Probing the surface chemical structure of some novel poly(ortho esters) prepared with N-methyl and N-phenyl ethanolamine by time-of-flight secondary ion mass spectrometry (ToF-SIMS)

The surface chemical structures of a series of novel poly(ortho ester) homopolymer and copolymer films prepared using N-methyl- and N-phenyl-ethanolamine (MDE and PDE) have been investigated using time-of-flight secondary ion mass spectrometry (ToF-SIMS). Systematic fragmentation patterns were observed within the ToF-SIMS spectra up to m/z = 1600, which were readily interpreted in terms of the polymer structures. Cations were detected which could be assigned to structures arising from the diols, the ortho ester species and diads, triads etc. of the monomer, from both the homopolymer and the random portion of the copolymer chains. The analysis of the proposed ion structures suggested two major mechanisms of fragmentation based on the cleavage of the ortho ester bonds involving either the exocyclic or the endocyclic alkoxy group. The Tof-SIMS peak area ratios for ions diagnostic of the diols and the ortho ester species reflected the bulk copolymer composition in a semi-quantitative fashion. The observation of such relationships for high mass cations (up to m/z = 500) is particularly noteworthy and has not been reported previously. These studies allow a dramatic insight into the surface chemical structure of these poly(ortho esters), information which has formed the foundation of current investigations on the mechanisms of the acid-catalysed surface degradation of these polymers.     

Application of XPS and ToF-SIMS for surface chemical analysis of DNA microarrays and their substrates

The chemical composition of the functional surfaces of substrates used for microarrays is one of the important parameters that determine the quality of a microarray experiment. In addition to the commonly used contact angle measurements to determine the wettability of functionalized supports, X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) are more specific methods to elucidate details about the chemical surface constitution. XPS yields information about the atomic composition of the surface, whereas from ToF-SIMS, information on the molecular species on the surface can be concluded. Applied on printed DNA microarrays, both techniques provide impressive chemical images down to the micrometer scale and can be utilized for label-free spot detection and characterization. Detailed information about the chemical constitution of single spots of microarrays can be obtained by high-resolution XPS imaging. Figure Eye-catching image for the graphical online abstract     

Nanotome cluster bombardment to recover spatial chemistry after preparation of biological samples for SIMS imaging

A C₆₀⁺ cluster ion projectile is employed for sputter cleaning biological surfaces to reveal spatio-chemical information obscured by contamination overlayers. This protocol is used as a supplemental sample preparation method for time of flight secondary ion mass spectrometry (ToF-SIMS) imaging of frozen and freeze-dried biological materials. Following the removal of nanometers of material from the surface using sputter cleaning, a frozen-patterned cholesterol film and a freeze-dried tissue sample were analyzed using ToF-SIMS imaging. In both experiments, the chemical information was maintained after the sputter dose, due to the minimal chemical damage caused by C₆₀⁺ bombardment. The damage to the surface produced by freeze-drying the tissue sample was found to have a greater effect on the loss of cholesterol signal than the sputter-induced damage. In addition to maintaining the chemical information, sputtering is not found to alter the spatial distribution of molecules on the surface. This approach removes artifacts that might obscure the surface chemistry of the sample and are common to many biological sample preparation schemes for ToF-SIMS imaging.     

Investigations of matrix-assisted laser desorption/ionization sample preparation by time-of-flight secondary ion mass spectrometry

Matrix-assisted laser desorption/ionization (MALDI) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) analyses are compared to gain insight into some of the details of sample preparation for MALDI analysis of synthetic polymers. ToF-SIMS imaging of MALDI samples shows segregation of the cationization agent from the matrix crystals. The amount of observed segregation can be controlled by the sample preparation technique. Electrospray sample deposition minimizes segregation. Comparing ToF-SIMS and MALDI mass spectra from the same samples confirms that ToF-SIMS is significantly more surface sensitive than MALDI. This comparison shows that segregation of the oligomers of a polymer sample can occur during MALDI sample preparation. Our data indicate that MALDI is not as sensitive to those species dominating the sample surface as to species better incorporated into the matrix crystals. Finally, we show that matrix-enhanced SIMS can be an effective tool to analyze synthetic polymers, although the sample preparation conditions may be different than those optimized for MALDI.     

ToF-SIMS analysis of poly(l-lysine)-graft-poly(2-methyl-2-oxazoline) ultrathin adlayers

Understanding of the interfacial chemistry of ultrathin polymeric adlayers is fundamentally important in the context of establishing quantitative design rules for the fabrication of nonfouling surfaces in various applications such as biomaterials and medical devices. In this study, seven poly(l-lysine)-graft-poly(2-methyl-2-oxazoline) (PLL–PMOXA) copolymers with grafting density (number of PMOXA chains per lysine residue) 0.09, 0.14, 0.19, 0.33, 0.43, 0.56, and 0.77, respectively, were synthesized and characterized by means of nuclear magnetic resonance spectroscopy (NMR). The copolymers were then adsorbed on Nb₂O₅ surfaces. Optical waveguide lightmode spectroscopy method was used to monitor the surface adsorption in situ of these copolymers and provide information on adlayer masses that were then converted into PLL and PMOXA surface densities. To investigate the relationship between copolymer bulk architecture (as shown by NMR data) and surface coverage as well as surface architecture, time-of-flight secondary ion mass spectrometry (ToF-SIMS) analysis was performed. Furthermore, ToF-SIMS method combined with principal component analysis (PCA) was used to verify the protein resistant properties of PLL–PMOXA adlayers, by thorough characterization before and after adlayer exposure to human serum. ToF-SIMS analysis revealed that the chemical composition as well as the architecture of the different PLL–PMOXA adlayers indeed reflects the copolymer bulk composition. ToF-SIMS results also indicated a heterogeneous surface coverage of PLL–PMOXA adlayers with high grafting densities higher than 0.33. In the case of protein resistant surface, PCA results showed clear differences between protein resistant and nonprotein-resistant surfaces. Therefore, ToF-SIMS results combined with PCA confirmed that the PLL–PMOXA adlayer with brush architecture resists protein adsorption. However, low increases of some amino acid signals in ToF-SIMS spectra were detected after the adlayer has been exposed to human serum.

Fabrication of self-organized chemically and topologically heterogeneous patterns on the surface of polystyrene-b-oligothiophene block copolymer films

A novel fabrication of the chemically and topologically heterogeneous patterns on the surface of polymeric films over an area of more than 1 square centimeter in a single step was demonstrated by using the self-organizing character of polystyrene-b-oligothiophene block copolymers. Hexagonally arranged open pores of a size of approximately 2 mum are spontaneously formed by casting the polymer solution under a moist air flow. The amphiphilic character of the polystyrene-b-oligothiophene block copolymers played the crucial role as a surfactant to stabilize the inverse emulsion of water droplets in the organic solvent, and subsequently the structure of the arranged hydrophilic oligothiophene segments remained on the interiors of the micropores. The chemical composition of the surface of the microporous films was characterized by time-of-flight secondary ion mass spectrometry (ToF-SIMS) to prove the chemical heterogeneity. The ToF-SIMS imaging clearly indicated that the oligothiophene forms the aggregated structure on the interior of the open micropores on the surface while the flat area on the surface was covered with the polystyrene.     

Probing the orientation of surface-immobilized immunoglobulin G by time-of-flight secondary ion mass spectrometry

Static time-of-flight secondary ion mass spectrometry (ToF-SIMS) is a powerful surface analysis technique for the characterization of protein films because of its chemical selectivity and surface sensitivity. In this study, static ToF-SIMS and principal component analysis (PCA), a multivariate data analysis method, were combined to probe the orientation of surface-immobilized immunoglobulin G (IgG). IgG orientation can enhance its ability to detect its antigen in immunoassay techniques. The IgG used in this work is the mouse monoclonal anti-human chorionic gonadotropin (anti-hCG). Anti-hCG films on different well-defined substrates have been studied using its F(ab')2 and Fc fragments as references. Atomic force microscopy was used to characterize these protein films before static ToF-SIMS analysis. The results from PCA of ToF-SIMS spectra were related to the antibody primary amino acid composition and its three-dimensional structure.     

Interpreting the signal from a localized fluorescence sensor: a study by angle-resolved XPS and dynamic SIMS

Angle-resolved X-ray photoelectron spectroscopy (XPS) and dynamic secondary ion mass spectroscopy (DSIMS) experiments were conducted to assess the interactions between a diamine curing agent and a glycidoxysilane-modified glass substrate. This effort was motivated by earlier work, in which a fluorescent probe localized in dilute quantities in the silane layer was used to track the penetration of the resin into the silane layer, as well as the resin cure. XPS and DSIMS experiments were performed on the silane layers immersed only in the resin hardener, providing more detailed information about the concentration profile and structural reorganization within the silane layer due specifically to hardener penetration. Dynamic SIMS spectra reveal the presence of hardener in the layer, as indicated by the strong CN- signal throughout the silane layer thickness. The XPS results indicate the presence of an amine gradient within the top 10 nm of the silane coating, with less amine penetration deeper into the silane layer. The XPS data also suggest some level of anisotropy in the molecular structure of the diamine/glycidoxysilane coating, as revealed by the differences in the relative atomic concentrations and peak positions of the C1s components at two different take-off angles.     

Three-dimensional depth profiling of molecular structures

Molecular time of flight secondary ion mass spectrometry (ToF-SIMS) imaging and cluster ion beam erosion are combined to perform a three-dimensional chemical analysis of molecular films. The resulting dataset allows a number of artifacts inherent in sputter depth profiling to be assessed. These artifacts arise from lateral inhomogeneities of either the erosion rate or the sample itself. Using a test structure based on a trehalose film deposited on Si, we demonstrate that the “local” depth resolution may approach values which are close to the physical limit introduced by the information depth of the (static) ToF-SIMS method itself.     

Quantifiable correlation of ToF-SIMS and XPS data from polymer surfaces with controlled amino acid and peptide content

Peptide-coated surfaces are widely employed in biomaterial design, but quantifiable correlation between surface composition and biological response is challenging due to, for example, instrumental limitations, a lack of suitable model surfaces or limitations in quantitatively correlating data from different surface analytical techniques. Here, we first establish a reference material that allows control over amino acid content. Reversible addition-fragmentation chain-transfer (RAFT) polymerisation is used to prepare a copolymer containing alkyne and furan units with well-defined chain length and composition. Huisgen Cu(I)-catalysed azide-alkyne cycloaddition reaction is used to attach the model azido-polyethyleneglycol-amide-modified pentafluoro-l -phenylalanine to the polymer. Different compositional ratios of the polymer provide a surface with varying amino acid content that is analysed by X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS). Nitrogen-related signals are compared with fluorine signals from both techniques. Fluorine and nitrogen signals from both techniques are found to be related to the copolymer compositions, but the homopolymer data deviate from this trend. The approach is then translated to a heparin-binding peptide that supports cell adhesion. Human embryonic stem cells cultured on copolymer surfaces presenting different amounts of heparin-binding peptide show strong cell growth while maintaining pluripotency after 72 h of culture. The early cell adhesion at 24 h can be correlated to the logarithm of the normalised CH₄N⁺ ion intensity from ToF-SIMS data, which is established as a suitable and generalisable marker ion for amino acids and peptides. This work contributes to the ability to use ToF-SIMS in a more quantitative manner for the analysis of amino acid and peptide surfaces.     

ToF-SIMS measurements with topographic information in combined images

In 2D and 3D time-of-flight secondary ion mass spectrometric (ToF-SIMS) analysis, accentuated structures on the sample surface induce distorted element distributions in the measurement. The origin of this effect is the 45° incidence angle of the analysis beam, recording planar images with distortion of the sample surface. For the generation of correct element distributions, these artifacts associated with the sample surface need to be eliminated by measuring the sample surface topography and applying suitable algorithms. For this purpose, the next generation of ToF-SIMS instruments will feature a scanning probe microscope directly implemented in the sample chamber which allows the performance of topography measurements in situ. This work presents the combination of 2D and 3D ToF-SIMS analysis with topographic measurements by ex situ techniques such as atomic force microscopy (AFM), confocal microscopy (CM), and digital holographic microscopy (DHM). The concept of the combination of topographic and ToF-SIMS measurements in a single representation was applied to organic and inorganic samples featuring surface structures in the nanometer and micrometer ranges. The correct representation of planar and distorted ToF-SIMS images was achieved by the combination of topographic data with images of 2D as well as 3D ToF-SIMS measurements, using either AFM, CM, or DHM for the recording of topographic data.     

Characterization of polymeric surfaces and interfaces using time-of-flight secondary ion mass spectrometry

Time-of-flight secondary ion mass spectrometry (ToF-SIMS) is used for chemical analysis of surfaces. ToF-SIMS is a powerful tool for polymer science because it detects a broad mass range with good mass resolution, thereby distinguishing between polymers that have similar elemental compositions and/or the same types of functional groups. Chemical labeling techniques that enhance contrast, such as deuterating or staining one constituent, are generally unnecessary. ToF-SIMS can generate both two-dimensional images and three-dimensional depth profiles, where each pixel in an image is associated with a complete mass spectrum. This Review begins by introducing the principles of ToF-SIMS measurements, including instrumentation, modes of operation, strategies for data analysis, and strengths/limitations when characterizing polymer surfaces. The sections that follow describe applications in polymer science that benefit from characterization by ToF-SIMS, including thin films and coatings, polymer blends, composites, and electronic materials. The examples selected for discussion showcase the three standard modes of operation (spectral analysis, imaging, and depth profiling) and highlight practical considerations that relate to experimental design and data processing. We conclude with brief comments about broader opportunities for ToF-SIMS in polymer science.     

Dewetting of unreacted epoxy/amine mixtures on silica

We employ a direct method, time-of-flight secondary ion mass spectroscopy (ToF-SIMS), to determine experimentally the chemical compositions of the wetted and dewetted regions of an uncured epoxy thin film. Determining the composition of the dewetted region indicated the presence of a very thin sublayer of resin in what was thought to be a region devoid of resin. The capability of ToF-SIMS to probe small 65 x 65 microm(2) areas of the surface has permitted us to directly compare the SIMS spectra of the wetted and dewetted regions to the survey spectra of the reactants. This may indicate the strength of resin/silica interactions, which determine interface formation and properties.     

A guide for the meaningful surface analysis of wood by XPS and ToF-SIMS

The surface analysis of wood and wood products is becoming increasingly important for reasons ranging from the investigation of molecular constituents through to the optimization of industrial processes. As with any natural product, wood analysis is not straightforward, and this review aims to provide guidance for the successful surface analysis of wood by XPS and ToF-SIMS. Through example experiments, three themes are addressed relevant to obtaining meaningful results: considerations related to heterogeneity in the composition of wood (e.g., growth rings); the impact of the chemical removal of minor wood components known as extractives, and whether such a process is necessary; and the potential for misleading or erroneous results as a result of contamination occurring during sample preparation. In addition to discussing successful sample preparation approaches, the important role to be played by MVA in surface analysis is emphasized, particularly in the analysis of ToF-SIMS data. Examples of ToF-SIMS/MVA are provided that highlight the identification of contamination in sample preparation, the quantification of wood composition in terms of cellulose and lignin, and the indication of age of softwood samples. Through consideration of the complexities that influence wood surface analysis, the design and interpretation of consequential experiments become easier and more accurate.     

Structural colors and physical properties of elytra in the jewel beetle,Chrysochroa fulgidissima,using surface analytical techniques

Structural coloration frequently originates from the interaction of light with multilayers of thin films in living organisms. One example where structural colors are created by multilayers is the jewel beetle, Chrysochroa fulgidissima, which has highly iridescent green elytra with longitudinal red stripes. We examine the structure, chemical information, and physical properties of the epicuticle of the jewel beetle by using atomic force microscopy (AFM), scanning electron microscopy (SEM), transmission electron microscopy (TEM), nanoindentation, and time-of-flight secondary ion mass spectrometry (ToF-SIMS). AFM and SEM were used to analyze the surface structures of the green elytra and red stripes of the jewel beetle's wing. SEM and TEM images obtained from the cross-sectioned cuticle samples of green and red areas indicated that the color arises from interference reflectors and reflectors consist of successive repeating layers of different electronic densities. Nanoindentation results showed that the green area of the elytron possesses a higher hardness and reduced modulus compared with the red area. To analyze the surface of the elytra and to compare multilayers of the green area with those of the red area, mass spectra and depth profiles were acquired by ToF-SIMS with C₆₀ and Ar cluster ion beams. The epicuticle consists of several layers with alternating high and low abundances of inorganic and organic fragment ions, with approximately 16 layers in the green and 12 layers in the red area. Therefore, ToF-SIMS combined with other analytical techniques indicate that multilayer reflection is a major mechanism of the jewel beetle's iridescence causing structural coloration.     

Surface molecular characterisation of different epoxy resin composites subjected to UV accelerated degradation using XPS and ToF-SIMS

Epoxy resin composites reinforced with E-glass (E), 3D glass (3D) and carbon fibre (CF) were subjected to an intense UV and high temperature accelerated degradation environment. X-ray photoelectron spectroscopy (XPS) and time-of-flight secondary ion mass spectrometry (ToF-SIMS) were used to provide a molecular characterisation of the surface of the degraded composites. The response at the surface of the epoxy resin composites to oxidative degradation is influenced by the composite reinforcement type and characteristics. XPS results indicate that 3D resin composites exhibit more surface oxidation as a result of the accelerated degradation in comparison with E and CF composites. Principal components analysis (PCA) of the ToF-SIMS positive ion spectra showed that E and 3D resin composites suffered chain scission while CF composites suffered chain scission and cross-linking reactions as a result of the intense UV exposure. The extent of the surface oxidation, cross-linking/condensation reaction and loss of low molecular weight (lower than C₄H_x) aliphatic hydrocarbons may be indicated using PCA of both the ToF-SIMS positive and negative ion spectra. PCA also provides insight for proposing epoxy resin chain scission and oxidation reaction mechanisms.     

Comparison of primary monoatomic with primary polyatomic ions for the characterisation of polyesters with static secondary ion mass spectrometry

Static secondary ion mass spectrometry (S-SIMS) emerges as one of the most adequate methods for the surface characterisation of polymers with an information depth of essentially one monolayer. The continuing search for increased analytical sensitivity and specificity has led to exploring the use of polyatomic primary ions as an alternative to the traditionally applied monoatomic projectiles. As part of a systematic investigation on polyatomic bombardment of organic and inorganic solids, this paper focuses on selected polyesters. Mass spectra and ion yields are compared for layers deposited on silicon wafers by spincoating solutions with different concentrations of poly(epsilon-caprolactone) (PCL), poly(butylene adipate) (PBA) and poly(ethylene adipate) (PEA). Accurate mass measurements have been used to support the assignment of the ions and link the composition of the detected ions to the analyte structure. Use of polyatomic projectiles increases the yield of structural ions with a factor of +/-15, +/-30 and +/-10 for PCL, PBA and PEA, respectively, in comparison to bombardment with Ga+ primary ions, while the molecular specificity is improved by the detection of additional high m/z ions.     

A quantitative determination of the polymerization of benzoxazine thin coatings by time-of-flight secondary ion mass spectrometry

Phenol-paraphenylenediamine (P-pPDA) benzoxazines exhibit excellent barrier properties, adequate to protect aluminum alloys from corrosion, and constitute interesting candidates to replace chromate-containing coatings in the aeronautical industry. For the successful application of P-pPDA coatings, it is necessary to decrease the curing temperature to avoid the delamination of the coating while preserving the mechanical properties of the alloy, as well as the barrier properties of the coating. However, decreasing the curing temperature leads to less polymerized films, the extent of which requires a quantitative assessment. While the conversion rate of the polymerization reaction is commonly evaluated for bulk samples using differential scanning calorimetry (DSC), a tool for its evaluation in thin films is missing. Therefore, a new approach was developed for that matter using time-of-flight secondary ion mass spectrometry (ToF-SIMS). The relation between the SIMS data integrated from inside thin films and the DSC results obtained on bulk samples with the same curing cycle allowed to calibrate the SIMS data. With this preliminary calibration of the technique, the polymerization of P-pPDA coatings can be locally determined, at the surface and along the depth of the coating, using dual-beam depth profiling with large argon cluster beam sputtering.     

Chemical Analysis of Inorganic and Organic Surfaces and Thin Films by Static Time-of-Flight Secondary Ion Mass Spectrometry (TOF-SIMS)

By using mass spectrometry to analyze the atomic and molecular secondary ions that are emitted from a solid surface when bombarded with ions, one obtains detailed information about the chemical composition of the surface. A time-of-flight mass spectrometer is especially suitable for the analysis of secondary ions because of its high transmission, high mass resolution, and ability to detect ions of different masses simultaneously. By using a finely focused primary ion beam it is also possible to analyze microareas and generate surface images with a lateral resolution of 0.1 μm or less. Static time-of-flight secondary ion mass spectrometry (TOF-SIMS) allows monolayer imaging and local analysis of monolayers with high sensitivity, a wide mass range, high mass resolution, and high lateral resolution. Besides information on elements and isotopes, the technique yields direct information on the molecular level and can also be used to analyze surface species of high molecular mass that are thermally unstable and cannot be vaporized. The method can be applied to practically all types of materials and sample forms, including insulators in particular. In this article the basic principles of TOF-SIMS are explained, and its analytical capabilities for both large area and imaging applications are illustrated by examples. These include silicon surfaces (both uniform and structured), thermally unstable organic molecules on surfaces, synthetic polymers, and synthetically prepared molecular surface films, particles, and fibers. Emitted neutral particles can also be analyzed by postionization with a laser, and the possibilities of this technique are discussed.     

Automated correlation and classification of secondary ion mass spectrometry images using a k-means cluster method

We present a novel method for correlating and classifying ion-specific time-of-flight secondary ion mass spectrometry (ToF-SIMS) images within a multispectral dataset by grouping images with similar pixel intensity distributions. Binary centroid images are created by employing a k-means-based custom algorithm. Centroid images are compared to grayscale SIMS images using a newly developed correlation method that assigns the SIMS images to classes that have similar spatial (rather than spectral) patterns. Image features of both large and small spatial extent are identified without the need for image pre-processing, such as normalization or fixed-range mass-binning. A subsequent classification step tracks the class assignment of SIMS images over multiple iterations of increasing n classes per iteration, providing information about groups of images that have similar chemistry. Details are discussed while presenting data acquired with ToF-SIMS on a model sample of laser-printed inks. This approach can lead to the identification of distinct ion-specific chemistries for mass spectral imaging by ToF-SIMS, as well as matrix-assisted laser desorption ionization (MALDI), and desorption electrospray ionization (DESI).