Measurement of in-plane motions and rotations using a simple electronic speckle pattern interferometer

We describe the construction and operation of a simple electronic speckle pattern interferometer which is sensitive to in-plane motions and rotations. The interferometer is extremely simple and easy to use. It uses a commercial digital still camera for image acquisition, and a personal computer for image storage and analysis. The interferometer was used to measure very small in-plane rotations of a rough surface, and the results were found to be in good agreement with the expected values. We propose to use this system as an instrument for the measurement of small-angle rotations.     

A simple electronic speckle shearing interferometer

A new speckle shearing interferometer with simple setup is proposed. The interferometer can be converted easily from a speckle referenced speckle pattern interferometer into a speckle shearing interferometer and vice versa. A beamsplitter and a mirror are used to generate the shear. The amount of shear can be adjusted by simply rotating the mirror. The costs involved are low and it is particularly useful for fast inspection in non-destructive testing of structural integrity. Both the theoretical studies of the method of measurement and the experimental results are presented.     

One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.     

Noise reduction in electronic speckle pattern interferometry fringes by merging orthogonally polarised speckle fields

The noise in sawtooth fringes generated by electronic speckle pattern interferometry (ESPI) is investigated. When deformations of depolarising objects are studied, the scattered object light can be decomposed into two orthogonal linearly polarised speckle patterns which are partially decorrelated. Their correlation coefficient decreases with increasing depolarisation coefficient of the object. By suitable merging of the phase distributions of these two speckle fields on the basis of a modulation depth analysis, the rms phase error in the ESPI sawtooth fringes can be reduced significantly.     

Improved evaluation of electronic speckle pattern interferograms by photogrammetric image analysis

Electronic speckle pattern interferometry (ESPI) is a well-established tool for non-destructive testing. It allows the quantitative determination of surface deformations and micro-movements with a sub-micrometer resolution. In the case of objects which are extended in depth, however, the evaluation and interpretation of the resulting correlation fringe patterns can be affected by perspective image distortions as well as by a varying image size. In this paper a method for combination of ESPI with a photogrammetric 3D coordinate measurement is presented. In this way, interferogram data are precisely allocated in 3D-space. Furthermore, it is possible to take into account a spatially varying sensitivity vector. The utilizability of the method is demonstrated by a deformation measurement on a stone sculpture.     

用电子散斑干涉法测量材料热膨胀系数

 利用双光束电子散斑干涉法（ESPI）对试件受热变形进行了实时观测，针对一次实验过程中得到的图片较多（300～500幅）的特点，在图像处理时摒弃了以往的手动识别等位移线的办法，用MATLAB语言编写了批处理程序，能够在采集的大量散斑图片中自动快速准确地标定等位移线，得到相应的位移和应变，并结合实时测量的温度值，获得了45钢和LY12铝合金在不同温升率下的热膨胀系数及其随温度的变化。实验结果表明，在涉及的温升率范围内，温升率的改变对材料热膨胀系数的影响不明显，材料的热膨胀系数随温度的升高略有上升。     

Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation

The thickness change of transparent plates was measured by electronic speckle pattern interferometry (ESPI) method and digital image correlation (DIC) method. An out-of-plane ESPI system was developed based on the Michelson interferometer, and a new thickness measurement method was designed, which is on the basis of Snell's law of refraction and DIC. The main principles and experimental procedures of these two methods were presented. The thickness change of polymethyl specimens under uniaxial tensile loading were measured by the optical techniques and compared with each other. The results reveal that the data obtained with DIC method achieve better linearity than ESPI.     

Sound field monitoring by tomographic electronic speckle pattern interferometry

Time-averaging electronic speckle pattern interferometry (ESPI) allows to record the phase modulation of light that has propagated through a sound field. When such data are collected from different projection directions the three-dimensional spatial distribution of amplitude and phase of the sound are obtained by tomographic back projection. The performance of such a setup increases with the number of projection directions, the number of effective resolution elements in the detector, and the number of recordings taken in averaging. These efforts, however, compete with the need for acceptable recording and processing times. Recent improvements in time-averaging ESPI enable even demanding applications in sound field monitoring. This is demonstrated in the design of a 38.5 kHz ultrasound source composed of a large number of individual piezoelectric transducer elements and intended to generate highly directive audio sound by nonlinear mixing in air (parametric array). The success of this method relies essentially on a non-intrusive control of the spatial homogeneity of the ultrasound field. Tomographic ESPI data have guided in a delicate alignment of the transducer elements yielding the expected narrowing of the angular radiation of the audio sound.     

The design of a non-cube beam-splitter used for electronic speckle pattern interferometry

A non-cube beam-splitter (NCBS) is proposed, by which an incident beam can be separated largely in a direction and then the lights from the test object and the lights from a reference surface placed adjacently to the test object can be combined to construct a simple electronic speckle pattern interferometry (ESPI) system. Two mainly useful quantitative ways, to calculate the phase change of the test object, the phase-shift and the fringe carrier method with Fourier transform, can be achieved in the ESPI system with the NCBS. Experiments with phase-shifting and fringe carrier method are completed. The experimental results show that the monolithic design of the proposed NCBS is effective in ESPI measurement and immunity to vibrations.     

New fourth-order partial differential equations for filtering in electronic speckle pattern interferometry fringes

Partial differential equations (PDEs) based methods have been demonstrated to be a powerful tool for filtering in electronic speckle pattern interferometry fringe or wrapped phase patterns. In this paper, we derive the new fourth-order partial differential equations (NFOPDE) with a better performance for filtering in electronic speckle pattern interferometry fringe patterns based on the variational methods. We test the proposed models on two computer-simulated speckle fringe patterns and an experimentally obtained fringe pattern, respectively, and compare our models with the widely used, well-known the second-order selective degenerate diffusion PDE model (SOSDPDE) and the published fourth-order PDE model (PFOPDE). The proposed NFOPDE can overcome the shortages that both the SOSDPDE and PFOPDE encounter. In all cases, our NFOPDE outperforms SOSDPDE and PFOPDE.     

一种可实现电子散斑干涉的新型大错位方棱镜

设计了一种可实现电子散斑干涉的大错位方棱镜.将普通方棱镜的一个面磨去一个楔角后变为斜面,该斜面和相邻的一个面镀反射膜,其他二个面镀增透膜.垂直入射的光线经过分光后变成二束光,分别经过平面反射和斜面反射,出射的二束光线就分开了.将该大错位方棱镜置于CCD镜头前,一个物体可以成二个错位的像;相邻的二个物体可叠加成像.错位量由楔角决定,错位量足够大,可实现大错位电子散斑干涉.根据试件大小和成像距离,楔角的大小可选择在1°到10°之间.对中心加载周边固定圆盘进行了电子散斑载频干涉实验,证明了大错位方棱镜能够高质量地实现电子散斑干涉,实现位移场测量.     

Measurement of the near-tip displacement field in a fatigue damaged steel plate by digital speckle pattern interferometry

A digital speckle pattern interferometry system with automatic data analysis is used to measure the near-tip in-plane displacement field in a stainless steel specimen previously cracked by a fatigue test. In-plane displacements over a zone of 3.15 mm×3.15 mm are determined through the evaluation of the optical phase distribution. A theoretical solution developed for elasto-plastic materials is used to evaluate the obtained experimental results.     

Measurement of out-of-plane static and dynamic deformations by processing digital speckle pattern interferometry fringes using wavelet transform

In this paper, we are presenting measurement of static and dynamic deformations in rectangular plate fixed at one end using digital speckle pattern interferometry (DSPI). To improve the measurement accuracy, we have developed a new filtering scheme based on combination of average/median filtering and Symlet wavelet filtering which enhances the signal-to-noise ratio (SNR) in the speckle interferogram obtained from DSPI. Experimental results show that our filtering scheme is quite effective in improving SNR of the speckle interferogram. The measurements by DSPI and calculations from beam theory in the case of out-of-plane static deformation and the measurements by DSPI and accelerometer in the case of dynamic deformation are in good agreement.     

电子散斑干涉载频调制形貌测量方法的分析

根据电子散斑干涉载频调制测量物体形貌的基本原理,物体表面的微小偏转可引入包含物体高度信息的载波干涉条纹。将物体的偏转视为变形,对物体变形与载波干涉条纹之间的关系进行了讨论,得出了离面位移引入载波和面内位移引入含有物体高度信息相位的结论。发现利用典型电子散斑干涉系统测量物体形貌效果最好,并通过实验得到了验证。     

The study and application of a new filtering method on electronic speckle pattern interferometric fringe

It is important for the study of digital image processing to remove noises and enhance images because of various noises in images. The article is concerned with the recursive algorithm-filtering technique, which is capable of effectively removing noise and rapidly leading to a continuous gray-level distribution of a random image. By applying the method on speckle images of defects of rubber material, it is shown that this technique is the most effective and speedy method for the filtering of ESPI fringe patterns. Comparing the images before and after filtering, we can see the advantages of the novel technique clearly. It can increase the accuracy of measurement both in phase measurement and in quantitative evaluations of defects.     

Measurement of the off-plane displacement of carbon steel corrosion with twin-object-beam electronic speckle interferometry

In this paper, twin-object-beam electronic speckle interferometry is used to study the longitudinal corrosion of carbon steel. The displacement expression of this technique is deduced and optical fibers are used to reduce the influence of the optical system and improve the quality of speckle pattern. Twin-object-beam electronic speckle interferometry cannot only quantitatively cipher out off-plane displacement as a result of corrosion, but also estimate the change of corrosion speed.     

Full field and microregion deformation measurement of thin films using electronic speckle pattern interferometry and array microindentation marker method

Thin films now are widely used in micro devices and structures, such as MEMS, electronic packaging, micro sensors, and so on. Their performances highly affect the reliability of the devices. Therefore, it is important to investigate the deformation and the failure mechanism of thin films. In this paper, we present two experimental methods to measure the mechanical properties of thin films. In the first method, a double-field-of-view electronic speckle pattern interferometry system (ESPI) and an integrated deformation and load measurement system are employed, which allows in situ and real-time measurements of full-field deformations of the thin films and microforces under uniaxial tensile test. In the second method, the array microindentation markers were indented on the surface of the thin film using a nanoindenter and the microregion deformations of the tested thin films were measured. In the proposed methods, the tested thin films can be made of metals, oxide ceramics, and multi-layer composites of thickness from several tens micrometers to less than a micron, and the tensile loads from 88 μN to 15 N for the first method or up to 100 N to the second one. The underlying principle of the methods and the experimental set-ups are presented. The deformations of Au and Au/Cr multi-layer films, and the pure Ni films are measured. The performance of the methods and the testing systems are also discussed.     

Feasibility study of a digital speckle pattern interferometry and bending test combined technique to investigate coating adhesion

This paper presents a feasibility study to assess whether digital speckle pattern interferometry could be used as a possible technique to investigate the adhesive performance of coatings. The approach is based on the measurement of the deflections produced by a pre-notched coated specimen subjected to a four-point bending test. When the bending load is increased, a delamination between the coating and the substrate is propagated with its length depending on the adhesion strength. Experiments carried out with specimens having simulated delaminations confirm that digital speckle pattern interferometry can be used to estimate the delamination length.     

Modulation analysis in spatial phase shifting electronic speckle pattern interferometry and application for automated data selection on biological specimens

In electronic speckle pattern interferometry (ESPI), for a fast and objective analysis of measurement data which occur with a high repetition rate, an automated data processing is of particular advantage. For this reason, investigations were carried out to determine if the modulation of speckle interferograms can be applied as a quality parameter for the selection of suitable interferogram data for further evaluation e.g. phase unwrapping when spatial phase shifting (SPS) is performed. Six methods for determining the modulation of speckle interferograms are characterised and compared. The applicability of the speckle interferogram modulation as a parameter for mask generation in the unwrapping process of the phase difference is demonstrated by the evaluation of measurement data obtained from experiments with a spatial phase shifting endoscopic ESPI system on a technical surface and on a human gastrectomy specimen.