresponding to DNA Raman bands indicated an increase in signal intensity in apoptotic cells, which was attributed to DNA condensation. The Raman spectral images of lipids indicated a high accumulation of membrane phospholipids and highly unsaturated non‐membrane lipids in apoptotic cells. This study demonstrates the potential of CRMS for label‐free time‐course imaging of individual live cells. This technique may become a useful tool for in vitro toxicological studies and testing of new pharmaceuticals, as well as other time‐dependent cellular processes, such as cell differentiation, cell cycle and cell–cell interactions. Copyright © 2010 John Wiley & Sons, Ltd.     

Spectrometer for hard X‐ray free‐electron laser based on diffraction focusing

X‐ray free‐electron lasers (XFELs) generate sequences of ultra‐short spatially coherent pulses of X‐ray radiation. A diffraction focusing spectrometer (DFS), which is able to measure the whole energy spectrum of the radiation of a single XFEL pulse with an energy resolution of ΔE/E? 2 × 10^?6, is proposed. This is much better than for most modern X‐ray spectrometers. Such resolution allows one to resolve the fine spectral structure of the XFEL pulse. The effect of diffraction focusing occurs in a single‐crystal plate due to dynamical scattering, and is similar to focusing in a Pendry lens made from a metamaterial with a negative refraction index. Such a spectrometer is easier to operate than those based on bent crystals. It is shown that the DFS can be used in a wide energy range from 5 keV to 20 keV.     

Raman spectra of nitrogen‐containing organic compounds obtained using a portable instrument at −15 °C at 2860 m above sea level

Well‐resolved Raman spectra of samples of nitrogen‐containing compounds were detected using a portable Raman instrument (Ahura First Defender XL) outdoors at a low ambient temperature of −15 °C and at an altitude of 2860 m (Pitztall, Austria). The portable Raman spectrometer tested here is equipped with a 785‐nm diode laser and a fixed frontal probe. Solid form of formamide, urea, 3‐methylpyridine, aniline, indene, 1‐(2‐aminoethyl)piperazine, indoline and benzofuran were detected unambiguously under high‐mountain field conditions. The main Raman features (strong, medium and partially weak bands) were observed at the correct wavenumber positions (with a spectral resolution 7–10 cm⁻¹) in the wavenumber range 200–1600 cm⁻¹. The results obtained demonstrate the possibility of employing a miniaturised Raman spectrometer as a key instrument for investigating the presence of nitrogen‐containing organic compounds and biomolecules outdoors under low temperature conditions. Within the payload designed by European Space Agency (ESA) and National Aeronautics and Space Administration (NASA) for future missions, focussing not only on Mars, Raman spectroscopy represents an important instrumentation for the detection of organic nitrogen‐containing compounds relevant to life detection on planetary surfaces or near sub‐surfaces. Copyright © 2009 John Wiley & Sons, Ltd.     

Quantitative or semi‐quantitative?–laboratory‐based WD‐XRF versus portable ED‐XRF spectrometer: results obtained from measurements on nickel‐base alloys

‘Semi‐quantitative’ analytical procedures are becoming more and more popular. Using such procedures, the question of the accuracy of results arises. The accuracy of an analytical procedure depends to a great extent on spectral resolution, counting statistics and matrix correction. Two ‘semi‐quantitative’ procedures are compared with a quantitative analytical program. Using a laboratory‐based wavelength‐dispersive x‐ray fluorescence (WD‐XRF) spectrometer and a portable energy‐dispersive x‐ray fluorescence (ED‐XRF) spectrometer, 28 different nickel‐base alloy Certified Reference Materials (CRMs) were analyzed. Line interferences and inaccurate matrix correction are reasons for deviations from the reference value. As the comparison shows, ‘semi‐quantitative’ analyses on the WD‐XRF spectrometer can be accepted as quantitative determinations. The investigations show that the results obtained with the portable ED‐XRF spectrometer do not meet the quality requirements of laboratory analysis, but they are good enough for field investigations. Copyright © 2004 John Wiley & Sons, Ltd.     

Polarization‐resolved high‐resolution Raman spectroscopy with a light‐emitting diode

We demonstrate the use of a light‐emitting diode (LED) based experimental setup for collecting polarization‐resolved Raman spectra with good spectral resolution. The combination of a commercial red LED (630 nm), a 1‐nm bandwidth laser‐line filter, and a polarizing prism is used as a light source. Polarization‐resolved spectra in dimethyl sulfoxide are recorded and compared with the corresponding laser‐Raman spectra. The LED‐excited spectra exhibit a resolution slightly lower than those in the laser case but still close to the resolution of the spectrometer. All relevant spectral features of dimethyl sulfoxide including the symmetric and antisymmetric stretching modes of the CSC moiety are resolved with the experimental setup providing a spectral resolution of approximately 20 cm⁻¹. Copyright © 2013 John Wiley & Sons, Ltd.     

Synchrotron X‐ray tests of an L‐shaped laterally graded multilayer mirror for the analyzer system of the ultra‐high‐resolution IXS spectrometer at NSLS‐II

Characterization and testing of an L‐shaped laterally graded multilayer mirror are presented. This mirror is designed as a two‐dimensional collimating optics for the analyzer system of the ultra‐high‐resolution inelastic X‐ray scattering (IXS) spectrometer at National Synchrotron Light Source II (NSLS‐II). The characterization includes point‐to‐point reflectivity measurements, lattice parameter determination and mirror metrology (figure, slope error and roughness). The synchrotron X‐ray test of the mirror was carried out reversely as a focusing device. The results show that the L‐shaped laterally graded multilayer mirror is suitable to be used, with high efficiency, for the analyzer system of the IXS spectrometer at NSLS‐II.     

The high‐resolution absorption spectroscopy branch on the VUV beamline DESIRS at SOLEIL

A VUV absorption spectroscopy facility designed for ultra‐high spectral resolution is in operation as a dedicated branch on the DESIRS beamline at Synchrotron SOLEIL. This branch includes a unique VUV Fourier transform spectrometer (FTS) and a dedicated versatile gas sample chamber. The FTS instrument can cover a large UV–VUV spectral range from 4 to 30 eV, with an ultimate line width of 0.08 cm^?1 on a large spectral window, ΔE/E = 7%, over which all spectral features can be acquired in a multiplex way. The performance can be considered to be a middle ground between broadband moderate‐resolution spectrometers based on gratings and ultra‐high‐spectral‐resolution VUV tunable‐laser‐based techniques over very narrow spectral windows. The various available gaseous‐sample‐handling setups, which function over a wide range of pressures and temperatures, and the acquisition methodology are described. A selection of experimental results illustrates the performance and limitations of the FTS‐based facility.     

Spin‐Orbit Coupling in All‐Electron Mixed Basis Approach

In the evaluation of the spin‐orbit coupling (SOC), the use of the L · S formula is invalid in the interatomic region where the effective potential is not spherically symmetric. This problem occurs in the LCAO, LMTO, and APW methods, while the plane‐wave pseudopotential and PAW methods cannot treat the spin‐orbit splitting (SOS) of core orbitals. To avoid these problems, the all‐electron mixed basis approach is adopted, which uses both plane waves (PWs) and atomic orbitals (AOs) as a basis set. The general form S · ?V × p can be used for PWs, while the standard form L · S can be used for AOs, which are well localized inside the non‐overlapping atomic sphere in the spherical potential region and composed of the numerical radial function on a logarithmic radial mesh and analytic cubic harmonics. The explicit formula of the AO–AO, PW–AO, and PW–PW matrix elements of the SOC for spin‐polarized systems is presented. In particular, the AO–AO matrices are explicitly derived for p, d, and f orbitals. The method is applied to the SOS of core and valence levels in X‐ray photoelectron spectra. The results are in excellent agreement with the available experimental data, which suggests the validity of the present method.     

Beamline BL‐07 at Indus‐2: a facility for microfabrication research

The X‐ray lithography beamline on Indus‐2 is now operational, with two modes of operation. With a pair of X‐ray mirrors it is possible to tune the energy spectrum between 1 and 20 keV with a controlled spectral bandwidth. In its `no optics' mode, hard X‐rays up to 40 keV are available. Features and performance of the beamline are presented along with some example structures. Structures fabricated include honeycomb structures in PMMA using a stainless steel stencil mask and a compound refractive X‐ray lens using a polyimide–gold mask in SU‐8.     

Out‐of‐Equilibrium Fluctuation‐Dissipation Relations Verified by the Electrical and Thermoelectrical AC‐Conductances in a Quantum Dot

The electrical and heat currents flowing through a quantum dot are calculated in the presence of a time‐modulated gate voltage with the help of the out‐of‐equilibrium Green function technique. From the first harmonics of the currents, we extract the electrical and thermoelectrical trans‐admittances and ac‐conductances. Next, by a careful comparison of the ac‐conductances with the finite‐frequency electrical and mixed electrical‐heat noises, we establish the fluctuation‐dissipation relations linking these quantities, which are thus generalized out‐of‐equilibrium for a quantum system. It is shown that the electrical ac‐conductance associated to the displacement current is directly linked to the electrical noise summed over reservoirs, whereas the relation between the thermoelectrical ac‐conductance and the mixed noise contains an additional term proportional to the energy step that the electrons must overcome when traveling through the junction. A numerical study reveals however that a fluctuation‐dissipation relation involving a single reservoir applies for both electrical and thermoelectrical ac‐conductances when the frequency dominates over the other characteristic energies.     

An X‐ray Raman spectrometer for EXAFS studies on minerals: bent Laue spectrometer with 20 keV X‐rays

An X‐ray Raman spectrometer for studies of local structures in minerals is discussed. Contrary to widely adopted back‐scattering spectrometers using ≤10 keV X‐rays, a spectrometer utilizing ～20 keV X‐rays and a bent Laue analyzer is proposed. The 20 keV photons penetrate mineral samples much more deeply than 10 keV photons, so that high intensity is obtained owing to an enhancement of the scattering volume. Furthermore, a bent Laue analyzer provides a wide band‐pass and a high reflectivity, leading to a much enhanced integrated intensity. A prototype spectrometer has been constructed and performance tests carried out. The oxygen K‐edge in SiO₂ glass and crystal (α‐quartz) has been measured with energy resolutions of 4 eV (EXAFS mode) and 1.3 eV (XANES mode). Unlike methods previously adopted, it is proposed to determine the pre‐edge curve based on a theoretical Compton profile and a Monte Carlo multiple‐scattering simulation before extracting EXAFS features. It is shown that the obtained EXAFS features are reproduced fairly well by a cluster model with a minimal set of fitting parameters. The spectrometer and the data processing proposed here are readily applicable to high‐pressure studies.