Grazing diffraction of X-ray radiation in a planar single-crystal waveguide

The propagation of an X-ray beam through a plane-parallel waveguide is studied with allowance for Bragg grazing diffraction on the crystalline structure of the plates. Expressions for the waveguide modes are obtained and nondecaying waveguide modes are shown to exist at angles that are larger than the critical one (the angle of total external reflection), which permits one to increase the capture angle of radiation incident on the waveguide. The calculated intensity at the waveguide output is compared with the intensity of waveguide modes in the absence of grazing diffraction in the waveguide material.     

A matrix approach to grazing-incidence X-ray diffraction in multilayers

A method for computation of X-ray grazing-incidence diffraction (GID) in multilayers and superlattices is presented. The method is based on X-ray dynamical diffraction theory and a matrix from a boundary equations and provides a simple numerical solution of the problem. The application of the method to simulating GID measurements taken from A1As/GaAs superlattice (20 periods of 14.6 nm A1As and 6.8 nm GaAs) demonstrates the principal validity of the theory. A perfect matching between the theory and the experiment requires the real-structure effects of sample to be taken into account.     

Be薄膜应力的X射线掠入射侧倾法分析

由于铍薄膜极易被X射线穿透, 传统的几何模式下很难获得有效的X射线衍射应力分析结果. 本文采用掠入射侧倾法分析SiO₂基底上Be薄膜残余应力, 相比其他衍射几何方法, 提高了衍射的信噪比, 获得的薄膜应力拟合曲线线形较好. 对Be薄膜的不同晶面分析, 残余应力结果相同, 表明其力学性质各向同性; 利用不同掠入射角下X射线的穿透深度不同, 获得应力在深度方向上的分布; 由薄膜面内不同方向的残余应力相同, 确定薄膜处于等双轴应力状态. 关键词： Be薄膜 X射线衍射 应力     

一维Co单晶纳米线的x射线研究

对电化学沉积法在多孔氧化铝中制备的一维单晶Co纳米线阵列的结构和形态利用各种x射线衍射测量方法进行了细致的表征.确定了阵列中的纳米线在线长方向均为一致的晶体学取向，并以很高的平行度排列.并且发现生长条件可能在一维纳米线中引起不同程度的螺旋晶格曲扭.根据实验观察结果提出了一个具有手性的螺旋曲扭模型.利用超导量子干涉磁强计测量了样品在300K下的磁特性，分析发现螺旋扭曲可以在相当大的程度上改变纳米线阵列的各向异性.说明利用磁弹性效应有可能有效地调节纳米线的磁各向异性. 关键词： 纳米线 单晶 x射线摇摆曲线 x射线极图     

Quantitative X-ray photoelectron diffraction studies of single-crystal silicates

The interpretation of angle-resolved X-ray photoelectron intensity measurements on single crystals which contain an element in more than one structurally distinct location, each of which is individually characteristic of a different element, to yield directly quantitative information concerning the extent of isomorphous substitution in such crystals is described. These principles are applied to quantify the distribution of aluminum between tetrahedrally and octahedrally coordinated sites in four 2:1 layered silicates. An accuracy of ? 5% is demonstrated by comparison with a less direct surface analytical route to the same information.     

X-ray interferometric short-wavelength holography with diffraction focusing

A four-unit off-axis interferometric scheme for recording x-ray short-wavelength holograms of amorphous bodies which are opaque to visible light is proposed. The diffraction spreading of the object wave in a unit is removed by diffraction focusing of the same wave in the next unit. Pis’ma Zh. éksp. Teor. Fiz. 68, No. 9, 681–684 (10 November 1998)     

Experimental system for X-ray magnetic diffraction under extreme conditions

An experimental system for X-ray magnetic diffraction (XMD) under extreme conditions was constructed on the beamline BL39XU at SPring-8. This system aims at studying magnetic properties of ferromagnets through the measurements of magnetic form factors under the conditions of low temperature (5 K), high magnetic field (6 T) and high pressure (10 GPa). This system consists of a superconducting magnet (SCM), a diamond anvil cell (DAC), a two-axis manipulator for the DAC, a five-axis goniometer for the SCM, and an X-ray polarizer with a phase plate. Details of this system are presented. Experimental results on uranium telluride are shown as a performance test with this instrumentation.     

Spectral focusing characteristics of a grazing-incidence flat-field grating spectrometer

The spectral focusing characteristics of a grazing-incidence flat-field spectrometer with a spherical variable-line-spacing grating in the 5－40nm spectral range are presented. The spectrometer can be used for any object at a distance in the 50mm－infinity range from the grating apex with a diffracted spectrum sharply focused on an almost flat focal plane at a constant distance from the grating apex.     

Comparison of focusing optics for femtosecond X-ray diffraction

We characterize and compare four different types of focusing optics for hard X-rays, suitable for femtosecond X-ray diffraction experiments, usinga tabletop femtosecond laser-based plasma source. We demonstrate a 23 μmfocus with a toroidally bent Ge single crystal. A maximum flux of 7× 10⁸ photons/(s mm²) is generated in a 32 μm focus using a multi-layer mirror. An elliptical glass capillary yields the highest number of photons per Bragg angle [2× 10⁵ photons/(s mrad)]. The largest number of photons[3× 10⁶ photons/s] per second is obtained in the 105 μm focus of a poly-capillary optical lens system. All numbers are given for characteristic Cu K _α photons.This revised version was published online in May 2005. The Article Category was removed.This revised version was published online in August 2005 with a corrected cover date.     

Chromatic focusing of X-ray diffraction lines and achromatic camera

The conditions for simultaneous suppression of the wave-length component (broadening) and instrumental component (broadening) of the X-ray diffraction lines are analyzed. The fulfilment of the chromatic focusing conditions theoretically restrains the wave-length component as if we used an infinitely narrow wave-length interval in the incident beam. This is advantageous particularly in measuring the line profiles, as the precision of profile analysis can thus be appreciably increased. This paper presents general considerations and computations for a given experimental set-up. A camera suitable for this kind of measurement is described and the profile of a line with=74·3° in an achromatic arrangement and in an ordinary back-reflection camera is compared.     

Surficial phase-identification and structural profiles from weathered natural pyrites: A grazing-incidence X-ray diffraction study

Five pyrites with original crystal face (1 0 0) with different tarnish colours were selected from one pyrite-bearing ore sample from Tongling multi-metal deposit, Anhui, China. They are henna mottled with dark violet, yellow mottled with red, yellow, blue mottled with violet and reddish brown in surface colour. Grazing-incidence X-ray diffractometry (GIXRD) was used to study the phases formed or precipitated on the surface of pyrite (1 0 0) face during chemical weathering. By changing the incident angle, GIXRD can provide information on the changes in the mineral phases from the surface as a function of depth. Products formed or precipitated on the surface of pyrite (1 0 0) face are one or several sulfur or iron-bearing hydrated oxides and include gypsum, jalpaite, goethite, goldichite. The sulfur-bearing minerals present on the surface imply the oxidation of sulfur to sulfate, or the reduction of sulfur to sulfide. By analyzing a series of GIXRD patterns obtained at different angles of incidence for a single pyrite, the mineral assemblage differs from the surface into the body of the crystal. Taking the reddish brown sample as an example, four diffraction profiles at 2.575, 2.2105, 1.9118 and 1.613 Å are present in the pattern of a 2° incident angle experiment whereas they cannot be found at a GIXRD angle smaller than 0.6°.     

Epitaxial growth and X-ray diffraction analysis of single-crystal thin films of CuCl

The epitaxial growth of single-crystal thin films of cuprous chloride (CuCl) with 2 to 4-μm thicknesses is reported for the first time. Single-crystal structure is achieved by thermal deposition of CuCl onto a sodium chloride (NaCl) substrate whose space lattice and lattice constant match that of CuCl. X-ray diffraction analysis reveals single-crystal structure of these CuCl thin films. Luminescence spectra arising from the decay of excitonic molecules to exciton states are substantially narrower in the single crystal thin films compared with polycrystalline thin films grown on amorphous substrates.     

Graphical solution of chromatic and geometric focusing of X-ray diffraction lines

A nomograph and a transparent chart, serving for the rapid determination of the simultaneous chromatic and geometric focusing of X-ray diffraction lines, are described.     

Combined X-ray absorption and X-ray diffraction under high pressure

ABSTRACT

X-ray absorption spectroscopy (XAS) and X-ray diffraction (XRD) are two complementary structural techniques. Their combination improves the understanding of the effect of pressure on materials as illustrated by examples taken from studies on different types of materials (semiconductors, molecular solid, ferroelectric perovskite and gas mixture). The introduction of nanopolycrystalline diamonds anvils has extended XAS to high-energy edges with the possibility to use energy-scanning XAS beamlines where XRD can be performed in addition to XAS experiments.     

X-ray diffraction radiation in conditions of Cherenkov effect

X-ray diffraction radiation from ultra-relativistic electrons moving near an absorbing target is considered. The emission yield is found to increase significantly in conditions of Cherenkov effect.     

Time reversed reverberation focusing in a waveguide

Time reversal mirrors have been applied to focus energy at probe source locations and point scatterers in inhomogeneous media. In this paper, we investigate the application of a time reversal mirror to rough interface reverberation processing in a waveguide. The method is based on the decomposition of the time reversal operator which is computed from the transfer matrix measured on a source-receiver array [Prada et al., J. Acoust. Soc. Am. 99, 2067-2076 (1996)]. In a similar manner, reverberation data collected on a source-receiver array can be filtered through an appropriate temporal window to form a time reversal operator. The most energetic eigenvector of the time reversal operator focuses along the interface at the range corresponding to the filter delay. It is also shown that improved signal-to-noise ratio measurement of the time reversal operator can be obtained by ensonifying the water column with a set of orthogonal array beams. Since these methods do not depend upon a priori environmental information, they are applicable to complex shallow water environments. Numerical simulations with a Pekeris waveguide demonstrate this method.     

X-ray diffraction studies on oxide-superconductors under pressure by a new X-ray detection system

Abstract

A new high pressure x-ray diffraction system has been developed, which consists of a diamond anvil cell, an imaging plate as a detector and an 18 kW rotating anode type generator. By this system we found an anisotropic compression and anomalies in linear compressibility for the Bi-oxide superconductors.     

X-ray diffraction analysis for quasi-crystals under pressure

Abstract

X-ray diffration analysis under high pressure was performed on the icosahedral phase (I-phase) of an Al₈₀Mn₂₀ alloy and Al₆Li₃Cu alloy. The I-phase of an Al-Mn alloy was stable and there was no indication of phase transformations. In an Al-Li-Cu alloy, the I-phase underwent irreversible transformation successively to the amorphous state and the long-range ordered state. This is the first observation of the pressure-induced amorphization.