铌酸锂晶体的光折变效应

铌酸锂(LiNbO₃, LN)是一种多功能多用途的人工晶体,被称为“光学硅”。近期以铌酸锂薄膜(LNOI)为平台的集成光子学发展迅速,有将“光学硅”变为现实的趋势。高集成意味着高局域高光强密度,使铌酸锂晶体的光折变效应变得不容忽视。光折变效应是光致折射率变化的简称,是非线性光学的重要组成部分。本文回顾了铌酸锂晶体光折变效应的发现和机理、不同掺杂及掺杂组合对光折变效应的调控,重点介绍了铋镁双掺铌酸锂晶体的光折变性能及相关理论和实验结果,概述了铌酸锂光折变波导和孤子,及基于LNOI的集成光子学器件中的光折变效应,并对未来的研究趋势进行了展望。期待我国发挥铌酸锂光折变研究及LNOI产业化的优势,在光子学芯片的竞争中占据主导地位。     

铌酸锂单晶薄膜材料

铌酸锂晶体集电光、声光和非线性光学等物理特性于一身,且透光范围宽,作为一种重要的光学材料被广泛应用于通信、传感等领域.通过离子注入与直接键合的方式制备出的铌酸锂单晶薄膜材料,保留了铌酸锂体材料的优秀物理特性,并且具有高折射率对比度的优点,使光子器件在集成度和性能上都得到了很大程度的提升.本文介绍了铌酸锂薄膜的制备及应用...     

薄膜铌酸锂光电探测器近期研究进展

铌酸锂晶体具有高电光、压电和非线性光学系数,宽光学透明范围、兼容速度匹配、相位匹配和色散工程,长期稳定性以及可低成本制备光学级晶圆等众多优势,作为构筑如电光调制器、光学频率梳、光波导等光电子器件的重要平台,在信息通信领域的光产生、光传输、光调制等领域大放异彩,被誉为“光子领域的硅”,具有巨大的集成应用潜力,受到学术界和产业界的广泛关注。然而,由于铌酸锂的绝缘体和弱光学吸收特性,基于铌酸锂平台的集成应用领域还面临光电转换效率低和探测难的问题,全光通信中光解调和光提取需要高性能探测器的支撑,因此研发基于铌酸锂的光电探测器具有重大的科学意义和应用价值。本文从铌酸锂的基本结构特性出发,详细介绍了铌酸锂的优异物性和光电转化机理,综述了国内外学者近期的一些研究成果,重点阐述了基于铌酸锂晶体的光波导集成型光电探测器和异质结型光电探测器的研究进展,探讨并比较了不同路线的优点和发展潜力,并对该领域提出展望。     

近化学计量比掺镁铌酸锂晶体的抗光折变性能

应用气相传输平衡技术,我们获得了3种近化学计量比掺镁铌酸锂晶体,晶体的掺镁量接近我们以前提出的第二阈值.在我们实验室所能达到的最大光强26 MW/cm2照射下,在所有近化学计量比掺镁铌酸锂晶片中没有观察到光斑畸变,该光强比同成分铌酸锂晶体所能承受的光强高6个量级,为目前已报道的铌酸锂晶体之最.应用双光束全息写入法测得掺1.0 mol; Mg近化学计量比铌酸锂晶体的光折变饱和值仅有4.6×10-7,比同成分铌酸锂晶体小两个量级,从已有实验数据推测,该晶体的抗光折变能力应当比同成分铌酸锂晶体高9个量级以上.     

大直径、高掺镁铌酸锂晶体的生长及其紫外光折变性能研究

我们生长了掺镁量分别为3.0mol;、5.0mol;、7.8mol;、9.0mol;的76mm高掺镁铌酸锂晶体,检测了这些晶体的生长条纹情况,并利用双光耦合配置测试了这些晶体在351nm紫外光下的光折变性能.从实验结果看,采用同成分共熔点铌锂配比的高掺镁铌酸锂晶体生长条纹比较多;虽然高掺镁铌酸锂晶体在可见光波段有很好的抗光折变能力,但是在紫外光下具有良好的光折变性能,可以作为优良的紫外光折变材料使用.同时,实验结果表明,掺镁量在5.0mol;的铌酸锂晶体具有最佳的紫外光折变性能.     

50Hz铌酸锂电光调Q开关

目前军用领域电光调Q开关的工作频率基本在30 Hz以下,为满足军用领域对更高重复频率脉冲激光的需求,研究并获得了可工作在50 Hz重复频率下的铌酸锂电光调Q开关.基于折射率椭球理论,通过分析铌酸锂晶体预偏置电光调Q的原理,选取了合适的预偏置角度.在闪光灯泵浦Ce∶ Nd∶ YAG激光系统中,通过合理设计谐振腔参数以及激光晶体的参数,采用预偏置加压式电光调Q方式,实现了频率为50 Hz,脉宽约为6 ns,能量不小于93mJ的1.06 μm激光输出,峰值功率达到了约15 MW.试验证明铌酸锂晶体用作电光调Q开关在中小功率和中低频率1.06μm激光上有很好的应用前景.     

掺锆铌酸锂系列晶体

本文简介了掺锆铌酸锂系列晶体的研究进展,包括单掺锆铌酸锂、锆铁双掺铌酸锂、锆铁锰及锆铜铈三掺铌酸锂。掺锆铌酸锂晶体不但在可见波段具有远优于掺镁铌酸锂的抗光损伤能力,即使在近紫外波段,也拥有其它掺杂晶体所不具备的抗光损伤性能。锆铁双掺铌酸锂晶体兼有高光折变灵敏度和高光折变衍射效率的性质。锆铁锰和锆铜铈三掺铌酸锂晶体不但能够实现非挥发存储,其光折变响应速度及灵敏度都较铁锰和铜铈双掺晶体有大幅提高。这些实验结果表明,掺锆铌酸锂有望成为出色的非线性光学晶体。     

晶体材料中的常青树——铌酸锂晶体

正从上世纪70年代开始,我国科研人员就开始了铌酸锂晶体生长、缺陷、性能及其应用研究。南开大学是国内最早开展研究的单位之一,几十年来,围绕通讯、激光、国防等领域对高光学均匀性、高抗光损伤、高温度适用性光学级铌酸锂晶体的需求,将铌酸锂晶体的光学均匀性提高了近2个数量级,发明了掺镁铌酸锂晶体,将抗光损伤能力提高6个数量级以上,并实现了高光学质量近化学计量比铌酸锂晶体的实用化制备。     

铌酸锂晶体的缺陷及其控制

针对铌酸锂晶体中的缺陷研究,本文总结了国内外学者提出的不同晶体缺陷模型及各自的特点,并介绍了我们提出的铌位依赖、锂位敏感模型.在分析晶体缺陷研究的基础上提出了对铌酸锂晶体进行缺陷控制的意义及理论依据,指出缺陷控制的主要任务是保护锂格位.本文还简要概括了铌酸锂晶体缺陷控制的主要手段,并建议从反映铌酸锂晶体性能的角度来研究缺陷结构.     

低应力铌酸锂电光调Q开关的研究

本文分析了铌酸锂晶体应力,按照来源包括热应力、缺陷应力、加工应力和晶体受到的外力等.对铌酸锂晶体热处理时固溶体脱溶问题的初步分析,采用合适的工艺对晶体毛坯进行了去应力热处理;在调Q开关制作时开发了弹性装配技术取代传统的硬性夹持方案,消除了夹持应力对电光调Q开关的影响.制备的铌酸锂电光调Q开关得到了实际应用,有效提高了激光器工作的温度稳定性.     

CdSe晶体倍频光学参数及元件加工研究

对红外非线性光学晶体CdSe的倍频光学参数及其元件加工进行了研究.根据非线性光学原理和折射率色散关系,从理论上计算出CdSe晶体的有效非线性系数和倍频元件相位匹配角与基频光波长(5.5～10.0 μm)的调谐特性曲线,从实验上探索到一种通过解理试验和XRD定向测试,快速确定其光轴方向的晶体定向新方法.结果表明,CdSe晶体在Ⅱ类相位匹配条件下的有效非线性系数d_(eff)为d_(15)sinθ,倍频转换效率与方位角无关;在Ⅰ类相位匹配条件下其有效非线性系数d_(eff)恒等于0,无倍频输出.根据理论计算结果,运用定向新方法,针对VUVG法生长出的外观无方向特征的CdSe晶体,经定向切割、研磨和抛光,初步加工出基频波长为9.6 μm的CdSe晶体Ⅱ类相位匹配倍频元件, 尺寸达9.5 mm×9.5 mm×18 mm.     

Strukturuntersuchungen an Oberflächenschichten spanend bearbeiteter Molybdän-Einkristalle

Molybdenum single crystals were used as model samples for gross machining operations (turning). The damaged surface layer was studied by reflection electron diffraction and transmission electron microscopy (TEM). Near the machined surface the material was found to be polycrystalline, the transition to the single crystal state occurs within the range from 2 to 5 μm. Pronounced plastic deformations are ranging to a depth of about 150 μm below the surface. The transition to the undisturbed single crystal occurs within the range from 150 to 300 μm.     

Measurement of Refractive Index of GaP Crystal over a Large Temperature Range Using Interferometry

The refractive index of GaP single crystal was measured through room temperature (300K) to 1200K at a wavelength of 780 nm by using an interferometry with a laser diode. To get a more accurate result, the thermal expansion coefficient of GaP crystal, which would be one parameter for the measurement of the refractive index, was measured by a diratometer equipped with laser interferometry against temperature in the range from room temperature to 973K. It was confirmed that the linear thermal expansion coefficient was a function of temperature. In this report, an empirical function was obtained to calculate the refractive index at any temperature for GaP crystal. The result shows that the refractive index of GaP varies from 3.1907 to 3.3354 in the temperature range from 300K to 1200K at the wavelength of 780nm.     

Investigations on the defect depth of electroerosive-cut Te single crystals by reflection electron diffraction (RHEED)

Results of the experimentally determined defect depth due to electroerosive working of Te single crystals as a function of crystal orientation and electric cutting energy by RHEED are given. The abrasion of the disturbed surface layer was made by chemical etch polishing as well as by bombardment with Ar⁺ ions. The defect depths determined from the RHEED patterns depend on the crystal orientation and the applied cutting energy. In case of the lowest cutting energy, it has a value of about 3 μm for the (0001)-orientation and 6 μm for the (101 0)-orientation, the corresponding values for the highest cutting energy are about 8 μm and 20 μm, respectively. It is discussed in how far defect depths determined from the interpretation of RHEED patterns correspond to the “real defect depths” which can be determined by other measuring techniques.     

Spectrometer of Synchrotron Radiation Based on Diffraction Focusing a Divergent Beam Formed by a Compound Refractive Lens

The results of the first experimental realization of a spectrometer based on the effect of diffraction focusing of X rays by a flat single crystal are discussed. A secondary X-ray source with a relatively high angular divergence and small sizes was formed at the focus of a compound refractive lens having 50 beryllium biconcave elements with a curvature radius of 50 μm. The silicon spectrometer crystal was cut in the form of a wedge of variable thickness, oriented perpendicular to the diffraction plane. The reflection 111 was used for energies of 8.3 and 12 keV. To simulate the experiment, a computer program was developed, which takes into account accurately and for the first time the focusing of radiation by the lens and its subsequent diffraction in the crystal. A calculated curve for a monochromatic beam has made it possible to determine the monochromator spectrum with high resolution from experimental data for a polychromatic beam. It is shown that monochromator resolution increases with an increase in the distance from the compound refractive lens to the crystal.     

Thermal conductivity and refractive indices of Nd:GdVO4 crystals

The thermal conductivities of Nd:YAG, M(Y,Gd)VO₄ crystals were measured at 298 K. The value of Nd:GdVO₄ crystal along <001> direction was 11.4 W/mK, which was higher than that of YAG crystal measured to be 10.7 W/mK. The principal refractive indices of Nd:GdVO₄ crystal in the temperature range from 20 °C to 170 °C were determined by auto‐collimation method. Based on the measured values of refractive indices, the Sellmeier equation and expression of temperature dependence of refractive indices have been obtained. The measured results show that the birefringence Δn is 0.22007 at 20 °C and temperature coefficient of birefringence is 4.33 × 10⁻⁶/°C for 1.064 μm. These results prove that the GdVO₄ crystal is a laser crystal with excellent thermal and birefringence properties. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Epitaxial growth of ferroelectric PLZT [(Pb,La)(Zr,Ti)O3] thin films

Thin films of PLZT were epitaxially grown at around 700°C on sapphire and SrTiO₃ substrates: (111) PLZT  (0001) sapphire and (100) PLZT  (100) SrTiO₃. PLZT films on semiconductor substrates were also grown at around 620°C. The crystal quality of these PLZT films was investigated by X-ray diffraction, reflection electron diffraction, scanning electron microscopy (SEM), and Auger electron spectroscopy (AES). The epitaxy of PLZT films grown on different single crystal substrates is discussed. The refractive index of the film on the sapphire substrate was determined as 2.49₇ by an optical waveguide technique.     

吸收光谱测量晶体折射率的简易方法

折射率是晶体的基本参数,本文提出了利用透过光谱来测量晶体折射率的简易方法,此种方法具有对样品的尺寸要求低、测量范围无限制、操作简单、易获得一定光谱范围晶体折射率的优点.用吸收光谱法和自准直法测量了Nd:GGG的折射率,二者给出的折射率测量结果符合得很好,表明用晶体透射光谱来测量折射率是一种有效的简易测量方法.     

Optical Properties of MnIn2S2Se2 Single Crystals

Optical transmittance and reflectance spectra of MnIn₂S₂Se₂ single crystals are measured in the wavelength range from 0.5 to 30 μm. The interference method is used to determine the refractive index of the compound for wavelengths between 0.8 and 12 μm. From an analysis of the absorption spectrum it follows that the fundamental edge is due to forbidden indirect transitions between parabolic bands for the polarization E ⊥ c with a gap energy of 1.50 eV at room temperature.     

Planar chalcogenide glass waveguides for IR evanescent wave sensors

Multi-layered chalcogenide glass waveguide structures have been fabricated for evanescent wave sensing of bio-toxins and other sensor applications. Thin films of Ge containing chalcogenides have been deposited onto Si substrates, with a-GeSe₂ as the lower cladding layer and a-GeSbSe as the core layer, to form the slab waveguide. The absence of a defined upper cladding layer enhances the leakage necessary to sense the target molecules. Modal refractive index is estimated from the m-lines. It is shown that photo-induced structural changes by 808 nm laser light in the core layer selectively enhance refractive index in the exposed regions, and thus provide a convenient method to form channel waveguides. A thin layer of Au has been deposited on top of the core layer for the attachment of linker molecules for biosensor application; ATR confirms this.