原子力与光子扫描隧道组合显微镜

介绍了超高分辨光于扫描隧遭显微镜（PSTM）的计冗历程,为解决第一代（单光束照明）光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜（AF／PSTM）图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜（AF／PSTM）样机。该样机在一次扫描中已获得两幅原子力显微镜图像（形貌与相位）和两幅光学图像（透过率和折射率）,有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。     

Near-Field Scanning Optical Microscopy Combined with a Tapping Mode Atomic Force Microscope

Tapping mode atomic force microscopy is used to control the tip-sample distance in near field scanning optical microscopy (NSOM), which gives both topographic and near-field images simultaneously. The evanescent waves are scattered by a vibrating silicon-nitride tip in the proximity of sample surfaces and are detected through a microscope objective. This NSOM allows the observation of opaque samples with reflection illumination. A glass grating of 1-μm pitch and an InP grating of 0.5-μm pitch are observed with a lateral resolution of 100 nm.Presented at 1996 International Workshop on Interferometry (IWI ‘96), August 27-29, Saitama, Japan     

二次谐波共焦成像的分辨率

通过与双光子荧光共焦成像过程比较,研究了非线性二次谐波的强度脉冲响应函数并对它进行频域分析,获得了横向、纵向截止频率和通频带.研究结果表明：二次谐波共焦成像具有更高的分辨率.     

Growth of InGaAs-capped InAs quantum dots characterized by Atomic Force Microscope and Scanning Electron Microscope

Atomic force microscopy (AFM) is typically used to measure the quantum dot shape and density formed by lattice mismatched epitaxial growth such as InAs on GaAs. However, AFM images are distorted when two dots are situated in juxtaposition with a distance less than the AFM tip width. Scanning electron Microscope (SEM) is much better in distinguishing the dot density but not the dot height. Through these measurements of the growth of In_xGa_1-xAs cap layer on InAs quantum dots, it was observed that the InGaAs layer neither covered the InAs quantum dots and wetting layer uniformly nor 100% phase separates into InAs and GaAs grown on InAs quantum dots and wetting layer, respectively.     

Formation of Magnetic Nanostructures Using an Atomic Force Microscope Probe

Technical Physics - The examples of application of pulse force nanolithography carried out using an atomic-force microscope probe for formation of magnetic nanowires, nanocontacts, one- and...     

Frequency Response of the Sample Vibration Mode in Scanning Probe Acoustic Microscope

Based on the interaction mechanism between tip and sample in the contact mode of a scanning probe acoustic microscope （SPAM）, an active mass of the sample is introduced in the mass-spring model. The tip motion and frequency response of the sample vibration mode in the SPAM are calculated by the Lagrange equation with dissipation function. For the silicon tip and glass assemblage in the SPAM the frequency response is simulated and it is in agreement with the experimental result. The living myoblast cells on the glass slide are imaged at resonance frequencies of the SPAM system, which are 20 kHz, 30 kHz and 120 kHz. It is shown that good contrast of SPAM images could be obtained when the system is operated at the resonance frequencies of the system in high and low-frequency regions.     

Simulation of the Interaction of a Magnetic Resonance Force Microscope Probe with a Ferromagnetic Sample

Technical Physics - We propose an algorithm and present results of micromagnetic simulation of the resonant response of a probe pickup (cantilever) of a magnetic resonance force microscope....     

Absolute Positioning of Scanning Probe Microscope Tip by Two-Wavelength Synthetic Method

In this paper, we describe the absolute positioning of a probe tip in a scanning Wiener fringe optical microscope (SWOM) using a synthetic wavelength method. Two laser beams with different wavelengths are superimposed and are incident on a sample surface. A synthetic fringe which has a longer period than that of the Wiener fringe obtained with a single wavelength is formed on the surface. The order of Wiener fringe which is utilized as a feedback signal in the microscope can be determined by the synthetic fringe. A sample with known structure was observed for various defined fringe orders using the SWOM.     

Measuring Charge Distribution of Molecular Cations by an Atomic Coulomb Probe Microscope

Imaging the charge distributions and structures of molecules and clusters will promote the understanding of the dynamics of the quantum system.Here,we report a method by using an Ar atom as a tip to probe the charge distributions of benzene(Bz) cations in gas phase.Remarkably,the measured charge distributions of Bz⁺(δ_H=0.204,δ_C=-0.037) and Bz²⁺(δ_H=0.248,δ_C=0.0853) agree well with the calculated Mulliken distributions,and the struc...     

一体型平行弹簧扫描隧道显微镜

描述了一种新结构形式的扫描隧道显微镜系统。该系统使用一体型平行弹簧和压电致动元件作为精密二维位置控制器件，使得ｘ轴和ｙ轴间的位移干扰变得极其微小。控制ｚ轴位移及试件与探针间距的压电致动元件是以悬挂方式固定在一体型平行弹簧上的，因此，对ｚ轴的位移干扰亦忽略。     

利用激光共聚焦扫描显微镜的绿色荧光蛋白荧光成像

报字利用基因标记技术净绿色荧光蛋白（ＧＦＰ）基因与目标蛋白基因融合,并利用激光共焦扫描显微镜通过探测绿荧光蛋白的荧光来跟踪观测目标蛋白基因的表达。     

探针尖带金属微粒的光子扫描隧道显微镜成像数值模拟

引入了色散介质的时域有限差分法散射场方程,并针对光子扫描隧道显微镜的带金属尖光纤扫描成像问题进行三维的数值模拟。在考虑了光纤和样品相互作用的情况下,采用等效入射波法设置入射波,探针扫描模式为等高扫描模式,从成像分辨力和灵敏度的角度,比较了不同入射角、不同的光纤一样品间距,不同金属类型,及不同金属尖大小的成像情况。数值模拟结果显示,带金属颗粒光纤探针尖的光子扫描隧道显微镜在成像分辨力和灵敏度上有显著的改进,而带不同类型金属颗粒情况下对分辨力影响不大,灵敏度是银最好。     

相干场作用下介质的探测谱及折射率谱的实验测量

利用改进的马赫－曾德尔干涉仪在实验上测出了相干场（５８９．６ｎｍ）作用下钠原子蒸０汽介质在５８９．０ｎｍ附近的探测谱和折射率谱,并针对拉曙以场驱动的四能经理论模型给出了相应的理论曲线,此项实验结果为验证原子的相干性理论及实现介质的无吸收、高折射率的可能性提供了可靠的实验依据。     

A Monatomic Optical Near-Field Microscope with Subnanometer Spatial Resolution

We propose the principle of operation of an optical near-field microscope on the basis of linear steady-state optical dimensional resonances in the system atom-probe–atoms of the sample. It is shown that such a microscope has high sensitivity and a spatial resolution of less than 1 nm and does not set limits on the choice of samples. The distribution of the optical fields in the wave and near zones in the near-field microscope at frequencies close to the optical dimensional resonances arising as a result of dipole-dipole interactions of atoms at small distances has been investigated. The optical scheme of the monatomic near-field microscope is presented.     

实例分析原子力显微镜使用中的假像

假像是原子力显微镜(AFM)技术研究中的一个热点问题,本文首先分析了AFM实验中产生假像的常见原因及其可能产生的假像类型,然后以实验中得到的重复"豆芽形结构"、完全一致的重复圆环形貌结构和许多重复的三角形结构的AFM图像为例,分析了假像产生的原因,为AFM实验结果分析中假像的辨别处理提供了借鉴经验。     

点衍射干涉术在扫描力显微镜中的应用

目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。本文讨论了一种根据这一原理设计的用于扫描力显微镜的干涉光探针，它利用微探针表面几何反身波与后向点衍射波之间的干涉来检测微探针的形变，其纵向分辨率达到０．０１ｎｍ。