基于Berreman矩阵的双折射薄膜光谱响应特性计算

采用Berreman特征矩阵方法,通过数值计算研究了双折射薄膜的反射、透射等光谱响应特性。依据电磁场理论的电场分量、磁场分量的界面连续条件,推导了光波在各向异性双轴薄膜中的Berreman转移矩阵,用以分析含有各向异性介质层的复杂薄膜系统的光学性质。这些矩阵递推关系包含了界面处的多点反射,适用于一般的各向异性的多层膜系统,包括入射媒质或基底为各向异性的情况。在文中给出了各向同性入射媒质双轴各向异性膜层一各向同性基底薄膜系统的计算结果,验证了该计算方法的可行性,以此作为进一步研究各向异性薄膜和相关光学薄膜器件设计的理论基础。     

Reflection interferometer based on the Troitsky thin film for frequency selection in fiber lasers

A two-mirror multiple-beam interferometer with a noninverted response function in reflection is used for the frequency selection and tuning in fiber lasers. The simplest version of the interferometer is based on a thin metal (Troitsky) film. Such a reflection interferometer corresponds to an external (with respect to a fiber) two-mirror cavity that consists of a spherical highly reflective (99.8%) mirror and a plane mirror represented by the thin metal film deposited on the fiber end face. Tuning to the selected frequency is performed due to a variation in the distance between the mirrors.     

System for measuring optical admittance of a thin film stack

A new method based on the polarization interferometer structure has been applied to measure the optical admittance, the refractive index and thickness of a thin film. The structure is a vibration insensitive optical system. There is one Twyman-Green interferometer part to induce a phase difference and one Fizeau interferometer part to induce the interference in the system. The intensities coming from four different polarizers were measured at the same time to prevent mechanical vibration influence. Using the polarization interferometer, the optical admittance, the refractive index and thickness of a single layer of Ta₂O₅ thin film has been measured. The measurement results were compared with the results obtained by ellipsometer. The results meet reasonable values in both refractive index and thickness.     

热蒸发YbF3薄膜的机械特性

 实验研究了热蒸发YbF₃薄膜在大气中的应力和附着力。利用Veeco干涉仪,测试了各种工艺条件下单层YbF₃薄膜的应力。结果发现:YbF₃薄膜的残余应力为张应力,热应力在残余应力中的比重较大;沉积方式对薄膜应力的影响不大;薄膜应力在大气中有一个释放的过程。热处理后,YbF₃薄膜应力增大。     

High-resolution dynamic measurement using electronic speckle pattern interferometry based on multi-camera technology

The speckle interferometer based on multi-camera technologies using two cameras is applied to a dynamic measurement. The new speckle interferometer is constructed by a prism array and two cameras. A phenomenon, which a bearing-ball collides against a thin polymer film, is investigated by the proposed interferometer. Then, it is shown that the local maximum deformation of the thin film by the collision is about 1.0 μm. Such a deformation process can precisely be analyzed by this method without any troubles of optical dislocations. In the results, it is confirmed that a large deformation process can be analyzed by accumulating measured results of small deformation in every small continuous analysis. Furthermore, it is estimated that the measurement precision of this method is about 5 nm as experimental results.     

光纤马赫-曾德尔干涉法测量极化聚合物的电光系数

报道了用光纤马赫曾德尔干涉法测量极化聚合物电光系数的方法和原理。该方法不仅可以测量聚合物薄膜的电光系数而且可以测量聚合物波导的电光系数,并且该方法可以同时测量聚合物的电光系数张量元r13和r33。该方法最突出的优点是不必在聚合物薄膜的表面制备第二个电极,因此尤其适合于在电光聚合物试制阶段测试聚合物的电光系数。干涉仪的输出被反馈到参考臂中控制相位偏置点的压电陶瓷,从而实现对干涉仪相位偏置点的闭环控制,因此降低了对环境稳定性的要求并且提高了测量精度。实际测试了极化聚合物薄膜PMMA-DR1的电光系数张量,其测量值r13=8.3 pm/V,r33=25.7 pm/V。     

Efficient single mode operation of a CW ring dye laser with a Mach-Zehnder interferometer

Stable single mode operation of a ring dye laser is obtained with the combination of a Mach-Zehnder interferometer (MZI), three plate birefringent filter, a single thin etalon and a unidirectional diode. The MZI eliminates the fractional insertion loss due to beam walk-off and distortion which an intracavity etalon must introduce in order to select single frequency operation. We experimentally demonstrate the low insertion loss, single mode stability and frequency tuning of a ring dye laser using a specially designed, compact MZI. Finally, we propose MZIs with no coatings, which should permit extremely low loss broadband operation.     

Compact static Fourier transform imaging spectropolarimeter based on channeled polarimetry

The theoretical operation and experimental demonstration of a Fourier transform imaging spectropolarimeter for real time measurement of the polarization state of light are presented. The spectropolarimeter uses a Wollaston prism as a birefringent interferometer and two high-order retarders to incorporate channeled polarimetry. Compared with previous instruments, the most significant advantage of the described model is that the complete wavelength-dependent polarization is acquired simultaneously along a one-dimensional spatial image by a single snapshot. Also, we show that, in this configuration, we can benefit from the advantages of the model: it is compact and robust, and the birefringent interferometer has a high throughput.     

Spectral interferometry and reflectometry used to measure thin films

A new method for a precise measurement of the oscillatory part of phase change on reflection (interferometric phase) from a thin-film structure is presented. The method, which is based on phase retrieval from the spectral interferograms recorded at the output of a slightly dispersive Michelson interferometer, is combined with reflectometry. The interferometric phase of the thin-film structure is measured precisely using a reference sample of known phase change on reflection. The spectral reflectance of the thin-film structure is also measured in the interferometer. The feasibility of the method is confirmed in processing the experimental data for SiO₂ thin film on a silicon wafer of known optical constants. Four samples of the thin film are used and their thicknesses are determined. We confirm very good agreement between the thicknesses obtained from the interferometric phase and reflectance measurements. PACS  07.60.Ly; 68.55.Jk; 78.20.Bh     

Heterodyne Interferometers Using Orthogonally Polarized and Two-Frequency Shifted Light Sources with Super-high Extinction Ratio

This paper describes heterodyne interferometers using orthogonally polarized and two-frequency shifted light sources of two types with super-high extinction ratio to reduce non-linearity of the interferometer due to polarization cross-talk. The acousto-optic modulators are used to shift light frequency. In the first interferometer the light source with Glan-Thomson prisms of very high extinction ratio (50 dB) is used to make the polarization cross-talk very small. In the second interferometer the light source of two-frequency shifted beams with small crossing angle (2.5 rnrad-10 mrad) is used to completely exclude non-linearity of the interferometer due to polarization cross-talk. By measuring the thickness of vacuum evaporation film, it was demonstrated that the interferometers are useful to measure thickness of a thin film in nanometer order.     

信噪比对偏振耦合测试影响分析

以白光麦克尔逊干涉仪对双折射保偏光纤的偏振耦合进行测试,并基于仪器结构建立了测试扫描结果的数学模型.分析及仿真了信噪比对耦合强度及耦合位置检测的影响大小及变化趋势.信噪比大于32dB,可满足偏振耦合测试的要求.     

非接触法自动测量薄膜厚度

根据白光等厚干涉原理,基于单片机改造的迈氏干涉仪用于自动测量透明薄膜厚度,采用非接触性测量法。当迈克尔逊干涉仪静镜形成的虚像与动镜相交所成的夹角很小时,在光屏上看到彩色干涉条纹,插入薄膜后,光程差改变,彩纹消失。步进电机带动微调手轮转动,当彩纹再次出现,即可得出透明薄膜厚度。     

基于FFT的薄膜厚度干涉测量新方法

在研究二维FFT法进行干涉测试基本原理的基础上,提出一种基于二维FFT的薄膜厚度测量新方法。利用搭建的泰曼-格林型干涉系统,用CCD接收、采集卡采集,可获得被测膜层的干涉条纹图像。编制算法处理软件,可实现对干涉条纹图中薄膜边缘识别、区域延拓、滤波、波面统一等的处理,从而获得带有薄膜信息的面形分布,实现对薄膜样片厚度的自动化测量。研究结果表明：所测薄膜厚度的峰谷值为0．2562,均方根值为0．068λ,说明采用基于FFT的薄膜厚度干涉测量新方法测量薄膜厚度具有较高的精度。     

Spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure

A two-step white-light spectral interferometric technique to measure the relative phase change on reflection from a thin-film structure is presented. The technique is based on recording of the channeled spectra at the output of a Michelson interferometer and their processing by using a windowed Fourier transform to retrieve the phase functions. In the first step, the phase difference between the beams of the interferometer with a thin-film structure is retrieved. In the second step, the structure is replaced by a reference sample of known phase change on reflection and the corresponding phase difference is retrieved. From the two phase differences, the relative phase change on reflection from the thin-film structure is obtained. The feasibility of the simple method is confirmed in processing the experimental data for a SiO₂ thin film on a Si wafer of known optical constants. Four samples of the thin film are used and their thicknesses are determined. The thicknesses obtained are compared with those resulting from reflectometric measurements, and good agreement is confirmed.     

An Iterative Formula for the Reflection Coefficient of Multi-layer Thin Film and Its Application in the Design of Optical All Pass Filter

In this paper, an iterative formula for the reflection coefficient of the multi-layer thin film is deduced and the design of multi-layer thin film gires-tournois interferometer optical all pass filter(GTI-OAPF) is discussed. The group delay τm ranges from 0.06 to 460 ps and the bandwidth Δω ranges from 0.068 to 0.0000079 (1015 rad/s). By changing the incident angle θ0, the multi-channel dispersion compensation may be achieved.     

双折射滤光片的色散特性研究

研究了由理想线偏振片和单轴双折射晶体波片组成的双折射滤光片倾斜放置时的二阶色散和 三阶色散特性，包括波片厚度、光线入射角和光轴旋转角的变化对二阶和三阶色散的影响. 还给出了双折射滤光片的群延迟表达式，并就色散特性与GT干涉仪进行了详细比较. 关键词： 双折射滤光片 群延迟 二阶色散 三阶色散     

All-fiber Mach-Zehnder interferometer for DWDM filter direct group-delay measurement

The group delay of the dense wavelength division multiplexing (DWDM) filter is becoming more important in optical communication. This study proposes a Mach-Zehnder interferometer based on the direct group delay measurement of an optical thin film filter. The interferometer provides a simple, accurate and physically intuitive picture of what happens to broadband optical pulses on common optical materials. A 100 GHz DWDM filter was used as an example in the measurement and showed that the time of measurement and selection of Gaussian window were two important factors.     

Measurement of absolute phase Shift on reflection of thin films using white-light spectral interferometry

A novel method to measure the absolute phase shift on reflection of thin film is presented utilizing a white-light interferometer in spectral domain. By applying Fourier transformation to the recorded spectral interference signal, we retrieve the spectral phase function Ф, which is induced by three parts： the path length difference in air L, the effective thickness of slightly dispersive cube beam splitter Teff and the nonlinear phase function due to multi-reflection of the thin film structure. We utilize the fact that the overall optical path difference （OPD） is linearly dependent on the refractive index of the beam splitter to determine both L and Teff. The spectral phase shift on reflection of thin film structure can be obtained by subtracting these two parts from Ф. We show theoretically and experimentally that our new method can provide a simple and fast solution in calculating the absolute spectral phase function of optical thin films, while still maintaining high accuracy.     

An Iterative Formula for the Reflection Coefficient of Multi-layer Thin Film and Its Application in the Design of Optical All Pass Filter

In this paper, an iterative formula for the reflection coefficient of the multi-layer thin film is deduced and the design of multi-layer thin film gires-tournois interferometer optical all pass filter(GTI-OAPF) is discussed. The group delay τm ranges from 0. 06 to 460 ps and the bandwidth △ω ranges from 0.068 to 0.0000079 (1015 rad/s). By changing the incident angle θ0, the multi-channel dispersion compensation may be achieved.     

Polymer relaxations determined by use of a temporally and thermally stable interferometer

We describe a phase-controlled, highly stable interferometer that is ideal for use in long-time and high-temperature studies. We recorded output intensity variations of <0.2% for over 6 h at temperatures up to 150 degrees C. The setup was used to study in situ the temperature and frequency characteristics of a thin polymer film composed of 4-dimethylamino-4?-nitrostilbene doped into poly(methyl methacrylate). The mobility of the dopant molecules, which governed the electro-optic property of the film, was used to probe the dye-doped polymer's rheology. We demonstrate one application of the interferometer in probing both the alpha and the beta relaxations of the polymer.