Polycrystallinity in Gallium Arsenide Crystals Grown by the Czochralski Method

Crystallography Reports - The specific features of the formation of crystallites in gallium arsenide crystals grown by the Czochralski method have been investigated. The crystallites are found to...     

Properties of Doped GaSb Single Crystals Grown by the Czochralski Method

The specific electrical properties and average dislocation density of GaSb crystals are shown and discussed regarding various elements presented as dopant. The single crystals were grown by the Czochralski method without encapsulant in a flowing atmosphere of molecular hydrogen, on the one hand, and of atomic hydrogen, on the other hand. The results are summarized in the Table II.     

Dislocation Photoconduction and Related Dislocation Memory Effects in KCl Crystals

Two types of memory phenomena are discussed, both related to dislocation photoconduction of highly pure and coloured KCl crystals, using the combination of Lyman- and F-illuminations. A very simplified explanation of the dislocation memory effects is given taking into consideration possible changes in the direction of the photocurrents. Some considerations may be of interest for the explanation of photoplastic effects.     

提拉法生长高质量氟化镁单晶

设计了适合提拉法生长氟化镁单晶体的温场,采用提拉法成功生长出了直径100 mm的高质量氟化镁单晶.晶体内无气泡等宏观缺陷、无开裂;通过精密退火处理后,晶体透过率达到95;,平均应力双折射小于0.5 nm/cm.上述结果表明采用提拉法可以生长高质量的氟化镁单晶.     

Defect Structure of Tin-Doped InAs Single Crystals Grown by the Czochralski Method

Crystallography Reports - Indium arsenide (InAs) single crystals heavily doped with Sn are found to have various violations of structural perfection, which depend on the Sn concentration in...     

Effect of Impurity Concentration and Plastic Deformation on Dislocation Density of KCl Crystals

Using the etch pit technique both the distribution and density of dislocations in undeformed and dynamically deformed nominally pure and Sr²⁺ or Pb²⁺ doped KCl crystals are examined. Additionally, the role of specimen geometry in the plastic deformation within the I deformation stage is determined. For all the crystals examined the relationship between screw dislocation density and plastic flow stress obeys the formula τ ⋍ ϱ_sc.^1/2.     

引晶直径对泡生法蓝宝石晶体位错及小角度晶界影响的研究

利用晶体生长模拟软件CGSim,模拟了引晶过程中晶体的直径对晶体生长初期晶体的热流密度和轴、径向温度梯度的影响.结果表明:随着引晶直径的减小,晶体肩部的热流密度减小,轴向及径向温度梯度减小,因而能有效的减小晶体内的热应力,减少晶体位错及小角度晶界缺陷,提高晶体质量,模拟结果得到了实验的验证.     

Effect of Annealing on the Luminescene Property of PbWO4 Crystals Grown by the Czochralski Method

PWO Crystals grown by the Czochralski method were annealed under different conditions. The transmittance of PWO crystal was decreased when it was annealed in anoxygen‐rich environment; where as it was in creased when the crystal was annealed in vacuum. A mechanism on the transmittance change was proposed. The main peaks of X‐ra y exite demission spectra showed that both as‐grown and vacuum‐annealed crystals fit into blue light region with the latter one showing higher intensity. The oxygen‐rich annealed crystals hifted to longer wave length of green light region at lower intensity. The faster components in the light yield of crystals annealed in vacuum were higher correspondence to its higher intensity of the blue light.     

Czochralski法生长Lu2SiO5：Ce晶体的发光特性

本文使用铱坩埚感应加热Czochralski法成功地生长出了无色透明且尺寸达5 0mm× 6 0mm的Lu2 SiO5:Ce晶体。XRD结构分析表明 ,该晶体为单斜结构。在室温下分别以X射线和紫外光为激发源测量了该晶体的发射光谱 ,获得的发射波长分别为 4 0 3nm和 4 2 0nm ,光衰减时间为 4 1ns,光产额达 32 0 0 0p/MeV。发射光谱的双峰结构以及晶体的发光特性证明其发光源于Ce3 离子的 5d1→5F5/ 2 和 5d1→5F7/ 2 跃迁。     

Czochralski法生长Lu2SiO5:e晶体的发光特性

本文使用铱坩埚感应加热Czochralski法成功地生长出了无色透明且尺寸达φ50mm×60mm 的Lu2SiO5:e晶体.XRD结构分析表明, 该晶体为单斜结构.在室温下分别以X射线和紫外光为激发源测量了该晶体的发射光谱,获得的发射波长分别为403nm和420nm,光衰减时间为41ns,光产额达32000p/MeV.发射光谱的双峰结构以及晶体的发光特性证明其发光源于Ce3+离子的5d1→5F5/2 和 5d1→5F7/2跃迁.     

K2O助溶剂提拉法和富锂提拉法生长的近化学计量比LiNbO3晶体性质的比较

分别采用K2O助溶剂提拉法和富锂提拉法生长了近化学计量比LiNbO3晶体.比较了两种方法生长的晶体紫外吸收边和红外吸收谱的差别,光谱结果表明,K2O助溶剂提拉法生长的晶体组成非常均匀,而富锂提拉法生长的晶体组成不均匀,沿晶体生长方向,Li2O含量逐渐增加.另外,两种生长方法中,籽晶表面均看到螺旋状环,分析了其产生原因.     

坩埚下降法生长钨酸镉闪烁单晶的晶体缺陷

采用坩埚下降法生长出大尺寸CdWO4单晶,通过光学显微镜、电子探针观察分析了所获CdWO4单晶的典型晶体缺陷,包括晶体开裂、丝状包裹物和晶体黑化.结果表明,CdWO4单晶存在显著的解理特性,常出现因热应力导致的沿(010)解理面的晶体开裂;当采用富镉多晶料进行单晶生长时,所获单晶棒的下部常出现沿轴向分布的丝状包裹物,电子探针分析证实这种丝状包裹物是熔体内过量CdO沉积所致;在氮气氛中进行高温退火处理,CdWO4单晶还会出现黑化现象.     

泡生法生长大尺寸蓝宝石单晶的等径控制方法

在泡生法生长大尺寸蓝宝石单晶的过程中,为了获得高质量的晶体,精确等径控制至关重要.本文根据晶体的重量变化率来控制热场,实现晶体等径生长.设计了应用在线整定多项式权值的广义最小方差(OAPW_GMV)控制方法,并建立了系统模型.该方法的主要思想是根据在线估计的被控对象参数及OAPW_GMV的输出,调整多项式的权值,实现炉内的热场控制.仿真和实验结果表明该控制方法实现了蓝宝石单晶的精确等径控制,有效地提高了蓝宝石单晶的质量.     

c向提拉法生长的四英寸蓝宝石单晶缺陷研究

采用提拉法沿[0001]方向成功生长出了四英寸蓝宝石单晶。X射线摇摆曲线测试结果表明晶体具有较好的晶格完整性。采用化学腐蚀法并借助光学显微镜观察了(0001)面的位错及形貌。研究了腐蚀温度、腐蚀时间、机械抛光和化学抛光对位错密度及形貌的影响。计算得到平均位错密度为6190 cm-2,优于一般提拉法生长的蓝宝石单晶。     

富锂熔体中提拉法生长近化学计量比铌酸锂(LiNbO3)晶体

利用提拉法,在富锂(Li2O∶NbO3=58.5/41.5)熔体中生长了质量良好的近化学计量比铌酸锂单晶,其紫外吸收边位置为308nm,居里温度超过了1200℃.测量了其Z向晶片的压电系数d33,并且观察了Z向晶片的180°畴,结果证明除少数区域外,所生长晶体为单畴.     

TSTGT蓝宝石晶体位错腐蚀形貌分析

采用化学腐蚀-金相显微镜法,利用熔融的KOH对顶部籽晶温度梯度法(TSTGT)生长的直径320 mm的蓝宝石单晶中不同部位的晶片做了位错腐蚀形貌分析.研究表明,(0001)面的位错腐蚀坑呈三角形,腐蚀晶界具有延伸性.对比不同腐蚀时间、不同腐蚀温度和不同表面粗糙度下的腐蚀效果,发现使用KOH腐蚀剂在400℃腐蚀15min时,效果最好.表面粗糙度越小,位错图像越清晰.     

Effect of a Travelling Magnetic Field on the Parameters of Tellurium-Doped Gallium Arsenide Single Crystals Grown by the Czochralski Method

Crystallography Reports - The effect of a traveling magnetic field on the parameters of Te-doped GaAs single crystals in the carrier density range of 5 × 1017–2 ×...     

用提拉法生长的GdCa4O(BO3)3晶体的结构缺陷研究

利用相衬显微镜结合化学腐蚀法,进行了沿 010 方向提拉生长的GdCa4O(BO3)3(GdCOB)晶体中的缺陷观察.发现位错是 010 方向生长的晶体中的重要缺陷.在不同方向的晶体切片上观察了螺位错和刃位错蚀坑,位错塞积,平底蚀坑及尖底蚀坑.位错密度随晶体长度的变化而变化.在晶体的尾部观测到位错密度为103/cm2,而在晶体的初始部位位错密度很低,只有40/cm2.在晶体的X,Z及 401 方向的切片的正反两面观察到的位错蚀坑现象完全不同,可以认为GdCOB晶体为单畴极性晶体,自发极化方向沿z轴方向.     

导模法蓝宝石单晶的位错缺陷及其力学性能的研究

采用导模法生长了a向,尺寸为60 mm ×5 mm ×300 mm的蓝宝石单晶片,采用化学腐蚀-金相显微镜法观测了其(0001)晶面的位错特征,并且采用INSTRON-1195万能试验机测试了抛光样品的弯曲强度.结果显示:当晶体中位错缺陷分布均匀时,在外部弯曲应力下,蓝宝石晶体发生特定晶面的高强解理断裂,位错密度的升高对蓝宝石弯曲强度没有明显损害作用.然而当晶体中出现位错密排结构时,蓝宝石单晶常温弯曲强度迅速下降.