Analytic description of enhanced backscattering and negative polarization from a cloud of dipoles

We develop a second-order model of the light scattered by a cloud of randomly positioned dipoles and consider the interference of reciprocal rays that lead to enhanced backscatter and negative polarization. For large pathlength separations, we derive analytic expressions for the individual polarization intensities.     

基于正交调制的偏振光谱成像系统研究

为了同时获取目标的全偏振二维图像信息和其光谱信息,设计了一种基于正交调制的偏振光谱成像系统。该系统由光学接收模块、相位调制器、Wollaston棱镜、Savart偏光镜、检偏器以及成像模块组成。其可以将原始光信号分解成两束相互正交的偏振光,并且分别成像在CCD焦平面的上下两部分上,从而构成两幅偏振图像。两组图像的叠加可以将干涉条纹的数据相互抵消,从而获得目标的纯图像信息,两组图像的相减可以将目标灰度图像相互抵消,从而获得目标的纯干涉条纹。通过理论分析与计算得到了光强分布函数和光谱变化形式。实验在稳定的光源环境中采用高对比度目标与背景板,完成了全偏振图像的实时采集。经相位校正和切趾处理改善了干涉图像的畸变,又通过去低频滤波和阈值滤波抑制了图像中背景噪声的影响,从而实现了对目标图像的提取及偏振光谱的复原。该系统具有稳定性高、光谱分辨率可调、信噪比高、可识别能力强等特点,对在复杂背景中提取目标图像、光谱及偏振态信息具有重要意义。     

角度调谐滤光片偏振控制的间隔层折射率寻优算法

斜入射滤光片的S偏振和P偏振的中心波长会发生分离,而通过调整间隔层的有效折射率,可使有角度入射滤光片两个偏振分量的中心波长相重合。由相位关系分析着手,利用多层膜的特征矩阵关系式,推导出间隔层中间折射率和P偏振及S偏振的中心波长的两个隐函数表达式,由此可快速解出所寻找的中间折射率及对应的中心波长数值。单腔和三腔的两个具体实例的模拟计算表明:采用此算法,对于调谐到一特定角度入射的滤光片能很快地求出准确的中间折射率数值,应用此中间折射率即可使P偏振和S偏振的中心波长很好地重合。入射角从0°到30°的实例偏差分析表明此算法的精确度高,这对于减少偏振分量特性之间的分离以及滤光片的宽角度调谐有着良好的意义。     

Phase Matching of SHG in Arbitrary Directions of Biaxial Crystals

In this paper, propagation and polarization characteristics of optical waves in arbitrary directions in a biaxial crystal are analyzed, and universal relationships of refractive index dependence on their propagation directions and the principal refractive indices for two perpendicular polarization waves propagating in arbitrarily directions are derived from indicatrix equation. By using these relationships, methods of collinear phase matching (PM) of SHG are developed, and general expressions of the collinear PM angle dependent of the principal indices are given for SHG in arbitrarily directions. The expressions may be used to make optimization design of PM by computer for the SHG and to select optimum PM direction and to raise the SHG conversion efficiencies.     

Phase Matching of SHG in Arbitrary Directions of Biaxial Crystals

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Refractive index profiling of a GRIN optical fiber using a modulated speckled sheet of light

A method for calculating the refractive index of GRIN optical fiber from its transverse interference pattern is presented.In this method the transverse interference fringe pattern through an optical fiber using a sheet of light is applied to get the refractive index profile of it. The optical fiber is not immersed in a matching liquid as used in different techniques [Barakat N, El-Hennawi HA, El-Zaiat SY, Hassan R. Pure Appl Opt 1996;5:27].In this method a sheet of He–Ne laser light is allowed to illuminate the fiber. The light sheet is divided into two parts, the first is refracted through the fiber while the second is used as a reference beam. Interference pattern will be obtained between these two rays displaying the refractive index variation along the fiber radius.The fringe shift of such interference pattern has been measured and used to calculate the deflection angle of light refracted by the fiber and the cladding. An equation is derived to calculate the refractive index profile difference ratio δn at different positions across the fiber cross section in terms of the corresponding deflection angle and is verified experimentally.The optical path difference between these two rays (refracted and reference beam divided by the fiber) has been derived and the fringe shift obtained has been used to calculate the refractive index profile of the fiber.Introducing a ground glass screen on the passage of the two light beams (refracted and reference beam divided by the fiber), two superimposed identical speckle patterns are formed leading to the formation of a third speckle pattern modulated by a grid structure displaying the optical thickness of the fiber.     

Phase profile analysis of transparent objects through the use of a two windows interferometer based on a one beam splitter configuration

In this research we implemented a two windows interferometer based on polarization phase shifting and grating interferometry techniques in order to retrieve the phase data profile of the object in a single capture. The optical configuration has two optical beams with circular polarization in opposite directions, and it is coupled with a 4-f system. An amplitude grid is used as a filter which is placed at the Fourier plane to obtain replicas of each beam which can properly interfere, depending on the separation between beams. The interferometer presents the capability of changing the beam separation in order to make different orders interfere properly. The interference patterns produced can be separately modulated through the operation of linear polarizer's placed on each interference replica. In order to present the capabilities of the system we will select four interferograms result of contiguous orders interference.     

新型双通道差分偏振干涉成像系统

针对Wollaston棱镜和Savart偏光镜(SP)组合的差分成像光谱系统存在光线溢出和无法改变系统光程等问题,设计了一种新型双通道差分偏振干涉成像系统.此系统不仅可获取正交偏振图像,还可以通过调整Savart偏光镜的厚度来改变系统光程.介绍了该系统的结构、理论原理,并利用琼斯矩阵推导出四束偏振光线的复振幅及其相干光干涉强度表达式.分析了宽视场Savart偏光镜(WSP)和可调光程的Savart偏光镜(MSP)的分束特性,得出WSP相较于SP具有更好的剪切能力和WSP可优化系统光路的结论.获得了不同楔形结构角下MSP的光程差、横向剪切量随楔形移动量的变化曲线.通过实验验证,获取了不同剪切量下的干涉图像和复色光下平行、垂直分量的空间图像,进而获得了总的强度图像和差分强度图像.得出差分强度图像相较于偏振强度图像具有较高对比度的结论.研究结果对双通道成像光谱系统的性能优化具有一定的参考意义.     

Determination of bending-induced strain in optical fibers by use of quantitative phase imaging

Quantitative phase microscopy with polarized light has been used to determine the change in refractive index introduced into an optical fiber when the fiber is bent through a constant radius of curvature. By obtaining phase images for two orthogonal directions of the polarization of the incident light, one can infer the induced axial strain profile within the fiber. Radii of curvature from 1 to 8 cm were considered, and in each case excellent agreement, within lambda/100, was obtained between experimental results and theory.     

基于Q-plate的双图像非对称偏振加密

基于Q-plate提出了一种对两幅图像做非对称偏振加密的新方法.在该方法中,首先,将待加密的两幅图像通过干涉分解成两块纯相位板;其次,将这两块纯相位板分别编码到偏振光的两个正交分量中;最后,利用Q-plate和像素化的偏振片改变这束光的偏振分布,达到对图像的加密效果,用电荷耦合器件接收输出面的强度分布图作为最终的密文.其中一块纯相位板作为解密密钥.算法的解密密钥不同于加密密钥,由此实现了非对称加密.由于Q-plate是电调控的,它的每个像素点的光轴各不相同,所以能够根据描述变面结构空间旋转率的常数q来改变每个像素的偏振态.加密过程中用Q-plate的q值和像素化的偏振片的偏振角度作为加密密钥,这两个加密密钥具有很高的敏感性,极大地提高了算法的安全性.数值模拟结果验证了该方法的可行性和有效性.     

偶氮苯聚合物全息光栅衍射效率和偏振特性研究

研究了不同偏振全息模式下基于交联偶氮苯聚合物薄膜的相位光栅的形成机理、衍射效率和偏振特性.利用琼斯矢量表征了正交线偏振(SP)和半行线偏振(SS)干涉模式下的偏振干涉场.基于SP和SS两种模式,制作了无明显表成起伏的纯折射率光栅和有表面起伏的浮雕光栅.偏光显微镜(POM)观测说明纯折射率光栅具有周期性的折射率分布;近场光学显微镜(SNOM)探测说明纯折射率光栅和浮雕光栅的表而起伏在5 nm以下和 85.23 nm.实验表明.当探测光为水平偏振时,纯折射率光栅的衍射效率达到22.2%.浮雕光栅只能达到1.65%.纯折射率光栅的0、 1级衍射光分别为水平和竖直线偏振光,偏振度达到0.9969和0.9963;浮雕光栅的0, 1级衍射光均为水平线偏振光.     

石英波片偏光干涉谱的研究

根据石英晶体双折射率的色散特性,对石英波片的偏光干涉谱进行了理论分析和数值模拟,提出了一种石英波片延迟量和厚度的偏光干涉标定法。即由偏光干涉谱,可以得出石英波片在200~2000 nm宽光谱范围内的延迟量;通过对长波段的偏光干涉谱极值波长的精确判断,可以准确地计算出该石英波片的厚度。利用Lambda900紫外-可见-近红外分光光度计对一片石英波片的偏光干涉谱进行了测量。在波长精度为0.1 nm的情况下,测量的厚度精度为0.1μm。误差分析结果表明,通过提高光谱的最小分辨力及选择较长的光谱波段进行测量计算,可以有效地降低误差。     

PMD compensation via real-time phase retrieval from spectral interference

We present a technique for pulse recovery based on real-time measurement of the differential optical phase spectrum from spectral interference patterns. Using a phase retrieval algorithm we can obtain accurate all order polarization mode dispersion (PMD) information for the optical signal and correspondingly compensate the impairment in optical transmission lines. Linear PMD is accurately extracted from measurements, and analytical simulations show recovery of pulses distorted by higher order PMD.     

System for measuring optical admittance of a thin film stack

A new method based on the polarization interferometer structure has been applied to measure the optical admittance, the refractive index and thickness of a thin film. The structure is a vibration insensitive optical system. There is one Twyman-Green interferometer part to induce a phase difference and one Fizeau interferometer part to induce the interference in the system. The intensities coming from four different polarizers were measured at the same time to prevent mechanical vibration influence. Using the polarization interferometer, the optical admittance, the refractive index and thickness of a single layer of Ta₂O₅ thin film has been measured. The measurement results were compared with the results obtained by ellipsometer. The results meet reasonable values in both refractive index and thickness.     

Optical properties of polarization-dependent geometric phase elements with partially polarized light

The behavior of geometric phase elements illuminated with partially polarized monochromatic beams is investigated both theoretically and experimentally. The element discussed in this paper is composed of wave plates with π-retardation and a space-variant orientation angle. We found that a beam emerging from such an element comprises two polarization orders; right-and left-handed circularly polarized states with conjugate geometric phase modification. This phase equals twice the orientation angle of the space-variant wave plate comprising the element. Apart from the two polarization orders, the emerging beam coherence polarization matrix includes a “vectorial interference matrix” which contains information concerning the correlation between the two orthogonal, circularly polarized portions of the incident beam. In this paper we measure this correlation by a simple interference experiment. In addition, we found that the equivalent mutual intensity of the emerging beam is modulated according to the geometric phase induced by the element. Other interesting phenomena concerning propagation will be discussed theoretically and demonstrated experimentally. The experiment made use of a spherical geometric phase element that was realized by use of a space-variant subwavelength grating illuminated with CO₂ laser radiation of 10.6 μm wavelength.     

Refraction of extraordinary rays and ordinary rays in the Savart polariscope

The refraction of rays in the Savart polariscope is different from the isotropic medium. We have analysed and discussed the refraction of rays in the Savart polariscope on the basis of the Snell law. The refraction formulae of the extraordinary rays and ordinary rays were derived. Results obtained may provide theoretical and practical guide lines for studying, developing and engineering of polarization interference imaging spectrometer.     

一种斜入射F-P型薄膜滤光片消偏振设计方法

薄膜滤光片在斜入射使用时,s偏振光和p偏振光的特性会产生分离:两偏振光的中心波长不一致,且s偏振光的通带宽度要小于p偏振光.而采用多种材料且满足特定条件的膜系结构,可使角度入射滤光片两偏振方向的特性趋于一致.通过理论分析,建立了两偏振光反射率的表达式,由表达式可看出非偏振的条件.通过计算,求出相应材料折射率值,从而设计出消偏振的膜系.对一个三腔129层实例膜系进行了计算求解、仿真分析及误差分析.最后的结果验证表明此方法是可行的.     

Cerenkov radiation and its polarization

General expression for the energy loss in Cerenkov radiation due to a charged particle possessing anomalous magnetic moment is obtained. The expressions include the spin-polarization of the particles. The contribution to the radiation due to anomalous magnetic moment is found to be small as compared to that due to charge. The interference term of charge and anomalous magnetic moment gives better contribution as compared to the term containing only anomalous magnetic moment. Polarization of the radiation as dependent on polarization of beam of particles is studied. The radiation has a dominant nature of linear polarization with small quantum corrections. The spin-flip also gives quantum correction to strong linear polarization and at threshold when phase velocity equals velocity of the particle.     

Polarization of light backscattered by small particles

We study scattering of light by wavelength-scale spherical, cubic, and spheroidal particles as well as clusters of spherical particles for equal-volume-sphere size parameters 4≤x≤10 and refractive indices 1.1≤m≤2.0. Such particles exhibit three specific features in the regime of backscattering: first, the intensity shows a backscattering peak; second, the degree of linear polarization for unpolarized incident light is negative; and, third, the depolarization ratio is double-lobed. We find that the overall characteristics of the scattering-matrix elements can be explained by an internal field composed of waves propagating in opposite directions near the particle perimeter and forming standing waves, as well as a wave propagating forward with the wavelength of the internal medium. When moving from the central axis of the particle toward its perimeter, the internal field changes from a forward-propagating wave with a wavelength dictated by the particle refractive index toward a standing wave with an apparent wavelength of the surrounding medium. The mapping of the internal field to the scattered far field is like an interference dial where rotation of the dial by a quarter of a wavelength on the particle perimeter results in a change from a destructive to constructive interference feature in the angular patterns (or vice versa). The dial is a manifestation of a well-known rule of thumb: the number of maxima or minima in the scattering-matrix elements is given by the size parameter. We explain the backscattering peak as deriving from the backward-propagating internal wave near the particle perimeter. Negative polarization follows from the spatial asymmetry of the internal fields: inside the particle, the fields are amplified near the central plane perpendicular to the polarization state of incident light, resulting in more pronounced interference effects for the perpendicular polarization than for the parallel polarization. The double-lobe feature in the depolarization results from the same internal-field structure with leading cross-polarized fields located slightly different from the copolarized fields. We discuss practical implications of these findings for the retrieval of particle sizes, shapes, and refractive indices from observations and laboratory experiments.     

结构光照明显微中的偏振控制

结构光照明显微(structured illumination microscopy.SIM)作为一种宽场超分辨光学显微成像技术,具有成像速度快、光漂白和光毒性弱等优点,是目前主流超分辨成像方法之一.在SIM技术中,正弦强度分布的条纹结构光场的对比度决定了SIM超分辨图像的质量.低的条纹对比度将导致样品中超衍射极限的高频信息被噪声掩盖,从而无法解析出超分辨信息.结构照明入射光的偏振态调控决定了干涉条纹的对比度,是SIM的关键技术.鉴于此,本文总结对比了几种典型的SIM系统偏振控制方法,同时提出了一种使用零级涡旋半波片的偏振控制方法.实验证明,与其他方法相比,采用零级涡旋半波片法可以获得更高效的偏振控制效果,具有系统结构简单、易使用、可将光能利用率提升到接近100%的优点.