Spin-asymmetry in elastic scattering of low-energy electrons from ultrathin Au films on W(110)

We present joint experimental and theoretical results on the elastic scattering of spin-polarized electrons from an epitaxial Au film on a W(110) substrate in the energy range from 8 eV to 27 eV. A time-of-flight technique with a position-sensitive detector is applied to measure secondary emission spectra for spin-up and spin-down primary electrons in a specular geometry. The spin-asymmetry of coherently scattered electrons is obtained by selecting the diffraction spot on the detector. Regions of large asymmetries – with a maximum of about ?60 % – are identified for electron energies of about 14 eV. Relativistic multiple-scattering calculations produce spin-orbit-induced asymmetries which are in agreement with their experimental counterparts. They further reveal that large asymmetries are associated with high intensities. This offers the possibility of an efficient new spin polarimeter with a figure of merit of about 1.5 · 10^?2.     

Fast atom diffraction at metal surface

Fast atoms with energies from 300 eV up to 1.7 keV are scattered under a grazing angle of incidence from a clean and flat Ni(1 1 0) surface. For scattering under ”axial surface channeling” conditions, we observe – as reported recently for insulator and semiconductor surfaces – defined diffraction patterns in the angular intensity distributions for scattered fast ³He and ⁴He atoms. We have investigated the domain of scattering conditions where decoherence phenomena are sufficiently small in order to observe for metal targets quantum scattering of fast atomic projectiles. As a consequence, fast atom diffraction appears to be a general technique with a wide range of applicability in surface science.     

Reflection electron energy loss spectroscopy of aluminum

Reflection electron energy loss spectra (REELS) of Al(111) single crystal and of the aluminum polycrystalline (poly Al) film were measured at 200 eV and 1000 eV electron energies for a variety of experimental geometries and were mutually compared. No anisotropy was found for the poly Al, as expected. Polar intensity plots evaluated from the elastic (no loss) and inelastic first surface plasmon- and first bulk plasmon-loss intensities of the Al(111) surface show clearly discernable peaks for both considered electron energies. Their positions on the angular axis are the same for the elastic as well as for the inelastic, surface and bulk plasmon-loss peaks. The polar plots of intensities of the elastically and inelastically reflected electrons were compared to calculated intensities of photoelectrons emitted from the Al 2s core level to the same kinetic energy. Peak positions in the theoretically determined polar plots of electron intensities agree with those obtained experimentally in REELS.     

A wide-range Parallel Radial Mirror Analyzer for scanning electron/ion microscopes

This paper presents the design of a wide-range Parallel Radial Mirror Analyzer (RMA) for use as an attachment inside the specimen chambers of scanning electron/ion microscopes. The range of energies for the PRMA typically varies by a factor of 50, and it is predicted to have second-order focusing properties for all electrons/ions that are detected. For a polar angular spread of ±3°, the simulated energy resolution at an energy of 100 eV is around 0.65%, and it drops to less than 0.2% for energies between 300 eV and 5000 eV. The PRMA is predicted to have a transmittance of over an order magnitude better than previous wide-range parallel energy analyzer designs.     

Segments of a commercial Ge-doped optical fiber as a thermoluminescent dosimeter in radiotherapy

Optical fibers have been proposed as dosimeters in both diagnostic and radiotherapy applications. A commercial germanium (Ge)-doped silica fiber with a 50 μm core diameter which showed good thermoluminescence (TL) properties was selected for this study. The radiation sources used were a high dose rate brachytherapy iridium-192, MV photon and MeV electron beams from a linear accelerator. The coating of the fiber was chemically removed and then annealed at 400 °C for 1 h prior to irradiation. After irradiation, the fiber was read on a Harshaw Model 3500 TLD reader. The optical fiber had one well-defined glow peak at 327 ± 2 °C at all the radiotherapy energies. The dose response was linear within the clinical relevant dose for all these energies. Reproducibility was mainly within 4–6% (one standard deviation) for high energy photons and electrons. The fiber was found to be energy independent within the MV photon energy range. At room temperature the fading up until 1 month was around 6% which was within the 6% uncertainty of the sensitivity calibration of the fiber. Re-using the fiber four times did not significantly alter the sensitivity factor. The optical fiber was found to be dose rate as well as angular independent. Central axis depth dose curves of both 10 MV photons and 12 MeV electrons using the fiber showed relatively good agreement to standard depth dose curves in water within 4%. The Ge-doped fiber is a promising TL dosimeter but improvements have to be made to reduce the reproducibility within 3% for high energy photons and electrons.     

Discrete dipole approximation for low-energy photoelectron emission from NaCl nanoparticles

This work presents a model for the photoemission of electrons from sodium chloride nanoparticles 50–500 nm in size, illuminated by vacuum ultraviolet light with energy ranging from 9.4 to 10.9 eV. The discrete dipole approximation is used to calculate the electromagnetic field inside the particles, from which the two-dimensional angular distribution of emitted electrons is simulated. The emission is found to favor the particle's geometrically illuminated side, and this asymmetry is compared to previous measurements performed at the Lawrence Berkeley National Laboratory. By modeling the nanoparticles as spheres, the Berkeley group is able to semi-quantitatively account for the observed asymmetry. Here however, the particles are modeled as cubes, which are closer to their actual shape, and the interaction of an emitted electron with the particle surface is also considered. The end result shows that the modeled emission asymmetry for these low-energy electrons is more sensitive to the interaction with the particle-surface than to the specific particle shape, i.e., a sphere or cube.     

Fast atom diffraction during grazing scattering from a MgO(001) surface

Fast neutral atoms and molecules with energies from 0.4 up to 3 keV are scattered under a grazing angle of incidence from a clean and flat MgO(001) surface. For “axial surface channeling” conditions, we observe defined diffraction patterns in the angular intensity distributions for scattered ³He and ⁴He atoms as well as H₂ molecules. The diffraction patterns are analyzed in terms of semiclassical trajectory calculations making use of projectile surface interaction potentials derived from density functional theory and from pair potentials calculated from Hartree–Fock wave functions. From comparison of measured and calculated diffraction patterns we deduced the rumpling of the topmost surface layer of MgO(001), i.e. an inward shift of Mg²⁺ ions with respect to O^2? ions, of (0.03±0.03) Å.     

Origin of threshold electrons produced in decay of the Xe 4d−1 np resonance

Coincidence spectra of energetic electrons with threshold electrons were measured following photo-excitation of the Xe 4d_3/2, 5/2 → np resonances, in order to investigate the origin of threshold electrons, and the mechanism leading to formation of the Xe²⁺ 5p⁻² and 5s⁻¹5p⁻¹ final states. A two-step decay process was observed in the production of Xe²⁺ 5p⁻²(¹D) following decay of the 7p resonance, where the intermediate state is Xe^+* 5p⁻²(¹S)8p that autoionizes emitting a pseudo-threshold electron. This process was confirmed in a time-of-flight analysis of the coincidence spectra of the energetic electrons with the threshold photoelectrons. It is suggested that a similar two-step process also contributes to the population of excited Xe²⁺ states and is the main origin for the production of threshold electrons in decay of the 4d⁻¹ np resonances.     

Ultrasound assisted dispersal of a copper nanopowder for electroless copper activation

This paper describes the ultrasound assisted dispersal of a low wt./vol.% copper nanopowder mixture and determines the optimum conditions for de-agglomeration. A commercially available powder was added to propan-2-ol and dispersed using a magnetic stirrer, a high frequency 850 kHz ultrasonic cell, a standard 40 kHz bath and a 20 kHz ultrasonic probe. The particle size of the powder was characterized using dynamic light scattering (DLS). Z-Average diameters (mean cluster size based on the intensity of scattered light) and intensity, volume and number size distributions were monitored as a function of time and energy input. Low frequency ultrasound was found to be more effective than high frequency ultrasound at de-agglomerating the powder and dispersion with a 20 kHz ultrasonic probe was found to be very effective at breaking apart large agglomerates containing weakly bound clusters of nanoparticles. In general, the breakage of nanoclusters was found to be a factor of ultrasonic intensity, the higher the intensity the greater the de-agglomeration and typically micron sized clusters were reduced to sub 100 nm particles in less than 30 min using optimum conditions. However, there came a point at which the forces generated by ultrasonic cavitation were either insufficient to overcome the cohesive bonds between smaller aggregates or at very high intensities decoupling between the tip and solution occurred. Absorption spectroscopy indicated a copper core structure with a thin oxide shell and the catalytic performance of this dispersion was demonstrated by drop coating onto substrates and subsequent electroless copper metallization. This relatively inexpensive catalytic suspension has the potential to replace precious metal based colloids used in electronics manufacturing.     

Surface and core hole effects in X-ray photoelectron spectroscopy

In XPS analysis, two effects, which significantly reduce the measured peak intensity, are usually neglected: the core hole left behind in an XPS process which causes “intrinsic” excitations and excitations as the photoelectron pass through the surface region. We have calculated these effects quantitatively for various energies, geometries, and materials. Instead of considering the two effects separately, we introduce a new parameter, namely the correction parameter for XPS or CP_XPS, which takes into account both effects. We define this CP_XPS as the change in probability for emission of a photoelectron caused by the presence of the surface and the core hole in comparison with the situation where the core hole is neglected and the electron travels the same distance in an infinite medium. The calculations are performed within the dielectric response theory by means of the QUEELS–XPS software determining the energy-differential inelastic electron scattering cross-sections for X-ray photoelectron spectroscopy (XPS) including surface and core hole effects. This study has been carried out for electron energies between 300 eV and 3400 eV, for angles to the surface normal between 0° and 60° and for various materials. We find that the absolute effect is a reduction by 35–45% in peak intensities but that the variation in CP_XPS with material, angle and energy are < ± 10% for emission angle ≤ 60° and photoelectron energy ≤ 1500 eV. This implies that when XPS analysis is done using relative intensities, the combined effect of the surface and of the core hole is typically less than ≈ ± 10% for geometries and energies normally used in XPS. In practice, it is however difficult to determine the bare peak intensity without the intrinsic electrons because the two overlap in energy.     

Attenuation lengths of high energy photoelectrons in compact and mesoporous SiO2 films

We have experimentally evaluated attenuation lengths (AL) of photoelectrons traveling in compact and micro and mesoporous (~ 45% voids) SiO₂ thin films with high (8.2–13.2 keV) kinetic energies. The films were grown on polished Si(100) wafers. ALs were deduced from the intensity ratio of the Si 1s signal from the SiO₂ film and Si substrate using the two-peaks overlayer method. We obtain ALs of 15–22 nm and 23–32 nm for the compact and porous SiO₂ films for the range of kinetic energies considered. The observed AL values follow a power law dependence on the kinetic energy of the electrons where the exponent takes the values 0.81 ± 0.13 and 0.72 ± 0.12 for compact and porous materials, respectively.     

Influence of intensity and frequency of ultrasonic waves on capillary interaction and oil recovery from different rock types

Oil saturated cylindrical sandstone cores were placed into imbibition cells where they contacted with an aqueous phase and oil recovery performances were tested with and without ultrasonic radiation keeping all other conditions and parameters constant. Experiments were conducted for different initial water saturation, oil viscosity and wettability. The specifications of acoustic sources such as ultrasonic intensity (45–84 W/sq cm) and frequency (22 and 40 kHz) were also changed. An increase in recovery was observed with ultrasonic energy in all cases. This change was more remarkable for the oil-wet medium. The additional recovery with ultrasonic energy became lower as the oil viscosity increased. We also designed a setup to measure the ultrasonic energy penetration capacity in different media, namely air, water, and slurry (sand + water mixture). A one-meter long water or slurry filled medium was prepared and the ultrasonic intensity and frequency were monitored as a function of distance from the source. The imbibition cells were placed at certain distances from the sources and the oil recovery was recorded. Then, the imbibition recovery was related to the ultrasonic intensity, frequency, and distance from the ultrasonic source.     

Nitrogen-rich GaN5 and GaN6 as high energy density materials with modest synthesis condition

Here, the energetic gallium nitrides with the network and zigzag poly-nitrogen configurations at modest pressures have been predicted. The nitrogen-rich Cmc2₁-GaN₅, high-pressure P2₁/m-GaN₅ and C2/c-GaN₆ phases can release higher energy of ∼3.27 kJ g⁻¹, 4.12 kJ g⁻¹, 5.71 kJ g⁻¹, respectively, which are close to or even higher than that of the traditional high energy density materials TNT and possess distinguished detonation performance simulated. The predicted synthesis pressures of GaN₅ and GaN₆ (25 and 50 GPa) are much lower than that of the famous atomic cg-N. The VSEPR theory and Zintl-Klemm concept are employed to reasonably explain the bonding properties of N-N bonds in locally environments. High pressures modulate the electron transfer between the different orbits and further induce higher energy density. The conjugation effect of π electrons in planar polymeric nitrogen chains is the main reason for the metallization of gallium nitrides.     

Molecular beam studies on inelastic collision processes of methane molecules at a Pt(1 1 1) surface

Inelastic collision processes of CH₄ at a Pt(1 1 1) surface have been analyzed by means of super-sonic molecular beam technique. Obtained results of the angular intensity distribution of the reflected CH₄ with the incident kinetic energy ranging from 190 to 350 meV are found to qualitatively agree with the prediction from the classical collision model. Surface temperature dependence of the speed distributions of the reflected CH₄ qualitatively follows the prediction at the surface temperature below 500 K, but deviates from the prediction as the surface temperature increases under the irradiation of CH₄ with higher kinetic energies, where decomposition of CH₄ takes place. The discrepancy of data from the model can be understood by introducing into the model decreased effective surface mass and increased surface “roughness”.     

Electronic energy alignment at the PbSe quantum dots/ZnO(101̅0) interface

A number of solar energy conversion strategies depend on exciton dissociation across interfaces between semiconductor quantum dots (QDs) and other electron or hole conducting materials. A critical factor governing exciton dissociation and charge transfer in these systems is the alignment of electronic energy levels across the interface. We probe interfacial electronic energy alignment in a model system, sub-monolayer films of PbSe QDs adsorbed on single crystal ZnO(101?0) surfaces using ultraviolet photoemission spectroscopy. We establish electronic energy alignment as a function of quantum dot size and surface chemistry. We find that replacing insulating oleic-acid capping molecules on the QDs by the short hydrazine or ethanedithiol molecules results in pinning of the valence band maximum (VBM) of QDs to ZnO substrate states, independent of QD size. This is in contrast to similar measurements on TiO₂(110) where the alignment of the PbSe QD VBM to that of the TiO₂ substrate depends on QD size. We interpret these findings as indicative of strong electronic coupling of QDs with the ZnO surface but less with the TiO₂ surface. Based on the measured energy alignment, we predict that electron injection from the 1s_e level in photo-excited PbSe QDs to ZnO can occur with small QDs (diameter ? = 3.4 nm), but energetically unfavorably for larger dots (? = 6.7 nm). In the latter, hot electrons above the 1s_e level are necessary for interfacial electron injection.     

Fragmentation of elongated-shaped ZnO nanostructures into spherical particles by swift ion impact

This work reports on the fragmentation of rod-shaped ZnO nanostructures into spherical nanoparticles under 120 MeV Ag⁹⁺ swift ion irradiation. The visual evidence of the irradiation induced morphological change has been witnessed through electron microscopic studies. Typically, rods of 50 nm length and 21 nm diameter have transformed into particles of smaller dimension. Conversely, X-ray diffraction studies have revealed the lowering of crystallite size from 21.5 nm to 9 nm and an increase in microstrain by 11 times. Further, spectroscopic results, such as, significant blue shift (∼24 cm⁻¹) in vibrational features of Zn–O bonding, increase in native defect concentration in the nanostructures etc. also favor the irradiation led modification of nanostructures. It was anticipated that, dislodging and recrystallization of the constituent atoms of the elongated systems, as a consequence of suppression of the cohesive energy (owing to enormous energy deposition) caused by energetic ion irradiation, is chiefly responsible for the evolution of spherical nanoparticles.     

Core hole and surface excitation correction parameter for XPS peak intensities

In XPS analysis, surface excitations and excitations originating from the static core hole created during the photoexcitation process are usually neglected. However, both effects significantly reduce the measured peak intensity. In this paper we have calculated these effects. Instead of considering the two effects separately, we introduce a new parameter, namely the Correction Parameter for XPS (or CP_XPS) defined as the change in probability for emission of a photoelectron caused by the presence of the surface and the core hole in comparison with the situation where the core hole is neglected and the electron travels the same distance in an infinite medium. The CP_XPS calculations are performed within the dielectric response theory by means of the QUEELS-XPS software determining the energy-differential inelastic electron scattering cross-sections for X-ray photoelectron spectroscopy (XPS) including surface and core hole effects. This study has been carried out for electron energies between 300 eV and 3400 eV, for angles to the surface normal between 0° and 60° and for various materials, especially metals, semiconductors and oxides. For geometries and energies normally used in XPS, i.e. for emission angle ≤ 60° and photoelectron energy ≤ 1500 eV, we find that CP_XPS values are significantly larger for oxides, (0.55 ? CP_XPS ? 0.75) than for metals and semiconductors (0.45 ? CP_XPS ? 0.6). We show that this behavior is due to the difference in the wave vector dispersion of the energy loss function. This dispersion has been determined from analysis of REELS and is found to be free electron like (α ? 1) for metals but is substantially smaller (α ≈ 0.02–0.05) for materials with a wide band gap. As a result, the group velocity of the valence electrons is very small for oxides with a large band gap. This leads to a reduction in the screening of the core-hole potential before the photoelectron has left the region of interaction and thereby to an increase in the intrinsic excitations caused by the core hole.     

Dependence of the AES backscattering correction factor on the experimental configuration

We present an analysis of the dependence of the backscattering correction factor (BCF) in Auger-electron spectroscopy (AES) on the analyzer acceptance angle. Illustrative BCF calculations are presented for Pd M₅N₄₅N₄₅ Auger electrons as a function of primary-electron energy for primary-electron angles of incidence, θ₀, of 0° and 80° and for various values of the analyzer acceptance angle. It was necessary to generalize the BCF definition for the case of an analyzer with an arbitrarily large acceptance angle; this was done with a new function, the integral emission depth distribution function. BCFs calculated from an advanced model of electron transport in the surface region of the Pd sample varied weakly with analyzer half-cone angle for θ₀ = 0° but more strongly for θ₀ = 80° where there were BCF differences varying between 19% at a primary energy of 1 keV and 6% at a primary energy of 5 keV. These BCF differences are due in part to variations of the BCF with emission angle and in part to variations of the density of inner-shell ionizations within the information depth for the detected Auger electrons. The latter variations are responsible for differences larger than 10% between BCFs from the widely used simplified BCF model and those from the more accurate advanced model for primary energies less than about 5 keV for θ₀ = 80°. For normal incidence of the primary beam, differences greater than 10% between BCFs from the simplified and advanced models were found for primary energies between 1 keV and 4 keV. These BCF differences indicate that the simplified model can provide only approximate BCF values. In addition, the simplified model does not provide any BCF dependence on Auger-electron emission angle or analyzer acceptance angle.