金辅助催化方法制备GaAs和GaAs/InGaAs纳米线结构的形貌表征及生长机理研究

利用金（Au）辅助催化的方法,通过金属有机化学气相沉积技术制备了GaAs纳米线及GaAs/InGaAs纳米线异质结构.通过对扫描电子显微镜（SEM）测试结果分析,发现温度会改变纳米线的生长机理,进而影响形貌特征.在GaAs纳米线的基础上制备了高质量的纳米线轴、径向异质结构,并对生长机理进行分析.SEM测试显示,GaAs/InGaAs异质结构呈现明显的“柱状”形貌与衬底垂直,InGaAs与GaAs段之间的界面清晰可见.通过X射线能谱对异质结样品进行了线分析,结果表明在GaAs/InGaAs轴向纳米线异质结构样品中,未发现明显的径向生长.从生长机理出发分析了在GaAs/InGaAs径向纳米线结构制备过程中伴随有少许轴向生长的现象.     

GaAs纳米线阵列太阳能电池的设计与优化

为了得到纳米线阵列太阳能电池的最优转换效率,通过仿真计算对GaAs轴向pin结纳米线阵列进行了结构优化.首先利用三维有限时域差分法分析了GaAs纳米线阵列的光吸收特性,并对其直径、密度等结构参量进行优化,优化后的GaAs纳米线阵列的光吸收率可达87.4%.在此基础上,利用Sentaurus软件包中的电学仿真模块分析了电池的电学性能,并根据光生载流子在纳米线中的分布,对轴向pin结结构进行优化,最终优化过的太阳能电池功率转换效率可达到17.6%.分析结果表明,通过钝化处理以降低GaAs纳米线的表面复合速率,可显著提升电池的功率转换效率,而通过减小纳米线顶端高掺杂区域的体积,可减少载流子复合损耗,从而提高电池效率.该研究可为制作高性能的纳米线太阳能电池提供参考.     

GaAs/AlGaAs异质结动力学行为研究

建立在空间电荷转移框架下,考虑GaAs/AlGaAs异质结物理模型,推导相应动力学方程,比较详细地分析了系统随激励电场变化出现的复杂分支情况.分析表明,直流场下稳态解和周期振荡解并存,理论上对滞后现象进行解释.对GaAs/AlGaAs异质结在微波场中动力学行为进行数值模拟,得到在输入场强度变化的一定范围内,具有锁频、准周期和混沌特性 关键词： 负微分电导率 异质结 分支 混沌     

光电子技术与器件 光能转换与器件

TM914．4 2006065287用于GalnP/GaAs双结叠层太阳电池的MOVPE外延材料=Wafers for GalnP/GaAs tandem solar cells bv MOVPE [刊,中]/黄子乾(南京大学物理系．江苏,南京(210016)),李肖…//太阳能学报．—2006,27(5)．—433-435采用金属有机化合物汽相淀积(MOVPE)技术生长用于GalnP/GaAs双结叠层太阳电池的外延材料。针对材料生长中的隧穿结、p-AIInP层等关键问题,通过对掺杂剂、生长技术及条件的调整与改进,极大地提高了GalnP/     

非机械清除的外延生长法

1 前言 近年来GaAs—AlGaAs双异质结(DH)激光器的惊人进展,是与晶体液相外延生长技术的改善分不开的。对充分利用异质结光电特微的DH激光器来说,很明显界质结介面的质量对器件的各种特性都有很大的影响。我们认为致使GaAs—AlGaAs异质结质量下降的最重要因素是因为混入了氧。AlGaAs中随着AlAs百分比的增加就     

GaAs-绝缘薄膜界面和金属-绝缘薄膜-半导体(MIS)结的特性

对Si-SiO2系统广泛而深入的研究和器件的平面技术的发展,导致了Si金属-氧化物-半导体场效应晶体管(MOSPET)及其集成电路(IC)的辉煌成就.GaAs的电子迁移率比Si高五倍多,预期GaAs金属-绝缘薄膜-半导体场效应晶体管(MISFET)可工作于更高频率,其IC可应用于更高速度.以往十多年,对GaAs-绝缘薄膜界面和MIS结的特性进行了研究(见文献[1]),取得了一定成果,但因研究对象相当复杂,还未能在FET及其IC方面取得突破.与此同时,对GaAs的金属-半导体(M-S)界面和结的特性也进行了研究,目前已在一系列GaAs微波器件包括金属-半导体接触场效应…     

直接键合的三结太阳能电池研究

本文研制了直接键合的三结GaInP/GaAs/InGaAsP太阳电池.直接键合技术可以减少晶格不匹配的材料在外延生长过程中产生的线位错和面缺陷,将缺陷限制在界面几十纳米的薄层而不向内扩散,是未来实现高效多结电池的发展趋势之一.此类电池国内鲜有报道.本文键合三结电池的键合界面采用p+GaAs/n+InP结构,得到电池开路电压3.0 V,在电池结构没有优化的情况下获得效率24%,表面未做减反膜.开路电压表明三结电池实现了串联,为单片集成的高效多结电池提供了新的途径.对实验结果进行了分析并给出了改进措施.     

高功率AlGaAs/GaAs单量子阱远结激光器及其老化特性

为了提高器件的可靠性和使用寿命,设计并研制了一种将p-n结和有源层分开的高功率AlGaAs／GaAs单量子阱远异质结(SQW-RJH)激光器,发射波长为808nm,腔长900μm,条宽100μm,其外延结构与通常的808nm AlGaAs／GaAs单量子阱半导体激光器的结构不同,在p-n结和有源区间多了一层p型AlGaAs层,其厚度约为0．1μm。为减小衬底表面位错对外延层质量的影响,在n^ -GaAs衬底和n-Al0．5Ga0．5As下包层间加一层n^ -GaAs缓冲层。对器件进行了电导数测试及恒流电老化实验。与常规AlGaAs／GaAs大功率半导体激光器相比,远结大功率半导体激光器具有阈值电流Ith偏大、导通电压Vth偏高的直流特性。3000h的恒流电老化结果表明,器件在老化初期表现出阈值电流随老化时间缓慢下降,输出功率随老化时间缓慢上升的远结特性。     

异质结光晶体管

本文介绍了异质结光晶体管的工作原理,概述了GaAlAs/GaAs和InGaAsP/InP两种系列异质结光晶体管的研制现状.     

GaInP/GaAs/Ge三结太阳电池的电子辐照损伤效应

研究了1 MeV和1.8 MeV电子辐照下GaInP/GaAs/Ge三结太阳电池的辐照损伤效应.电学性能研究结果表明,GaInP/GaAs/Ge三结太阳电池的开路电压、短路电流和最大功率随辐照剂量的增加发生明显衰降,在1 MeV电子辐照下剂量为1×10¹⁵cm^-2时,与辐照前相比最大功率衰降了17.7%.暗I-V特性分析表明,高能电子辐照下三结电池串、并联电阻的变化是引起太阳电池电学性能衰降的重要原因.光谱响应分析结果表明,GaInP 关键词： GaInP/GaAs/Ge太阳电池 电子辐照 电学性能 光谱响应     

Strain Field in GaAs/GaN Wafer-Bonding Interface and Its Microstructure

The strain fields in a wafer-bonded GaAs/GaN structure are measured by electron backscatter diffraction （EBSD）. Image quality （IQ） of EBSD Kikuchi patterns and rotation angles of crystal lattices as strain sensitive parameters axe employed to chaxacterize the distortion and the rotation of crystal lattices in the GaAs-interface-GaN structure, as well as to display the strain fields. The results indicate that the influence region of the strains in the wafer-bonded GaAs/GaN structure is mainly located in GaAs side because the strength of GaAs is weaker than that of GaN. The cross-sectional image of transmission electron microscopy （TEM） further reveals the distortion and the rotation of crystal lattices induced by strains systematically.     

Experimental study on the activation process of GaAs spin—polarized electron source

GaAs spin-polarized electron source is a new kind of electron source, where the GaAs semiconductor crystal is used as a photocathode under the irradiation of helicity light. In this paper the activation process of the GaAs spin-polarized electron source is unvestigated experimentally in detail, during which the negative electron affinity of the photo cathode should be achieved more carefully by absorbing the caesium and oxygen on the surface of the GaAs crystal under ultrahigh vacuum conditions. Besides the different activation processes, the important physical parameters are studied to achieve the optimum activation results. At the same time the stability and lifetime of the polarized electron beam are explored for future experiments. Some important experimental data have been acquired.     

空间用GaInP/GaAs/In0.3Ga0.7 As(1 eV)倒装三结太阳电池研制

采用阶变缓冲层技术 (step-graded) 外延生长了具有更优带隙组合的倒装GaInP/GaAs/In_0.3Ga_0.7As(1.0 eV) 三结太阳电池材料, TEM和HRXRD测试表明晶格失配度为2%的In_0.3Ga_0.7As 底电池具有较低的穿透位错密度和较高的晶体质量, 达到太阳电池的制备要求. 通过键合、剥离等工艺制备了太阳电池芯片. 面积为 10.922 cm² 的太阳电池芯片在空间光谱条件下转换效率达到32.64% (AM0, 25 ℃), 比传统晶格匹配的 GaInP/GaAs/Ge(0.67 eV) 三结太阳电池的转换效率提高3个百分点. 关键词： 太阳电池 三结 倒装结构     

Electron spectroscopy of the nanostructures created in Si, GaAs, and CaF2 surface layers using low-energy ion implantation

A review of the experimental results on the study of the Si, GaAs, and CaF₂ surface layers that are created using the low-energy ion implantation is presented. Optical and electron spectroscopy and microscopy are employed in the experiments.     

Hot electron light-emitting semiconductor heterostructure device--type 2

A novel hot electron light-emitting device is proposed which operates by the application of longitudinal electric field, i.e. in the plane of the GaAs quantum wells, which are placed next to the junction plane of an n-Ga_1-xAl_xAs--p-GaAs heterostructure. Application of high electric fields results in the transfer of hot electrons via tunnelling and thermionic emission, from the quantum well in the depletion region, into the GaAs inversion layer. The hot holes in the p-GaAs, initially away from the junction, then diffuse towards the junction plane to recombine with the excess hot electrons, giving rise to electroluminescence (EL) which is representative of the GaAs band-to-band emission. As the applied field is increased, a high-energy tail in the EL spectrum develops, and, photons with energies greater than the el-hhl transition energy in the quantum well are absorbed and re-emitted by the quantum well. Thus a second peak develops in the EL spectra which becomes stronger with increasing applied electric field. The device has been theoretically modelled, by solving Schrodinger and Poisson's equations self-consistently, to understand the processes leading to EL emission in the various channels.     

用阶跃恢复法测定砷化镓结型(p-n和M-S结)两极管的载流子寿命

本文报告了我们用阶跃恢复法测定砷化镓两极管载流子寿命的初步结果。首先,对硅阶跃两极管用反向恢复法和阶跃恢复法两种方法测寿命,经比较结果,数据相当符合。在此基础上提出了阶跃恢复法的测试条件,并认为这一方法测得的p-n结两极管寿命即少数载流子寿命。然后,用阶跃恢复法测定了砷化镓p-n结两极管的少数载流子寿命。我们也测定了砷化镓M-S结两极管的寿命,经过分析,认为它不是少数载流子寿命。 关键词：     

Spin Dynamics in Ferromagnet/10-nm-Thick N-Type GaAs Quantum Well Junctions

Spin dynamics in several different types of ferromagnetic metal(FM)/10-nm-thick n-type GaAs quantum well(QW) junctions is studied by means of time-resolved Kerr rotation measurements. Compared with the MnGa/insitu doped 10-nm-thick n-type GaAs QW junction, the spin lifetime of the MnGa/modulation-doped 10-nm-thick n-type GaAs QW junction is shorter by a factor of 5,consistent with the D'yakonov-Pcrel' spin relaxation mechanism. Meanwhile, compared with the spin lifetime of the MnAs/in-situ doped 10-nm-thick n-type GaAs QW junction, the MnGa/in-situ doped 10-nm-thick n-type GaAs QW junction is of a spin lifetime longer by a factor of 4.2. The later observation is well explained by the Rashba effect in the presence of structure inversion asymmetry, which acts directly on photo-excited eleetron spins. We demonstrate that MnGa-like FM/in-situ doped 10-nm-thick n-type GaAs QW junctions, which possess relatively low interfacial potential barriers, are able to provide long spin lifetimes.     

位移损伤剂量法评估空间GaAs/Ge太阳电池辐照损伤过程

本文针对GaAs/Ge太阳电池,利用位移损伤剂量法研究了其在轨服役条件下的性能退化行为.首先在地面模拟辐照环境中,试验获得了在不同能量的电子和质子辐照下的电池性能随辐照注量的退化行为.基于上述实验结果以及计算获得的带电粒子在电池中的非电离能量损失(NIEL)获得了不同能量电子辐照位移损伤的等效指数n为1.7,电子损伤剂量转化为质子损伤剂量等效系数为5.2,并进一步建立了电池性能随位移损伤剂量的退化方程.利用该方法对国产GaAs/Ge太阳电池在500,22000和36000 km轨道带电粒子辐 关键词： GaAs/Ge太阳电池 辐照损伤 带电粒子 位移损伤剂量     

GaAs真空电子源衰减模型研究

利用X射线光电子能谱(XPS)仪对激活后的GaAs真空电子源进行了随时间衰减变化的XPS分析,分析发现了电子源阴极表面各元素百分含量随时间的变化,揭示了杂质气体吸附造成的偶极矩方向的改变是电子源灵敏度显著下降的主要原因.基于上述结论,通过分析真空系统中杂质气体的吸附过程,推导并得到了GaAs电子源衰减模型.该模型从理论上揭示了GaAs电子源的指数衰减规律以及寿命与真空度的反比关系,与实验现象完全一致. 关键词： 电子源 X射线光电子能谱 衰减模型 真空度     

High precision de Haas-van Alphen measurements on a two-dimensional electron gas

Using a new, highly sensitive, torsional magnetometer technique we have observed the de Haas-van Alphen Effect in GaAs/(AlGa)As two-dimensional electron systems. The results for a superlattice of 172 layers are quantitatively compared to theory taking account of finite Landau level width as well as known sample inhomogeneities. In addition, this device is being employed to study the Zero Resistance State of the 2-D electron system via eddy currents generated by small field changes.