载能团簇离子诱发的非线性二次离子发射

载能团簇离子进入固体时, 由于集体相互作用,在入射路径上产生非常高的能量沉积密度。 实验发现, 载能团簇离子的作用结果并不等于团簇中各原子独立作用的总和, 而是具有非线性效应。 就二次离子发射而言, 这种非线性通常与团簇的能量、 团簇的大小、 离子的电荷态以及靶物质的结构有关。 通过研究二次离子发射有助于理解载能团簇离子与物质相互作用过程中的能量沉积与释放机制。 Using energetic cluster as projectile is a unique way to produce simultaneous impacts of several atoms and deposit extremely high energy density in a very small area. The cluster impingement on solids has exhibited some non linear effects not presented in collisions of individual atoms with those solids. The study of the secondary ion emissions can give insight into the energy deposition and relaxation steps of the cluster solid interaction. The dependence of the yields of secondary ion emission induced by clusters on the energy of clusters,cluster sizes,charge states and material structures of the targets was reviewed in this paper.     

载能团簇离子在物质中的能量损失

实验表明,团簇离子在物质中的能量损失并不等于各成分单独作用的总和,而是具有非线性效应．这种非线性效应与团簇离子的能量、团簇的种类和大小、团簇成分之间的空间关联程度以及作用物质的结构有关．对团簇作用的非线性效应研究对于了解团簇与物质相互作用的机制具有非常重要的理论意义．MeV能区的团簇离子在物质中的非线性电子能损和核能损方面的直接实验数据还相当缺乏,其理论模型也更待建立．评述了载能团簇离子在物质中的能量损失及测量方法．Fast ions deposit energy in matter through electronic and nuclear collision processes. The relaxation of the deposited energy induces emission of photons, electrons, ions, and neutral species from the target. Comparing with single incident ion, cluster induces many new phenomena: such as non-linear energy loss, non-linear emission of secondary ions, production of giant tracks and craters in various irradiated materials. These new phenomena induced by clusters are attributed to the vicinage effect ......     

Formation,Dynamics, and Characterization of Nanostructures by Ion Beam Irradiation

Ion beam irradiation is a potential tool for phase formation and material modification as a non-equilibrium technique. Localized rise in temperature and ultra fast (～10^?12 s) dissipations of impinging energy make it an attractive tool for metastable phase formation. As a matter of fact, a major component of materials science is dominated by ion beam methods, either for synthesis of materials or for its characterization. The synthesis of nanostructures, and their modification by ion beam technique will be discussed in this review article. Formation of nanostructures using ion beam technique will be discussed first. Depending on species (e.g., mass and charge state) and energy range, there are various modes for an energetic ion to dissipate its energy. The role of the electron will also be covered in this article as a basic principle of its interaction with matter, which is same as for an ion. By using a simple reactive ion beam or electron induced deposition, a secondary phase can be nucleated by ion beam mixing techniques, either by using inert gas irradiation or reactive gas implantation on any desired substrate. Nucleation of secondary phase can also be executed by electron irradiation and direct implantation of either negative or positive ions. Post implantation annealing processes are required for the complete growth of clusters formed in most of these ion irradiation techniques. Implantation processes being inherently a non-equilibrium technique, defects always have a role to play in phase formation, amorphization, and beyond (blister formation). When implanted with large energy, even electrons, one of the lightest charged particles, also manifest these properties. Electronic and nuclear energy losses of the impinging charged particle play a crucial role in material modification. Doping a nanocluster, however, is still a controversial topic. Some light will be shed on this topic with a discussion of focused ion beam.     

Zum Mechanismus der Ionenbildung und Ionenemission bei der FestkörperzerstÄubung

It is demonstrated that the degree of ionization of secondary particles emitted from a solid surface under ion bombardment cannot be predicted by the Saha-Langmuir equation. For an understanding of the ion emission it is necessary to separate the process of ion formation and the following emission. There exists a great number of different processes resulting in the formation of an ion on the surface. These processes can be disentangled by means of a systematical mass spectrometrical analysis. The probability for an ion to leave the surface without neutralization depends on various parameters as ionization potential and velocity of the emitted particle, work function and temperature of the surface etc.     

高电荷态离子207Pb36+与金属Nb表面作用产生的二次离子产额

本文报道了利用兰州重离子加速器国家实验室的ECR离子源引出的高电荷态离子207Pb36 入射到金属Nb表面产生的二次离子的实验测量结果.实验发现,二次离子产额Y随入射初动能Ek的增加有先增加后减小的关系,在初动能为576 keV时二次离子产额达到最大.通过对实验点做高斯拟合发现,曲线峰值对应的入射初动能为602 keV.分析表明,这是势能沉积作用与线性级联碰撞过程协同作用的结果.高电荷态离子本身携带的高势能沉积在靶表面引起势能溅射,促进了二次离子的发射;而主导二次离子溅射的过程是动能溅射,它与靶表面的动量沉积(核能损)过程密切相关.     

高电荷态离子40Arq+与Si表面作用中的电子发射产额

报道了在兰州重离子加速器国家实验室电子回旋共振离子源原子物理实验平台上，用高电荷态⁴⁰Ar^q+(1≤q≤12)离子作用于半导体Si固体表面时的电子发射产额实验测量.实验中，通过改变炮弹离子的电荷态和引出电压选取其不同的势能和动能，系统地研究了入射离子势能沉积和与其在固体中的电子能损对表面电子发射产额的贡献.结果表明，作为引起表面电子发射的两个主要因素，单离子的电子发射产额与炮弹离子在固体表面的势能沉积和电子能损都有近似的正比关系.     

Measurement of the decay and time-resolved spectra of the emission from σ-excitons in KBr in the nanosecond range,produced by heavy-ion irradiation

While energetic heavy ions are currently in increasing use in solid state physics, radiation chemistry and biology, there is still little experimental information regarding the primary physicochemical processes. These high LET (linear energy transfer) ion particles injected into condensed matter produce short life-intermediates such as excited states, ions, and radicals, at high density along the track. The density effect of these intermediates may cause damage-formation and chemical reaction to yield different results compared with low LET radiation (γ, X-ray) or photo-irradiation. Electronically excited states, among the above intermediates, are thought to be especially important precursors. Measurements of the decay and time-resolved spectra of the emission are expected to give useful information regarding the radiation action of heavy ions. The measurements were done using a KBr single crystal at 4.2 K. We reported previously [1] that heavy ion irradiated KBr results in an extraordinarily large ratio of σ-emission to π-emission 2 intensity (～ 5 times larger than in the X- or electron-irradiation). This large ratio is, as was ascertained previously, not due to apparent processes such as temperature increase of a track but to intrinsic processes which will be discussed here.     

Low energy ion impact phenomena on single crystal surfaces

The dynamics of a solid bombarded by a 600 eV Ar⁺ ion have been studied classically by computer simulation. The model uses a crystallite of about 250 atoms described by pair potentials derived from elastic constants and which reproduce the surface binding energy of the solid. The relative calculated yield of secondary atom emission from the three low index faces of Cu follow the previously determined experimental order (111) > (100) > (110). We find major differences in the sputtering mechanisms for these faces. On (110), the impacted atom is ejected most frequently, while on (111) and (100) it almost never leaves the solid. We report the energy distribution of the sputtered particles for each face. The simulation successfully predicts the shape of the curve including the low energy maximum which is observed experimentally near 2 eV. In addition our model shows that many low energy atoms attempt to leave the crystal but are subsequently trapped to the solid at large distances from their original sites. This mechanism of radiation enhanced diffusion inevitably occurs in conjunction with sputtering or any other heavy secondary particle emission or scattering process.     

The shape of doppler-broadened spectral lines produced by light atom reflection from metals: I. Theory

A model for predicting the shapes of Doppler-broadened spectral lines due to de-excitation by photon emission of excited neutral atoms backscattered from solids is presented. The distribution of backscattered particles is calculated on the basis of single Rutherford collisions within the solid accompanied by energy loss due to electronic stopping during passage of the particle through the solid. The effect of the energy dependence of the stopping power, radiationless de-excitation of the escaping neutral atom and the probability of the particle leaving the surface in the desired excited state are incorporated into the calculation. The broadening of the spectral line is determined by combining the Doppler shift formula with the energy- and angular distribution of the backscattered particles.     

Elastic and inelastic processes in the interaction of 1–10 eV ions with solids: ion transport through surface layers

We review the escape depth of secondary ions (or neutrals) desorbing from solid surfaces under the impact of electrons, photons or ions. We survey ion (or neutral) transport through many materials, but most are wide band gap insulators such as rare-gas solids and molecular solids. We address the issue of low-energy (<10 eV) ion—solid interactions, and review experimental and theoretical studies that provide insight into the physical mechanisms of these interactions, such as elastic scattering, charge transfer and ion—molecule reactions. Although it is usually assumed that most of the secondary ions stem from the top surface layer, we show that this is not necessarily the case: In certain instances, 1–10 eV ions are able to transmit solid films which are several monolayers thick. The transport of low-energy ions through materials has very broad implications. We point out the importance of these results for electron or photon stimulated desorption (ESD/PSD), secondary ion mass spectrometry (SIMS), and ion-sputtering of surfaces, and discuss their relevance to other fields, such as ion beam deposition (IBD), low-energy ion implantation, and electrochemistry.     

Solid state nuclear track detectors: Track forming,stabilizing and development processes

Fast moving heavy charged particles passing through solids are mainly losing their energy—in a wide range of velocities—by excitation and ionization processes which result in a more or less stable radiation damage.¹ The radiation damage may consist of broken bonds, free radicals, chemical reaction products, displaced atoms, ionic and electronic defects, dislocation configurations, voids, clusters of defects with and without impurities, nuclei of new phases etc. The nature and stability of this localized radiation damage, termed the “latent” track of the particle depends on the data of the particle and on the physical and chemical properties of the solid. Dielectric materials with low electric and thermal conductivities offer favorable conditions for relatively high local excitation and ionization densities resulting in physical and chemical solid state reactions with relatively stable reaction Products.     

Ion–solid interactions: current status,new perspectives

In the past half century, we have witnessed an explosive growth of effort in that cross-discipline which is characterized by the deposition of localized high–energy densities in condensed matter by means of energetic ions—the field of ion–solid interactions. In this overview, the fundamental physical processes of ion–solid interaction are outlined. A brief discussion is given of the basic energy transfer mechanisms and the consequences of ion impact into solids such as scattering, sputtering and radiation damage. It is now understood that radiation damage is itself far from being restricted to deleterious and detrimental consequences. Our knowledge of the growing variety of changes in the physical, chemical and biological properties of target materials are growing exponentially. Many valuable beneficial technological applications, some of which we discuss, have their origin in physical processes taking place at the nanometric level.     

The use of secondary ion mass spectrometry in surface analysis

Secondary ion mass spectrometry (SIMS) is based on the bombardment of solids by ions and subsequent mass analysis of the sputtered ions or of the post-ionized neutrals. Various models have been proposed for the emission of secondary ions from the target. These models can roughly be grouped into two categories: (a) lonization takes place outside the target; the sputtered particles are assumed to leave the target in an excited or super-excited state; ionization can then result from such processes as Auger de-excitation or resonance ionization. (b) Ions are generated inside the target by collision cascades initiated by a primary impinging ion. Experimental data of the element- and matrix-dependent ion yield and estimates of the minimum detectable concentrations are shown as well as the rate of consumption of the target. Methods for efficient use of the sputtered material will be discussed. Examples of the wide range of applications of SIMS for determination of the chemical composition and structure of the surface layer and for imaging of the distribution of elements in the surface are given. The SIMS results are compared with those of Auger and Ion Scattering Spectrometry. The essentially non-destructive method of static SIMS is shown to be a powerful tool for the investigation of the outermost atomic layers of a solid.     

Activation energy of etching for CR-39 as a function of linear energy transfer of the incident particles

In this work, we have studied the effect of the radiation damage caused by the incident particles on the activation energy of etching for CR-39 samples. The damage produced by the incident particle is expressed in terms of the linear energy transfer (LET). CR-39 samples from American Acrylic were irradiated to three different LET particles. These are N (LET₂₀₀ = 20 KeV/μm) as a light particle, Fe (LET₂₀₀ = 110 KeV/μm) as a medium particle and fission fragments (ff) from a ²⁵²Cf source as heavy particles. In general the bulk etch rate was calculated using the weight difference method and the track etch rate was determined using the track geometry at various temperatures (50–90 °C) and concentrations (4–9 N) of the NaOH etchant. The average activation energy F_b related to the bulk etch rate v_b was calculated from ln v_b vs. l/T. The average activation energy E_t related to the track etch rate v_t was estimated from ln v_t vs. l/T. It is shown that activation energy of etching is a constant value for CR-39 detector where E_t was found to be independent on the damage produced by the incident particle.     

加速器束流脉冲化及氢二次离子发射研究

详细介绍了快速高压晶体管开关在加速器束流脉冲化和用于二次离子测量的加速器飞行时间谱仪上的应用. 利用飞行时间法研究了碳纳米管在不同能量的Si和Si2团簇离子轰击下氢二次离子的发射. 实验结果表明， 在每个原子质量单位的速度为2.5×108 cm/s以上， Si和Si2离子引起的氢二次离子的发射主要受电子阻止过程控制； 在每个原子质量单位的速度为2.5×108 cm/s以下和Si2团簇离子轰击的情况下， 氢二次离子的发射产额明显增加， 团簇离子在靶表面的核能损增强效应起主要作用. The application of Fast High Voltage Transistor Switches (HTS) in pulsed ion beam and the time of flight(TOF ) setup is described. Secondary ion emissions from carbon nanotubes under bombardments of MeV Si and Si2 clusters are measured by using TOF. The measurements indicate that the yield of the secondary ion emissions of hydrogen increases with increasing energy of Si and it is attributed to the electronic processes. The yield of the secondary ions of hydrogen decreases with increasing energy of Si2 clusters and the enhancement of nuclear energy loss of cluster constituents at the surface of sample plays a more significant role in the secondary ion emission of hydrogen at the low energies.     

Combined mass spectrometer and electron spectrometer for investigation of solids

The possibility to develop the electron-and-ion energy analyzer and mass spectrometer combined in one optical system for the investigation of the properties of solids has been considered. This device allows one to obtain information on the chemical composition and energy spectrum for all the particles emitted by the surface of a solid subjected to various effects in one experiment. The combined spectrometers are based on the source of the particle flux, which transforms the mass spectrum into the energy spectrum due to the effect of electric-field pulses on the ion flux, and the high-resolution electrostatic energy analyzer. The particles appear in the source as a result of the interaction of the exciting radiation from an independent source with the surface of the solid under study. The type of exciting radiation (fluxes of ions, atoms, electrons, and laser radiation) is chosen depending on the goals of the study. Numerical modeling of the device operation, which confirms the possibility of its implementation in the form of a compact informative system for the investigation of characteristics of solids, has been performed.     

400 AMeV 12C诱发乳胶核反应重电离粒子前后关联研究

对400 AMeV 12C诱发乳胶核反应重电离粒子的前后关联进行了研究。重电离粒子来源于靶核碎片,分为灰径迹粒子和黑径迹粒子两种。实验结果很好地验证了核-核碰撞几何模型。灰径迹粒子的发射在前、后半球是各向异性的,而黑径迹粒子的发射基本是一致的。向前、向后发射的灰径迹粒子、黑径迹粒子平均多重数对重电离粒子数n_h呈线性依赖,黑径迹粒子、灰径迹粒子的向前发射随n_h的增加而增加的幅度分别大于其向后发射随n_h的增加而增加的幅度,但核内级联效应受靶核大小的影响,向后半球内发射的灰径迹粒子平均多重数随n_h的增加有饱和现象,这些多重数关联特性基本上可以利用基于碰撞几何的旁观体-反应体模型及级联蒸发模型来解释。The forward-backward multiplicity correlation of heavily ionized particles produced in 12C-emulsion interactions at 400 AMeV is investigated. The heavy ionized particles, come from the target fragments, are divided into grey track particle and black track particle. The experimental results can be well explained by the geometry model of the nucleus-nucleus collisions. The emission of grey track particles in forward and backward hemisphere is not isotropic, but the emission of black track particle is almost isotropic. The averaged multiplicity of grey track particles and black track particles in forward and backward hemisphere linearly depend on the number of heavily ionized particle n_h, the correlation strength in forward hemisphere is greater than that in backward hemisphere, but the dependence of grey track particle in backward hemisphere on the number of heavily ionized particle n_h shows the saturation because of the intranuclar cascade effect is influenced by target size. The characteristics of multiplicity correlations can be well explained by the participant-spectator model based on the colliding geometrical picture and the cascade evaporation model of high energy nucleus-nucleus collisions.     

The charge exchange of slow highly charged ions at surfaces unraveled with freestanding 2D materials

The property of a variable charge state makes ions unique to other types of radiation a material surface can be exposed to. As a consequence of charge exchange between ions and surfaces, energy is transferred to the surface and material damage may be triggered. Furthermore, a changing charge state of the ion alters its slowing down process in solids and has important implications when back-scattered ions are to be measured for material analysis purposes. Over the last decades extensive research was devoted to the understanding of ion charge exchange with solids. Here I review recent progress in this field with special emphasize on slow ions in high charge states. This class of ions allows a detailed analysis of charge exchange in experiments, which employ also ultra-thin solid targets and therefore give experimental access to electronic processes on the femtosecond timescale. In this review I will discuss general properties of charge exchange and present typical experimental techniques. I will also discuss current developments in the modelling and simulation of ion-surface interaction. Recent findings using freestanding 2D materials are discussed as well as results from spectroscopy of emitted secondary particles. The paper concludes with a unified picture of ion charge exchange at surfaces and presents possible applications based on the understanding of the underlying physics.     

高能铁离子在水介质中核反应过程所导致的能量沉积

在银河宇宙射线中,400MeV/nucleon的铁离子通量相对来讲是较高的,400MeV/nucleon的铁离子对空间辐射引起的损伤和辐射剂量有重要的贡献.本文以Geant4为基础,对400MeV/nucleon Fe离子与物质相互作用后通过核反应过程产生的次级碎片进行模拟分析.对铁离子在水中产生的能量沉积和铁离子与水介质发生核反应后产生的次级碎片的能量沉积进行了模拟研究,得到了通过核反应过程产生次级粒子所导致的剂量贡献. 关键词： 能量沉积 剂量 碎片     

A modified REL track formation model and its application to registration of 1 GeV/n Au and U ions in polycarbonate

Identification of heavy ions recorded in track detectors requires the knowledge of the physical processes which take place in each of the three steps involved in ion registration: (i) energy deposition by the incident particle in the detector; (ii) track formation; and (iii) the identification method itself. The amount of energy deposited by the incident particle per unit path length (dE/dx) is usually calculated by means of the Bethe–Bloch formula, which is described in terms of the so-called close and distant collisions. The REL track formation model excludes the contribution of close collisions when calculating the fraction of dE/dx leading to track formation. The identification method relates REL to a measurable signal S in the detector, so that S=g(REL)^h where g and h are parameters to be obtained from calibration. In this work, we present a modified REL model in which the energy deposited by close collisions may contribute partially to track formation. This contribution is accounted for by means of a new coefficient κ, introduced in the modified REL expression, which can take values between 0 and 1. We estimate the value of κ from measurements of tracks originated in polycarbonate detectors by incident Au and U ions of energy from accelerator. The results are consistent with a small contribution (κ0.3) of close collisions.