Internal reflectance spectroscopy associated with cyclic staircase voltammetry using a microcomputer

In order to obtain extensive information on electrode-solution interfaces, a rapid-scan internal reflectance spectroscopic system is combined with cyclic staircase voltammetry; the staircase wave generated by computer software is applied to an optically transparent tin oxide electrode. The internal reflectance spectrum is measured at each step of the applied staircase voltage simultaneously with the instantaneous current.