Transient response of infrared photoconductors: The roles of contacts and space charge

The transient response of an extrinsic photoconductor, with two implanted ohmic contacts, has been calculated by solving the full continuity equation using a variable finite difference technique. For a step function in photon flux under constant voltage bias, transient times ranging from 10^–4 to 10^–2 s have been determined for 20 to 200 m thick detectors under the low background fluxes typical of infrared astronomy. The transient response consists of a fast and a slow component, with their relative magnitudes dependent on the ratio of diffusion and drift lengths to the device length. The characteristic time for the fast component is determined, as expected, by the carrier lifetime, but a slower transient response is also present which is controlled by out-diffusion and sweep-out and the establishment of a counteracting electric field barrier. The effects of material and operating parameters have been investigated, and an analytical model is presented for estimating transient response times for any extrinsic photoconductor. Contact-limited transient response will be most limiting for operation of thin device structures under very low photon backgrounds.     

Nearest neighbor effect on capture cross sections measured in IR phototransients on Si:In

The extrinsic photoconductive decay at T=20–100 K is analyzed in FZ-grown Si: In material after pulsed irradiation by a PbSSe infrared laser (=4 m). Trapping time constants (=10 ns-100 s) are resolved for the prevalent In acceptor (N _In=10¹⁶–10¹⁷ cm^–3) and for additional shallow acceptors B, Al, and the X(In)-center present at low concentrations (N=10¹²–10¹⁴ cm^–3). Hole capture cross sections determined for the acceptor levels show a large scatter over up to 4 orders of magnitude. It is shown that the capture cross section is dependent on all the dopant concentrations present in the sample due to nearest neighbor interaction. Due to the formation of donor-acceptor dipoles, the capture cross section assumes low values. A model calculation of the interaction based on only fundamental parameters of Si is in accordance with the experimental data within the experimental error. The hole capture cross sections for isolated acceptors are _p=1×10^–12, 1×10^–14, 1×10^–13, 2.5×10^–13 cm² for indium, X-center, aluminum, and boron at the temperatures T=95 K, 100 K, 70 K, 45 K, respectively.     

The origin of reduced fill factors of emitter‐wrap‐through‐solar cells

Low fill factors generally limit the efficiency of emitter‐wrap‐through (EWT) solar cells. Until now, a conventional series resistance limitation along the laser‐drilled EWT vias has usually been assumed to be responsible for this effect. We demonstrate that the characteristic fill factor loss is caused by a crucial change in the diffusion currents inside the base, which are influenced by the conductivity along the laser‐drilled EWT vias. In addition, we show that the EWT via conductivity influences the fill factor loss caused by an iron contaminated base. This result affects the proposition that the EWT design is suitable for multicrystalline silicon in which interstitial iron is known to be the main contaminant. (© 2008 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Optoelectronic characteristics of close-packed HgTe nanoparticles in the infrared range

Absorption, photoluminescence (PL), photoresponse, and I-V measurements were made for a close-packed HgTe nanoparticle film without organic capping materials to investigate its optoelectronic characteristics in the infrared (IR) range. In the absorption and PL spectra taken for the close-packed nanoparticle film, the wavelength of exciton peak was red-shifted, compared with 1-thioglycerol capped HgTe nanoparticles dispersed in solution. For the HgTe nanoparticle film, dark current was below several pA level, current was increased by about three orders of magnitude at a biased voltage of 3 V under the illumination, and photoresponse was very rapid compared with 1-thioglycerol capped HgTe nanoparticles. These optoelectronic characteristics illustrate that HgTe nanoparticles are one of promising materials for the photodetector in the IR range. Finally, the origin for the increase of photocurrent with increasing temperature observed in this study will be discussed.     

On the photoconductivity of layered molecular complex of fullerene C60 with saturated amine TMPDA

It was revealed that the photoconductivity of layered molecular complex of fullerene C₆₀ with saturated amine TMPDA: TMPDA · C₆₀ is caused by intermolecular electronic processes in the fullerene layers. The intermediate magneto‐sensitive stage of photogenerating free charge carriers was found to be due to the effect of magnetic field on the rate constant of the triplet charge transfer exciton annihilation process. (© 2007 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Electron traps in wide-gap n-Hg0.3Cd0.7Te characterized by time-resolved photoconductivity

Time-resolved photoconductivity measurements have been used to characterize electron traps in wide-gap n-HgO_0.3Cd_0.7Te for the first time. The characterization was made possible by combining the time-resolved photoconductive data with the analytical method conventionally used in DLTS spectroscopy. Two electron traps were found in the band gap with 61 meV and 79 meV below the conduction band edge, their concentrations are 1.1×10¹³ cm^–3 and 5.8×10¹¹ cm^–3, respectively. Compared with DLTS spectroscopy, this characterization method markedly simplifies sample preparation and experimental procedure.     

Determination of photoexcited carrier concentration and mobility in GaAs doping superlattices by hall effect measurements

The photo-Hall effect in a new type of periodicp-n doping multilayer structures (superlattices) of GaAs grown by molecular beam epitaxy has been investigated. In these space charge systems electrons and holes are separated in real space. As a consequence, large deviations from thermal equilibrium become quasi-stable. Carrier generation by optical absorption occurs in these doping superlattices even at photon energies far below the gap of the homogeneous semiconductor material. The photoexcitation results in a strong enhancement of the conductivityparallel to the layers and in a substantial photovoltaic response. An increase in carrierconcentration as well as an increase in carriermobility both contribute to the observed enhancement of the conductivity under excitation. The absolute values of changes in free-carrier concentration are very large due to the manyfold active layers of the structure. The measured free-carrier mobilities depend on the population of the multilayer system. A reduction in mobility as compared to bulk material is found to be more pronounced in weakly populated systems. This finding is caused by the larger weight of the boundary regions of the total active layers where the free-carrier density is lower than the density of ionized impurities resulting in an enhanced impurity scattering.     

Role of free carriers in the application of optically detected magnetic resonance for studies of defects in silicon

The influence of free carriers on optically detected magnetic resonance (ODMR) signals for defects in silicon is discussed. The presence of free carriers induces a strong background signal in the ODMR spectrum due to carrier heating effects in a microwave field. This background signal often obscures a possible detection of a defect-related magnetic resonance signal and is therefore highly undesirable. To avoid this problem, a delayed ODMR (D-ODMR) technique is employed. On the other hand, the presence of free carriers provides a medium for a possible ODMR detection of nonradiative defects. This is realized by a shunt pass of carrier recombination at such defects, which competes with the radiative carrier recombinations detected optically, and gives rise to negative ODMR signals for the defects responsible for the nonradiative recombination. Typical examples from recent studies of these different cases of defects in silicon are demonstrated.Dedicated to H.-J. Queisser on the occasion of his 60th birthday     

Field-enhanced carrier-generation effect of deep-level centers in semiconductors

A general theory on the field-enhanced carrier generation of deep-level centers in semiconductors is put forward in order to explain the relevant phenomena observed in some experiments. It is concluded that generally both the Coulombic and the non-Coulombic emissions control the generation process of carriers from deep-level centers. On the basis of this, a theoretical relationship between the generation current density and the effective generating width is derived. Further it is shown that the present theory is better than the previous ones in which the non-Coulombic emission was ignored in explaining the experimental results and the latter can be considered a special case of the former.     

Multi-exponential analysis of DLTS

Deep-level transient spectroscopy (DLTS), which is widely used to characterize deep impurity centers in semiconductors, assumes a single exponential wave form for the transient junction capacitance. When there are several closely spaced energy levels this assumption is no more valid, and the conventional DLTS may lead to errorneous results. To overcome this difficulty we propose here a novel method which we call the multi-exponential DLTS(MEDLTS). The transient wave form of the junction capacitance is directly analysed into multi-exponential compouents using the nonlinear least-squares analysis program DISCRETE developed by Provencher. The resolved time constants of these components are then displayed in the form of aT ²–1/T plot. According to the results of simulation with various parameters MEDLTS is shown quite effective to resolve closely spaced energy levels which can not be resolved by the conventional DLTS. As an example of the application of this method deep levels in Si: Au were investigated. The results have shown that a single peak in conventional DLTS actually consists of two adjacent levels with activation energies and capture cross-sectionsE _B1=0.49 eV, _B1=1.1×10^–14cm² andE _B2=0.46 eV, _B2=1.3×10^–15 cm² and with amplitude ratio 11.     

Photoconductivity and the structural phase transition in SrTiO3

Detailed photoconductivity measurements have been performed in nominally pure SrTiO₃ in order to elucidate the effect of the antiferrodistorsive cubic-tetragonal phase transition. Small features in the photoconductivity’s temperature dependence in the phase transition region were found using low intensity interband UV or 514 nm light illumination. Such features are associated with a transformation of the defect system controlling the photoconductivity. At the same time, the temperature behavior of the photoconductivity spectral maximum reveals a rather unusual feature which is connected with changes in the absorption band edge structure in the phase transition region.     

Shallow acceptor population and free hole concentration in Si: In and Si:Ga with IR-photoexcitation

Hall measurements at low temperaturesT<50 K have been performed on Si:In (N _In10¹⁷ cm^–3) and Si:Ga (N _Ga10¹⁸ cm^–3) with infrared photoexcitation of holes into the valence band. It is shown in quantitative agreement with a theoretical model that the population of shallow acceptors, e.g. B and Al, which are present as impurities in concentrations ofN _B,Al10¹²-10¹⁴ cm^–3 strongly affects the photoexcited hole concentration. Photo-Hall measurements can, therefore, serve as a tool for the determination of low impurity acceptor concentrations in the case of high In- or Ga-doping. Hole capture coefficientsB _In=6×10^–4 (T/K)^–1,8 cm³ s^–1 andB _Ga=2×10^–4 (T/K)^–1 cm³ s^–1 have been determined.     

Impact of the sublinear photoconductivity law on the interpretation of holographic results in BaTiO3

Thick holographic refractive index gratings are written in nominally pure and in iron doped BaTiO₃ crystals. The phase shift between refractive index grating and light pattern is studied as a function of an externally applied electric field by a direct phase shift measuring technique. The choice of the method is suggested by a theoretical analysis which allows for the effect of a nonlinear relation between photoconductivity and light intensity on the holographic writing process.     

Band gap states of V and Cr in 6H-silicon carbide

Ti, V and Cr in n-type 6H-SiC were investigated by radiotracer deep level transient spectroscopy (DLTS). Doping with the radioactive isotopes ⁴⁸V and ⁵¹Cr was done by recoil implantation followed by annealing (1600 K). Repeated DLTS measurements during the elemental transmutation of these isotopes to ⁴⁸Ti and ⁵¹V respectively revealed the corresponding concentration changes of band gap states. Thus, three levels were identified in the band gap: a Cr level at 0.54 eV and two V levels at 0.71 and 0.75 eV below the conduction band edge. There are no deep levels of Ti in the upper part of the band gap. Received: 28 April 1997/Accepted: 16 May 1997     

Determination of bulk and surface transport properties by photocurrent spectral measurements

Reliable minority carrier diffusion length and surface recombination velocity values have been obtained from stationary photocurrent measurements. A modified surface photovoltage method has been used to determine diffusion lengths longer than the wafer thickness in high-purity Si, whereas the spectral variation of the photocurrent has been employed to measure the surface recombination velocity. The novelty presented in this paper is that a Schottky diode has been employed in both the methods to collect generated charged carriers. Moreover the same Schottky diode has been employed in both the methods in order to avoid any a priori assumptions on the material transport parameters. This combined application of the two methods at the same device enables the determination of highly reliable results. Received: 17 February 2000 / Accepted: 28 March 2000 / Published online: 30 June 2000     

Time-dependent photocurrent of a CdTe nanoparticle film under the above-gap illumination

Time-dependent photocurrent of a solid film of 1-thioglycerol-capped CdTe nanoparticles under the illumination of the 325-nm wavelength light is characterized to investigate the transport mechanism of photo-generated charge carriers in this nanoparticle film. Under the illumination of the above-gap light, photocurrent rises rapidly, and subsequently it decays or rises slowly, depending on the magnitude of bias voltage. A careful investigation into the variation in the magnitude of the current measured as a function of time while the light was switched on and off periodically reveals that rapidly and slowly respondent photocurrents overlap in the time-dependent photocurrent. Charge carriers contributing to the rapidly and slowly respondent photocurrents are electrons and holes separated from a fraction of excitons excited by the above-gap light. The transport behaviors of these charge carriers may explain the monotonously decay and slow rising of the photocurrent after its rapidly rising under the illumination for the solid film at unbiased and biased voltage, respectively.     

Theory of electron escape from the surface of liquid helium

We have studied the properties of an electron bubble close to the surface of liquid³ He, by using a Density Functional approach. We find that up to an electron-surface distanced ₀ 23 Åthe bubble is stable, while at smaller distances it becomes unstable and bursts. A potential energy barrier /K _B 38°K for the thermal emission of electrons is obtained from our results, in agreement with experiments. Even when the electron-surface distance is larger thand ₀, however, tunneling through the surface layer dominates the electron escape probability. Large deviations of the electron potential energy from its ideal value are found close to the surface. These deviations have a profound effect on the calculated decay rates of the tunneling curent, which are much smaller than those obtained previously and in semi-quantitative agreement with experiments.     

Optoelectronic characteristics of CdTe/HgTe/CdTe quantum-dot quantum-well nanoparticles

Optoelectronic characteristics of CdTe/HgTe/CdTe quantum-dot quantum-well (QDQW) nanoparticles synthesized by the colloidal method are investigated in this study. Strong exciton bands were observed in absorption and photoluminescence (PL) spectra taken for the CdTe/HgTe/CdTe QDQW nanoparticles. The energy difference between the exciton absorption and PL bands is larger than those obtained with CdTe and HgTe nanoparticles. Photocurrent-voltage curves and time-dependent photocurrent curves were obtained for the CdTe/HgTe/CdTe QDQW nanoparticles. With regard to the photocurrent mechanism of these QDQW nanoparticles, those charge carriers participating in the formation of excitons may not contribute to the photocurrent, because of the large binding energy of the excitons. Moreover, it is suggested in this paper that free holes in the HgTe quantum-well in the valance band, rather than free electrons, are the main contributors to the photocurrent.     

Photosensitivity of nanocrystalline ZnO films grown by PLD

We have studied the properties of ZnO thin films grown by laser ablation of ZnO targets on (0 0 0 1) sapphire (Al₂O₃), under substrate temperatures around 400 °C. The films were characterized by different methods including X-ray photoelectron spectroscopy (XPS), X-ray diffraction (XRD) and atomic force microscopy (AFM). XPS analysis revealed that the films are oxygen deficient, and XRD analysis with θ-2θ scans and rocking curves indicate that the ZnO thin films are highly c-axis oriented. All the films are ultraviolet (UV) sensitive. Sensitivity is maximum for the films deposited at lower temperature. The films deposited at higher temperatures show crystallite sizes of typically 500 nm, a high dark current and minimum photoresponse. In all films we observe persistent photoconductivity decay. More densely packed crystallites and a faster decay in photocurrent is observed for films deposited at lower temperature.     

Inelastic processes in the scattering of metastable rare gas atoms at metal surfaces

Electron spectra of various metastable rare gas atoms systematically measured on a Pt(111) surface with Rb coverages ranging from submonolayers (3%) to multilayers are presented. The different decay channels of the excited particles are discussed in terms of resonant electron exchange processes between the substrate and the projectile in relation to the work function. It is shown that below a certain value of the work function a highly excited negative rare gas atom is formed which can undergo different de-excitation processes. A careful discussion of the branching ratios into the decay channels offers a natural explanation of the variations in the electron spectra induced by alkali metal adsorption. Additionally, an attempt is made to extract information about the alkali metal chemisorption state from the observed electron spectra.