3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. I. Flat sample

The 3D representation of the DuMond diagram is used to explain the dimensional features of X-ray topographs obtained by multi-crystal configuration with a synchrotron beam. Symmetric Bragg-case reflections are considered for a flat double-crystal monochromator and a flat sample. Two ways of sample alignment are taken into account. They are referred to as σ–σ and σ–π geometries, where the diffraction plane of the sample is parallel and perpendicular, respectively, to the vertical diffraction plane of the monochromator (σ polarization). It is shown that the shape of the sample image is closely connected to the shape the diffraction domain common to monochromator and sample assumes in the 3D DuMond diagram. An experiment is reported for the less commonly used σ–π topography, showing how the lattice mismatch and its lateral homogeneity are determined in samples made by epilayer and substrate. Received: 31 July 2000 / Accepted: 25 January 2001 / Published online: 3 May 2001     

应变弛豫InGaAs/GaAs超晶格的X射线双晶衍射及形貌研究

应用X射线双晶衍射及双晶形貌术,对应变弛豫的InGaAs/GaAs超晶格作了研究,通过对双晶衍射摇摆曲线的计算机模拟,得到了超晶格的结构,应变弛豫机制,弛豫比,超晶格层与衬底的取向差等重要参数。从双晶形貌,得到了超晶格与衬底界面处和超晶格中的位错分布。 关键词：     

High-resolution magnetic imaging by local tunneling magnetoresistance

We give an overview over our recent efforts of high-resolution magnetic imaging using scanning tunneling microscopy with a ferromagnetic tip. Magnetic sensitivity is obtained on the basis of local tunneling magnetoresistance between a soft magnetic tip and the sample. The magnetisation of the tip is switched periodically with a small coil, leading to variations of the tunneling current due to the tunneling magnetoresistance effect. These variations are detected with a lock-in amplifier to separate spin-dependent parts from the topographic parts of the tunneling current such that the topography and the magnetic structure of the sample can be recorded simultaneously. Crucial for this method is to avoid mechanical vibrations of the tip, that may also lead to variations in the tunneling current. Exemplary studies of polycrystalline Ni and the closure domain pattern of Co(0001) are presented, showing high contrast at acquisition times as low as 3 ms/pixel and a lateral resolution of the order of 1 nm. Further it is demonstrated that besides topography and magnetisation, also local information about the magnetic susceptibility can be obtained. Received: 28 April 2000 / Accepted: 15 May 2000 / Published online: 7 March 2001     

Contrast mechanisms in photothermal scanning tunneling microscopy

By irradiation of the tunneling junction of a scanning tunneling microscope with intensity-modulated laser light a gap-width modulation due to thermal expansion of tip and sample was produced. Photothermal images were obtained by spatial mapping of the resulting modulation of the tunneling current or its logarithm. The various mechanisms responsible for the observed contrast are discussed quantitatively. In case of a highly corrugated gold film on mica the contrast arises mainly from either the current variations caused by the non-zero reaction time of the current control loop or from a geometry factor. In both cases the images reflect certain properties of the sample topography. On the other hand, for a liquid-crystal film adsorbed on graphite a contrast on a molecular scale was found which is attributed to variations of the effective barrier height.     

Factors affecting phase and height contrast of diblock copolymer PS-b-PEO thin films in dynamic force mode atomic force microscopy

Asymmetric PS-b-PEO block copolymer exhibits well-ordered cylindrical morphology with nanoscale domain sizes due to microphase separation. Since the PS and PEO blocks have large stiffness difference, this polymer system represents an ideal candidate for studies of the phase contrast behavior in atomic force microscopy (AFM). In this paper, PS-b-PEO films are investigated under different scanning conditions using two different atomic force microscopes. It is found that the phase contrast of the film can be well described in terms of energy dissipation, though the exact phase image may also depend on the scanning parameters (e.g., the repulsive versus attractive regimes) as well as the settings of the microscope. Height variation on sample surface does not have significant effect on phase contrast. However, in order to obtain true topography of the polymer film, care has to be taken to avoid damage to the sample by AFM. Under certain conditions, true topography can be obtained during the first scan in spite of the surface-damaging forces are used.     

3D DuMond diagrams of multi-crystal Bragg-case synchrotron topography. II. Curved sample

The dimensional features of multi-crystal synchrotron X-ray topographs are explained by 3D DuMond diagrams for a flat double-crystal monochromator and a curved sample. Symmetric Bragg-case reflections are assumed for all crystals. σ–σ and σ–π geometries are considered, where the diffraction plane of the sample is parallel and perpendicular, respectively, to the vertical diffraction plane of the monochromator (σ polarization). It is shown that the shape of the sample image is closely connected to the shape of the volume shared by the diffraction domains of monochromator and sample in the 3D DuMond diagram. In particular, for the σ–π set-up, the image shape depends on the curvature value and sign. An experiment is reported for this latter crystal geometry to determine lattice mismatch, its lateral homogeneity and curvature value and sign in a sample made of epilayer and substrate. Received: 31 July 2000 / Accepted: 25 January 2001 / Published online: 26 April 2001     

Image contrast in X‐ray reflection interface microscopy: comparison of data with model calculations and simulations

The contrast mechanism for imaging molecular‐scale features on solid surfaces is described for X‐ray reflection interface microscopy (XRIM) through comparison of experimental images with model calculations and simulated measurements. Images of elementary steps show that image contrast is controlled by changes in the incident angle of the X‐ray beam with respect to the sample surface. Systematic changes in the magnitude and sign of image contrast are asymmetric for angular deviations of the sample from the specular reflection condition. No changes in image contrast are observed when defocusing the condenser or objective lenses. These data are explained with model structure‐factor calculations that reproduce all of the qualitative features observed in the experimental data. These results provide new insights into the image contrast mechanism, including contrast reversal as a function of incident angle, the sensitivity of image contrast to step direction (i.e. up versus down), and the ability to maximize image contrast at almost any scattering condition defined by the vertical momentum transfer, Q_z. The full surface topography can then, in principle, be recovered by a series of images as a function of incident angle at fixed momentum transfer. Inclusion of relevant experimental details shows that the image contrast magnitude is controlled by the intersection of the reciprocal‐space resolution function (i.e. controlled by numerical aperture of the condenser and objective lenses) and the spatially resolved interfacial structure factor of the object being imaged. Together these factors reduce the nominal contrast for a step near the specular reflection condition to a value similar to that observed experimentally. This formalism demonstrates that the XRIM images derive from limited aperture contrast, and explains how non‐zero image contrast can be obtained when imaging a pure phase object corresponding to the interfacial topography.     

Comparative studies on structural and optical properties of ZnO films grown on c-plane sapphire and GaAs (001) by MOCVD

ZnO thin films were grown on c-plane sapphire and GaAs (001) substrates by metalorganic chemical vapor deposition. Atomic force microscopy and double-crystal X-ray diffractometry were utilized to investigate the structural properties of the ZnO films. The optical properties of ZnO films were also investigated in terms of time integrated and resolved photoluminescence (TIPL and TRPL). Large hexagonal crystallites and better crystalline quality were observed from the ZnO film on sapphire. Also, both the TIPL and TRPL showed a significant difference as the substrate changed. In particular, a detected sharp contrast in the result of TRPL measurement is due to the different defect structure and the lattice strain and stress of ZnO films on different substrates.     

Three Gaussian beam heterodyne interferometer for surface profiling

A novel three Gaussian beam interferometric technique for profiling optical smooth surfaces is presented. The technique is based on the heterodinization of three Gaussian beams, two of them with the same temporal frequency. The first beam is used as a probe beam after being focused and reflected from the surface under test. The second beam is reflected from a reference surface. The third beam is obtained from the first diffraction order of a Bragg cell and thus, it is shifted in its temporal frequency. The three beams are coherently added at the sensitive plane of a photodetector that integrates the overall intensity of the beams. We show analytically that the electrical signal at the output of the photodetector consists of a temporal carrier whose amplitude is a sinusoidal function of the local topography. We include the measurement of the topography of a sample consisting in a blazed-reflecting grating calibrated by means of an atomic force microscope.     

静电场作用下α一LiIO3单晶中子衍射增强现象的理论解释

本文根据(1)在偏振锥光下,用显微镜观察到α-LiIO₃单晶中层状缺陷在静电场作用下的变化;(2)静电场对a-LiIO₃单晶的X射线形貌象的影响;(3)用X射线双晶衍射测得α-LiIO₃单晶晶格参数的不均匀性,指出α-LiIO₃单晶在静电场作用下中子衍射增强现象是由于晶体中的空间电荷(载流子、杂质离子和空位)在宏观尺度缺陷处富集,造成晶格参数有一定梯度。我们对通常计算中子布喇格散射截面的玻恩近似,引入消光修正,得到畸变晶格中子衍射强度公式,可以解释文献[4—6]中观察到的各种现象。 关键词：     

Reflection-scanning near-field optical microscopy and spectroscopy of opaque samples

Opaque samples are imaged by Scanning Nearfield Optical Microscopy (SNOM) in reflection mode: A quartz glass fiber tip is used both to illuminate the sample and to collect light locally reflected from or emitted by the surface. The collected light is coupled out by a 2×2 fiber coupler and fed into a grating spectrometer for spectral analysis at each sampled point. The tip-sample distance is controlled by a shear-force feedback system. The simultaneous measurement of topography and optical signals allows an assessment of imaging artifacts, notably topography-induced intensity changes. It is demonstrated that an optical reflectance contrast not induced by topographic interference can be found on suitable samples. Local spectral analysis is shown in images of a photoluminescent layer.     

Simulation of KrF laser ablation of Al2O3-TiC

Previous work by the authors on micromachining of Al₂O₃-TiC ceramics using excimer laser radiation revealed that a columnar surface topography forms under certain experimental conditions. Scanning electron microscopy (SEM) and atomic force microscopy (AFM) observations show that the columns develop from small globules of TiC, which appear at the surface of the material during the first laser pulses. To understand the mechanism of formation of these globules, a 2D finite element ablation model was developed and used to simulate the time evolution of the temperature field and of the surface topography when a sample of Al₂O₃-TiC composite is treated with KrF laser radiation. Application of the model showed that the surface temperature of TiC rises much faster than that of Al₂O₃, but since TiC has a very high boiling temperature, its vaporization is significant only for a short time. By contrast, the surface temperature of Al₂O₃ rises above its boiling temperature for a much longer period, leading to a greater ablation depth than TiC. As a result, a small TiC globule stands above the Al₂O₃ surface. The results of the model are compared with experimental measurements performed by AFM. After three pulses, the height of the globules predicted by the model is about 340 nm, in good agreement with the height measured experimentally, about 400 nm.     

Potentiometry with the acoustic near field microscope: A new method for microscopy of surface potentials

 We used a quartz tuning fork vibrating at 30 kHz both as an acoustic near field microscope and at the same time as a microscopic Kelvin probe. One leg of the tuning fork carried a small gold electrode serving as a conducting vibrating tip. By using this instrument and the method described here it is possible to measure simultaneously both the surface topography of the sample surface and the contact potential between tip and sample. The topography is observed by operating the instrument as an acoustic near field microscope. The contact potential between the vibrating tip and the sample gives rise to a displacement current which is used here for the determination of the contact potential. In first applications of this method we demonstrate that the contact potential can be measured with a sensitivity of at least 100 mV and a local resolution of about 5 μm. It seems possible to use the microscopic method described here also for investigating local potentials at low temperatures and even in high magnetic fields. For example, the microscopic study of the Hall voltages in the quantum Hall effect might be an interesting application. Received: 22 April 1996/Accepted: 18 June 1996     

Investigation into the structural perfection and acoustic properties of a piezoelectric Ca3TaGa3Si2O14 crystal

Ca₃TaGa₃Si₂O₁₄ (CTGS) crystals are a new promising material from the lanthanum-gallium silicate family, which can be employed in high-temperature sensors and other acoustoelectronic devices. The structural perfection and acoustic properties of CTGS crystals have been investigated via X-ray topography and diffractometry at the BESSY II synchrotron radiation source in the geometry of a double-crystal X-ray diffractometer.     

基于叠层衍射成像的二元光学元件检测研究

本文提出了一种基于叠层衍射成像(ptychography)的二元光学元件的检测方法,该方法可实现对二元光学元件表面微观轮廓的检测以及特征尺寸的标定.相比于传统的二元光学元件检测方法,其使用无透镜成像技术,简化了系统结构并可适用于特殊环境下的检测.该方法可直接通过采集多幅衍射图,利用叠层衍射成像迭代算法可精确地复原大尺寸待测元件的表面微观轮廓,提高大尺寸器件的检测效率.本文模拟仿真了台阶高度与噪声大小对纯相位台阶板复原结果的影响,并在光学实验中选取计算全息板为样品,复原样品的表面微观轮廓信息以及得到台阶高度.以白光干涉仪检测结果为标准,该方法在精度要求不太高的前提下,可获得令人满意的成像质量.     

偏振小孔干涉仪

偏振小孔干涉仪是一种可实用的新型干涉仪。它综合小孔衍射技术、偏振技术和共光路设计为一体,具有条纹对比度可调、抗干扰能力强和非接触检验等优点,可广泛用于各种光学元件及其胶合层的检验。目测精度达1/10λ,计算机条纹处理精度可调。     

Moiré topography: alternative technique in health care

The instrumentation and application of moiré topography in the diagnosis of corporal asymmetries associated to different illnesses of the osseous-muscular system in early ages is presented in this paper. A sample comprising 203 adolescents ranging between 12 and 15 years were studied. Some moiré topography analysis of human legs and the sole of the foot are also given as examples of moiré applications. The results show the advantages of using this technique in the health care and treatment of different illnesses in adolescents. Some of these advantages are provided by the easy diagnosis and the low cost of the moiré technique.     

Formation of the image of an edge dislocation in an absorbing crystal

The specific features of the formation of a diffraction image of a single edge dislocation in the case where the defect region can be located at different points of the scattering triangle are investigated by computer simlation and experimentally. The dislocation images are experimentally obtained at different wavelengths and for different reflections. The diffraction geometry in which the dislocation line is perpendicular to the sample surface and the Burgers vector is parallel or perpendicular to the reciprocal lattice vector is studied. From analysis of the experimental and theoretical images, inferences are made regarding the image symmetry, as well as the angular resolution and the sensitivity of section topography to the formation of the dislocation image. Special attention is focused on the dependence of the image contrast and the image size on the radiation wavelength, the magnitude of the reciprocal lattice vector, and the interference absorption.     

The moire topography based on optical logic operation

The optical logic-operated moire,which is proposed on the basis of optical logicoperation,is a new method to obtain specific moire beat pattern.Its advantages lie in the ca-pability to select carrier-free,sharpened fringes with high contrast.The experimental methodand results of the application of the optical logic-operared moire in moire topography are pre-sented in this paper.     

High-sensitivity piezoelectric tube sensor for shear-force detection in scanning near-field optical microscopy

An easy-to-implement non-optical shear-force detection setup for tip–sample distance regulation in scanning near-field optical microscopy is demonstrated. The detection method is based on attaching the near-field probe to a piezoelectric tube resulting in excellent mechanical contact between tip and detector. The main advantages of the method are good signal-to-background contrast and thus potential for high sensitivity. The method is demonstrated by obtaining approach curves of silicon surfaces. The suitability for optical experiments is further shown by measuring the near-field intensity distribution of the emission of a semiconductor laser.