Experimentally observed orientation of C60F18 molecules on the nickel single crystal (100) surface

The angular dependence of near edge X-ray absorption fine structure (NEXAFS) spectra has been obtained in the vicinity of carbon and fluorine 1s absorption edges in a monolayer film of polar fullerene fluoride (C₆₀F₁₈) molecules on a Ni(100) substrate. The fine structure of the spectra has been identified according to experimental data via calculations based on the density functional theory, and the angular dependence of the spectra has been explained. The orientations of structural molecular fragments are determined from the angular dependence of the NEXAFS spectra. It is demonstrated that the electric dipole moment of a C₆₀F₁₈ molecule is oriented along the normal to the substrate surface with an accuracy of 5°.     

Structural and compositional mapping of a phase-separated Langmuir–Blodgett monolayer by X-ray photoelectron emission microscopy

The structure and composition of phase-separated Langmuir–Blodgett monolayer films comprised of mixtures of arachidic acid (C₁₉H₃₉COOH) and perfluorotetradecanoic acid (C₁₃F₂₇COOH) were characterized using a combination of X-ray photoelectron emission microscopy (X-PEEM), secondary electron emission microscopy (SEEM) and atomic force microscopy (AFM). X-PEEM provides high lateral spatial resolution and is directly sensitive to the elemental and chemical (functional group) composition of these ultrathin films through the chemical sensitivity of NEXAFS spectroscopy; AFM provides high-resolution imaging, both in terms of lateral and vertical (height) film topography. SEEM provides additional structural and electronic information through work function and electron scattering effects. The combination is used for chemical mapping of the phase-separated domains in the monolayer film. Our results directly confirm previous AFM measurements that suggested that the discontinuous domains are enriched in arachidic acid, whereas the surrounding continuous domain is a mixture of both arachidic acid and perfluorotetradecanoic acid.     

Polymerization of solid C<Subscript>60</Subscript> under C<Stack><Subscript>60</Subscript><Superscript>+</Superscript></Stack> cluster ion bombardment

The structure transformation occurring in fullerene film under bombardment by 50 keV C₆₀⁺ cluster ions is reported. The Raman spectra of the irradiated C₆₀ films reveal a new peak rising at 1458 cm⁻¹ with an increase in the ion fluence. This feature of the Raman spectra suggests linear polymerization of solid C₆₀ induced by the cluster ion impacts. The aligned C₆₀ polymeric chains composing about 5–10 fullerene molecules have been distinguished on the film surface after the high-fluence irradiation using atomic force microscopy (AFM). The surface profiling analysis of the irradiated films has revealed pronounced sputtering during the treatment. The obtained results indicate that the C₆₀ polymerization occurs in a deep layer situated more than 40 nm below the film surface. The deep location of the C₆₀ polymeric phase indirectly confirms the dominant role of shock waves in the detected C₆₀ phase transformation.     

Determination of C60/C70 ratios in fullerene mixtures and film characterization by scanning tunneling microscopy

Fullerene powder mixtures with different C₆₀/C₇₀ ratios have been analyzed by a variety of techniques, and results have been compared. The fullerence mixtures have been characterized as solutions in n-hexane by high-pressure liquid chromatography (HPLC) and UV-VIS spectroscopy. Thin films of fullerenes on Au(111) have been prepared from the mixtures by sublimation. The sublimation process has been studied by simultaneous thermogravimetric and differential thermal analyses. Thin fullerene films on Au(111) have been investigated by scanning tunneling microscopy (STM). The STM images show primarily two types of ballshaped molecules arranged in a lattice with hexagonal symmetry (fcc(111) face, nearest neighbour distance: 1 nm). The two species differ in diameter. STM images of films made of mixtures of different C₆₀/C₇₀ ratios show that C₇₀ molecules display a larger apparent diameter (0.8 nm) and corrugation than C₆₀ molecules (0.7 nm). The C₆₀/C₇₀ ratios obtained by counting the corresponding molecular species in the STM images of the thin films are compared to the C₆₀/C₇₀ ratios determined by HPLC on hexane solutions of the mixtures. The observed differences might be explained by different rates of sublimation for the two species. The STM images reveal film defects (vacancies and boundaries) and dynamic processes (displacement of C₇₀ molecules and vacancies). In films prepared to have a C₆₀ coverage of less than one monolayer, stable structural units of the C₆₀(111) surface consisting of three or seven C₆₀ molecules are revealed by STM. Occasionally, substructure within individual fullerene molecules is observed.     

Enhanced cohesion of photo-oxygenated fullerene films: A new opportunity for lithography

The irradiation of sublimed fullerene (C₆₀ and C₇₀) thin films with ultraviolet light in an oxygen-rich ambient has been found to lead to a substantially increased cohesive energy in the fullerene solid. The decreased solubility and lower vapor pressure of the phototransformed material enables wet (organic solvents) or dry (thermal or photon-induced sublimation) development of photo-defined negative images. One micrometer wide lines with good edge definition are demonstrated. X-ray, infrared, optical absorption, and high performance liquid chromatography reveal that photo-oxygenated C₆₀ retains its fcc crystal structure but with a substantial fraction of the C₆₀ molecules modified with carbonyl (C=O) bonds.     

Electronic interactions in two-dimensional polymers of the C60 fullerene

The electronic structure of tetragonal and rhombohedral polymers of the C₆₀ fullerene is investigated using x-ray emission spectroscopy. It is found that, compared to the C₆₀ molecular crystals, the formation of intermolecular covalent bonds in two-dimensional layers of the C₆₀ fullerene polymers leads to a broadening of the maxima in the CK _α x-ray emission spectra, a decrease in the density of high-energy states, and an increase in the width of the valence band of the polymer. The experimental data are interpreted by analyzing the results of the calculations performed within the density functional theory for the C₆₀ fullerene cage forming eight and twelve covalent bonds. It is shown that the electronic interactions between C₆₀ molecules in the polymerized layers are provided by two types of molecular orbitals located at energies 0.5–3.0 and ∼5.0 eV below the energy of the Fermi level.     

Interactions between glycine and amorphous solid water nanoscale films

The interactions of glycine (Gly) with amorphous solid water (ASW) nanolayers (≤ 100 ML), vapor-deposited on single crystalline AlO_x surfaces at 100 K, have been investigated by near-edge X-ray absorption fine structure spectroscopy (NEXAFS) at the oxygen K-edge, temperature-programmed thermal desorption (TPD), X-ray photoelectron spectroscopy (XPS), and temperature-dependent work function measurements. Gly-on-ASW, ASW-on-Gly, and Gly on top of ASW-on-Gly ultrathin films have been fabricated. In contrast to the uniform ASW films grown directly on the hydrophilic AlO_x, water molecules adsorb on the hydrophobic Gly films in the form of 3D ASW clusters. This leads to significant differences in the NEXAFS and work function data obtained from ASW-on-AlO_x and ASW-on-Gly films, respectively. Furthermore, these structural differences influence the chemical state of Gly molecules (neutral vs. zwitterionic) adsorbed on top of ASW films. N1s XPS measurements revealed an increased amount of neutral Gly molecules in the film top-deposited on the ASW-on-Gly structure in comparison to the neutral Gly in the films directly condensed on AlO_x or grown on the ASW substrate. H₂O TPD spectra demonstrate that the crystallization and desorption processes of ASW are affected in a different way by the Gly layers, top-deposited on to ASW-on-AlO_x and ASW-on-Gly films. At the same time, Gly adlayers sink into the ASW film during crystallization/desorption of the latter and land softly on the alumina surface in the form of zwitterionic clusters.     

The study of polystyrene-fullerene solid-phase composites

Polystyrene-based films containing from 0 to 45 mol % of C₆₀ fullerene are investigated. It is found that the introduction of fullerene increases the molecular packing density of polystyrene chains, thus affecting the transport of small molecules through the polymer films. Gas diffusion through the composite films is slower than through the polystyrene films, while the gas-distributing properties of the composites are higher. The dielectric relaxation method shows that the solution-grown films retain the cluster state of fullerene. When the films containing more than 0.15 mol % of fullerene are heated above the glass transition temperature of polystyrene away from air, the relaxation time of the α transition in polystyrene is found to increase. This effect is associated with strong chain interaction via fullerene molecules incorporated into polystyrene-C₆₀ complexes. The NMR spectroscopy method allows us to observe the typical changes in the composites.     

Surface depth analysis for fluorinated block copolymer films by X-ray photoelectron spectroscopy using C60 cluster ion beam

X-ray photoelectron spectroscopy (XPS) using fullerene (C₆₀) cluster ion bombardment was applied to films of a fluorinated block copolymer. Spectra so obtained were essentially different from those using Ar ion beam. Structure in the surface region with the depth down to 60 nm drawn on the basis of XPS with C₆₀ beam was essentially the same as the one drawn by the result using dynamic secondary ion mass spectrometry, which is a well-established method for the depth analysis of polymers. This implies that XPS using C₆₀ beam enables one to gain access to the depth analysis of structure in polymer films with the depth range over the analytical depth of conventional XPS, that is, three times inelastic mean-free path of photoelectrons.     

Structural, magnetic and electronic structure studies of Mn doped TiO2 thin films

We report structural, magnetic and electronic structure study of Mn doped TiO₂ thin films grown using pulsed laser deposition method. The films were characterized using X-ray diffraction (XRD), dc magnetization, X-ray magnetic circular dichroism (XMCD) and near edge X-ray absorption fine structure (NEXAFS) spectroscopy measurements. XRD results indicate that films exhibit single phase nature with rutile structure and exclude the secondary phase related to Mn metal cluster or any oxide phase of Mn. Magnetization studies reveal that both the films (3% and 5% Mn doped TiO₂) exhibit room temperature ferromagnetism and saturation magnetization increases with increase in concentration of Mn doping. The spectral features of XMCD at Mn L_3,2 edge show that Mn²⁺ ions contribute to the ferromagnetism. NEXAFS spectra measured at O K edge show a strong hybridization between Mn, Ti 3d and O 2p orbitals. NEXAFS spectra measured at Mn and Ti L_3,2 edge show that Mn exist in +2 valence state, whereas, Ti is in +4 state in Mn doped TiO₂ films.     

Investigating the fine structure of near-edge X-ray absorption in the molecular spectra of C60F18 adsorbed on a single nickel crystal

Angular dependences of the fine structure of near-edge X-ray absorption (NEXAFS) of carbon C1s spectra are obtained for a monolayer film of C₆₀F₁₈ polar molecules on a Ni (100) substrate. The fine structure and angular dependences of these spectra are interpreted using calculation data obtained by the density functional method upon fitting NEXAFS spectra by the set of trial functions. It is shown that during deposition, the dipole moment of molecules is oriented perpendicular to the surface and fluorine atoms are the ones closest to the surface.     

X-ray photoelectron spectroscopy and near-edge X-ray-absorption fine structure of C60 polymer films

We report core-level and valence-band X-ray photoelectron spectroscopy (XPS) and carbon [ _]K near-edge X-ray-absorptionfine structure spectroscopy (NEXAFS) results of plasma-polymerized C₆₀. In comparison with evaporated C₆₀ the C 1s peak is broader and asymmetric for the C₆₀ polymer and its shake-up satellites diminished. Furthermore, the features of the valence-band as well as the features of the π^* antibonding orbitals of the C₆₀ polymer are broader and reduced in intensity. Changes in the electronic structure are attributed to the polymerization of C₆₀, the post-plasma functionalization of the surface by oxygen after exposure to atmosphere, and the occurrence of amorphous carbon. Received: 28 May 1999 / Accepted: 31 August 1999 / Published online: 8 March 2000     

Pressure- and temperature-induced transformations in crystalline polymers of C60

The great advantage of the C₆₀ molecule is its potential for polymerization, due to which the molecule can be the building block of new all carbon materials. In addition, it contains, both sp ² and sp ³ hybridized carbon atoms, which allows synthesizing new carbon materials with desired physicochemical properties using both types of carbon bonding. The one- and two-dimensional polymeric phases of C₆₀ are prototype materials of this sort. Their properties, especially polymerization under pressure and room temperature via covalent bonding between molecules belonging to adjacent polymeric chains or polymeric layers, can be used for further development of new materials. The present review focuses on the study of the pressure-induced polymerization and thermodynamic stability of these materials and their recovered new phases by in-situ high-pressure Raman and X-ray diffraction studies. The phonon spectra show that the fullerene molecular cage in the high-pressure phases is preserved, while these polymers decompose under heat treatment into the initial fullerene C₆₀ monomer.     

Vapour phase formation of amino functionalised Si3N4 surfaces

Self-assembled monolayer (SAM) formation of silanes on SiO₂ surfaces has been extensively studied. However, SAMs formed on silicon nitride (Si₃N₄) substrates have not been explored to the same level as SiO₂, even though they are of technological interest with a view to the chemical modification of microelectromechanical systems (MEMS). Therefore, this article presents the formation and characterisation of 3-aminopropyltrimethoxysilane (APTMS) SAMs on Si₃N₄ substrates from solution phase and vapour phase, compared to the well characterised APTMS SAMs formed on SiO₂ surfaces. Contact angle, atomic force microscopy (AFM), X-ray photoelectron spectroscopy (XPS) and ellipsometric data indicate the formation of APTMS SAMs (0.55 nm ellipsometric thickness) after 60 min immersion of either SiO₂ or Si₃N₄ substrates in APTMS solution (0.5 mM in EtOH). By comparison Si₃N₄ substrates exposed to APTMS vapour, at 168 mbar for 60 min, result in the formation of the equivalent of a bi or trilayer of APTMS.     

Processing of C<Subscript>60</Subscript> thin films by Matrix-Assisted Pulsed Laser Evaporation (MAPLE)

Thin films of fullerenes (C₆₀) were deposited onto silicon using matrix-assisted pulsed laser evaporation (MAPLE). The deposition was carried out from a frozen homogeneous dilute solution of C₆₀ in anisole (0.67 wt%), and over a broad range of laser fluences, from 0.15 J/cm² up to 3.9 J/cm². MAPLE has been applied for deposition of fullerenes for the first time and we have studied the growth of thin films of solid C₆₀. The fragmentation of C₆₀ fullerene molecules induced by ns ablation in vacuum of a frozen anisole target with C₆₀ was investigated by matrix-assisted laser desorption/ionization (MALDI). Our findings show that intact fullerene films can be produced with laser fluences ranging from 0.15 J/cm² up to 1.5 J/cm².     

In-situ measurement of molecular orientation of the pentacene ultrathin films grown on SiO2 substrates

Molecular orientations of pentacene ultrathin films grown on SiO₂ substrates were studied without the influence of the atmosphere by vacuum atomic force microscopy (V-AFM) and near edge X-ray absorption fine structure (NEXAFS). The experimental processes from deposition of pentacene to characterization of films were performed under vacuum condition without exposure to the atmosphere. V-AFM and NEXAFS measurements showed that pentacene molecules tend to grow on SiO₂ surface with their molecular long axes perpendicular to the substrate surfaces (standing-mode) irrespective of preparation procedure of SiO₂ substrate.     

Low-dimensional nanostructures and fullerene films on semiconductor surface

The morphology and atomic structures of C₆₀ fullerene films on a Bi(0001)/Si(111)-7 × 7 surface and adsorption of fluorofullerene C₆₀F _x molecules on a Si(111)-7 × 7 surface have been studied by scanning tunneling microscopy/spectroscopy and low-energy electron microscopy under ultra high-vacuum conditions. It has been shown that initial nucleation of C₆₀ islands on the surface of an epitaxial Bi film occurs on double steps and domain boundaries, while tunnel spectra do not exhibit any significant charge transfer to the lowest unoccupied molecular orbital states. Fluorofullerene molecules allow local (at the nanoscale level) modification of Si surface through local etching.     

Permeability of C60 films deposited on polycarbonatesyloxane to N2, O2, CH4, and He gases

In this study, we report on the gas permeability of non-polymerized and polymerized fullerene films (thickness about 0.5 μm) grown on an organic polymer substrate, polycarbonatesyloxane (PCS), using a high vacuum deposition method. The photopolymerized C₆₀ films were prepared by a simultaneous thin film deposition and UV-vis irradiation method which was reported previously [V.A. Karachevtsev, P.V. Mateichenko, N.Y. Nedbailo, A.V. Peschanskii, A.M. Plokhotnichenko, O.M. Vovk, E.N. Zubarev, A.M. Rao, Carbon 42 (2004) 2091]. Raman spectroscopy revealed that ∼90% of the C₆₀ molecules are covalently linked to neighboring C₆₀ molecules in the photopolymerized film after 20 h of film deposition/irradiation. Permeability of the resulting membranes consisting of polymer PCS base and fullerene films to the N₂, O₂, CH₄, and He gases has been investigated. Our experiments revealed that the gas permeability properties are dependent on the age of the membrane. In particular, the aged membrane exhibited an enhanced permeability for O₂ and He gases in comparison to N₂ and CH₄, respectively.     

Orientation-dependent ionization potential of CuPc and energy level alignment at C60/CuPc interface

The electronic structure evolution of interfaces of fullerene (C₆₀) with copper phthalocyanine (CuPc) on highly oriented pyrolytic graphite (HOPG) and on native silicon oxide has been investigated with ultraviolet photoemission spectroscopy and inverse photoemission spectroscopy. The LUMO edge of C₆₀ was found to be pinned at the interface with CuPc on SiO₂. A substantial difference in the electron affinity of CuPc on the two substrates was observed as the orientation of CuPc is lying flat on HOPG and standing up on SiO₂. The ionization potential and electron affinity of C₆₀ were not affected by the orientation of CuPc due to the spherical symmetry of C₆₀ molecules. We observed band bending in C₆₀ on the standing-up orientation of CuPc molecules, while the energy levels of C₆₀ on the flat-lying orientation of CuPc molecules were observed to be flat. The observation points to a dependence of photoexcited charge transfer on the relative molecular orientation at the interface.     

吡嗪分子在硅(100)面吸附构型的XPS和NEXAFS谱理论研究

本文利用X射线谱研究了吡嗪(C₄H₄N₂)分子共价吸附于硅(100)面的几种吸附构型的几何结构和电子结构. 利用密度泛函理论结合团簇模型,对预测的吸附结构的碳K壳层(1s)X射线光电子能谱(XPS)和近边X射线吸收精细结构(NEXAFS)谱进行了模拟. 计算结果阐明了XPS和NEXAFS谱与不同吸附构型的对应关系. 与XPS谱相比,NEXAFS谱对所研究的吡嗪/硅(100)体系的结构有明显的依赖性,可以很好地用于结构鉴定. 根据碳原子的分类,研究了在NEXAFS光谱中不同化学环境下碳原子的光谱成分.