环形共光路点衍射干涉仪

建立了一种基于偏振掩膜板与环形共路结构的点衍射干涉仪,通过旋转偏振片可以改变参考光与测试光之间的相对光强,实现干涉条纹对比度的调节,能够获得最高对比度的干涉条纹,并且针对条纹对比度进行了详细的理论分析;由于系统中线性载频幅度极易调节,可以有效地改善傅里叶变换法的相位提取精度;验证性实验被完成。     

Phase invariance in a recently proposed common-path laser interferometer

This study shows that the principle of a recently proposed common-path laser interferometer containing a planar grating is nonexistent and apparently caused by a mathematical derivation error. Both p-and s-polarized beams in the proposed setup experience once the +1st-order diffraction and once the-1st-order diffraction by the grating. As a result, the phase of each beam remains unchanged and the interference fringes formed by the two beams are not expected to move when the grating is translated in the grating vector direction. We perform an experiment to confirm this prediction. Both our analysis and experimental observation cast doubt on the experimental results of the authors who proposed the interferometer.     

迈克耳孙干涉仪产生特殊干涉条纹的原因

推导了迈克耳孙干涉仪分光镜放反的情况下光程的表达式,解释了出现椭圆干涉条纹或双曲线条纹的原因.     

Practical common-path heterodyne surface profiling interferometer with automatic focusing

In modern semiconductor and optics industries, there is a strong demand for a highly sensitive and non-contact surface profilometer. This paper describes a practical heterodyne surface profiling interferometer for on-line non-contact measurement which has been developed recently. The essential feature of the profilometer is a newly designed common-path configuration to minimize the effects caused by vibration, air turbulence and other environmental variations. A single-mode frequency-stabilized laser diode (780 nm) serves as the light source to make the whole system compact (total volume 250L×200W×100H mm). A powerful signal processing scheme is also developed, which includes three parts: automatic voltage control, phase measurement with wide range and automatic focusing control. All these make the repeatability and stability of the profiling interferometer greatly improved. The system has vertical resolution of 0.39 nm and lateral resolution of 0.73 μm. During approximately an hour, the stability is within 1.95 nm(3σ).     

共光路外差干涉法精密测量光学表面

报道了光学外差法测量表面起伏精度及横向分辨精度达到０．１１ｎｍ及４μｍ。本文采用的是完全共光路外差干涉系统，阐述了它的原理、构造及噪声的影响，并将测量结果与其它商品仪器测量结果作了比较。     

利用等厚干涉条纹测量微光的调制传递函数MTF

通过对微光的调制传递函数 (MTF)的讨论 ,结合传统的“分辨率板法” ,提出了一种新的测量微光的MTF的方法。该方法直接从MTF的物理含义出发 ,利用迈克尔逊干涉仪产生一系列空间频率的等厚干涉条纹来模拟分辨率板的作用 ,在计算机的控制下 ,自动测量出连续的MTF曲线。给出的实验光路和实验结果表明 ,利用干涉条纹测量微光的MTF是一种可行的简便方法 ,在计算机的控制下 ,可快速完成夜视仪的传递函数测量     

迈克耳孙干涉仪非定域干涉条纹分析

针对迈克耳孙干涉仪实验调节过程中经常会出现椭圆、双曲线等非圆形二次曲线条纹的现象,本文基于点光源条件下非定域干涉的原理,推导出了干涉条纹满足的曲线方程,分析了不同条件下干涉条纹的形状,发现观察屏上可呈现圆、椭圆、抛物线、双曲线和直线5种类型的干涉条纹.基于理论结果进行了数值模拟和实验验证,数值模拟结果和实验结果吻合较好.     

Near common-path optical fiber interferometer for potentially fast on-line microscale-nanoscale surface measurement

We introduce a new surface measurement method for potential online application. Compared with our previous research, the new design is a significant improvement. It also features high stability because it uses a near common-path configuration. The method should be of great benefit to advanced manufacturing, especially for quality and process control in ultraprecision manufacturing and on the production line. Proof-of-concept experiments have been successfully conducted by measuring the system repeatability and the displacements of a mirror surface.     

Phase measurements of a twisted nematic liquid crystal spatial light modulator with a common-path interferometer

We present a novel and high accuracy (±1°) technique for measuring the difference in phase delay between the positive and negative eigenvectors of a twisted nematic liquid crystal spatial light modulator (LCSLM) as a function of applied voltage. We show a new architecture for a common-path interferometer where we simultaneously generate both the positive and negative eigenvectors of the LCSLM. We use an electro-optic light modulator to provide a time varying phase shift between the two eigenvectors and measure the phase delay difference between the two eigenvectors. We compare the phase delay values with those obtained using a Mach–Zehnder interferometer and find good agreement.     

改变写入Bragg波长的干涉条纹运动的扫描式Talbot干涉仪

一种干涉条纹运动的扫描式Talbot干涉仪被用于改变光纤Bragg光栅的写入Bragg波长。在系统中,光纤光栅是由来自相位掩模的±1级衍射光经平面镜反射后在远场形成紫外干涉条纹写入的,其中,相位掩模被用作±1级衍射光的分束器。值得注意的是通过干涉条纹的运动来扫描写入光纤光栅,有效降低了Talbot干涉仪对写入光源相干性的要求。     

利用透射光栅寻找迈克耳孙干涉仪的白光干涉条纹

介绍了借助透射光栅调整迈克耳孙干涉仪的白光干涉条纹的方法和原理，并讨论了其中的有关现象．     

Young's modulus measurement of the radius bone using a shearing interferometer with carrier fringes

A technique for measuring Young's modulus of the radius bone by using electronic speckle-shearing pattern interferometry is proposed. The technique is based on the introduction of carrier fringes and the use of a phase unwrapping algorithm to obtain a phase map corresponding to the out-of-plane displacements of a radius bone without sign ambiguities. The carrier fringes are obtained by the correlation algorithm of two consecutive speckle fields with a translation of the illuminating beam between each recording, then the spatial synchronous detection (SSD), an unwrapping phase algorithm and integration process along shear direction are successfully applied for obtaining a displacement phase map. Next, analysis of the radius bone as a cantilever allows us to obtain Young's modulus. The study was performed with speckle interferometry and with the finite element method for comparing the results. Advantages and disadvantages of the proposed method are discussed.     

The influence of scanning rate in sequential analysis of fringes produced by a Michelson interferometer

The influence of sequential analysis rate on measurements of Michelson fringes is examined on a theoretical basis, sh whilst considering the special case where the elementary telescope pupils are small in comparison with Fried's parameter (r₀). As a result of this investigation it seems that the principal effect due to an insufficient scanning rate is a degradation of the spectral analysis window employed in the calculation of spatial energy spectra. This effect is related to Fried's parameter and to the wind speed. Taylor's hypothesis is employed in the calculation.The results obtained appear to be consistent with experimental observations.     

“Noninverted” interference fringes upon light reflection from a Fabry-Perot interferometer with an asymmetric diffraction mirror

This paper describes the calculation, fabrication, and experimental investigation of a reflection two-mirror interferometer whose front mirror is asymmetric in reflection and made as a thin-layer diffraction metal structure (Al, Ag) in combination with a dielectric coating (MgF₂, ZnS). In reflection, this interferometer creates in the zero diffraction order a transmission-like pattern similar to that produced by an ordinary Fabry-Perot interferometer operating in transmitted light.     

Analysis of the fringes visibility generated by a lateral cyclic shear interferometer in the retrieval of the three-dimensional surface information of an object

We report the evaluation of the topography of an object with projected fringes generated with a lateral cyclic shear interferometer (CSI) and we then compare the topography recovery obtained with the proposed method with the one obtained from a coordinate measuring machine (CMM). We also study how the fringes visibility along the z axis affects the retrieval. Finally, we discuss the advantages and drawbacks of this profilometry system.     

条纹法实现高分辨率成像

研究了一种高分辨率成像的方法,该方法利用余弦条纹照射目标以获取目标更宽的频谱。条纹对目标的照射起到了对目标频谱的搬移作用,使光学系统截止频率外的一部分高频分量通过系统。利用多幅条纹照射目标并分别成像,各条纹空间频率相同而相位按照一定规律变化,综合处理照射条纹后获得的图像将叠加在一起的频谱分量分离开并恢复到相应的位置,经过反变换获得高分辨率的图像。通过计算机仿真验证了这种方法的可行性。     

条纹法实现高分辨率成像

 研究了一种高分辨率成像的方法,该方法利用余弦条纹照射目标以获取目标更宽的频谱。条纹对目标的照射起到了对目标频谱的搬移作用,使光学系统截止频率外的一部分高频分量通过系统。利用多幅条纹照射目标并分别成像,各条纹空间频率相同而相位按照一定规律变化,综合处理照射条纹后获得的图像将叠加在一起的频谱分量分离开并恢复到相应的位置,经过反变换获得高分辨率的图像。通过计算机仿真验证了这种方法的可行性。     

Reference fringes in holographic interferometry

This paper describes the application of reference fringes in double exposure holography of transient phase objects. This includes selection of fringe patterns and fringe number densities suitable for the quantitative analysis of the hologram. Methods of realizing different reference fringe patterns are presented. As the focus of the interference fringes depends on the optical arrangement, different systems are discussed.     

Moiré fringes in metrology

Moiré fringe phenomena have been exploited in a wide range of transducers, particularly in the field of engineering metrology. Paying particular attention to developments which have taken place during the last 15 years, the paper presents a cross-section of moiré techniques for the measurement of displacement, surface topography, deformation, vibration and refractive index gradient.