Micro‐beam Laue alignment of multi‐reflection Bragg coherent diffraction imaging measurements

Multi‐reflection Bragg coherent diffraction imaging has the potential to allow three‐dimensional (3D) resolved measurements of the full lattice strain tensor in specific micro‐crystals. Until now such measurements were hampered by the need for laborious, time‐intensive alignment procedures. Here a different approach is demonstrated, using micro‐beam Laue X‐ray diffraction to first determine the lattice orientation of the micro‐crystal. This information is then used to rapidly align coherent diffraction measurements of three or more reflections from the crystal. Based on these, 3D strain and stress fields in the crystal are successfully determined. This approach is demonstrated on a focused ion beam milled micro‐crystal from which six reflections could be measured. Since information from more than three independent reflections is available, the reliability of the phases retrieved from the coherent diffraction data can be assessed. Our results show that rapid, reliable 3D coherent diffraction measurements of the full lattice strain tensor in specific micro‐crystals are now feasible and can be successfully carried out even in heavily distorted samples.     

A curved image‐plate detector system for high‐resolution synchrotron X‐ray diffraction

The developed curved image plate (CIP) is a one‐dimensional detector which simultaneously records high‐resolution X‐ray diffraction (XRD) patterns over a 38.7° 2θ range. In addition, an on‐site reader enables rapid extraction, transfer and storage of X‐ray intensity information in ≤30 s, and further qualifies this detector to study kinetic processes in materials science. The CIP detector can detect and store X‐ray intensity information linearly proportional to the incident photon flux over a dynamical range of about five orders of magnitude. The linearity and uniformity of the CIP detector response is not compromised in the unsaturated regions of the image plate, regardless of saturation in another region. The speed of XRD data acquisition together with excellent resolution afforded by the CIP detector is unique and opens up wide possibilities in materials research accessible through X‐ray diffraction. This article presents details of the basic features, operation and performance of the CIP detector along with some examples of applications, including high‐temperature XRD.     

Optimizing the accuracy and precision of the single‐pulse Laue technique for synchrotron photo‐crystallography

The accuracy that can be achieved in single‐pulse pump‐probe Laue experiments is discussed. It is shown that with careful tuning of the experimental conditions a reproducibility of the intensity ratios of equivalent intensities obtained in different measurements of 3–4% can be achieved. The single‐pulse experiments maximize the time resolution that can be achieved and, unlike stroboscopic techniques in which the pump‐probe cycle is rapidly repeated, minimize the temperature increase due to the laser exposure of the sample.     

High‐energy X‐ray diffraction using the Pixium 4700 flat‐panel detector

The Pixium 4700 detector represents a significant step forward in detector technology for high‐energy X‐ray diffraction. The detector design is based on digital flat‐panel technology, combining an amorphous Si panel with a CsI scintillator. The detector has a useful pixel array of 1910 × 2480 pixels with a pixel size of 154 µm × 154 µm, and thus it covers an effective area of 294 mm × 379 mm. Designed for medical imaging, the detector has good efficiency at high X‐ray energies. Furthermore, it is capable of acquiring sequences of images at 7.5 frames per second in full image mode, and up to 60 frames per second in binned region of interest modes. Here, the basic properties of this detector applied to high‐energy X‐ray diffraction are presented. Quantitative comparisons with a widespread high‐energy detector, the MAR345 image plate scanner, are shown. Other properties of the Pixium 4700 detector, including a narrow point‐spread function and distortion‐free image, allows for the acquisition of high‐quality diffraction data at high X‐ray energies. In addition, high frame rates and shutterless operation open new experimental possibilities. Also provided are the necessary data for the correction of images collected using the Pixium 4700 for diffraction purposes.     

A twelve‐analyzer detector system for high‐resolution powder diffraction

A dedicated high‐resolution high‐throughput X‐ray powder diffraction beamline has been constructed at the Advanced Photon Source (APS). In order to achieve the goals of both high resolution and high throughput in a powder instrument, a multi‐analyzer detector system is required. The design and performance of the 12‐analyzer detector system installed on the powder diffractometer at the 11‐BM beamline of APS are presented.     

晶体X射线衍射的发现及其深远影响

1912年4月,弗里德里希、克里平和劳厄成功地观察到X射线透过硫酸铜晶体后的衍射斑点！随后劳厄推导出描述晶体衍射的著名劳厄方程.由于晶体X射线衍射的发现,劳厄于1914年荣获诺贝尔物理学奖.1912年10月, W.L.布拉格通过X射线透射ZnS晶体实验,推导出了著名的布拉格方程.1915年布拉格父子荣获诺贝尔物理学奖.晶体X射线衍射的发现对自然科学的影响是深远的.2012年是劳厄发现晶体X射线衍射100年,文章回忆了这段光辉的历史及其对科学技术所产生的深远影响,以怀念科学先驱们对科学技术的贡献,弘扬他们对科学研究的认真严谨的科学态度、勇于创新的科学精神和谦逊无私的品德.     

High‐energy transmission Laue micro‐beam X‐ray diffraction: a probe for intra‐granular lattice orientation and elastic strain in thicker samples

An understanding of the mechanical response of modern engineering alloys to complex loading conditions is essential for the design of load‐bearing components in high‐performance safety‐critical aerospace applications. A detailed knowledge of how material behaviour is modified by fatigue and the ability to predict failure reliably are vital for enhanced component performance. Unlike macroscopic bulk properties (e.g. stiffness, yield stress, etc.) that depend on the average behaviour of many grains, material failure is governed by `weakest link'‐type mechanisms. It is strongly dependent on the anisotropic single‐crystal elastic–plastic behaviour, local morphology and microstructure, and grain‐to‐grain interactions. For the development and validation of models that capture these complex phenomena, the ability to probe deformation behaviour at the micro‐scale is key. The diffraction of highly penetrating synchrotron X‐rays is well suited to this purpose and micro‐beam Laue diffraction is a particularly powerful tool that has emerged in recent years. Typically it uses photon energies of 5–25 keV, limiting penetration into the material, so that only thin samples or near‐surface regions can be studied. In this paper the development of high‐energy transmission Laue (HETL) micro‐beam X‐ray diffraction is described, extending the micro‐beam Laue technique to significantly higher photon energies (50–150 keV). It allows the probing of thicker sample sections, with the potential for grain‐level characterization of real engineering components. The new HETL technique is used to study the deformation behaviour of individual grains in a large‐grained polycrystalline nickel sample during in situ tensile loading. Refinement of the Laue diffraction patterns yields lattice orientations and qualitative information about elastic strains. After deformation, bands of high lattice misorientation can be identified in the sample. Orientation spread within individual scattering volumes is studied using a pattern‐matching approach. The results highlight the inability of a simple Schmid‐factor model to capture the behaviour of individual grains and illustrate the need for complementary mechanical modelling.     

多层膜劳厄透镜对8keV X射线的聚焦性能模拟研究

基于多层膜技术的劳厄(Laue)透镜能实现硬X射线纳米级聚焦,在X射线微纳分析领域具有重要的应用前景.基于衍射动力学理论,分析了X射线在多层膜劳厄透镜中的传播,计算了不同结构的多层膜劳厄透镜对8 keVX射线的聚焦性能.结果表明,最外层厚度为5 nm的倾斜多层膜劳厄透镜可获得5.7 nm的聚焦光斑和26%的平均衍射效率...     

Performance calculations of the X‐ray powder diffraction beamline at NSLS‐II

The X‐ray Powder Diffraction (XPD) beamline at the National Synchrotron Light Source II is a multi‐purpose high‐energy X‐ray diffraction beamline with high throughput and high resolution. The beamline uses a sagittally bent double‐Laue crystal monochromator to provide X‐rays over a large energy range (30–70 keV). In this paper the optical design and the calculated performance of the XPD beamline are presented. The damping wiggler source is simulated by the SRW code and a filter system is designed to optimize the photon flux as well as to reduce the heat load on the first optics. The final beamline performance under two operation modes is simulated using the SHADOW program. For the first time a multi‐lamellar model is introduced and implemented in the ray tracing of the bent Laue crystal monochromator. The optimization and the optical properties of the vertical focusing mirror are also discussed. Finally, the instrumental resolution function of the XPD beamline is described in an analytical method.     

Radiation damage to protein specimens from electron beam imaging and diffraction: a mini‐review of anti‐damage approaches,with special reference to synchrotron X‐ray crystallography

Recent research progress using X‐ray cryo‐crystallography with the photon beams from third‐generation synchrotron sources has resulted in recognition that this intense radiation commonly damages protein samples even when they are held at 100 K. Other structural biologists examining thin protein crystals or single particle specimens encounter similar radiation damage problems during electron diffraction and imaging, but have developed some effective countermeasures. The aim of this concise review is to examine whether analogous approaches can be utilized to alleviate the X‐ray radiation damage problem in synchrotron macromolecular crystallography. The critical discussion of this question is preceded by presentation of background material on modern technical procedures with electron beam instruments using 300–400 kV accelerating voltage, low‐dose exposures for data recording, and protection of protein specimens by cryogenic cooling; these practical approaches to dealing with electron radiation damage currently permit best resolution levels of 6 Å (0.6 nm) for single particle specimens, and of 1.9 Å for two‐dimensional membrane protein crystals. Final determination of the potential effectiveness and practical value of using such new or unconventional ideas will necessitate showing, by experimental testing, that these produce significantly improved protection of three‐dimensional protein crystals during synchrotron X‐ray diffraction.     

超快电子衍射系统的时间空间分辨能力研究及其优化

超快电子衍射技术是研究物质瞬态结构变化及超快结构动力学的有效手段.研制了国内第一套同时具有超快时间分辨及超高空间分辨能力的超快电子衍射系统,并研究了在该超快电子衍射系统上实现超快时间分辨及超高空间分辨能力的技术手段及其优化方法.实验结果表明：经过优化后该系统可以具有优于500 fs的时间分辨能力,其空间分辨能力达到0.04%的衍射峰位置变化,对应的晶面变化为0.0005?.该系统可以为实时测量超快光脉冲激发的物质瞬态结构变化,特别是为研究晶体材料的超快动力学行为提供了强有力的实验工具. 关键词： 超快电子衍射 空间分辨 时间分辨     

Energy‐dispersive diffraction with synchrotron radiation and a germanium detector

The response of an intrinsic Ge detector in energy‐dispersive diffraction measurements with synchrotron radiation is studied with model calculations and diffraction from perfect Si single‐crystal samples. The high intensity and time‐structure of the synchrotron radiation beam leads to pile‐up of the output pulses, and the energy distribution of the pile‐up pulses is characteristic of the fill pattern of the storage ring. The pile‐up distribution has a single peak and long tail when the interval of the radiation bunches is small, as in the uniform fill pattern, but there are many pile‐up peaks when the bunch distance is a sizable fraction of the length of the shaping amplifier output pulse. A model for the detecting chain response is used to resolve the diffraction spectrum from a perfect Si crystal wafer in the symmetrical Laue case. In the 16‐bunch fill pattern of the ESRF storage ring the spectrum includes a large number of `extra reflections' owing to pile‐up, and the model parameters are refined by a fit to the observed energy spectrum. The model is used to correct for the effects of pile‐up in a measurement with the 1/3 fill pattern of the storage ring. Si reflections (2h,2h,0) are resolved up to h = 7. The pile‐up corrections are very large, but a perfect agreement with the integrated intensities calculated from dynamical diffraction theory is achieved after the corrections. The result also demonstrates the convergence of kinematical and dynamical theories at the limit where the extinction length is much larger than the effective thickness of the perfect crystal. The model is applied to powder diffraction using different fill patterns in simulations of the diffraction pattern, and it is demonstrated that the regularly spaced pile‐up peaks might be misinterpreted to arise from superlattices or phase transitions. The use of energy‐dispersive diffraction in strain mapping in polycrystalline materials is discussed, and it is shown that low count rates but still good statistical accuracy are needed for reliable results.     

Investigation of the energy resolution with a RETGEM detector

A novel Micro-pattern gaseous detector (MPGD), thick GEM with electrodes made of a resistive material (RETGEM) is presented. In this paper we mainly investigate the energy resolution of a RETGEM in Ar+CO_2 with different gas mixtures. The results indicate that an energy resolution 30% in single and double mode can be obtained. The existence of an optimum energy resolution is discussed.     

Investigation of the energy resolution with a RETGEM detector

A novel Micro-pattern gaseous detector （MPGD）, thick GEM with electrodes made of a resistive material （RETGEM） is presented. In this paper we mainly investigate the energy resolution of a RETGEM in Ar＋CO2 with different gas mixtures. The results indicate that an energy resolution 30% in single and double mode can be obtained. The existence of an optimum energy resolution is discussed.     

用傅里叶变换法测试平面衍射光栅的分辨特性

本文提出了测试平面衍射光栅的分辨特性的新方法,用干涉法测量光栅衍射的波阵面的相位,得出衍射波阵面的三维波面图,并用所取得的相位数据作傅里叶变换求得其在谱面上的光谱衍射斑——光谱线像的强度分布,并可据此确定半宽度值和分辨极限.文中叙述了这一新方法的优点、基本原理和实验方法,并给出应用这方法测量一批光栅所得结果中的两个例子,结果表明,与通常所用直接扫描光谱线法所测结果相符合.     

Accuracy of stress measurement by Laue microdiffraction (Laue‐DIC method): the influence of image noise,calibration errors and spot number

Laue microdiffraction, available at several synchrotron radiation facilities, is well suited for measuring the intragranular stress field in deformed materials thanks to the achievable submicrometer beam size. The traditional method for extracting elastic strain (and hence stress) and lattice orientation from a microdiffraction image relies on fitting each Laue spot with an analytical function to estimate the peak position on the detector screen. The method is thus limited to spots exhibiting ellipsoidal shapes, thereby impeding the study of specimens plastically deformed. To overcome this difficulty, the so‐called Laue‐DIC method introduces digital image correlation (DIC) for the evaluation of the relative positions of spots, which can thus be of any shape. This paper is dedicated to evaluating the accuracy of this Laue‐DIC method. First, a simple image noise model is established and verified on the data acquired at beamline BM32 of the European Synchrotron Radiation Facility. Then, the effect of image noise on errors on spot displacement measured by DIC is evaluated by Monte Carlo simulation. Finally, the combined effect of the image noise, calibration errors and the number of Laue spots used for data treatment is investigated. Results in terms of the uncertainty of stress measurement are provided, and various error regimes are identified.     

A method to stabilize the incident X‐ray energy for anomalous diffraction measurements

A method to calibrate and stabilize the incident X‐ray energy for anomalous diffraction data collection is provided and has been successfully used at the single‐crystal diffraction beamline 1W2B at the Beijing Synchrotron Radiation Facilities. Employing a feedback loop to control the movement of the double‐crystal monochromator, this new method enables the incident X‐ray energy to be kept within a 0.2 eV range at the inflection point of the absorption edge.     

Application of a pnCCD in X‐ray diffraction: a three‐dimensional X‐ray detector

The first application of a pnCCD detector for X‐ray scattering experiments using white synchrotron radiation at BESSY II is presented. A Cd arachidate multilayer was investigated in reflection geometry within the energy range 7 keV < E < 35 keV. At fixed angle of incidence the two‐dimensional diffraction pattern containing several multilayer Bragg peaks and respective diffuse‐resonant Bragg sheets were observed. Since every pixel of the detector is able to determine the energy of every incoming photon with a resolution ΔE/E? 10^?2, a three‐dimensional dataset is finally obtained. In order to achieve this energy resolution the detector was operated in the so‐called single‐photon‐counting mode. A full dataset was evaluated taking into account all photons recorded within 10⁵ detector frames at a readout rate of 200 Hz. By representing the data in reciprocal‐space coordinates, it becomes obvious that this experiment with the pnCCD detector provides the same information as that obtained by combining a large number of monochromatic scattering experiments using conventional area detectors.     

Characterization and on‐line adjustment of the sagittal‐bent Laue crystal profile

The sagittal‐bent Laue monochromator can provide an ideal way to focus high‐energy X‐ray beams. However, the anticlastic curvature induced by sagittal bending has a great influence on the crystal performance. Thus, characterizing the bent‐crystal shape is very important for predicting the performance of the bent‐crystal monochromator. In this paper the crystal profile is measured by off‐line optical metrology and on‐line X‐ray experiments. The off‐line results showed that the bent‐crystal surface could be well fitted to a saddle surface apart from a redundant cubic term which was related to the different couples applied on the crystal. On‐line characterization of the meridional and the sagittal radius of the bent crystal includes double‐crystal topography and ray‐tracing measurement. In addition, the double‐crystal topography experiment could be used as a quick diagnostic method for the bending condition adjustment. The sagittal radius of the bent crystal was characterized through a ray‐tracing experiment by using a particularly designed tungsten mask. Moreover, rocking curves under different bending conditions were measured as well. The results were highly consistent with analytical results derived from the elastic theory. Furthermore, radii along different vertical positions under various bending conditions were measured and showed a quadratic relationship between the vertical positions and the meridional radii.     

KB scanning of X‐ray beam for Laue microdiffraction on accelero‐phobic samples: application to in situ mechanically loaded nanowires

A mapping technique has been developed where a sub‐micrometer focused polychromatic X‐ray beam is scanned across a stationary sample instead of scanning the sample in front of the X‐ray microbeam. This method is applied to a gold nanowire during its mechanical loading using the tip of an atomic force microscope. During the loading process, such a sample is `accelero‐phobic', i.e. the sample scanning stages must not to be moved to avoid parasitic additional load. Without beam scanning, only one single position within the sample can be probed during the test. The probed material point may even change because of drifts or movements induced by the test itself. The new scanning approach facilitates the in situ mapping of the entire wire giving access to the evolution of the wire shape as well as to the boundary conditions. This novel scanning technique opens promising perspectives for studies where sample motion is forbidden because of the sample environment.