原子力显微镜在高分子领域的应用

原子力显微镜在其发现不久即应用于高分子领域,弥补了扫描隧显微镜不能观测非导电样品的缺欠,因而受到重视,应用范围也不断扩展。最近几年,原子力显微镜的应用已由对聚合物表面几何形貌的观测发展到深入研究高分子的米级结构和表面性能等新领域,并由此导出了若干新概念和新方法。本文仅对当前原子力显微镜应用于高分子和高分子材料研究的几个重要方面举例进行介绍。     

相分离高分子共混薄膜退火和准淬火的原位原子力显微镜研究

近年来,高分子共混薄膜在选择性渗透膜、生物材料、润滑剂、粘结剂、光敏电阻平板印刷、光电器件及纳米尺寸表面图案化等方面的研究日益受到重视,应用前景也十分可观,然而,由于其相容性较差,高分子共混物常发生相分离,相对于本体,表面的分子链具有更大的自由度,因此表面高分子链的热运动状态与本体有很大差别,为控制因相分离而导致的相区尺寸,人们必须同时对相分离热力学及动力学行为进行研究。     

基于原子力显微镜的高分子单分子力学研究

原子力显微镜(AFM)从根本上改变了人们对单个原子和分子的作用和认识方式。单分子力谱是基于原子力显微镜力的测量方法。概速了近年来利用基于原子力显微镜的单分子力谱研究单个高分子分子内及分子闻作用力的进展。     

原子力显微镜

<正>德国Bruker MultiMode 8型原子力显微镜德国Bruker MultiMode 8型原子力显微镜(AFM)的系统配置为MultiMode 8型主系统+NanoScope V型控制器,是全球噪音最低,分辨率最高的扫描探针显微镜;其采样速度高达6 MH,可同时进行8通道实时数据采集和成像;能对高分子、生物、化工、食品、医药等各种材料和样品进行纳米区域的物理性质包括形貌进行探测,或者直接进行纳米操纵;被测样品可为导体、半导体或绝缘体,不需要对被测样品作特殊处理,对样品损害     

原子力显微镜针尖诱导聚氧乙烯熔体结晶的研究

原子力显微镜(AFM)是研究高分子结晶行为的一种重要实验手段.在使用AFM原位观察高分子结晶时,为保证能真实地反映结晶过程,一个必须注意的问题是要避免AFM针尖的影响.与此同时,人们考察了在AFM扫描时针尖诱导高分子结晶成核的情况.若使用AFM接触模式(contactmode),扫描时容易造     

原子力显微镜原位观察球晶界面上片晶的生长

当结晶聚合物由熔融冷却或从浓溶液中析出结晶时 ,在不存在应力和流动的情况下 ,一般形成球晶 .球晶在一定的生长时期内呈现球形外观 ,在偏光显微镜下通常呈现Maltese黑十字消光图样 .球晶作为一种常见的结晶形态 ,由片晶堆积而成[1,2 ] .Keith和Padden认为形成球晶的体系包含杂质和聚合物链 ,由于杂质在片晶生长界面的富集导致片晶产生小角度分叉 ,这样片晶能填满球状的空间[1,2 ] .近年来的研究表明球晶是由一个片晶开始生长 ,片晶在生长过程中不断的诱导成核使片晶分叉 ,首先形成片晶捆束 ,然后片晶向各个方向发散生长 ,最终形成球晶[3…     

原子力显微镜在聚烯烃研究中的应用

聚烯烃材料因其卓越的性能和较低的价格广泛应用于工农业、医疗卫生、军事、日常生活等领域。为了拓展聚烯烃材料的应用范围,表面功能化聚烯烃、聚烯烃与其他材料的共混物以及聚烯烃/无机纳米复合材料等得到了发展,并成为该领域的研究热点。原子力显微镜(AFM)是利用一个极为尖锐的针尖与样品间的相互作用力进行材料表面的形貌、物理和化学信息探测的一种技术,它在上述聚烯烃研究中发挥着重要作用。表面粗糙度是聚烯烃材料表面功能化研究中的重要参数之一,AFM技术则能够给出准确的表面粗糙度信息。由于AFM技术能够直观地观察各组分的混合状态及相分离情况,因此AFM技术成为聚烯烃与其他材料共混研究的重要手段之一。此外,AFM是一种非常有效的微纳米结构形貌的表征方法,在聚烯烃的结晶研究方面也得到了应用。本文简单介绍了AFM表面形貌观测的工作原理和工作模式,主要阐述AFM在聚烯烃材料研究中的三个主要应用:材料表面粗糙度、共混相分离以及结晶研究。     

原子力显微镜在生物大分子结构研究中的应用进展

评述了原子力显微镜（ａｔｏｍｉｃ ｆｏｒｃｅ ｍｉｃｒｏｓｃｏｐｙ,ＡＦＭ）的成镜模式与探针技术的发展以及在脱氧核糖核酸、蛋白质和多糖等生物大分子结构研究中的应用进展,并展望了原子力显微镜在此领域的发展前景。     

高分子结晶理论的新概念与新进展

回顾了传统的高分子结晶成核与生长模型,指出了该模型在应用中遇到的一些问题;同时总结了Strobl根据近年小角X射线散射结果提出的高分子结晶新机理-中介相机理.介绍了Strobl等构建的热动力学图解对熔体、中介相和片晶的转变过程,阐述了各相间的平衡转变温度、潜在的转变热以及表面自由能,说明了处于熔体和晶体之间的中介相的热动力学性质是理解高分子结晶过程的重要依据.     

Observation of Organic Thin Film Surface by Atomic Force Microscopy

The 8-hydroxyquinoline neodymium(Ndq3) organic thin films deposited on the cleaned indium/tin oxide (ITO) at different deposition rates with the same vacuity (133.3×10^-5 Pa) were revealed by atomic force microscopy (AFM). Organic devices with one layer of Ndq3 as the e-type conductive material at different deposition rates sandwiched between ITO and aluminum electrodes have been fabricated. respectively. Evidence suggests that the current-voltage (I-V) characteristics were determined by the uniformity of organic film which was controlled by the deposition conditions.     

原子分辨显微分析技术研究进展

非接触原子力显微技术(NC-AFM)近年来发展迅速. NC-AFM对单个分子的成像和谱学实现了原子分辨和单个化学键分辨. NC-AFM自身功能的拓展及其与不同探针技术的联用将为材料、物理、化学和生命科学有关的研究提供崭新的思路. 本文首先介绍NC-AFM和qPlus 传感器的基本原理, 然后讨论原子尺度的相互作用力和短程力的精确测量, 总结近年来NC-AFM在原子尺度的化学结构成像、化学识别、电子结构性质分析以及原子操纵技术中的研究进展, 并讨论了开尔文探针力显微技术(KPFM)在局域接触势差(LCPD)测量方面的应用. 最后展望了NC-AFM面临的挑战和发展机遇.     

Atomic Force Microscopy Studies of SnO2 Thin Film Microstruc tures Deposited by Atomic Layer Epitaxy

 ALE-grown, rutile-type SnO₂ thin films and gas sensor structures based thereupon were studied by AFM with main emphasis on cross-sectional investigations (X-AFM). On glass substrates the polycrystalline films showed a preferred orientation which depended on the film thickness and growth temperature while on single crystal sapphire () the growth was heteroepitaxial. For the X-AFM studies various sample preparation techniques were investigated but only ion beam etching gave satisfactory results and revealed substructures in the sensor structure consisting of Pt and SnO₂ layers on a silicon substrate.     

Atomic Force Microscopic Studies of Porous TiO2 Thin Films Prepared by the Sol-Gel Method

Porous titanium dioxide thin films were prepared from alkoxide solutions with and without polyethylene glycol (PEG) by the sol-gel method on soda-lime glass. The effects of PEG addition to the precursor solution on the microstructure and roughness of the resultant thin films were investigated by atomic force microscopy (AFM). It was found that TiO₂ films prepared from the precursor solution without PEG had granular microstructure and flat texture, and was composed of about 100 nm spherical particles. With an increase in the times of coating cycles, the roughness of films decreased and the size of TiO₂ particles increased. On the other hand, the larger the amount and molecular weight of the added PEG in precursor solutions, the larger the diameter and the depth of pores in the resultant films on the decomposition of PEG during heat-treatment. The surface of the films was also rougher, and fewer pores were produced during heat-treatment. The mechanism of porous structure formation in the TiO₂ films was explained using the principle of spinodal phase separation.     

Understanding the Rhodopsin Worldview Through Atomic Force Microscopy (AFM): Structure,Stability, and Activity Studies

Rhodopsin is a G protein-coupled receptor (GPCR) present in the rod outer segment (ROS) of photoreceptor cells that initiates the phototransduction cascade required for scotopic vision. Due to the remarkable advancements in technological tools, the chemistry of rhodopsin has begun to unravel especially over the past few decades, but mostly at the ensemble scale. Atomic force microscopy (AFM) is a tool capable of providing critical information from a single-molecule point of view. In this regard, to bolster our understanding of rhodopsin at the nanoscale level, AFM-based imaging, force spectroscopy, and nano-indentation techniques were employed on ROS disc membranes containing rhodopsin, isolated from vertebrate species both in normal and diseased states. These AFM studies on samples from native retinal tissue have provided fundamental insights into the structure and function of rhodopsin under normal and dysfunctional states. We review here the findings from these AFM studies that provide important insights on the supramolecular organization of rhodopsin within the membrane and factors that contribute to this organization, the molecular interactions stabilizing the structure of the receptor and factors that can modify those interactions, and the mechanism underlying constitutive activity in the receptor that can cause disease.     

原子力显微镜在多糖结构研究中的进展

简述了原子力显微镜(AFM)的工作原理和特点,以及在多糖,特别是在淀粉结构研究中的进展。     

质膜微囊的分离及原子力显微镜研究

采用非去污剂在OptiPrep梯度中漂浮超声处理质膜的方法, 从鼠肺中分离质膜微囊, 在原子力显微镜下以不同条件进行了观察. 该非去污剂法能分离出完整的质膜微囊, 在去离子水稀释500倍的条件下得到了清晰的质膜微囊的原子力显微镜图片, 建立了一种新的快速分离完整质膜微囊的方法和用原子力显微镜观测质膜微囊结构的新方法.     

原子力显微镜-荧光显微镜联用技术在活细胞单分子检测中的应用

原子力显微镜(Atomic force microscopy,AFM)及荧光显微镜(Fluorescence microscopy,FM)是目前活细胞单分子分析检测中最常用的两种工具.结合两种显微镜的优势,发展高时空分辨、多功能的AFM-FM联用技术成为近年该领域的研究热点.本文简述了AFM单分子力谱和FM单分子荧光成像的原理,总结了AFM-FM联用系统在仪器研制方面的发展概况,并结合本课题组在应用AFM-FM联用技术研究细胞膜上配受体相互作用等方面的工作,介绍了其在活细胞单分子检测中的应用进展.     

原子力显微镜及其在电化学和电分析化学中的应用

本文评述了原子力显微镜原理和技术及其在现场电化学和电分析化学领域中的应用，并展望了扫描隧道显微镜和原子力显微镜在电化学和电分析化学中的发展方向。     

Film thickness dependence of the domain size in weakly incompatible thin polymer blend films

The surface morphology of thin polymer blend films of deuterated polystyrene (dPS) and polyparamethylstyrene (PpMS) is investigated with scanning force microscopy (SFM) and optical microscopy. From a statistical analysis of the data the most prominent in-plane length picturing the domain size as a function of the blend film thickness is determined. In ultra-thin films surface patterns directly after preparation are absent, whereas for thicker films a linear dependence is observed. After a relaxation towards equilibrium, resulting from annealing or storage under toluene vapor, the power law observed changes for ultra-thin films and remains unchanged for thicker films. Received: 27 July 2000 Accepted: 30 October 2000