Determination of trace impurities in zircaloy-2 and tellurium by spark source mass spectrometry

Determination of trace impurities in zircaloy-2 and tellurium by Spark Source Mass Spectrometry (SSMS) is reported. The advantage of SSMS lies in the fact that along with metallic trace constituents even the nonmetallic impurities and gases including hydrogen can also be determined.     

Classification of the distribution of trace impurities by spark source mass spectrometry analysis

Spark source mass spectrometry in combination with principal component analysis and clustering analysis was used to investigate the trace element distributions in metallic samples. The analysis of Zn and Cu samples and a comparison with direct imaging secondary ion microscopy demonstrated the consistency of the approach.On leave from Department of Chemistry, Nanjing Normal University, Nanjing, People's Republic of China.     

Determination of trace constituents in high purity germanium tetrachloride by spark source mass spectrometry

Summary A procedure was developed for the determination of trace constituents at sub-ppm levels in high purity germanium tetrachloride (GeCl₄) by spark source mass spectrometry using the photoplate detection system. Experiments were conducted to study the loss of various elements present in the chloride form in GeCl₄ by using energy dispersive X-ray fluorescence. Relative sensitivity factors for various elements were determined using synthetically prepared samples. Blanks were determined for graphite powder and for quartz bi-distilled water. Intensities of the doubly charged ions for a number of elements were also determined and used for confirming the semi-quantitative results. The paper presents typical results obtained in the analysis of high purity GeCl₄ obtained from a commercial source. For a number of elements results were compared with those obtained with graphite furnace atomic absorption spectrometry.

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Bestimmung von Spurenbestandteilen in hochreinem Germaniumtetrachlorid mit Hilfe der Funkenionen-Massenspektrometrie

Zusammenfassung Ein Verfahren zur Bestimmung von Spurenbestandteilen in hochreinem GeCl₄ im sub-ppm-Bereich mit Hilfe der Funkenionen-MS mit Photoplattendetektion wurde ausgearbeitet. Untersuchungen über den Verlust verschiedener Elemente als Chloride wurden mit energiedispersiver Röntgenfluorescenz durchgeführt. Relative Empfindlichkeitsfaktoren wurden anhand synthetischer Proben bestimmt. Für Graphitpulver und bidestilliertes Wasser wurden Blindwerte bestimmt. IntensitÄten für zweifach geladene Ionen verschiedener Elemente wurden gemessen und zur BestÄtigung halbquantitativer Ergebnisse herangezogen. Typische Resultate für eine handelsübliche Probe werden angegeben. In einigen FÄllen wurden Vergleiche mit den Ergebnissen aus der Graphitofen-AAS angestellt.

     

Determination of trace cobalt in fruit samples by resonance ionization mass spectrometry

1-color 2-photon resonance ionization mass spectrometry (RIMS) with a new electro-thermal atomizer equipped with six filaments has been applied for quantitative analysis of trace cobalt in fruit samples. The efficient transition lines for sensitive detection were investigated in the wavelength range of 283-302 nm and a transition at 298.71 nm was chosen as an excited state for the determination of Co. A proper calibration curve for cobalt up to 1 ppb has been constructed with satisfactory results. The minimum detectible amount of cobalt in this RIMS system was identified as less than 5 pg. The content of Co in three different fruits, pear, apple and Korean mandarin orange, have been determined by adopting standard addition to the fruit sample juice. The content of the Co in 5 μl of apple, pear and Korean mandarin juice was identified as 150, 45 and 100 pg, respectively.     

Analysis of tellurium by spark source mass spectrometry

Summary Three tellurium standards were analyzed by both spark source mass spectrometry (SSMS) and graphite furnace atomic absorption spectrophotometry (GFAAS). From these results relative sensitivity coefficients (RSC) for spark source mass spectrometry were derived for 24 elements.With these RSC's SSMS results within a factor 1.5 from the GFAAS values could be obtained for the determination of various impurities in tellurium. A comparison is made between SSMS, GFAAS and glow discharge mass spectrometry (GDMS) for the analysis of 4–6 N tellurium samples.

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Analyse von Tellurium mit Hilfe der Funkenionisations-Massenspektrometrie

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Dedicated to Prof, Dr. G. Tölg on the occasion of his 60th birthday     

Determination of rare earths in selected rare earth matrices by spark source mass spectrometry

Three methods of preparing rare earth samples for mass spectrographic analysis are presented. Techniques for adding appropriate internal standards are described and relative sensitivity factors for rare earth impurities in rare earths, lanthanum, yttrium and scandium matrices are presented. Although indium has some value as an internal standard in rare earth samples, best analytical results are obtained when selected rare earths are used as internal standards.     

Chemical analysis and distribution investigation of trace elements in indium matrix by spark source mass spectrometry

Summary High-purity indium was analysed by spark source mass spectrometry, using electrical and photoplate detection. For the calibration of the differences in elemental sensitivity, a standard sample was prepared in which 10 impurities were determined by graphite furnace atomic absorption spectrometry. In this way accuracies of less than 40% were obtained for relatively homogeneous elements at ppm and sub-ppm level. About 40 elements could be determined with detection limits of 10 to 30 ppb. Two pattern recognition methods, principal component analysis and clustering analysis, were applied to obtain information on trace element distribution, which indicated that a number of elements were strongly spatially correlated in the analysed sample.

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Chemische Analyse und Verteilungsbestimmung von Spurenelementen in Indium-Matrix durch Funkenquellen-Massenspektrometrie

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On leave from: Department of Chemistry, Nanjing Normal University, Nanjing, People's Republic of China     

Analysis of geothermal waters by spark source mass spectrometry

Summary Although the analysis of thermal water by spark-source mass spectrometry (SSMS) is rather timeconsuming, it allows the detection of about 20 elements of geochemical interest down to the ppb-level. A physical preconcentration is proposed in order to collect elements having quite different chemical properties, e.g. alkalis, transition elements, and elements occurring in anionic form. The relative sensitivity factors appear to be rather independent of the salt content of the graphite electrodes. Contrary to neutron activation analysis, SSMS has a quite uniform elemental sensitivity, and allows to determine elements for which neutron activation is not suitable, e.g. Sn and Pb. The precision of SSMS is however by a factor of about 2 worse than that obtained for neutron activation.

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Analyse von geothermalen Wässern mittels Funken-Massenspektrometrie

Zusammenfassung Die Analyse von Thermalwasser mittels Funken-Massenspektrometrie ist zwar zeitraubend, sie gestattet aber die Bestimmung von etwa 20 geochemisch interessanten Spurenelementen im ppb-Bereich. Es wird eine physikalische Anreicherung vorgeschlagen, um Elemente mit ganz verschiedenen chemischen Eigenschaften erfassen zu können, z. B. die Alkaligruppe, die Elemente der Übergangsreihe und anionische Verbindungen. Die relativen Empfindlichkeitsfaktoren sind vom Salzgehalt in den Graphitelektroden ziemlich unabhängig. Wegen ihrer gleichmäßigen Elementempfindlichkeit liefert die Funken-Massenspektrometrie Auskunft über den Gehalt von Elementen, die mit Neutronenaktivierung nicht erfaßt werden können, wie z. B. Sn und Pb. Ihre Reproduzierbarkeit ist aber etwa zweimal schlechter.

     

Analysis of radioactive metals by spark source mass spectrometry

A spark source mass spectrograph with photographic plate recording has been adapted for the analysis of plutonium and americium metals. Over seventy elements can be determined simultaneously in these metals. A comparison has been made between results obtained by mass spectrography and by conventional methods for impurity elements. The operations involved in handling radioactive materials in the mass spectrograph are also discussed.     

Method for increasing the accuracy of the determination of elemental impurities in metals by spark source mass spectrometry

This paper presents a method for increasing the accuracy in the determination of impurities in metals by spark source mass spectrometry (SSMS). The method is based on the application of a parametric equation to calculate sensitivity coefficients. The parameters of this equation are determined from results obtained by analysis of an appropriate standard material. Concentrations in the sample of elements certified in the standard material are determined using experimental values of sensitivity coefficients, while the concentrations of remaining elements in the test sample are determined using coefficients calculated from the proposed parametric equation.     

Determination of trace impurities in high-purity cadmium by high-resolution inductively coupled plasma mass spectrometry.

Trace impurities in high-purity cadmium were determined by high-resolution inductively coupled plasma mass spectrometry (HR-ICP-MS). To overcome some potentially problematic spectral interference, measurements were acquired in both medium and high-resolution modes. The matrix effects due to the presence of excess HCl and cadmium were evaluated. The optimum conditions for the determination were tested in this experiment and discussed. The detection limits ranged from 0.01 to 0.27 microg g-1, depending on the elements. The results for the determination of 22 trace elements in high-purity cadmium are presented.     

电感耦合等离子体-质谱法测定高纯硫粉末中17种痕量杂质

建立电感耦合等离子体-质谱(ICP-MS)法测定高纯硫粉中Si、P、V、Cr、Mn、Ni、Co、Cu、As、Zn、Zr、Cd、In、Sb、Te、Pb、Bi等17种痕量金属杂质含量的方法。样品用HClO4溶解后挥发硫基体,使样品中杂质元素得到富集,各杂质元素的方法检出限为0.1～50ng/g。方法加标回收率为83%～117%。各杂质元素均为10ng/mL的混合标准溶液平行7次测定的相对标准偏差均小于5%。该方法能够满足纯度为99.999%～99.9999%的高纯硫样品中杂质测定的需要。     

电感耦合等离子体质谱法测定高纯氧化钽中28种痕量杂质元素

建立了用电感耦合等离子体质谱仪(ICP-MS)测定高纯氧化钽中28种痕量杂质元素的方法。讨论了质谱干扰及接口效应,采用标准加入法消除基体效应。各元素的方法检出限为0.001~0.1μg/g,回收率为90%~115%,方法适用于纯度为99.999%的高纯氧化钽中痕量杂质元素的测定。     

Determination of trace impurities in cosmetic intermediates by ion mobility spectrometry

The cosmetic and pharmaceutical industries are continuously demanding fast, efficient, cost-effective analytical methods to monitor production processes and assure end-product quality. The presence of residual reagents or impurities formed during a synthetic process can have an adverse impact on product quality, assurance of which requires using increasingly sensitive analytical methods to facilitate the detection and/or determination of toxic compounds with potentially hazardous effects on consumer's health. In this work, we assessed the potential of ion mobility spectrometry (IMS) for the detection and quantitation of dimethylaminopropylamine (DMAPA) residues in stearamidopropyldimethylamine (SAPDA) production samples. The influence of instrumental variables including solvent, solution drying time, injected volume and volatilization temperature was examined. The ensuing analytical method takes less than 1 min per analysis and uses only a few microlitres of sample. The calibration curve was linear over the DMAPA concentration range 0.030-0.500 μg mL(-1). The proposed method was validated for use in control processes. The complex plasmagram for amidoamines allows the origin of cosmetic oils to be easily, expeditiously identified. Based on the results, IMS holds great promise for the qualitative and quantitative determination of the studied amide and various others in cosmetic products.     

Influence of spark generator parameters in the analysis of graphite electrodes by spark source mass spectrometry

Spark source mass spectrometric analyses of doped carbon samples were performed at different pulse lengths, pulse frequencies and breakdown voltages. The pulse length and pulse frequencies had no influence on the analysis. The relation between breakdown voltage, spark gap and sample matrix was determined. With increasing breakdown voltage, the abundance of the multiply charged ions was found to decrease, whereas the abundance of the cluster ions increased. The breakdown voltage was also found to affect the absolute and relative intensities of different elements in different manners. Interpretation of these results led to some new considerations on the phenomena in a spark discharge.     

Matrix effects and analysis of biological material by spark source mass spectrometry

Summary Spark-source mass spectrometric analyses of synthetic simulated biological samples were performed to determine the importance of matrix effects. A correlation between the variation of the relative sensitivity coefficients (RSC's) and the spark plasma composition, hence plasma temperature, was found. The determined RSC's were used in the analysis of four biological standard reference materials. An accuracy of 10–13% and detection limits between 0.005 and 0.5 ppm were obtained during analysis under normal conditions.

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Matrixeffekte und Analyse von biologischem Material mit Hilfe der Funkenionen-Massenspektrometrie

Zusammenfassung Um die Bedeutung von Matrixeffekten zu untersuchen, wurden Analysen von synthetischem biologischem Material mit der Funkenquellen-Massenspektrometrie durchgeführt. Dabei wurde eine Beziehung zwischen der Veränderung der relativen Empfindlichkeitskoeffizienten und der Zusammensetzung des Funkenplasmas (und damit der Plasmatemperatur) festgestellt. Die bestimmten Empfindlichkeitskoeffizienten wurden zur Analyse von vier biologischen Standardreferenzmaterialien eingesetzt. Unter normalen Bedingungen wurde eine Genauigkeit von 10–13% und Nachweisgrenzen zwischen 0,005 und 0,5 ppm erreicht.

     

超高效液相色谱-静电场轨道阱高分辨质谱法测定硝苯地平中痕量基因毒性杂质

建立了测定硝苯地平中基因毒性杂质2、6和12的超高效液相色谱-静电场轨道阱高分辨质谱法(UHPLC-Orbitrap HRMS).样品以甲醇为溶剂,提取后直接进样分析.采用ACE EXCELTM 3 C18-AR色谱柱(150 mm×4.6 mm,3μm)分离,流动相为甲醇-0.1％甲酸水(65:35,v/v),等度洗...