Surface profile inspection of a moving object by using dual-frequency Fourier transform profilometry

The 2π phase ambiguity caused by surface isolations and large height step can be solved by dual-frequency projection grating profilometry. However, in the Fourier transform profilometry (FTP) of a moving object, only one single deformed fringe pattern can be obtained. In order to introduce the dual-frequency technique into the FTP of moving object, a novel experimental system is designed to capture two fringe patterns with different frequency at the same time. A grating structure comprising two regions with different frequencies is projected upon the surface of the detected object. Two line-scan CCD cameras are used to capture the surface images encoded by the two kinds of patterns, respectively. By getting the corresponding image intensity at the same point of the object surface in the two acquired images, the dual-frequency technique is applied to extract the real phase without phase ambiguity. The surface profile of a specimen with a large height step is measured to prove the feasibility of the proposed method. The experimental results show that the proposed method can solve the 2π phase ambiguity problem successfully in the surface profile inspection of a moving object.     

A novel 3D measuring method for discontinuous object by non-integral twin-frequency grating

A new 3D shape measurement method based on non-integral twin-frequency grating projection is proposed. In this paper, the projected composite grating is composed of two sinusoidal gratings, and the quotient of whose frequencies is not an integer. By using appropriate phase-shifting algorithms, two wrapped phases can be obtained from sixteen frames of the distorted grating patterns. In aid of appropriate phase unwrapping method, the unwrapped phase of high frequency fringe is obtained only from the relation of the two wrapped phases by a pixel-to-pixel phase unwrapping technique. Therefore the unwrapped phase of high frequency fringe pattern is independent of the low frequency fringe pattern, different from traditional integral twin-frequency grating projection methods in which the phase unwrapping error of low frequency fringe pattern may be propagated onto the unwrapped phase of high frequency fringe pattern. The new theory proves that the proposed method is applicable to measure discontinuous object, and has considerable measurement accuracy.     

An improved stair phase encoding method for absolute phase retrieval

An improved phase unwrapping method is proposed to reduce the projection fringes in three-dimensional (3D) surface measurement. Color fringe patterns are generated by encoding with sinusoidal fringe and stair phase fringe patterns in red and blue channels. These color fringe patterns are projected onto the tested objects and then captured by a color CCD camera. The recorded fringe patterns are separated into their RGB components. Two groups of four-step phase-shifting fringe patterns are obtained. One group of the stripes are four sinusoidal patterns, which are used to determine the wrapped phase. The other group of stripes are four sinusoidal patterns with the codeword embedded into stair phase, whose stair changes are perfectly aligned with the 2π discontinuities of sinusoidal fringe phase, which are used to determine the fringe order for the phase unwrapping. The experimental results are analyzed and compared with those of the method in Zheng and Da (2012. Opt Express 20(22):24139–24150). The results show that the proposed method needs only four fringe patterns while having less error. It can effectively reduce the number of projection fringes and improve the measuring speed.     

一种针对彩色物体的光栅投影三维测量方法

针对传统彩色编码光栅三维轮廓术中光栅易受到物体表面彩色纹理的干扰,从而造成编码条纹颜色误判和相位误差增大这一问题,提出一种基于互补彩色光栅的三维测量方法,给出了理论分析、光栅设计原理、补偿算法与实验分析。对图像进行初步的解耦校正后,通过预先设计的光栅互补特性,依据彩色响应模型求取物体表面逐点的反射率,并对红绿蓝(RGB)三通道反射率的不平衡进行补偿,消除物体表面彩色纹理的干扰,改善光栅的正弦性。以补偿后的图像来指导彩色编码条纹的分割解码并用傅里叶变换法提取出包裹相位,依据解码结果指导相位展开,继而完成整个三维测量过程。实验证明该方法对彩色纹理的补偿准确有效,降低了彩色纹理对测量的影响。     

Phase measuring profilometry based on elliptically pattern grating

The present study proposes a new method for measuring the surface shape of an object using elliptically pattern grating projection. Based on phase measuring profilometry (PMP), elliptically pattern grating is projected on the surface of the object to measure its shape in 3D. The computing formula for solving the phase by the phase-shifting fringe method is derived, and the 3D shape formula for the altitude is reestablished. The error-contrastive analysis of the object's surface shape is re-established based on the proposed method and traditional PMP. The proposed method was shown to have a strong anti-noise ability and able to measure objects under high noise. More accurate measurement results were obtained by computer simulation and experiment to verify the feasibility of the proposed method.     

3D shape measurement of larger complex objects based on fringe cycle correction

The grating fringe on the reference plane is broadened in the intersecting axis system because of oblique-angle projection. In order to solve this problem, we study the theoretical model of the temporal phase unwrapping method based on the fringe cycle correction. We also study the 3D shape measurement theoretical model of the larger complex objects after considering the coordinate deviation and lens distortion. Experimental results demonstrate that the fringe cycle on the reference plane can be corrected to a constant value, the lens distortion can be corrected, and 3D shape of larger complex objects can be accurately measured.     

Measurement of surface topography by RGB Shadow-Moiré with direct phase demodulation

In this paper we present the application of a direct demodulation method for the measurement of surface topography by means of Shadow-Moiré. In our set-up, we use three LEDs (with green, red and blue peak wavelengths) to illuminate the grating. Due to the different position of these light sources, a polychromatic Shadow-Moiré fringe pattern is produced, which can be described as the superposition of three monochromatic (red, green and blue) fringe patterns. Taking the image of this polychromatic fringe pattern with a RGB CCD camera, we get a monochromatic fringe pattern stored at each RGB channel of the CCD. The direct demodulation algorithm employed uses these fringe patterns to calculate the wrapped phase map. After unwrapping the phase map using a standard multi-grid technique, we implemented an automatic procedure to detect the area of interest of the phase map by removing low modulation zones and to calculate the absolute value of the phase. In this way it is possible to determine the topography of a surface with a single RGB snapshot maintaining a simple experimental set-up, which is an important feature, especially for the study of dynamic phenomena such as deformations. We present the experimental results obtained after measuring different objects with both smooth and rough surface textures.     

Defect information detection of a spare part by using a dual-frequency line-scan method

The surface defect of a moving spare part is measured by a line-scan system online. The experimental system is combined with a line-scan CCD, a LCD projector, a translation stage, and a personal computer. The deformed fringe patterns of the spare part can be captured and stored in the personal computer. The Fourier transform method is used to extract the fringe deformation. Following the geometric relationship between the fringe deformation and the surface height, the full-field surface 3D information can be obtained. Furthermore, the projection dual-frequency composite grating technique is used to solve 2π phase ambiguity problem because of some bigger surface defect steps. Some experimental results are presented to prove the feasibility of the proposed method and the inspection system.     

Evaluation of absolute phase for 3D profile measurement using fringe projection

A new method of absolute phase evaluation for three-dimensional (3D) profile measurement using fringe projection is presented, which combines the gray code and the phase shift technique. Two kinds of fringe patterns are projected onto the object surface respectively, one is sinusoidal intensity distribution used for phase demodulation and the other is gray code fringe pattern for unwrapping. These images are acquired by camera and stored into computer. The absolute phase is obtained by analyzing these images. The validity of this method is verified experimentally. The method is superior to other phase unwrapping methods.     

基于声光栅的变频条纹投射系统

针对三维形貌测量中结构光照明系统投影速度慢、结构复杂、在线集成困难的问题,提出了一种基于声光栅的变频条纹投射系统。该系统利用拍频信号驱动声光偏转器,在声光晶体中形成两个重叠的光栅,光源发出的激光以布拉格角入射,形成两束一级衍射光,经透镜聚焦形成光强按正弦规律分布的结构光条纹。建立了数学模型,同时提出了一种新的相位凝固技术,使条纹空间频率和相位的变化规律得到了很好的解释。该系统结构紧凑、体积小,全电控可调,无任何机械移动部件,具有条纹投影速度快、精度高、动态可编程的特点。应用该系统对石膏像形貌进行测量,获得了用于三维成像的相位图。该投射系统对于解决复杂几何形状物体的三维测量问题具有较高的工程应用价值。     

Shape identification using phase shifting interferometry and liquid-crystal phase modulator

A phase shifting technique using a Michelson interferometry system is presented and applied to surface contour measurement. Hyperbolic fringes are produced by the interference of two spherical wavefronts expanded from a beam expander. The fringe pattern is projected on an object surface and the deformed grating image is captured by a CCD camera for subsequent analysis by a PC. Phase variation is achieved by a liquid-crystal device incorporated in the Michelson interferometry system. Results obtained using the proposed method for objects of various shapes and sizes compared well with those from a conventional profilometer.     

基于自适应条纹投影的高反光物体三维面形测量

结构光投影方法在三维形貌测量中应用广泛,但是由于被测物体表面反射率变化范围较大,过度曝光会导致相位信息无法获取。而传统的高动态范围扫描技术步骤复杂,耗时较长。文中提出一种自适应条纹投影技术,向待测物体表面投射较高灰度级的条纹图,判断并标记过度曝光点。降低投射强度后通过非线性最小二乘法拟合来确定每个饱和像素点最适合的最大输入灰度,用重新生成的自适应条纹图来采集图像并进行相位计算和三维形貌恢复。通过实验验证,该方法可以对物体表面的高反光区域进行有效测量,避免过度饱和,仿真误差在0.02 mm范围内,实测误差约为0.14 mm,实际实验对过曝点的补偿率可达到99%。     

Surface profile measurement of moving objects by using an improved π phase-shifting Fourier transform profilometry

The π phase-shifting Fourier transform technique is introduced into the surface profile measurement of moving objects. A digital grating comprising two regions, which have a π phase shifting is projected onto the object. Two line-scan CCD cameras are used to capture two deformed fringe patterns with π phase shifting at the same time. As the object is moving, each point at the object surface can be captured twice. The digital correlation method is used to calibrate the experimental system. The zero-order component can be eliminated by subtracting intensities of the same surface point in two captured images. And then the phase can be extracted by Fourier transform without the disturbance of zero-order component. Experimental results demonstrate that this method is feasible for the moving surface profile detection and the measurable slope of height variation can be extended.     

A flexible fast 3D profilometry based on modulation measurement

This paper proposes a flexible fast profilometry based on modulation measurement. Two orthogonal gratings through a beam splitter are vertically projected on an object surface, and the measured object is placed between the imaging planes of the two gratings. Then the image of the object surface modulated by the orthogonal gratings can be obtained by a CCD camera in the same direction as the grating projection. This image is processed by the operations consisting of performing the Fourier transform, spatial frequency filtering and inverse Fourier transform. Using the modulation distributions of two grating patterns, we can reconstruct the 3D shape of the object. In the measurement process, we only need to capture one fringe pattern, so it is faster than the MMP and remains the advantages of it. In the article, the principle of this method, the setup of the measurement system, some simulations and primary experiment results are given. The simulative and experimental result proves it can restore the 3D shape of the complex object fast and comparatively accurate. Because only one fringe pattern is needed in the testing, our method has a promising extensive application prospect in real-time acquiring and dynamic measurement of 3D data of complex objects.     

Deformation and profile measurement using the digital projection grating method

This paper presents a digital projection grating method for full field measurement of out-of-plane deformation and shape of an object. Two grating patterns on an object before and after deformation are captured by a CCD camera and stored in a computer. With the aid of Fast Fourier Transform (FFT) and signal demodulating techniques, a wrapped phase map is generated. The phases are expanded in the range of 0–2π and compared with the resulting moiré pattern. An unwrapping procedure is used to obtain a continuous phase. In addition, a digital method for fractional fringe multiplication is also developed. Results on deformation and object profile measurements are presented.     

连续振动悬臂梁的瞬时三维形貌测量

提出一种连续振动悬臂梁瞬时三维形貌的测量方法。利用影栅云纹法在连续振动悬臂梁表面产生包含有三维形貌信息的云纹,采用准直双光源提高亮度,通过高速摄相机获取随时间变化的一系列变形条纹,利用傅里叶变换方法对序列图像进行处理,采用补零延拓法对数据进行处理,以减小频谱泄漏所引起的相位计算误差。将相位解包裹方法用于动态过程瞬时三维相位场的相位展开中,重建了悬臂梁的瞬时三维形貌,再现了悬臂梁的连续振动过程。     

Study on a novel phase-recovering algorithm for partial intensity saturation in digital projection grating phase-shifting profilometry

The phase error and its periodic behavior caused by the partial intensity saturation of fringe patterns in the digital projection grating phase-shifting profilometry are studied. A saturation coefficient K is defined to describe the saturation degree of the fringe patterns projected on a measured object. The distribution of the phase error is analyzed through a simulation method. Moreover, a novel phase-recovering algorithm is studied to resolve the phase error issue introduced by the partial saturated fringe patterns. The real phase can be recovered by the unsaturated intensity values. A series of results corresponding to different degrees of saturation defined by K are given to prove the validity of the proposed algorithm.     

Microscopic surface contouring by fringe projection method

This paper describes the use of optical fringe projection method for 3D surface profile and deformation measurement of micro-components. In this method, sinusoidal linear fringes are projected on a micro-component surface by a grating phase shifting projector and a long working distance microscope (LWDM). The image of the fringe pattern is captured by a high-resolution CCD camera and another LWDM and processed by phase-shifting technique. A simple procedure is described which enables calibration of the optical set-up for subsequent quantitative measurement of micro-components of unknown shapes. This method is relatively simple and accurate, and is capable of conducting fully automated measurements. In this paper, two micro-components, a micro-mirror (0.1 mm×0.1 mm) and a micro-electrode pad are used to demonstrate deformation measurement and microscopic surface contouring.     

Robust wrapping-free phase retrieval method based on weighted least squares method

Phase unwrapping is one of the most challenging processes in many profilometry techniques. To sidestep the phase unwrapping process, Perciante et al. (2015) proposed a wrapping-free method to retrieve the phase based on the direct integration of the spatial derivatives of the fringe patterns. However, this method is only applicable to objects with phase continuity, so it may fail to handle fringe patterns containing complicated singularities such as noise, shadows, shears and surface discontinuities. In the light of this problems, a robust wrapping-free phase retrieval method is proposed that is based on the combined use of Perciante's method and the weighted least squares method. Two partial derivatives of the desired phase are obtained from the fringe patterns, while the carrier is eliminated using the direct phase difference method. The phase singularities are determined using a derivative variance correlation map (DVCM), and the weighting coefficient is obtained from the binary mask of the reverse DVCM. Simulations and experiments are conducted to prove the validity of the proposed method. The results are analyzed and compared with those of Perciante's method demonstrating that in addition to maintaining the advantage of sidestepping the phase unwrapping process, the proposed method is available for measuring objects with some types of singularities sources.     

Automatic Analysis of the Phase Object Using Projection Moire Deflectometry

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