Investigation of the depth‐profiling capabilities of the Storing Matter technique

The so‐called Storing Matter technique allows the matrix effect observed in secondary ion mass spectrometry to be successfully circumvented. We therefore investigate in this work the depth‐profiling capabilities of the Storing Matter technique with a goal of developing protocols for quantitative depth profiles. The effect of the steps involved in the Storing Matter process on the main parameters such as the depth resolution and the dynamic range is studied experimentally and by simulations. A semi‐automated process consisting of the sputter‐deposition process on a rotating collector in the Storing Matter instrument followed by a complete analysis of the collector by secondary ion mass spectrometry is defined. This protocol is applied to depth profile a B implant in Si and a Sn/Zn multilayered sample, and the results are compared with those obtained with conventional secondary ion mass spectrometry. Copyright © 2015 John Wiley & Sons, Ltd.     

Investigation of block depth distribution in PS‐b‐PMMA block copolymer using ultra‐low‐energy cesium sputtering in ToF‐SIMS

Directed self‐assembly of block copolymers (BCPs) is a promising candidate for next generation nanolithography. In order to validate a given pattern, the lateral and in‐depth distributions of the blocks should be well characterized; for the latter, time‐of‐flight (ToF) SIMS is a particularly well‐adapted technique. Here, we use an ION‐TOF ToF‐SIMS V in negative mode to provide qualitative information on the in‐depth organization of polystyrene‐b‐polymethylmethacrylate (PS‐b‐PMMA) BCP thin films. Using low‐energy Cs⁺ sputtering and Bi₃⁺ as the analysis ions, PS and PMMA homopolymer films are first analyzed in order to identify the characteristic secondary ions for each block. PS‐b‐PMMA BCPs are then characterized showing that self‐assembled nanodomains are clearly observed after annealing. We also demonstrate that the ToF‐SIMS technique is able to distinguish between the different morphologies of BCP investigated in this work (lamellae, spheres or cylinders). ToF‐SIMS characterization on BCP is in good agreement with XPS analysis performed on the same samples. Copyright © 2013 John Wiley & Sons, Ltd.     

Multitechnique characterization of thin films of immiscible polymer systems: PS–b‐PMMA diblock copolymers and PS–PMMA symmetric blends

Immiscible polymer systems are known to form various kinds of phase‐separated structures capable of producing self‐assembled patterns at the surface. In this study, different surface characterization methods were utilized to study the surface morphology and composition produced after annealing thin polymer films. Two different SIMS techniques—static time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and dynamic nano‐SIMS—were used, complemented by x‐ray photoelectron spectrometry (XPS) and atomic force microscopy (AFM). Thin films (spin‐coated onto silicon wafers) of polystyrene (PS)–poly(methyl methacrylate) (PMMA) symmetric blends and diblock copolymers of similar molecular weight were investigated. Surface enrichment by PS was found on all as‐cast samples. The samples were annealed at 160 °C for different time periods, after which the blend and the copolymer films exhibited opposite behaviour as seen by ToF‐SIMS and XPS. The annealed blend surface presented an increase in the PMMA concentration whereas that of copolymers showed a decrease in PMMA concentration compared with the as‐cast sample. For blends, the nano‐SIMS as well as AFM images revealed the formation of phase‐separated domains at the surface. The composition information obtained from ToF‐SIMS and XPS, as well as the surface mapping by nano‐SIMS and AFM, allowed us to conclude that PS formed phase separated droplet‐like domains on a thin PMMA matrix on annealing. The three‐dimensional nano‐SIMS images showed that the PS droplets were supported inside a rim of PMMA and that these droplets continued from the surface like columnar rods into the film until the substrate interface. In the case of annealed copolymer samples, the AFM images revealed topographical features resembling droplet‐like domains on the surface but there was no phase difference between the domains and the matrix. In the case of copolymers, owing to the covalent bonding between the blocks, complete phase separation was not possible. The three‐dimensional nano‐SIMS images showed domain structures in the form of striations inside the film, which were not continuous until the substrate interface. Information from the different techniques was required to gain an accurate view of the surface composition and topographical changes that have occurred under the annealing conditions. Copyright © 2005 John Wiley & Sons, Ltd.     

ToF‐SIMS characterisation of methane‐ and hydrogen‐plasma‐modified graphite using principal component analysis

Time of flight secondary ion mass spectrometry (ToF‐SIMS) has been used to determine the extent of surface modification of highly ordered pyrolytic graphite (HOPG) samples that were exposed to radio‐frequency methane and hydrogen plasmas. The ToF‐SIMS measurements were examined with the multivariate method of principal component analysis (PCA), to maximise the amount of spectral information retained in the analysis. This revealed that the plasma (methane or hydrogen plasma) modified HOPG exhibited greater hydrogen content than the pristine HOPG. The hydrogen content trends observed from the ToF‐SIMS studies were also observed in elastic recoil detection analysis measurements. The application of the ToF‐SIMS PCA method also showed that small hydrocarbon fragments were sputtered from the hydrogen‐plasma‐treated sample, characteristic of the formation of a plasma‐damaged surface, whereas the methane‐plasma‐treated surface sputtered larger hydrocarbon fragments, which implies the growth of a polymer‐like coating. Scanning tunnelling microscopy measurements of the modified surfaces showed surface features that are attributable to either etching or film growth after exposure to the hydrogen or methane plasma. Copyright © 2009 John Wiley & Sons, Ltd.     

Quantitative analysis of styrene‐pentafluorostyrene random copolymers by ToF‐SIMS and XPS

Poly(styrene) (PS), poly(2,3,4,5,6‐pentafluorostyrene) (5FPS) and their random copolymers were prepared by bulk radical polymerization. The spin‐cast polymer films of these polymers were analyzed using X‐ray photoelectron spectroscopy (XPS) and time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The surface and bulk compositions of these copolymers were found to be same, implying that surface segregation did not occur. The detailed analysis of ToF‐SIMS spectra indicated that the ion fragmentation mechanism is similar for both PS and 5FPS. ToF‐SIMS quantitative analysis using absolute peak intensity showed that the SIMS intensities of positive styrene fragments, particularly C₇H₇⁺, in the copolymers are higher than the intensities expected from a linear combination of PS and 5FPS, while the SIMS intensities of positive pentafluorostyrene fragments are smaller than expected. These results indicated the presence of matrix effects in ion formation process. However, the quantitative approach using relative peak intensity showed that ion intensity ratios are linearly proportional to the copolymer mole ratio when the characteristic ions of PS and 5FPS are selected. This suggests that quantitative analysis is still possible in this copolymer system. Copyright © 2005 John Wiley & Sons, Ltd.     

ToF‐SIMS studies of nanoporous PMSSQ materials: kinetics and reactions in the processing of low‐K dielectrics for ULSI applications

Detailed investigations of spin‐on polymethylsilsesquioxane (PMSSQ)‐based low‐K materials were carried out by means of time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) to identify the reaction kinetics and mechanisms occurring during the manufacturing of nanoporous dielectrics for ULSI applications. Analysis of the static SIMS fingerprints led to the identification of key species related to the PMSSQ oligomers, as well to the observation of features related to the initial functionality of the precursor materials. The intensity variations of the key species with thermal curing reveal the polymerization kinetics of the dielectric precursors. In addition, thermal decomposition and volatilization of the polymethylmethacrylate–dimethylaminoethylmethacrylate copolymer (PMMA‐co‐DMAEMA) porogen was established based on the detection of fragments related to the different moieties of the copolymer molecule. Porogen degradation takes place via cleavage of the DMAEMA co‐monomer at low temperature, followed by volatilization of the residual PMMA‐enriched polymer upon annealing at higher temperature. Several complementary phenomena occurring during the formation of these complex systems can be evaluated by ToF‐SIMS, revealing major features crucial to materials development and the manufacturing of novel low‐dielectric‐constant (K) dielectrics. Copyright © 2004 John Wiley & Sons, Ltd.     

ToF‐SIMS for the characterization of hyperbranched aliphatic polyesters: probing their molecular weight on surfaces based on principal component analysis (PCA)

A series of 2,2‐bis(hydroxymethyl)propionic acid (Bis‐MPA) hyperbranched aliphatic polyesters with different molecular weights (generations) is analysed for the first time by time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). The main negative and positive low‐mass fragments are identified in the fingerprint part of the spectra (m/z < 400) and are principally assigned to fragmentation of the Bis‐MPA repeating units. In addition, it is shown that the fragmentation pattern is highly affected by the functional end‐groups. This is illustrated for a phthalic acid end‐capped hyperbranched polymer and for an acetonide‐terminated dendrimer analog. Also, typical fragments assigned to the ethoxylated pentaerythritol core molecule are detected. These ions show decreasing intensities with increasing molecular weight. This intensity dependency on the generation is used to calibrate the molecular weight of hyperbranched polyesters on the surface. To obtain quantitative information, a principal component analysis (PCA) multivariate statistical method is applied to the ToF‐SIMS data. The influence of different normalization procedures prior to PCA calculation is tested, e.g. normalization to the total intensity, to the intensities of ions assigned to the Bis‐MPA repeating unit or to intensities of fragments due to the core molecule. It is shown that only one principal component (PC1) is needed to describe most of the variance between the samples. In addition, PC1 takes into account the generation effect. However, different relationships between the PC1 scores and the hyperbranched mass average molecular weights are observed depending on the normalization procedure used. Normalization of data set ion intensities by ion intensities from the core molecule allows linearization of the SIMS intensities versus the molecular weight and allows the hyperbranched polymers to be discriminated up to the highest generations. In addition, PCA applied to ToF‐SIMS data provides an extended interpretation of the spectra leading to further identification of the correlated mass peaks, such as those of the Bis‐MPA repeating unit (terminal, dendritic and linear) and those of the core molecule. Finally, the work presented demonstrates the extreme potential of the static ToF‐SIMS and PCA techniques in the analysis of dendritic molecules on solid surfaces. Copyright © 2003 John Wiley & Sons, Ltd.     

Degradation of poly(acrylates) under SF5+ primary ion bombardment studied using time‐of‐flight secondary ion mass spectrometry. 1. Effect of main chain and pendant methyl groups

Polyatomic primary ions have been applied recently to the depth profiling of organic materials by secondary ion mass spectrometry (SIMS). Polyatomic primary ions offer low penetration depth and high damage removal rates in some polymers, but the relationship between polymer chemistry and degradation under polyatomic primary ion bombardment has not been studied systematically. In this study, positive and negative ion time‐of‐flight SIMS (ToF‐SIMS) was used to measure the damage of ～100 nm thick spin‐cast poly(methyl methacrylate) (PMMA), poly(methyl acrylate) (PMA) and poly(methacrylic acid) (PMAA), films under extended (～2 × 10¹⁴ ions cm^?2) 5 keV SF₅⁺ bombardment. These polymers were compared to determine the effect of the main chain and pendant methyl groups on their degradation under SF₅⁺ bombardment. The sputter rate of PMMA was approximately twice that of PMA or PMAA and the rate of damage accumulation was higher for PMA and PMAA than PMMA, suggesting that the main chain and pendant methyl groups played an important role in the degradation of these polymers under SF₅⁺ bombardment. These results are consistent with the literature on the thermal and radiation‐induced degradation of these polymers, which show that removal of the main chain or pendant methyl groups reduces the rate of depolymerization and increases the rate of intra‐ or intermolecular cross‐linking. Copyright © 2004 John Wiley & Sons, Ltd.     

Surface properties of polypropylene following a novel industrial surface‐treatment process

Polypropylene (PP) is used in many automotive applications where good paint adhesion is of primary importance. PP is widely known for its low surface energy which impacts negatively on its adhesion strength. PP surfaces were modified using a new industrial surface‐treatment process known as the Accelerated Thermo‐molecular adhesion Process (ATmaP). ATmaP grafts functional groups to the polymer surface derived from an atomised and vapourised nitrogen‐containing coupling agent. The surface properties and adhesion performance of PP samples treated using the ATmaP process and two different flame processes were compared using XPS, time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) and mechanical testing (pull‐up tests). The latter showed that ATmaP improved adhesion strength significantly in comparison with conventional flame treatments. XPS showed an increase in oxygen and nitrogen concentration on the surface of ATmaP‐treated samples compared with untreated and flame‐treated samples. Principal components analysis (PCA) of the ToF‐SIMS data revealed the major phenomena occurring during the surface treatment of PP samples. Early stage events, including the chain scission of the PP backbone chain and the subsequent reaction of these chains with the surrounding air, are captured by the first principal component (PC1). The increase in the concentration of NO surface functional groups resulting from ATmaP treatment is captured by the second principal component (PC2). Copyright © 2008 John Wiley & Sons, Ltd.     

Tailoring the surface chemistry of carbon fiber and E‐glass composites for improved adhesion

The main challenges in the manufacture of composite materials are low surface energy and the presence of silicon‐containing contaminants, both of which greatly reduce surface adhesive strength. In this study, carbon fiber (CF) and E‐glass epoxy resin composites were surface treated with the Accelerated Thermo‐molecular adhesion Process (ATmaP). ATmaP is a multiaction surface treatment process where tailored nitrogen and oxygen functionalities are generated on the surface of the sample through the vaporization and atomization of n‐methylpyrrolidone solution, injected via specially designed flame‐treatment equipment. The treated surfaces of the polymer composites were analyzed using XPS, time of flight secondary ion mass spectrometry (ToF‐SIMS), contact angle (CA) analysis and direct adhesion measurements. ATmaP treatment increased the surface concentration of polar functional groups while reducing surface contamination, resulting in increased adhesion strength. XPS and ToF‐SIMS showed a significant decrease in silicon‐containing species on the surface after ATmaP treatment. E‐glass composite showed higher adhesion strength than CF composite, correlating with higher surface energy, higher concentrations of nitrogen and C?O functional groups (from XPS) and higher concentrations of oxygen and nitrogen‐containing functional groups (particularly C₂H₃O⁺ and C₂H₅NO⁺ molecular ions, from ToF‐SIMS). Copyright © 2010 John Wiley & Sons, Ltd.     

Multivariate analysis of ToF‐SIMS data using mass segmented peak lists

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) provides detailed molecular insight into the surface chemistry of a diverse range of material types. Extracting useful and specific information from the mass spectra and reducing the dimensionality of very large datasets are a challenge that has not been fully resolved. Multivariate analysis has been widely deployed to assist in the interpretation of ToF‐SIMS data. Principal component analysis is a popular approach that requires the generation of peak lists for every spectrum. Peak list sizes and the resulting data matrices are growing, complicating manual peak selection and analysis. Here we report the generation of very large ToF‐SIMS peak lists using up‐binning, the mass segmentation of spectral data in the range 0 to 300 m/z in 0.01 m/z intervals. Time‐of‐flight secondary ion mass spectrometry data acquired from a set of 4 standard polymers (polyethylene terephthalate, polytetrafluoroethylene, poly(methyl methacrylate), and low‐density polyethylene) are used to demonstrate the efficacy of this approach. The polymer types are discriminated to a moderate extent by principal component analysis but are easily skewed with saturated species or contaminants present in ToF‐SIMS data. Artificial neural networks, in the form of self‐organising maps, are introduced and provide a non‐linear approach to classifying data and focussing on similarities between samples. The classification outcome achieved is excellent for different polymer types and for spectra from a single polymer type generated by using different primary ions. This method offers great promise for the investigation of more complex systems including polymer classes and blends and mixtures of biological materials.     

Denoising and multivariate analysis of time‐of‐flight SIMS images

Time‐of‐flight SIMS (ToF‐SIMS) imaging offers a modality for simultaneously visualizing the spatial distribution of different surface species. However, the utility of ToF‐SIMS datasets may be limited by their large size, degraded mass resolution and low ion counts per pixel. Through denoising and multivariate image analysis, regions of similar chemistries may be differentiated more readily in ToF‐SIMS image data. Three established denoising algorithms—down‐binning, boxcar and wavelet filtering—were applied to ToF‐SIMS images of different surface geometries and chemistries. The effect of these filters on the performance of principal component analysis (PCA) was evaluated in terms of the capture of important chemical image features in the principal component score images, the quality of the principal component score images and the ability of the principal components to explain the chemistries responsible for the image contrast. All filtering methods were found to improve the performance of PCA for all image datasets studied by improving capture of image features and producing principal component score images of higher quality than the unfiltered ion images. The loadings for filtered and unfiltered PCA models described the regions of chemical contrast by identifying peaks defining the regions of different surface chemistry. Down‐binning the images to increase pixel size and signal was the most effective technique to improve PCA performance. Copyright © 2003 John Wiley & Sons, Ltd.     

ToF‐SIMS analysis of a polymer microarray composed of poly(meth)acrylates with C6 derivative pendant groups

Surface analysis plays a key role in understanding the function of materials, particularly in biological environments. Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) provides highly surface sensitive chemical information that can readily be acquired over large areas and has, thus, become an important surface analysis tool. However, the information‐rich nature of ToF‐SIMS complicates the interpretation and comparison of spectra, particularly in cases where multicomponent samples are being assessed. In this study, a method is presented to assess the chemical variance across 16 poly(meth)acrylates. Materials are selected to contain C₆ pendant groups, and ten replicates of each are printed as a polymer microarray. SIMS spectra are acquired for each material with the most intense and unique ions assessed for each material to identify the predominant and distinctive fragmentation pathways within the materials studied. Differentiating acrylate/methacrylate pairs is readily achieved using secondary ions derived from both the polymer backbone and pendant groups. Principal component analysis (PCA) is performed on the SIMS spectra of the 16 polymers, whereby the resulting principal components are able to distinguish phenyl from benzyl groups, mono‐functional from multi‐functional monomers and acrylates from methacrylates. The principal components are applied to copolymer series to assess the predictive capabilities of the PCA. Beyond being able to predict the copolymer ratio, in some cases, the SIMS analysis is able to provide insight into the molecular sequence of a copolymer. The insight gained in this study will be beneficial for developing structure–function relationships based upon ToF‐SIMS data of polymer libraries. © 2016 The Authors Surface and Interface Analysis Published by John Wiley & Sons Ltd.     

Extraction of hidden information of ToF‐SIMS data using different multivariate analyses

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) is a powerful tool for determining surface information of complex systems such as polymers and biological materials. However, the interpretation of ToF‐SIMS raw data is often difficult. Multivariate analysis has become effective methods for the interpretation of ToF‐SIMS data. Some of multivariate analysis methods such as principal component analysis and multivariate curve resolution are useful for simplifying ToF‐SIMS data consisting of many components to that explained by a smaller number of components. In this study, the ToF‐SIMS data of four layers of three polymers was analyzed using these analysis methods. The information acquired by using each method was compared in terms of the spatial distribution of the polymers and identification. Moreover, in order to investigate the influence of surface contamination, the ToF‐SIMS data before and after Ar cluster ion beam sputtering was compared. As a result, materials in the sample of multiple components, including unknown contaminants, were distinguished. Copyright © 2014 John Wiley & Sons, Ltd.     

A ToF‐SIMS investigation of a buried polymer/polymer interface exposed by ultra‐low‐angle microtomy

The interfacial region of a model multilayer coating system on an aluminium substrate has been investigated by high‐resolution time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS). Employing ultra‐low‐angle microtomy (ULAM), the interface between a poly(vinylidene difluoride) (PVdF)‐based topcoat and a poly(urethane) (PU)‐based primer ‘buried’ >20 µm below the PVdF topcoat's air/coating surface was exposed. Imaging ToF‐SIMS and subsequent post‐processing extraction of mass spectra of the ULAM‐exposed interface region and of the PVdF topcoat and PU primer bulks indicates that the material composition of the polymer/polymer interface region is substantially different to that of the bulk PVdF and PU coatings. Analysis of the negative ion mass spectra obtained from the PVdF/PU interface reveals the presence of a methacrylate‐based component or additive at the interface region. Reviewing the topcoat and primer coating formulations reveals that the PVdF topcoat formulation contains methyl methacrylate (MMA)–ethyl acrylate (EA) acrylic co‐polymer components. Negative ion ToF‐SIMS analysis of an acrylic co‐polymer confirms that it is these components that are observed at the PVdF/PU interface. Post‐processing extraction of ToF‐SIMS images based on the major ions of the MMA–EA co‐polymers reveals that these components are observed in high concentration at the extremities of the PVdF coating, i.e. at the polymer/polymer interface, but are also observed to be distributed evenly throughout the bulk of the PVdF topcoat. These findings confirm that a fraction of the MMA–EA acrylic co‐polymers in the formulation segregate to the topcoat/primer interface where they enhance the adhesive properties exhibited by the PVdF topcoat towards the underlying PU primer substrate. Copyright © 2004 John Wiley & Sons, Ltd.     

Identifying and minimizing buffer interferences in ToF‐SIMS analyses of lignocellulose

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has demonstrated applicability to the analysis of lignocellulosic samples including pulp, paper, plants, and wood. One such application is to use ToF‐SIMS as a tool for detecting the activity of enzymes applied to degrade or modify plant biomass. The use of buffers for pH control of these enzymatic reactions can pose problems due to the nature of the ToF‐SIMS measurement. Specifically, inorganic species (e.g. salts) from buffer components could introduce several concerns for quantitative or semi‐quantitative ToF‐SIMS analysis. First, salts can produce additional peaks in the mass spectra, which may overlap with lignocellulose peaks of interest (mass interference). Second, salts can alter the chemical environment, or ‘matrix’, altering the ionization probability of lignocellulose‐related secondary ions during the sputtering mechanism of the ToF‐SIMS measurement (matrix effects). Third, salts may physically coat the lignocellulose surface, decreasing the signal from the lignocellulose, causing poor signal‐to‐noise in the analysis. The current work presents a simple approach for identifying interferences due to buffers, using both principal component analysis (PCA) and previously established lignocellulose‐relevant peak ratios. Furthermore, a simple acetic acid rinsing protocol is compared to distilled water rinsing and is evaluated and for its effectiveness in removing buffer‐related salts. The data shows that briefly rinsing lignocellulose samples in dilute acetic acid can be effective in restoring the validity of lignocellulose composition interpretations using ToF‐SIMS. Copyright © 2014 John Wiley & Sons, Ltd.     

The issue of pseudoreplication when applying a statistical exploratory approach to extract relevant features from ToF‐SIMS spectra

The issue of automated peak selection in time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) spectra is examined in relation to the hierarchical nature of the experimental design and the related existence of observations which are not statistically independent. To avoid unreliable results, the presence of pseudoreplication should be taken into account correctly. A combination of the recommended univariate peak selection approach with some multivariate techniques, namely principal component analysis and heat map data representation, is proposed to highlight and analyze obtained results for a set of ToF‐SIMS spectra from copper phthalocyanine thin films grown on TiO₂ substrates by a supersonic beam deposition apparatus. New insight is obtained on the effectiveness of the deposition for different working parameters of the process. Copyright © 2013 John Wiley & Sons, Ltd.     

ToF‐SIMS study of 1‐dodecanethiol adsorption on Au,Ag, Cu and Pt surfaces

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) has been used to perform a chemical analysis of long‐chain thiol (CH₃(CH₂)₁₁SH)‐treated gold, silver, copper and platinum surfaces. All the mass peaks from positive and negative ion spectra within the range m/z = 0–2000 u are studied. ToF‐SIMS data revealed that on gold, silver and copper substrates 1‐dodecanethiol form dense standing‐up phases, but on platinum being a catalytically active substrate, we were able to identify also surface‐aligned parallel lying molecules in addition to a standing thiolate layer. Our study shows that when ToF‐SIMS spectra are analyzed, not only the existence of oligomers but also metal + hydrocarbon fragments give information about the order of SAM. Copyright © 2008 John Wiley & Sons, Ltd.     

Detecting changes in arabidopsis cell wall composition using time‐of‐flight secondary ion mass spectrometry

Time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS) was previously used to characterize lignocellulosic materials, including woody biomass. ToF‐SIMS can acquire both rapid spectral and spatial information about a sample's surface composition. In the present study, ToF‐SIMS was used to characterize the cell walls of stem tissue from the plant model organism, Arabidopsis thaliana. Using principal component analyses, ToF‐SIMS spectra from A. thaliana wild‐type (Col‐0), cellulose mutant (irx3), and lignin mutant (fah1) stem tissues were distinguished using ToF‐SIMS peaks annotated for wood‐derived lignocellulose, where spectra from the irx3 and fah1 were characterized by comparatively low polysaccharide and syringyl lignin content, respectively. Spatial analyses using ToF‐SIMS imaging furthermore differentiated interfascicular fiber and xylem vessels based on differences in the lignin content of corresponding cell walls. These new data support the applicability of ToF‐SIMS peak annotations based on woody biomass for herbaceous plants, including model plant systems like arabidopsis. Copyright © 2015 John Wiley & Sons, Ltd.     

Differentiating diterpene resin acids using ToF‐SIMS and principal component analysis: new tools for assessing the geochemistry of amber

Amber is a polymerized plant resin having remarkable preservation potential in the geological record. Numerous analytical techniques have been applied to the study of amber organic chemistry in order to extract paleobotanical information. However, only exploratory work has been conducted using time‐of‐flight secondary ion mass spectrometry (ToF‐SIMS), despite its immense potential due to the high mass resolution and range that can be analyzed concurrently. Detailed assessments of ion fragmentation patterns are prerequisite, given that amber is comprised of a challenging range of terpenoids, carboxylic acids, alcohols, and associated esters. In recent work, we demonstrated the applicability and efficiency of ToF‐SIMS as a tool to investigate amber chemical composition. However, only two diterpene resin acid standards were considered in this preliminary study, namely abietic acid and communic acid. We now extend this work by documenting the ToF‐SIMS spectra of ten additional diterpene resin acids and ask whether ToF‐SIMS analysis can distinguish subtle differences within a larger set of diterpenoids. Both positive and negative ToF‐SIMS spectra were produced, although negative polarity appears particularly promising for differentiating diterpene resin acids. Principal component analysis (PCA) was used to distill the data and verified that purified diterpenes have distinct ToF‐SIMS spectra that can be applied to amber chemotaxonomy as well as to the analysis of modern resins of known botanical origin. While this work is pertinent to the study of the composition and histories of ambers, the mass spectra of the 12 diterpene standards could prove valuable to any system where diterpenoid chemistry plays a role. Copyright © 2014 John Wiley & Sons, Ltd.