共查询到18条相似文献,搜索用时 500 毫秒
1.
2.
在磨削、研磨和抛光加工过程中产生的微裂纹、划痕、残余应力等亚表面缺陷会导致熔石英元件抗激光损伤能力下降,如何快速、准确地检测亚表面损伤成为光学领域亟待解决的关键问题。采用HF酸蚀刻法、角度抛光法和磁流变斜面抛光法对熔石英元件在研磨加工中产生的亚表面缺陷形貌特征及损伤深度进行了检测和对比分析,结果表明,不同检测方法得到的亚表层损伤深度的检测结果存在一定差异,HF酸蚀刻法检测得到的亚表面损伤深度要比角度抛光法和磁流变斜面抛光法检测结果大一些。且采用的磨粒粒径越大,试件表面及亚表面的脆性断裂现象越严重,亚表面缺陷层深度越大。 相似文献
3.
为了理解前后表面损伤不对称性的物理内涵, 利用阴影成像技术研究了纳秒紫外激光诱使熔石英光学元件表面损伤的时间分辨动力学过程.研究表明,纳秒紫外激光与熔石英作用过程中前后表面损伤的物理机理是完全不同的.前表面处空气中等离子体和冲击波较强, 等离子体的屏蔽作用抑制了余脉冲能量的沉积, 降低了元件损伤程度.而后表面处等离子体吸收激光能量膨胀, 对后表面冲击作用更为严重, 形成的等离子体电子密度可达到1023cm-3以上, 反射部分激光能量与入射的激光余脉冲干涉, 使得
关键词:
熔石英
激光诱使损伤
阴影成像技术
光学元件表面 相似文献
4.
5.
微/纳米尺度亚表面缺陷会降低光学元件等透明样品的物理特性,严重影响光学及半导体领域加工制造技术的发展。为了快速、无损检测透明样品亚表面缺陷,本文针对光学元件亚表面内微米量级缺陷的检测需求,提出了一种基于过焦扫描光学显微镜(TSOM)的检测方法。利用可见光光源显微镜和精密位移台,沿光轴对亚表面缺陷进行扫描,得到亚表面缺陷的一系列光学图像。将采集到的图像按照空间位置进行堆叠,生成TSOM图像。通过获得所测特征的最大灰度值来获得亚表面缺陷的定位信息。提出方法对2000μm深亚表面缺陷的定位相对标准差达到0.12%。该研究为透明样品亚表面缺陷检测及其深度定位提供了一种新方法。 相似文献
6.
《中国光学》2021,(5)
深紫外光刻、极紫外光刻和先进光源等现代光学工程需求牵引先进光学制造技术持续发展,要求超光滑光学元件表面粗糙度达到原子级水平以及表面全频段面形误差达到RMS(Root Mean Square)亚纳米量级甚至几十皮米,推动超光滑光学元件制造要求不断逼近物理极限。目前,对于如何实现上述超高精度要求的超光滑加工技术及装备仍然存在技术挑战。尤其对如何实现柱面,椭球面,超环面等复杂曲面的原子量级超光滑加工仍是国内外前沿研究方向。弹性发射加工技术是一种去除函数稳定,超低亚表面缺陷,面向原子级的超光滑加工方法,可以作为加工上述精度要求光学元件的手段。本文总结了弹性发射加工技术的国内外研究现状及最新进展,归纳了弹性发射加工技术的原理,包含流体特性、抛光颗粒运动特性和化学特性,弹性发射加工装备,影响弹性发射加工技术表面粗糙度提升和材料去除效率的因素,分析了弹性发射加工技术面临的问题,展望了未来的发展方向,期望为弹性发射加工技术进一步发展和应用提供一定的参考。 相似文献
7.
8.
9.
10.
基于熔石英材料对波长为10.6μm的CO2激光具有强吸收作用这一特点,提出采用CO2激光光栅式多次扫描修复熔石英光学元件表面密集分布的划痕和抛光点等缺陷的方法.实验结果表明,在合理的扫描参数下,元件表面的划痕和抛光点等缺陷可被充分地消除.损伤阈值测试结果表明,表面划痕和抛光点等缺陷被完全消除的元件的损伤阈值可回复到或超过基底的损伤阈值.同时结合有限元软件Ansys的模拟结果分析了CO2激光扫描修复及消除元件表面划痕和抛光点等缺陷的过程.本文为消除元件表面划痕和抛光点等缺陷提供了非常有意义的参考. 相似文献
11.
12.
M. Fiebig M. Kauf J. Fair H. Endert M. Rahe D. Basting 《Applied Physics A: Materials Science & Processing》1999,69(7):S305-S307
The use of F2 excimer laser sources, emitting at 157 nm, constitutes a new promising tool for scientific, industrial and lithography applications. The 157-nm laser emission enables high-resolution processes and the high photon energy offers the unique possiblity of photoionizing molecules in a single step. Therefore a lower fragmentation or thermal loading takes place. The 157-nm radiation will enable fundamental research and development for deep UV (DUV) high-resolution optical microlithography in the manufacturing of integrated circuits. This is the next step from the technology of ArF lasers at 193 nm. Furthermore, benefits are expected for key technologies requiring high-resolution processing and the micromachining of tough materials like Teflon or fused silica for micro-optics fabrication. Such applications require F2 excimer laser sources with high performance, reliability and efficiency. The world of nanotechnology is just beginning to reveal its potential. 相似文献
13.
为深入了解熔石英元件化学刻蚀过程,研究了HF刻蚀反应机理、HF刻蚀工艺参数以及刻蚀对表面质量的影响规律。通过控制变量法,获得刻蚀速率随HF浓度、刻蚀温度以及NH4F浓度的变化规律。对刻蚀不同深度后的元件表面粗糙度、形貌、杂质含量以及激光损伤阈值进行了检测,实验结果表明:刻蚀速率受多种因素共同影响,其中HF浓度的促进作用最为显著;刻蚀后的熔石英表面形貌复杂,有横向、纵向、拖尾等形式的划痕,以及坑点、杂质等缺陷,其中横向划痕和纵向划痕占据了缺陷部分的主体,主要杂质铈元素随刻蚀时间的增长不断减少;激光损伤阈值测量实验表明,通过HF刻蚀将元件损伤阈值提高了59.6%。 相似文献
14.
Surface defects,stress evolution,and laser damage enhancement mechanism of fused silica under oxygen-enriched condition 下载免费PDF全文
Wei-Yuan Luo 《中国物理 B》2022,31(5):54214-054214
Oxygen ions (O+) were implanted into fused silica at a fixed fluence of 1×1017 ions/cm2 with different ion energies ranging from 10 keV to 60 keV. The surface roughness, optical properties, mechanical properties and laser damage performance of fused silica were investigated to understand the effect of oxygen ion implantation on laser damage resistance of fused silica. The ion implantation accompanied with sputtering effect can passivate the sub-/surface defects to reduce the surface roughness and improve the surface quality slightly. The implanted oxygen ions can combine with the structural defects (ODCs and E' centers) to reduce the defect densities and compensate the loss of oxygen in fused silica surface under laser irradiation. Furthermore, oxygen ion implantation can reduce the Si-O-Si bond angle and densify the surface structure, thus introducing compressive stress in the surface to strengthen the surface of fused silica. Therefore, the laser induced damage threshold of fused silica increases and the damage growth coefficient decreases when ion energy up to 30 keV. However, at higher ion energy, the sputtering effect is weakened and implantation becomes dominant, which leads to the surface roughness increase slightly. In addition, excessive energy aggravates the breaking of Si-O bonds. At the same time, the density of structural defects increases and the compressive stress decreases. These will degrade the laser laser-damage resistance of fused silica. The results indicate that oxygen ion implantation with appropriate ion energy is helpful to improve the damage resistance capability of fused silica components. 相似文献
15.
随着光学测量与遥感领域的不断发展,折反式光学系统对重量、体积和环境适应性等需求不断提高。基于增材制造技术的金属反射镜以其便于实现优化设计、快速制造和加工工艺性好等优点,逐渐获得国内外学者的关注与研究。与传统金属反射镜相比,增材制造金属反射镜可以提高反射镜的结构刚度,同时可实现更高程度的轻量化。增材制造反射镜可以满足光学系统对环境适应性和快速性的需求。本文首先讨论了金属反射镜的评价指标;其次,综述了国内外在基于增材制造技术制备金属反射镜领域的发展现状和技术参数,从增材制造金属反射镜的基体设计与制备和基体的后处理2个方面展开论述;然后,通过分析,总结了增材制造金属反射镜的技术路线和关键技术;最后,对增材制造反射镜的应用前景提出了展望。 相似文献
16.
V. P. Pashinin N. Yu. Konstantinov V. G. Artjushenko V. I. Konov A. S. Silenok G. Muller B. Schaldach R. Ulrich 《Fiber and Integrated Optics》1991,10(4):365-372
An alteration of absorption spectra of fused silica fibers under delivery of high-power (ultraviolet) UV laser radiation (4th harmonic of the Nd:YAG laser, wavelength 266 nm) was studied in comparison with their photoluminescent properties. Tested fibers were produced by various technologies based on PMCVD methods. The nature of defects responsible for UV absorption in fibers and the mechanisms of their photogeneration are discussed. 相似文献
17.
等离子体加工技术是近年来发展起来的先进光学制造技术,具有快速缓解或去除传统光学加工方法导致的表面/亚表面损伤,以及高效、高精度和高分辨率修整光学面形的优势。从等离子体光学加工基本原理出发,基于等离子体激发频率与特征对发生器进行了简要叙述;进一步对各研究机构在等离子体加工技术涉及的射流特性、界面物化反应、损伤去除机理、去除函数、加工热效应和工艺定位等关键技术研究内容及成果进行分析,并对等离子体的新型光学加工技术进行介绍。随着研究的不断深入,构建多物理场和化学反应综合作用下的等离子体加工模型,揭示表面等离子体特性分布与去除函数的内在联系,从而建立准确的去除函数模型,是提高修形精度的发展方向,研究热效应控制方法和补偿策略在降低由热效应带来的修形误差方面起到了重要作用。 相似文献
18.
Subsurface defect characterization and laser-induced damage performance of fused silica optics polished with colloidal silica and ceria 下载免费PDF全文
This paper mainly focuses on the influence of colloidal silica polishing on the damage performance of fused silica optics. In this paper, nanometer sized colloidal silica and micron sized ceria are used to polish fused silica optics. The colloidal silica polished samples and ceria polished samples exhibit that the root-mean-squared(RMS) average surface roughness values are 0.7 nm and 1.0 nm, respectively. The subsurface defects and damage performance of the polished optics are analyzed and discussed. It is revealed that colloidal silica polishing will introduce much fewer absorptive contaminant elements and subsurface damages especially no trailing indentation fracture. The 355-nm laser damage test reveals that each of the fused silica samples polished with colloidal silica has a much higher damage threshold and lower damage density than ceria polished samples. Colloidal silica polishing is potential in manufacturing high power laser optics. 相似文献