The design of a non-cube beam-splitter used for electronic speckle pattern interferometry

A non-cube beam-splitter (NCBS) is proposed, by which an incident beam can be separated largely in a direction and then the lights from the test object and the lights from a reference surface placed adjacently to the test object can be combined to construct a simple electronic speckle pattern interferometry (ESPI) system. Two mainly useful quantitative ways, to calculate the phase change of the test object, the phase-shift and the fringe carrier method with Fourier transform, can be achieved in the ESPI system with the NCBS. Experiments with phase-shifting and fringe carrier method are completed. The experimental results show that the monolithic design of the proposed NCBS is effective in ESPI measurement and immunity to vibrations.     

用电子散斑干涉法测量材料热膨胀系数

 利用双光束电子散斑干涉法（ESPI）对试件受热变形进行了实时观测，针对一次实验过程中得到的图片较多（300～500幅）的特点，在图像处理时摒弃了以往的手动识别等位移线的办法，用MATLAB语言编写了批处理程序，能够在采集的大量散斑图片中自动快速准确地标定等位移线，得到相应的位移和应变，并结合实时测量的温度值，获得了45钢和LY12铝合金在不同温升率下的热膨胀系数及其随温度的变化。实验结果表明，在涉及的温升率范围内，温升率的改变对材料热膨胀系数的影响不明显，材料的热膨胀系数随温度的升高略有上升。     

一种可实现电子散斑干涉的新型大错位方棱镜

设计了一种可实现电子散斑干涉的大错位方棱镜.将普通方棱镜的一个面磨去一个楔角后变为斜面,该斜面和相邻的一个面镀反射膜,其他二个面镀增透膜.垂直入射的光线经过分光后变成二束光,分别经过平面反射和斜面反射,出射的二束光线就分开了.将该大错位方棱镜置于CCD镜头前,一个物体可以成二个错位的像;相邻的二个物体可叠加成像.错位量由楔角决定,错位量足够大,可实现大错位电子散斑干涉.根据试件大小和成像距离,楔角的大小可选择在1°到10°之间.对中心加载周边固定圆盘进行了电子散斑载频干涉实验,证明了大错位方棱镜能够高质量地实现电子散斑干涉,实现位移场测量.     

Improved evaluation of electronic speckle pattern interferograms by photogrammetric image analysis

Electronic speckle pattern interferometry (ESPI) is a well-established tool for non-destructive testing. It allows the quantitative determination of surface deformations and micro-movements with a sub-micrometer resolution. In the case of objects which are extended in depth, however, the evaluation and interpretation of the resulting correlation fringe patterns can be affected by perspective image distortions as well as by a varying image size. In this paper a method for combination of ESPI with a photogrammetric 3D coordinate measurement is presented. In this way, interferogram data are precisely allocated in 3D-space. Furthermore, it is possible to take into account a spatially varying sensitivity vector. The utilizability of the method is demonstrated by a deformation measurement on a stone sculpture.     

Measuring thickness change of transparent plate by electronic speckle pattern interferometry and digital image correlation

The thickness change of transparent plates was measured by electronic speckle pattern interferometry (ESPI) method and digital image correlation (DIC) method. An out-of-plane ESPI system was developed based on the Michelson interferometer, and a new thickness measurement method was designed, which is on the basis of Snell's law of refraction and DIC. The main principles and experimental procedures of these two methods were presented. The thickness change of polymethyl specimens under uniaxial tensile loading were measured by the optical techniques and compared with each other. The results reveal that the data obtained with DIC method achieve better linearity than ESPI.     

电子散斑干涉载频调制形貌测量方法的分析

根据电子散斑干涉载频调制测量物体形貌的基本原理,物体表面的微小偏转可引入包含物体高度信息的载波干涉条纹。将物体的偏转视为变形,对物体变形与载波干涉条纹之间的关系进行了讨论,得出了离面位移引入载波和面内位移引入含有物体高度信息相位的结论。发现利用典型电子散斑干涉系统测量物体形貌效果最好,并通过实验得到了验证。     

One-wavelength in-plane rotation analysis in electronic speckle pattern interferometry

The analysis of in-plane rigid-body rotations requires phase-shifting methods to determine the direction of rotation in conventional electronic speckle pattern interferometry (ESPI). The phase-shifting procedure makes the real-time measurements impossible. A quasi-real-time method is published recently, where the usual symmetric illumination is combined with a wavelength change before the second exposure. The present paper proposes a device sparing an alternative to this. The symmetric illumination is retained but the wavelength change is replaced by simple illumination direction changes.     

New fourth-order partial differential equations for filtering in electronic speckle pattern interferometry fringes

Partial differential equations (PDEs) based methods have been demonstrated to be a powerful tool for filtering in electronic speckle pattern interferometry fringe or wrapped phase patterns. In this paper, we derive the new fourth-order partial differential equations (NFOPDE) with a better performance for filtering in electronic speckle pattern interferometry fringe patterns based on the variational methods. We test the proposed models on two computer-simulated speckle fringe patterns and an experimentally obtained fringe pattern, respectively, and compare our models with the widely used, well-known the second-order selective degenerate diffusion PDE model (SOSDPDE) and the published fourth-order PDE model (PFOPDE). The proposed NFOPDE can overcome the shortages that both the SOSDPDE and PFOPDE encounter. In all cases, our NFOPDE outperforms SOSDPDE and PFOPDE.     

Modulation analysis in spatial phase shifting electronic speckle pattern interferometry and application for automated data selection on biological specimens

In electronic speckle pattern interferometry (ESPI), for a fast and objective analysis of measurement data which occur with a high repetition rate, an automated data processing is of particular advantage. For this reason, investigations were carried out to determine if the modulation of speckle interferograms can be applied as a quality parameter for the selection of suitable interferogram data for further evaluation e.g. phase unwrapping when spatial phase shifting (SPS) is performed. Six methods for determining the modulation of speckle interferograms are characterised and compared. The applicability of the speckle interferogram modulation as a parameter for mask generation in the unwrapping process of the phase difference is demonstrated by the evaluation of measurement data obtained from experiments with a spatial phase shifting endoscopic ESPI system on a technical surface and on a human gastrectomy specimen.     

Sound field monitoring by tomographic electronic speckle pattern interferometry

Time-averaging electronic speckle pattern interferometry (ESPI) allows to record the phase modulation of light that has propagated through a sound field. When such data are collected from different projection directions the three-dimensional spatial distribution of amplitude and phase of the sound are obtained by tomographic back projection. The performance of such a setup increases with the number of projection directions, the number of effective resolution elements in the detector, and the number of recordings taken in averaging. These efforts, however, compete with the need for acceptable recording and processing times. Recent improvements in time-averaging ESPI enable even demanding applications in sound field monitoring. This is demonstrated in the design of a 38.5 kHz ultrasound source composed of a large number of individual piezoelectric transducer elements and intended to generate highly directive audio sound by nonlinear mixing in air (parametric array). The success of this method relies essentially on a non-intrusive control of the spatial homogeneity of the ultrasound field. Tomographic ESPI data have guided in a delicate alignment of the transducer elements yielding the expected narrowing of the angular radiation of the audio sound.     

Comparison between instantaneous and integral intensities in dynamic speckle pattern interferometry

A new speckle measurement technique called temporal speckle pattern interferometry or time sequential speckle pattern interferometry has been developed recently. Its principle is that by capturing the temporal speckle patterns related to the object deformation or displacement, the whole-field displacement, the amplitude of the vibrating object and the shape of the tested object can be calculated through speckle intensity fluctuation scanning technique or Fourier-transforming method. In this paper, we combine the analytical and numerical methods to simulate the properties of the time demodulation in temporal speckle patterns interferometry techniques. The performance of three kinds of temporal phase sequences, power, exponential and harmonic phase sequences, are studied with the parameters of temporal speckle intensity fluctuation, the value of the spatial phase term, optical integral time of the recording camera and the initial phase of the temporal speckle intensities. The results indicate that the normalized value and period change of the instantaneous intensity are nearly coincident with that of the integral intensity for the harmonic temporal phase sequences and are different for the power and exponential temporal phase sequences.     

Wavelet filtering applied to time-average digital speckle pattern interferometry fringes

In this paper we are presenting a filtering scheme using Symlet wavelet to remove the speckle noise from the time-averaged digital speckle pattern interferometry fringes. To demonstrate the potential of Symlet wavelet filtering, experiments are conducted to remove the speckle noise from the fringes recorded for the surface of computer hard disk. Experimental results demonstrate that this filtering removes the speckle noise to the large extent.     

Measurement of out-of-plane static and dynamic deformations by processing digital speckle pattern interferometry fringes using wavelet transform

In this paper, we are presenting measurement of static and dynamic deformations in rectangular plate fixed at one end using digital speckle pattern interferometry (DSPI). To improve the measurement accuracy, we have developed a new filtering scheme based on combination of average/median filtering and Symlet wavelet filtering which enhances the signal-to-noise ratio (SNR) in the speckle interferogram obtained from DSPI. Experimental results show that our filtering scheme is quite effective in improving SNR of the speckle interferogram. The measurements by DSPI and calculations from beam theory in the case of out-of-plane static deformation and the measurements by DSPI and accelerometer in the case of dynamic deformation are in good agreement.     

Low-frequency harmonic vibration analysis with temporal speckle pattern interferometry

In this paper, the time sequence phase method (TSPM) has been applied to measure the displacement caused by low-frequency vibration in temporal speckle pattern interferometry (TSPI). The principle is that by capturing the temporal speckle patterns related to the object vibration, the whole-field displacement responses (amplitude and phase) of the vibrating object can be calculated through scanning these fluctuations. Thus, quantitative measurement can be carried out using a conventional ESPI system without a camera synchronized to the object vibration or a phase shifting system. The elaboration on the method is given and experimental results are presented.     

The separation of out-of-plane displacement from in-plane components by fringe carrier method based on large image-shearing ESPI

A fringe carrier method for separating out-of-plane displacement from in-plane components based on large image-shearing electronic speckle pattern interferometry (ESPI) is presented. If the test object is respectively illuminated by two expanded symmetric illuminations in large image-shearing ESPI, two interferometers are formed. Carrier fringe patterns can be introduced by tilting reference surface a small angle. The carrier fringe patterns are demodulated after deformation of the object. Two phase maps, which include out-of-plane and in-plane displacement, can be obtained by using Fourier transform. Then out-of-plane displacement can be easily separated from in-plane displacement by simple operation between two unwrapped phase distributions. The principle of spatial carrier frequency modulation in large image-shearing ESPI is discussed. A typical three-point-bending experiment is completed. Experimental results are offered. The results show that the method offers high visibility of carrier fringes. And the system presented does not need a special beam as a reference light and has simple optical setup.     

A simple electronic speckle shearing interferometer

A new speckle shearing interferometer with simple setup is proposed. The interferometer can be converted easily from a speckle referenced speckle pattern interferometer into a speckle shearing interferometer and vice versa. A beamsplitter and a mirror are used to generate the shear. The amount of shear can be adjusted by simply rotating the mirror. The costs involved are low and it is particularly useful for fast inspection in non-destructive testing of structural integrity. Both the theoretical studies of the method of measurement and the experimental results are presented.     

载频调制大剪切电子散斑干涉系统

大剪切电子散斑干涉技术不需要引入参考光，具有条纹质量好等特点。提出将干涉场的载频调制技术引入到大剪切电子散斑干涉中，可形成具有载频调制功能的新的电子散斑干涉系统。该系统具有对测量环境的隔振振动要求低，能方便定量求解物体的变形场等优点。首先讨论大剪切载频的调制机理，然后利用中心加载、周边固定的圆盘进行典型实验，设计了可用计算机控制且可对参考物进行精确偏转的步进电机系统，进而实现了对电子散斑干涉场的自动控制调制。最后，利用傅里叶变换法对调制条纹进行解调，解调出变形场的相位，并通过相位与位移的转换计算，得到精确的物体变形场。实验结果证明，该系统能够调制电子散斑干涉场，求解物体的位移场。     

Measurement of modal damping by electronic speckle shearing interferometry

A time-average electronic speckle shearing interferometer (ESSI) has been used for modal damping measurement. This is effected by a new fringe enhancement technique. The damping factor of a cantilever measured by using this technique agrees well with the value measured by using the accelerometer method. The study shows that time-average speckle interferometry can be used as a convenient tool for modal damping measurement.     

Continual deformation analysis with scanning phase method and time sequence phase method in temporal speckle pattern interferometry

If a laser beam illuminates a continual deformation object surface, it will lead to a temporal speckle pattern on the observation plane. Recording this time-dependent speckle pattern the deformation of the surface of an object can be obtained. Two methods, scanning phase method (SPM) and time sequence phase method (TSPM), have been introduced for measuring the displacement caused by the deformation in temporal speckle pattern interferometry (TSPI). Their principle is that by capturing a series of speckle interference patterns related to the object deformations, the fluctuations in the intensity of the interference patterns can be obtained. Through scanning these fluctuations and estimating both the average intensity and modulation of the temporal speckle interference patterns, the phase maps for whole-field displacements are calculated. In this way one is capable of quantitatively measuring continual displacements simply using a conventional electronic speckle pattern interferometry (ESPI) system without phase shifting or a carrier. The elaboration on the new methods is given in this paper and experiments are performed to demonstrate their performance with a conventional ESPI system.     

Comparison of phase recovery methods in spiral speckle pattern interferometry correlation fringes

Spiral interferometry can be used as a solution to the problem of sign ambiguity presented in the conventional speckle pattern interferometric technique when the optical phase needs to be reconstructed from a single closed fringe system. Depressions and elevations of the topography corresponding to the object deformation are distinguished by the direction of rotation of the local spiral fringe pattern. In this work, we implement and compare several methods for optical phase reconstruction by analyzing a single image composed of spiral speckle pattern interferometry correlation fringes. The implemented methods are based on contour line demodulation, center line demodulation, Spiral Phase Quadrature Transform and the 2D Riesz transform with multivector structure. Contour line and center line demodulation approaches are exclusively dedicated to images containing a fringe system with spiral structure. The others are based on the 2D Riesz transform, these being well known approaches in conventional interferometry. We examine simulated experiments and analyze some of the emerging drawbacks for solving the phase reconstruction problem by using different mean values of speckle size and background noise levels. We also discuss several numerical procedures that may well improve the efficiency and robustness of the presented numerical implementations. The performance of the implemented demodulation methods is evaluated by using a universal image quality index and therefore a quantitative comparison is also presented.