苯基荧光酮分光光度法测定煤矸石中钛

本文研究和比较了几种表面活性剂存在下,苯基荧光酮（ＰＦ）与钛的显色反应。试验表明,在０．０３－０．０５ｍｏｌ·Ｌ－１的硫酸介质中,钛与ＰＦ形成蓝紫色配合物,最大吸收峰在５９５ｎｍ处,表观摩尔吸光系数ε＝６．３×１０４Ｌ·ｍｏｌ－１·ｃｍ－１。钛量在０－１５μｇ／２５ｍＬ范围内服从比耳定律。方法灵敏度高,选择性好,抗干扰能力强,体系稳定,测定煤矸石中钛,结果满意。     

钡-偶氮胂Ⅲ-锌(钴)-邻菲口罗啉多元配合物显色反应的研究

在近中性环境中，研究了钡与偶氮胂Ⅲ、锌（钴）、邻菲口罗啉形成多元配合物的条件及其配合物组成。显色体系的摩尔吸光系数由二元配合物的２．１×１０４Ｌ·ｍｏｌ－１·ｃｍ－１提高到７．４×１０４Ｌ·ｍｏｌ－１·ｃｍ－１。用此方法，经过简单的分离后，可作硅钡合金中钡的光度法测定。     

5-Br-PADAP光度法测定磷铁中的钒

本文研究了在H2O2存在下，用5－Br-PADAP光度法，测定磷铁中钒的条件及配合物组成。配合物在波长590nm处有最大吸收，其摩尔吸光系数ε＝5.43×10^4L·mol^-1·cm^-1；钒量在2－20μg/25mL范围内符合比耳定律；钒与5－Br-PADAP的配合比为1：2。     

煤矸石中钒的测定研究

本文研究了钒与5－Br-PADAP及羟胺反应形成有色配合物的条件，配合物的最大吸收波长600nm，摩尔吸光系数ε＝2.8×10^4L·mol^-1·cm^-1，配合比V：5－Br－PADAP：羟胺＝1：1：1。钒含量在0－0.8mg/L范围内符合比耳定律，此法用于煤矸石中钒的测定结果满意。     

钛—邻苯二酚紫—EDTA—溴化十六烷基哟眵元配合物显色反应的研究

在 p H6 .2的 HAc- Na Ac缓冲液中 ,钛与邻苯二酚紫、EDTA、溴化十六烷基吡啶形成 1∶ 3∶ 2∶ 2的多元配合物 ,在 5 6 9.3nm处有最大吸收 ,摩尔吸光系数ε=5 .5× 1 0 4 L· mol- 1 · cm- 1 。钛量在 2—1 5 μg/ 2 5 m L范围内符合比耳定律。方法可用于工业硅中微量钛的测定。     

钡—偶氮胂Ⅲ—锌（钴）—邻菲罗啉多元配合物显色反应的研究

在近中性环境中，研究了钡与偶氮胂Ⅲ、锌（钴）、邻菲罗啉形成多元配合物的条件及其配合物组成。显色体系的摩尔吸光系数由二元配合物的2.1×10^4L·mol^-1·cm^-1提高到7.4×10^4L·mol^-1·cm^-1。用此方法，经过简单的分离后，可作硅钡合金中钡的光度法测定。     

新显色剂4,4'''' -二(2,6-二溴-4-硝基苯基重氮氨基)联苯与汞显色反应的研究

本文研究了新显色剂4，4'-二（2，6－二溴－4－硝基苯基重氮氨基）联苯与Hg(Ⅱ）的显色反应，在表面活性剂Triton X-100的存在下，于pH8.8的Na2B4O7-HCl缓冲溶液中，试剂与Hg（Ⅱ）形成2：2橙红色配合物，其最大吸收峰位于490nm，表观摩尔吸光系数为7.62×10^4L·mol^-1·cm^-1。Hg（Ⅱ）量在0－12μg/25mL范围内符合比耳定律。方法用于废水中微量Hg（Ⅱ）的测定，结果满意。     

Fe(Ⅲ)-苯基荧光酮-溴化十六烷基三甲胺显色反应的研究与应用

本文研究了在溴化十六烷基三甲胺存在下，苯基荧光酮与铁的显色反应。试验结果表明，显色的适宜酸度为pH等于7.3至10．5，配合物的摩尔吸光系数为1．09×105L·mol-1·cm-1，铁量在0－6μg·25mL-1范围内符合比耳定律。用于试样中铁的测定，灵敏度高，且简便可靠。     

钡-偶氮胂Ⅲ-锌(钴)-邻菲啰啉多元配合物显色反应的研究

在近中性环境中,研究了钡与偶氮胂Ш、锌(钴)、邻菲啰啉形成多元配合物的条件及其配合物组成.显色体系的摩尔吸光系数由二元配合物的2.1×104L·mol-1·cm-1提高到7.4×104L·mol-1·cm-1.用此方法,经过简单的分离后,可作硅钡合金中钡的光度法测定.     

槲皮素-铁配合物的光度法研究

在 p H=4 .0 5的 HAc- NH4 Ac缓冲体系中 ,槲皮素 ( Qu)与 Fe3+配位 ,该配合物在 4 30 nm处有最大吸收。 Fe3+的浓度在 2 .0× 10 -5— 1.2× 10 -4 mol· L-1之间与吸光度成线性关系 ,最低检出限为 2 .0× 10 -5mol· L-1。测得配合物的组成为 Fe3+∶ Qu=1∶ 2 ,稳定常数 K稳 =1.0× 10 8。     

缺陷碳纳米管限域金属Ti原子的理论研究

基于密度泛函第一性原理研究了金属原子Ti在原始、单空位缺陷(SV)、Stone-Wales(SW)缺陷碳纳米管内外的吸附情况.我们的计算结果表明金属Ti原子在缺陷碳纳米管内外结合能的排列顺序为:SVSW-zSW-xpristine(外吸附),SVSW-xSW-zpristine(内吸附).同时,我们通过吸附结构、电子密度和态密度等分析了Ti原子与碳纳米管的作用机制.其中,SV缺陷碳纳米管由于失去一个碳原子而形成了的三个悬键具有很强的结合能力,金属原子Ti在SV缺陷碳纳米管内外的吸附能力都是最强的.对于SW缺陷的碳纳米管,由于缺陷的位置不同,对于金属原子Ti内外吸附的能力也是不同的.因此,缺陷的存在能调节碳纳米管载体对Ti原子的吸附性能.     

纯钛电极上的表面增强拉曼光谱研究

采用机械粗糙、电化学氧化还原、化学刻蚀等方法对纯钛电极表面进行粗糙,在钛基底上获得了表面增强拉曼光谱(SERS)信号。初步的实验结果表明,采用机械粗糙和电化学氧化还原方法能够获得具有一定粗糙度的电极表面,但是该表面并不具有SERS活性。而采用氢氟酸化学刻蚀方法能够获得具有SERS活性的表面,并且成功检测到吡啶分子的表面增强拉曼信号。实验尝试了在不同条件下进行刻蚀,对酸的刻蚀浓度、刻蚀时间、外接电位等影响因素作了研究,结果发现基底的SERS活性随氢氟酸浓度增大而出现最佳条件,即氢氟酸浓度0.33 Wt%,刻蚀时间为5 min时的拉曼信号最好。实验以0.01 mol·L-1吡啶为探针分子,0.1 mol·L-1 KCl为电解质,在开路电位下成功地观察了钛电极上的表面增强拉曼光谱。     

Effect of Pt and Ti on Ni/Ag/(Pt or Ti)/Au p-ohmic contacts of GaN based flip-chip LEDs

In this paper, we report the dependence of Ni/Ag/diffusion barrier (D.B)/Au p-ohmic contact on Pt^D.B and Ti^D.B for GaN based flip-chip light emitting diodes (FC LEDs). It is shown that D.B metals have strongly influenced on the reflectance and contact resistivity of contacts. We present these results are caused by the variation of the morphology and atomic distribution due to D.Bs. The roles of Pt^D.B and Ti^D.B on Ni/Ag/D.B/Au p-GaN ohmic contacts are analyzed using the confocal laser scanning microscopy (CLSM) measurement and the secondary ion mass spectroscopy (SIMS) profiles in details.     

大口径掺钛蓝宝石晶体放大的实验研究

 分析了口径为80 mm的钛宝石晶体内的增益特性,对大口径钛宝石晶体中的泵浦光能量密度和泵浦光口径进行了优化设计。对于80 mm×17 mm的晶体,最佳工作光束口径为55 mm,泵浦能量为50 J;对于80 mm×30 mm的晶体,最佳工作光束口径为60 mm,泵浦能量为90 J,且其横向小信号增益远小于80 mm×17 mm晶体的。对影响大口径钛宝石晶体放大的横向放大自发辐射（ASE）和寄生振荡采用折射率匹配的包边技术进行了抑制。实验表明,该方法把允许横向增益从13提高到了2 100。实验系统为100 J绿光台面泵浦激光器,100 TW主放大器采用四程空间构型放大光路。80 mm×17 mm钛宝石晶体c轴水平放置,泵浦光和主激光均为水平偏振。当以泵浦光能量为49 J对主放大器进行双端泵浦,注入信号光能量为1.2 J,光束口径60 mm时,获得了14.2 J的放大光输出和286 TW的最高峰值功率。     

退火对钛/铜热等静压扩散连接界面的影响

钛/铜(Ti/Cu)作为ITER 第一壁Be/CuCrZr 热等静压连接中间过渡层,形成了多层中间金属相结构,容易在Ti/Cu 金属相之间产生裂纹等缺陷。采用CuCrZr 代替Be,经过与Be/CuCrZr 相同的热等静压工艺,制作了多个CuCrZr/Ti/Cu/CuCrZr 连接件,对Ti/Cu 连接接头进行深入分析。对连接件分别进行未退火、400℃和500℃ 退火处理,去应力退火后对接头强度和缺陷分布的影响进行了研究。研究结果表明,中间钛层的两侧都形成了三层Ti/Cu 扩散层,分别为Cu₄Ti、CuTi 和CuTi₂。纯铜侧的Cu₄Ti 厚度比CuCrZr 侧的厚,使得裂纹几乎全部分布于铜侧的Cu₄Ti 与CuTi 交界处,拉伸样品极易在此处发生脆性断裂。随着退火温度升高,裂纹的产生和扩展减少。     

Structure of Ti

We reproduce the gross experimental features of the low-lying negative parity states in ⁵¹Ti basing the structure on single n, 2p-1h n and core plus n states. Most calculations do not consider the latter modes as distinct alternatives.     

多波长钛宝石飞秒激光技术研究

报道了一种新的交叉锁模多波长钛宝石飞秒激光器的设计原理。该激光器能够同步产生两列或三列飞秒光脉冲。持续期短到２５ｆｓ的双波长脉冲调谐在７５５－８４８ｎｍ之间,同步精度约１０ｆｓ。     

Role of cleaning methods on bond quality of Ti coated glass/imidex system

Thin film materials are widely used in the fabrication of semiconductor microelectronic devices. In thin film deposition, cleanliness of substrate surface have become critically important as over 50% of yield losses in integrated circuit fabrication are caused by microcontamination [1]. There are many wafer cleaning techniques. The most successful approach for silicon wafer cleaning technique is RCA clean [2]. But for glass substrate it is still not known which procedure of cleaning is the best. This paper provides an understanding of the right way of glass wafer cleaning method, with a focus towards identifying good bond strength. Two wafer cleaning techniques have been used for cleaning glass substrates in the context of laser micro-joining of dissimilar substrates. First cleaning procedure involves two steps, first cleaning in acetone solution and then in DI water solution. After each step dried with N₂. Second cleaning procedure involves four steps, first cleaning with 1% Alconox solution, second in DI water, third in acetone solution and finally in a methanol solution and dried with N₂ after each step. Deposition of Ti thin film on top of these two types of substrate using DC magnetron sputtering method also showed better adhesion of Ti film on glass for the second type of cleaning method. Scanning electron microscopy (SEM) analyses of the lap shear tested failed surfaces for these two kinds of samples revealed strong bond for samples prepared by second cleaning method compared to first cleaning method. Characterization of these two sets of samples using X-ray photoelectron spectroscopy (XPS) has shown excellent contamination removal for the second cleaning method. This modification is believed to be due to reduction of carbon contamination.     

Messung der Kernradiusdifferenzen von46Ti,48Ti und50Ti durch elastische Elektronenstreuung

Ratios of differential cross sections for elastic electron scattering from⁴⁶Ti,⁴⁸Ti and⁵⁰Ti have been measured at 29 MeV and 58 MeV. A partial wave analysis, carried out for static Fermi-type nuclear charge distributions, yields differences of the r.m.s. radiiR _m ofR _m ⁴⁸ ?R _m ⁴⁶ =(?0,00₅±0,02₇) fm andR _m ⁵⁰ ?R _m ⁴⁶ =(0,00₃±0,02₁) fm, if the skin thickness parameterz of the charge density is assumed to be constant. If allowance is made for a change inz ofΔz/z=±5% and ±10%, then the errors increase by ±0,01₃ fm and ±0,02₈ fm, respectively. This indicates a relatively small change in nuclear r.m.s. radii below the magic neutron number N=28.     

EXAFS measurements of lattice vibrations of Ti and Cu in Ti

Lattice vibrations of Cu, Ti, and a dilute solution of Cu in Ti were studied by means of the EXAFS Debye-Waller factor. The pure metals had the same first-shell mean-squared relative displacement (MSRD). This was expected since they have similar moduli, atomic masses, and X-ray diffraction Debye-Waller factors. The MSRD was linear in the $\text{3}\text{2}$ power of absolute temperature, and was about twice as great as for Cu in Ti as for Ti or Cu. This difference suggests a difference in interatomic force constants between TiCu and CuCu or TiTi.