A new positioning approach of fiber probe for near-field scanning optical microscope

A fiber probe-based positioning scan approach was established, whose precision can reach as high as 0.8 μm. And a set of modified microscope system was designed utilizing this approach, in which the scanning probe microscope (SPM) combined with an optical microscope was manipulated. The optical microscope and scanning probe can conveniently be switched through a switch panel. The observation period of samples can significantly be shortened. And more reliable images can be provided using this approach. Our design can effectively solve the inherent disadvantages of SPM technology, which makes SPM scan and image more reliably, conveniently, safely and rapidly.     

Near-field and far-field modeling of scattered surface waves. Application to the apertureless scanning near-field optical microscopy

The detection of surface waves through scanning near-field optical microscopy (SNOM) is a promising technique for thermal measurements at very small scales. Recent studies have shown that electromagnetic waves, in the vicinity of a scattering structure such as an atomic force microscopy (AFM) tip, can be scattered from near to far-field and thus detected. In the present work, a model based on the finite difference time domain (FDTD) method and the near-field to far-field (NFTFF) transformation for electromagnetic waves propagation is presented. This model has been validated by studying the electromagnetic field of a dipole in vacuum and close to a dielectric substrate. Then simulations for a tetrahedral tip close to an interface are presented and discussed.     

微波模拟近场光学显微镜实验

介绍了近场光学显微镜的基本原理，并利用微波代替可见光模拟了近场光学显微镜实验．     

Influence of the sample-probe coupling on the resolution of transmitted near-field optical image

Numerical simulation of photon scanning tunneling microscopy is presented to study the near-field distribution in the vicinity a dielectric surface with one-dimensional sub-wavelength structures. Multiple scattering between the probe tip and the sample has been taken into account implicitly by matching electromagnetic boundary conditions at interfaces. The near-field intensity in transmission mode through two ridges on surface has been modeled in order to analyze the resolution of the system. The effects on the signal by the sample-tip coupling, the polarization of the incident light, and the angle of incidence are investigated. We find that the capability to recognize the feature will be improved when the tip–object interaction is strong.     

Sensitivity analysis of scanning near-field optical microscope probe

In this paper, we study the dynamic modes of a scanning near-field optical microscope (SNOM) which uses an optical fiber probe; and the sensitivity of flexural and axial vibration modes for the probe were derived and the closed-form expressions were obtained. According to the analysis, as expected each mode has a different sensitivity and the first mode is the most sensitive mode of flexural and axial vibration for the SNOM probe. The sensitivities of both flexural and axial modes are greater for a material surface that is compliant with the cantilever probe. As the contact stiffness increases, the high-order vibration modes are more sensitive than the lower-order modes. Furthermore, the axial contact stiffness has a significant effect on the sensitivity of the SNOM probe, and this should be noted when designing new cantilever probes.     

Direct observation of variations of optical properties in single quantum dots by using time-resolved near-field scanning optical microscope

We study the variations of optical properties of self-assembled In_0.5Ga_0.5As single quantum dots (QDs) in the spatial and time domains by combining a near-field scanning optical microscope with an ultrafast pulsed laser. Through the examinations of several tens of QDs, we find that the variations of photoluminescence (PL) intensity strongly depend on the condition of the initial carrier creation. The differences in quantum efficiency and those in the carrier flow rate into QDs cause the large distribution of PL intensity when the carriers are excited in the barrier layers. From the results of time-resolved PL decay measurements, we find that there are two types of QDs exhibiting quite different PL decay profiles.     

A resonance tracking method for stable operation of a near-field scanning optical microscope in liquid environment

We report on the novel design of the near-field scanning optical microscope (NSOM) which operates in liquid environment. A resonance tracking digital scanning method is applied to compensate the resonance shift due to the evaporation of the liquid in the atmospheric pressure. By this method, stable operation of NSOM system is demonstrated by showing topographic images of the metallic grating embedded in liquid environment.     

Effect of interactive damping on vibration sensitivities of a scanning near-field optical microscope probe

The effect of interactive damping on the sensitivity of flexural and axial vibration modes of scanning near-field optical microscope (SNOM) with a tapered optical fiber probe has been analyzed. The interaction of the SNOM probe with a sample surface is modeled by a combination of a spring and a dashpot in the flexural direction and a similar combination in the axial direction. An approximate form for the sensitivities of both modes was derived by using the Rayleigh–Ritz method. The results show that the interactive damping will decrease the sensitivities of both flexural and axial vibration modes when the contact stiffness is low. The more the damping effect, the lower the sensitivities are. In addition, when the contact stiffness was low, the flexural sensitivity of the tapered probe slightly increased as the tapered angle decreased. However, the axial sensitivity apparently decreased as the tapered angle decreased. When the contact stiffness became higher, the sensitivities of both flexural and axial vibration modes increased as the tapered angle increased. PACS 68.35.Ja; 07.79.Fc; 61.16.Ch     

Micromachining of diamond with a near-field scanning optical microscope

Direct-write laser micromachining of diamond on a submicrometer scale with a near-field scanning optical microscope with an uncoated tapered fiber tip has been demonstrated. Micromachined structures can be imaged in situ immediately after modification of the sample. An early stage of the ablation process, which is believed to be conversion of diamond into graphite, has been visualized.     

Fabrication of high-quality fiber micro-probe for near-field optical microscope by laser-assisted melting and pulling method

The fiber micro-probe for near-field scanning optical microscope (NSOM) was fabricated using end-fixed laser-assisted melting and pulling method. The scanning electron microscope (SEM) observation showed that the fiber probes obtained by this method possessed small diameter of tip and large conic angle. The reproducibility came close to 70%. The effects of various fabrication parameters on probes were investigated, including laser power, pulling force, and the diameter of melting zone. The optimal processing conditions were derived based on the experiments and theoretical analysis. This research provides an alternative and advantageous method for fabrication of high-quality fiber probes.     

Signal detection techniques for scattering-type scanning near-field optical microscopy

Scattering-type scanning near-field optical microscopy (s-SNOM) has been playing more and more important roles in investigating electromagnetic properties of various materials and structures on the nanoscale. In this technique, a sharp tip is employed as the near-field antenna to measure the sample's properties with a high spatial resolution. As the scattered near-field signal from the tip is extremely weak and contaminated by strong background noise, the effective detection, and subsequent extraction of the near-field information from the detected signals is the key issue for s-SNOM. In this review, we give a systematic explanation of the underlying mechanisms of s-SNOM, and summarize and interpret major signal detection techniques involved, including experimental setups, theories for signal analysis and processing, and exposition of advantages and disadvantages of such techniques. By this, we hope to provide a practical guide and a go-to source of detailed information for those interested in and/or working on s-SNOM.     

Pressure-induced modulation of the confinement in self-organized quantum dots produced and detected by a near-field optical probe

Near-field optical probing, or nanoprobing, achieves spatial resolution that surpasses the diffraction limit of light and makes possible the luminescence imaging and spectroscopy of single quantum dots in dense arrays of dots. We use optical nanoprobing to study self-organized InGaAs quantum dots grown on (3 1 1)B oriented GaAs substrates. Here, we emphasize a new feature of nanoprobing: pressure-induced strain modulation near the surface. Operating in near-field optical excitation–collection mode, the probe makes contact with the surface and exerts direct pressure whose main effect is a compressive uniaxial strain under the probe. By adjusting the applied pressure, we modulate the local strain environment in and around a quantum dot, but still preserve the capability to capture its near-field luminescence. Nanoprobe pressure effects modify the confinement potential and radiative emission of single quantum dots, and the coupling strength between dots. This opens new possibilities for the study and control of the optical and electronic properties of single- and coupled-quantum dots.     

Influence of the probe--sample interaction on scanning near-field optical microscopic images in the far field

We have studied the influence of probe--sample interaction in a scanning near-field optical microscopy (SNOM) in the far field by using samples with a step structure. For a sample with a step height of $\sim \lambda $/4, the SNOM image contrast between the two sides of the step changes periodically at different scan heights. For a step height of $\sim \lambda $/2, the image contrast remains approximately the same. The probe--sample interaction determines the SNOM image contrast here. The influence of different refractive indices of the sample has been also analysed by using a simple theoretical model.     

Ultrasonic resonance regulated near-field scanning optical microscope and laser induced near-field optical-force interaction

We have developed a novel sample-tip regulation for a near-field optical microscope: an ultrasonic resonance regulation method. The regulation range is from 0 to 50 nm. It shows not only stability, simplicity in construction, but also versatility in vacuum, magnetic field, and low temperature environments. The main advantage of this technique is that it is a non-optical detecting scheme, which is very important for near-field spectroscopy. Such construction can also be used as a force microscope to study the topography of insulating samples. The laser light induced force interaction in the near-field range has been observed for the first time, showing that aided by laser radiation, the shear force between sample and tip can be changed depending on the type of sample. This can be interpreted as the light induced optical tip-sample interaction of light pressure effect. The van der Waals dispersion energy and the optical binding energy induced by laser beam between dielectric tip and samples play important role. The effect confirms a theoretical prediction. This new technique and phenomenon will add new aspects to near-field optics.     

Recent developments in nanofabrication using scanning near-field optical microscope lithography

In addition to its well-known capabilities in imaging and spectroscopy, scanning near-field optical microscopy (SNOM) has recently shown its great potentials for fabricating various structures at the nanoscale. A variety of SNOM-based fabrication techniques have been developed for different applications. In this paper, the SNOM-based techniques involving three major functions: material modification, addition, and removal, are examined with emphasis on their abilities and reliability to make structures with resolutions at the nanometer level. The principles and procedures underlying each technique are presented, and the differences and uniqueness among them are subsequently discussed. Finally, concluding remarks are provided to summarize the major techniques studied and to recommend the scopes for technology improvement and future research.     

扫描探针显微学中的云纹方法

在扫描探针显微镜（SPM）的扫描过程中，由SPM的扫描线与物质表面周期性晶格结构进行干 涉可以形成纳米云纹图像.采用高取向热解石墨（HOPG）和云母作为试件，分别对扫描隧道 显微镜（STM）和原子力显微镜（AFM）云纹进行了研究，实验结果与理论分析完全一致.SPM 纳米云纹法在纳米测量和表征方面具有较大的应用前景. 关键词： 云纹 SPM 晶格栅线 纳米测量     

Method for edge contour extraction of a scanning probe microscope image

A method for edge contour extraction of a scanning probe microscope image is proposed. This method is developed to process an image that has the large size irregularity and/or objects bound together. It is based on definition of the local minimum points of brightness data function and permits one to obtain the correct edge contour line. The advantages of the proposed method over traditional methods are demonstrated using model results. This method can be used to process different images.     

THz near-field optical imaging by a local source

A new THz imaging system based on a local illumination by a near-field source is presented. Model object is imaged, and sub-wavelength spatial resolution is demonstrated for the first time to our knowledge with this configuration. The contrast and the resolution are confirmed by a theoretical study based on the diffraction in near-field zone.     

Quantitative amplitude and phase measurement by use of a heterodyne scanning near-field optical microscope

A coherent photon scanning tunneling microscope is presented. The setup employs heterodyne interferometry, allowing both the phase and the amplitude of the optical near field to be measured. Experimental results of measurements on a standing evanescent wave reveal the high resolution that is obtainable with such an approach. In fact we have measured the amplitude and the phase of the near field, with a resolution of 1.6 nm between sample points.     

Local magneto-optical Kerr effect imaging by scanning near-field optical microscope in reflection-mode

<正>A method for local magneto-optical Kerr effect imaging based on a home-made scanning near-field optical microscope working in reflection mode is presented.Shear force detection is carried out by using a symmetric piezoelectric bimorph sensor,which provides an easy way not only for probe-surface distance control but also for imaging.Polarization-preserving fiber probes used as a local optical detector are fabricated with a heating-pulling technique and the probes' polarization properties are measured.Shear force topographic and near-field magneto-optical images of magneto-optical disk taken with the proposed method are shown.