Exciton binding energies in II–VI compound strained layer superlattices

II–VI strained-layer superlattices are very efficient emitters of visible light. The dependence of the luminescence intensity on the excitation power density allows us to characterise the recombination processes involved in the emission. At low temperatures excitonic processes are dominant whereas electron-hole recombinations feature at room temperature. No special evidence of the dual nature of the emission is observed at intermediate temperatures because the optical transitions are broadened by well-width fluctuations. In spite of this we may estimate the exciton binding energy from the temperature dependence of the photoluminescence intensity, as long as the photoluminescence remains excitonic. This is the case for narrow wells in CdS---ZnS superlattices over the temperature range zero to room temperature. The estimated exciton binding energy measured in this way approaches the two dimensional limit but does not exceed it.     

CdTe/CdZnTe多量子阱激子复合动力学性质的研究

报道了分子束外延制备的高质量CdTe/Cd_0.64Zn_0.36Te多量子阱结构的光学性质,由变温光致发光光谱讨论了随温度升高辐射线展宽和辐射复合效率降低的机理.在变密度激发的皮秒时间分辨光谱中,发现不同激发密度下发光衰减时间不同,并研究了它的机理.在高激发密度下观测到n=2的重空穴激子发光. 关键词：     

CdSe/ZnSe复合结构非对称量子阱的发光特性

利用MOCVD技术在GaAs衬底上外延生长了非对称量子阱结构CdSe/ZnSe材料,通过对其稳态变温光谱及变激发功率光谱,研究了其发光特性。稳态光谱表明:在82～141K时,观测到的两个发光峰来源于不同阱层厚度的量子阱激子发光,用对比实验验证了高能侧发光的来源。宽阱发光强度先增加后减小,将其归结为激子隧穿与激子热离化相互竞争的结果。通过Arrhenius拟合,对宽阱激子热激活能进行了计算。82K时变激发功率PL光谱表明:由于激子隧穿的存在,使得窄阱发光峰位不随激发功率变化而变化,宽阱发光峰位随激发功率增加发生了蓝移,并对激子隧穿进行了实验验证。     

Abnormal Energy Dependence of Photoluminescence Decay Time in InGaN Epilayer

We employ photoluminescence (PL) and time-resolved PL to study exciton localization effect in InGaN epilayers.By measuring the exciton decay time as a function of the monitored emission energy at different temperatures,we have found unusual behaviour of the energy dependence in the PL decay process. At low temperature, the measured PL decay time increases with the emission energy. It decreases with the emission energy at 200K, and remains nearly constant at the intermediate temperature of 12OK. We have studied the dot size effect on the radiative recombination time by calculating the temperature dependence of the exciton recombination lifetime in quantum dots, and have found that the observed behaviour can be well correlated to the exciton localization in quantum dots. This suggestion is further supported by steady state PL results.     

Photoluminescence spectroscopy of carbon nanotube bundles: evidence for exciton energy transfer

We investigate photoluminescence of nanotube bundles. Their spectra are explained by exciton energy transfer between adjacent tubes, whereby excitation of large gap tubes induces emission from smaller gap ones. The consequent relaxation rate is faster than nonradiative recombination, leading to enhanced photoluminescence of acceptor tubes.     

CdS单晶中的绿色电致发光和光致发光

在50-290K温度范围内,研究了在正向电压激发下,用高纯CdS单晶制备的MIS发光二极管的电致发光光谱。在室温时,发射光谱分别由峰值为5135±25Å和5300±15Å的二个绿色谱带所组成,而在低温下,观测到有很多结构的光谱。在50K时,自由和束缚激子的发射实际上占有统治地位。文中提出,在室温时,谱峰为5135±25Å的谱带是与受导带自由电子散射的自由激子的发射有关;而谱峰为5300±15Å的谱带归结为与同时发射二个纵光学声子的自由激子的发射有关。比较了刚生长的高阻CdS单晶以及在熔融镉中热处理的低阻CdS单晶的光致发光光谱。在熔融镉中的热处理抑制了自由到束缚(HES)和束缚到束缚(LES)的边缘发射,也抑制了I2束缚激子谱线,但是增强了自由激子的发射,在电场激发下,也使自由激子的发射增强。     

Origins of green band emission in high-temperature annealed N-doped ZnO

Nitrogen-doped ZnO sample has been annealed in O₂ ambient at high temperature (1000 °C) to improve its photoluminescence property. Low-temperature photoluminescence spectra of the sample are dominated by three near-band-edge emissions at 3.377, 3.362, and 3.332 eV, which are ascribed to free exciton emission (FX_A), and neutral donor-bound exciton (D⁰X), and its two-electron satellite (TES), respectively. With increasing temperature in low temperature region, the intensity of FX_A increases and the green band (GB) shows a negative thermal quenching effect resulting from thermal dissociation of D⁰X with more free excitons and neutral donors formed. The doublet structure with energy space ∼30 meV and repeated separation of longitudinal-optical phonon energy of 72 meV are observed in GB at low temperatures. The temperature independent energy position of GB indicates a typical recombination characteristic within strongly localized complexes. The doublet structures are considered to originate from the ground and exited states of shallow donors recombining with deep acceptors such as zinc vacancies.     

双模自组织量子点光致发光的温度依赖性

采用稳态速率方程模型,对双模自组织量子点光致发光的温度依赖性进行了研究,模拟获得了不同温度下双模自组织量子点的光致发光光谱,并进一步研究了两组量子点分布的光致发光强度比的温度依赖性。研究表明:在低温下(<75K),两组量子点分布的发光强度比基本保持不变;随着温度的升高(75K相似文献   

Pressure dependence of the near-band-edge photoluminescence from ZnO microrods at low temperature

The temperature and pressure dependences of band-edge photoluminescence from ZnO microrods have been investigated. The energy separation between the free exciton (FX) and its first order phonon replica (FX-1LO) decreases at a rate of k_BT with increasing temperature. The intensity ratio of the FX-1LO to the bound exciton (BX) emission is found to decrease slightly with increasing pressure. All of the exciton emission peaks show a blue shift with increasing pressure. The pressure coefficient of the FX transition, longitudinal optical (LO) phonon energy, and binding energy of BX are estimated to be 21.4, 0.5, and 0.9 meV/GPa, respectively.     

Exciton emission from forward-biased zinc selenide Schottky diodes

Exciton emission has been observed in the forward-biased electroluminesence of ZnSe Schottky diodes free of intentionally added luminescent centres. The emission has been studied from ≈ 95° K to room temperature and is attributed to the recombination of free excitons (zero-LO phonon line). No LO phonon side bands were observed. As with exciton photoluminescence in CdS the half-width of the emission line, although a linear function of temperature, is greater than that predicted by theory. At temperatures below ≈150°K pair emission was also observed.     

激子转移对GaP:N发光热猝灭过程的影响

本文研究了20K-120K范围内GaP:N束缚激子发光与温度的关系,从实验结果发现,各发光中心之间存在着激子转移.初步分析表明,采用带带激发方式,激子转移会导致深束缚中心的热激活能拟合值偏高,其发光热猝灭是由于空穴的热离化所造成的.     

退火温度对ZnO薄膜结构和发光特性的影响

采用反应射频磁控溅射法在 Si(100)基片上制备了高c轴择优取向的ZnO薄膜，研究了退火温度对ZnO薄膜的晶粒尺度、应力状态、成分和发光光谱的影响，探讨了ZnO薄膜的紫外发光光谱和可见发光光谱与薄膜的微观状态之间的关系.研究结果显示,在600—1000℃退火温度范围内，退火对薄膜的织构取向的影响较小，但薄膜的应力状态和成分有比较明显的变化.室温下光致发光光谱分析发现，薄膜的近紫外光谱特征与薄膜的晶粒尺度和缺陷状态之间存在着明显的对应关系；而近紫外光谱随退火温度升高所呈现的整体峰位红移是各激子峰相对比例变 关键词： ZnO薄膜 退火 光致发光 射频反应磁控溅射 可见光发射     

Correlated photons from multi-carrier complexes in GaAs quantum dots

We have studied micro-photoluminescence spectra of a self-assembled single GaAs quantum dot under 8 K. With strong pulsed excitation, the micro-photoluminescence spectrum shows bright emission lines originated from an exciton, a positively charged exciton, and a biexciton, together with weak lower energy emissions reflecting multi-excitonic structures with more carriers. We have identified the origins of these weak emission lines, and showed the existence of charged biexciton states, through single photon correlation measurements and excitation power dependence of the photoluminescence intensity. In addition, investigating the radiative recombination process of the charged biexciton, we have determined the electron–hole exchange energy in the GaAs quantum dot.     

无序GaInP光致发光谱的温度依赖关系

研究了无序ＧａＩｎＰ样品的温度依赖关系，大低温ＰＬ谱中，谱线呈单峰结构。随着温度从１５Ｋ升高到２５０Ｋ，说地宽从１６ｍｅＶ增大到３１ｍｅＶ，并且发生红移，同时强度减小两个数数量级。     

Phase transition in a two-dimensional dipole-oriented exciton system

A dipole-oriented two-dimensional exciton system in electrically biased GaAs/AlGaAs coupled quantum wells has been studied through photoluminescence. The system has a sample-dependent built-in random potential which traps excitons at low temperature. The average photoluminescence photon energy shows a sudden reduction when the excitation intensity exceeds a critical value at low temperatures. This suggests a phase transition from a Bose glass to superfluid phase.     

Temperature-Dependent Defect-Induced New Emission in ZnSe Crystal

The temperature-dependent photoluminescence behaviour of chemical vapour transport （CVT）-grown ZnSe crystal is investigated. A new emission band appears when temperature is reduced to 155K. It is shown that the new emission band is strongly related to defect emission peaked at around 2.1 eV. The emergence of the new emission band is accompanied by decreasing emission intensity of free exciton, as well as redshiR of defect emission with temperature decreases. The activated energy of the defect state is estimated to be 60.6 meV, which is approximately equal to the energy difference between the new emission and the free exciton emission at 155K.     

CdSe/ZnSe自组装量子点中非线性系数随着温度的规律性变化(英文)

研究了在CdSe/ZnSe自组装量子点中CdSe量子点的发光随着激发光强度变化的特性。发现当激发强度(I)变化3个数量级的时候,量子点发光的峰位、峰形都没有发生明显的变化。通过公式L∝Ik(其中I是激发光强度,L是量子点发光强度,k是非线性系数)得到非线性系数k值。实验结果表明:在温度由21 K升高到300 K的过程中,k值随温度变化可以分为3个区域:当温度低于120 K时,k值接近于1;然后,随着温度升高,k值慢慢变小;最后,随温度进一步升高,k值由200 K时的0.946迅速减少到0.870。结合发光随温度变化的实验结果,确认在120 K以下发光主要来源于束缚激子复合。在温度由200 K升高到300 K的过程中,非线性系数的单调减小主要归因于随着温度的升高,发光部分来自于由自由电子或空穴到束缚态能级(FB)的复合。进一步通过分析量子点发光的积分强度随着温度的变化的实验结果,发现发光强度随温度升高而减弱的主要原因是材料中的缺陷或者位错等提供非辐射渠道。     

Thermal activation and thermal transfer of localized excitons in InAs self-organized quantum dots

We have investigated the temperature dependence of photoluminescence (PL) properties of a number of InAs/GaAs heterostructures with InAs layer thickness ranging from 0.5 monolayer (ML) to 3 ML. The temperature dependence of the InAs exciton energy and linewidth was found to display a significant difference when the InAs layer thickness is smaller or larger than the critical thickness around 1.7 ML, indicating spontaneous formation of quantum dots (QDs). A model, involving exciton recombination and thermal activation and transfer, is proposed to explain the experimental data. In the PL thermal quenching study, the measured thermal activation energies of different samples demonstrate that the InAs wetting layer may act as a barrier for thermionic emission of carriers in high quality InAs multilayers, while in InAs monolayers and submonolayers the carriers are required to overcome the GaAs barrier to thermally escape from the localized states.     

Optical properties of Zn0.5Cd0.5Se thin films grown on InP by molecular beam epitaxy

We report photoluminescence (PL) and reflectivity measurements of Zn_0.5Cd_0.5Se epilayers grown by molecular beam epitaxy on InP substrates. The low-temperature PL spectra are dominated by asymmetric lines, which can be deconvoluted into two Gaussian peaks with a separation of ∼8 meV. The behavior of these peaks is studied as a function of excitation intensity and temperature, revealing that these are free exciton (FE) and bound exciton emission lines. Two lower energy emission lines are also observed and assigned to the first and second longitudinal optical phonon replicas of the FE emission. The temperature dependence of the intensity, line width, and energy of the dominant emission lines are described by an Arrhenius plot, a Bose-Einstein type relationship, Varshni's and Bose-Einstein equations, respectively.     

Localized exciton dynamics in AlInGaN alloy

Carrier recombination dynamics in AlInGaN alloy has been studied by photoluminescence (PL) and time-resolved PL (TRPL) at various temperatures. The fast red-shift of PL peak energy is observed and well fitted by a physical model considering the thermal activation and transfer processes. This result provides evidence for the exciton localization in the quantum dot (QD)-like potentials in our AlInGaN alloy. The TRPL signals are found to be described by a stretched exponential function of exp[(−t/τ)^β], indicating the presence of a significant disorder in the material. The disorder is attributed to a randomly distributed QDs or clusters caused by indium fluctuations. By studying the dependence of the dispersive exponent β on temperature and emission energy, we suggest that the exciton hopping dominate the diffusion of carriers localized in the disordered QDs. Furthermore, the localized states are found to have 0D density of states up to 250 K, since the radiative lifetime remains almost unchanged with increasing temperature.