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在ALCATELGSM交换机中 ,号码分析字冠是以树的结构分类 ,所有的字冠分为5棵树 ,其中TREE1是手机做主叫的分析字冠 ,TREE2是短消息中心的分析字冠 ,TREE7是PSTN呼入的分析字冠 ,TREE5和TREE6分别为漫游、呼叫前转字冠以及MSC呼入字冠。从数据的角度来看 ,用户进行呼叫处理的流程如图1所示。当一呼叫源发起一个呼叫时 ,呼叫处理软件先搜寻其源码信息 ,并确定在哪一棵数字树上分析所送的号码 ,然后在该数字树上分析呼叫源送来的字冠 ,从中获得目标信息 ,再将源信息与目标信息综合起来进行分析 ,用… 相似文献
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无失效数据可靠性分析的贝叶斯方法 总被引:1,自引:0,他引:1
Bayes方法是对无失效数据问题进行可靠性分析的有效途径之一。针对某一产品,在确定了其寿命分布类型之后,建立了无失效数据模型,并利用Bayes方法对产品进行了可靠性分析。 相似文献
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由于分析手段与分析设备的限制,系统级封装(SiP)组件的芯片在失效分析的过程中带有一定的盲目性。结合故障树分析方法,以PM O S芯片失效为例,讨论了SiP组件常见的管芯失效机理:电应力失效、热应力失效、机械损伤和环境应力失效以及相应的失效现象;最后从设计和工艺角度提出了降低各种失效机理发生的改进措施。 相似文献
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Extending the p-cycle concept to path segment protection for span and node failure recovery 总被引:6,自引:0,他引:6
The paper introduces an extension to the method of p-cycles for network protection. The p-cycle concept is generalized to protect path segments of contiguous working flow, not only spans that lie on the cycle or directly straddle the p-cycle. The original span protecting use of the p-cycle technique is extend to include path protection or protection of any flow segment along a path. It also gives an inherent means of protecting working flows that transit a failed node. We use integer linear programming to study the new concept and determine its inherent capacity requirements relative to prior p-cycle designs and other types of efficient mesh-survivable networks. Results show that path-segment-protecting p-cycles ("flow p-cycles") have capacity efficiency near that of the shared backup path-protection (SBPP) scheme currently favored for optical networking. Because its protection paths are fully preconnected and because it protects path segments (not entire paths), it has the potential for both higher speed and higher availability than SBPP. We also develop capacity optimization models to support 100% restoration of transiting flows through failed nodes. Only a very small additional spare capacity is needed to achieve both 100% span and intermediate node-failure restorabilities, and a very high transiting traffic restorability can be accomplished for node failure restorability given spare capacity only for span-failure protection. An immediate practical application is to suggest the use of flow p-cycles to protect transparent optical express flows through a regional network. 相似文献
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《Mechatronics》2023
In order to increase the productivity on construction sites, a current topic of research is the automation of the payload transport by tower cranes. Thereby, a key requirement is to ensure that the tower crane precisely tracks the planned paths and positions the payload at the specified target location. Most of the state-of-the-art tower crane controllers damp load sway while moving each driving system to its desired position. However, the path error also consists of bending displacements of the tower crane’s mechanical structure, observer errors, or sensor offsets once the crane hook position is considered in a fixed georeferenced construction site system. These errors have not been addressed in literature on tower cranes so far. This paper introduces an approach to reduce the path error of automated tower cranes without permanently integrating additional sensors. A regression model is derived for predicting the path error and a least absolute shrinkage and selection operator (LASSO) is used to select the most important features. The predicted error is then used to compute a compensating hook path such that the measured hook path matches the desired hook path. The effectiveness of the approach is experimentally validated utilizing a real large-scale tower crane showing a reduction of the path error of more than 50% and a position accuracy of less than 16 cm. 相似文献
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通过理论建模和试验测试的方法研究了多指结构微波双极型晶体管在静电放电作用下的热稳定性和电稳定性。选择2SC3356作为受试器件,对100个测试样本进行人体模型静电放电注入实验,并从器件内部电场强度、电流密度和温度分布变化出发,用二维器件级仿真软件辅助分析了在静电放电应力下其内在损伤过程与机理。由于指间热耦合的存在,雪崩电流在各指上分布不均,局部的电流拥挤和过热效应会导致晶格损伤。试验结果表明,由于特殊的物理结构,受试器件对静电放电最敏感的端对并不是EB结,而是CB结,当静电放电电压增大到1.3KV时,CB结首先损坏。失效分析进一步表明静电放电引起的失效机理通常是介质层的击穿和局部铝硅共晶体的过热融化。静电放电注入实验的过程中存在积累效应,多次低强度的注入测试会导致潜在性失效并使器件性能大幅下降。 相似文献
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Electrostatic discharge(ESD) phenomena involve both electrical and thermal effects,and a direct electrostatic discharge to an electronic device is one of the most severe threats to component reliability.Therefore, the electrical and thermal stability of multifinger microwave bipolar transistors(BJTs) under ESD conditions has been investigated theoretically and experimentally.100 samples have been tested for multiple pulses until a failure occurred.Meanwhile,the distributions of electric field,current density and lattice temperature have also been analyzed by use of the two-dimensional device simulation tool Medici.There is a good agreement between the simulated results and failure analysis.In the case of a thermal couple,the avalanche current distribution in the fingers is in general spatially unstable and results in the formation of current crowding effects and crystal defects.The experimental results indicate that a collector-base junction is more sensitive to ESD than an emitter-base junction based on the special device structure.When the ESD level increased to 1.3 kV,the collector-base junction has been burnt out first.The analysis has also demonstrated that ESD failures occur generally by upsetting the breakdown voltage of the dielectric or overheating of the aluminum-silicon eutectic.In addition,fatigue phenomena are observed during ESD testing,with devices that still function after repeated low-intensity ESDs but whose performances have been severely degraded. 相似文献
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本文提出了一种用于组合电路中的多故障诊断的新算法FAOG(Filtered AND/OR graphs)。此算法基于过滤技术和AOG图。其中过滤技术用来除去电路中的非可能致错部分,以减少所需处理的电路规模。AOG是与电路对应的AND/OR图,是改错的关键部分。此算法对于树状组合电路是完全自动的。对于普通组合电路是半自动的。它既解决了基于模拟的改错算法只能限定出错区域而不能告知如何诊断故障信息的局限性,也大大减轻了符号诊断法的内存爆炸问题。实验表明,这是一种快速高效的故障诊断方案,适用于多故障的组合电路。 相似文献
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提出了数字投影的填充因子对相位测量的误差分析。在结构光三维测量中,数字投影容易改变条纹周期和产生准确的相移,因而到了越来越广泛的应用。然而相比传统的机械模拟投影方式,数字投影采用了抽样方式,且由于其自身结构的限制,填充因子不能做到100%,必然对相位测量有影响。针对填充因子对相位测量的误差,还没有人进行充分研究。对填充因子引起误差原因进行分析,并给出其数学描述,从而建立了理论依据,还进一步提出了离焦减少误差的方法,并给出了其数学表达。最后通过模拟实验的方法,对理论进行了验证,实验结果证明了填充因子减少将增大测量误差,离焦法可以减少相位测量误差。 相似文献
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