Excitons in Si nanocrystals

The states of electron-hole pairs in spherical silicon nanocrystals are theoretically studied using the “multiband” effective-mass approximation in the limit of an infinitely high potential barrier at the boundary. The degeneracy of the states at the top of the valence band is taken into account in the spherical approximation, and the ellipsoidal character of the electronic spectrum in the conduction band is allowed for. Coulomb interaction-induced corrections to the energy of an electron-hole pair are found.     

Excitonic and quasiparticle gaps in Si nanocrystals

We present calculations of the one- and two-particle excitations in silicon nanocrystals. The one-particle properties are handled in the GW approximation, and the excitonic gap is obtained from the Bethe-Salpeter equation. We develop a tight binding version of these methods to treat clusters up to 275 atoms. The self-energy and Coulomb corrections almost exactly cancel each other for crystallites with radius larger than 0.6 nm. The result of this cancellation is that one-particle calculations give quite accurate values for the excitonic gap of crystallites in the most studied range of sizes.     

Vacancies in a Si(111) thin film

We investigated the electronic structure of an ideal vacancy in the Si(111) thin film by using empirical tight binding method. The supercell model used in our calculations predicted vacancy related states in general agreement with previous works. For the vacancy near the surface, it is found that the bound state energies shift to higher energies as the vacancy moves toward the surface. At the surface, however, it was seen that the vacancy bound state mix with the dangling bond surface states. Considering energy locations in the bond gap, we propose that vacancies created in the surfaceregion may account for the peak (at about ～0.5 eV above the valence band edge) in the density of interface states observed at the interface of the Si-SiO₂ junction.     

Photoluminescence studies of Si nanocrystals

Summary We report room temperature time-resolved photoluminescence (PL) and temperature dependence of continuous wave (cw) PL studies of high fluence (from 3·10¹⁶ to 3·10¹⁷ cm⁻²) Si⁺-implanted thermal SiO₂ layers after annealing at high temperature (T=1000°C). Such measurements were related to TEM analysis of samples. Nancocrystals were observed at TEM only a samples implanted at higher fluence. In these samples a near infrared PL signal peaked at approximately 1.5 eV with decay time of about 100 μs is present. Besides, in all samples a light emission is present in the green region of the spectrum. The intensity of the emission shows large variations with ion fluence, and is characterized by 0.4, 2 and 7 ns decay times. Paper presented at the III INSEL (Incontro Nazionale sul Silicio Emettitore di Luce) Torino, 12–13 October 1995.     

Direct bandgap optical transitions in Si nanocrystals

The effect of quantum confinement on the direct bandgap of spherical Si nanocrystals has been modelled theoretically. We conclude that the energy of the direct bandgap at the Γ-point decreases with size reduction: quantum confinement enhances radiative recombination across the direct bandgap and introduces its “red“ shift for smaller grains. We postulate to identify the frequently reported efficient blue emission (F-band) from Si nanocrystals with this zero-phonon recombination. In a dedicated experiment, we confirm the “red“ shift of the F-band, supporting the proposed identification.     

Direct bandgap optical transitions in Si nanocrystals

JETP Letters - The effect of quantum confinement on the direct bandgap of spherical Si nanocrystals has been modelled theoretically. We conclude that the energy of the direct bandgap at the...     

Temperature-dependent photoluminescence of arsenic-doped Si nanocrystals

The characteristics of temperature-dependent photoluminescence (PL) from Si nanocrystals and effects of arsenic-doping (As-doping) were investigated. The Si nanocrystals on a p-type Si substrate were prepared by low pressure chemical vapor deposition and post-deposition thermal oxidation. The As-doping process was carried out using the gas-phase-doping technique. Temperature-dependent PL from Si nanocrystals exhibited considerable differences between samples with/without As-doping. Phase transition between electron-hole liquid and free exciton was observed in the undoped Si nanocrystals, leading to the increase in PL intensity with temperature less than 50 K. Electron emission from As-doped Si nanocrystals to the p-Si substrate was responsible for the significant increase in PL intensity with temperature greater than 50 K. Characteristics of light emission from Si nanocrystals will facilitate the development of silicon-based nanoscaled light-emitting devices.     

Optical gap of P-doped Si nanocrystals

The optical gap of Si nanocrystals strongly doped with phosphorus has been calculated. The energy levels of the electron and hole ground states in the Si nanocrystal were found as functions of the nanocrystal size and the P concentration in the framework of the envelope function approximation and under the assumption of uniform impurity distribution over the nanocrystal volume. It is shown that introducing phosphorus into the nanocrystal leads to a decrease in its optical gap. This decrease is related to a strong shift of the ground electron level produced by the short-range part of the Coulomb electron-P-ion interaction.     

Anomalous mobility enhancement in Si doping superlattices

Enhanced Hall mobility has been measured in Si doping superlattices with pipi or nini doping profiles grown by molecular beam epitaxy. Although the carrier concentration is large, in the range of 10¹⁸cm⁻³, the mobility of holes in the pipi doping superlattice has the temperature dependence such as that expressed in the T^−2.2 law which is characteristic of high purity bulk crystals. The hole mobility is about twice that of high purity crystals, rising up to 40,000 cm²/V.s at about 30 K. In the case that p-type impurity concentration is comparable to n-type impurity concentration, no mobility enhancement is observed and the mobility is anomalously depressed. The mechanisms for drastical change in the mobility of doping superlattices have not yet been clarified.     

Thermodynamic analysis of Si doping in GaN

Equilibrium calculations of Si-doping in GaN are investigated using the Gemini code. The method of the calculation is based on the minimisation of the Gibbs free energy. Experimental growth conditions are used for the calculation. The variables are the amount of the dopant and the temperature. The results show the formation of a solid Si₃N₄ compound with a certain quantity of the input SiH₄, that is the silicon precursor in our MOVPE system. Si₃N₄ formation can explain the limitation of Si incorporation and the surface roughening as revealed by MOVPE Si doped layers.     

Structure and energetics of Si nanocrystals embedded in a-SiO2

We develop realistic models of Si nanocrystals embedded in a-SiO2 using a Monte Carlo approach. The interface structure and its energetics are studied as a function of the nanocrystal size. We find that the low-energy geometries at the interface are Si-O-Si bridge bonds. Remarkably, their fraction strongly declines as the size becomes smaller. Concurrently, the embedding causes substantial deformation in such small nanocrystals. Based on these findings, an alternative explanation is given for the reduced optical gaps in this size regime.     

Photoluminescence of Si nanocrystals under selective excitation

Photoluminescence of Si nanocrystals passivated by different alkanes (hexane, octane, and tridecane) was studied at room temperature. It is shown that the emission band shape is not affected by the length of the carbon chain in the alkanes used for passivation. A pronounced fine structure of the photoluminescence band consisting of peaks separated by 150-160 meV was observed under resonant excitation. The structure is interpreted by predominant contribution from Si nanocrystal groups with particular stable size/shape existing in addition to the previously reported nanocrystals with “magic” numbers of Si atoms. The contribution of these stable nanocrystals is revealed using selective resonant photoexcitation to the higher energy states in the discrete energy spectrum of such nanocrystals.     

Erbium-doped Si nanocrystals: optical properties and electroluminescent devices

In the last decade, a strong effort has been devoted towards the achievement of efficient light emission from silicon. Among the different approaches, rare-earth doping and quantum confinement in Si nanostructures have shown great potentialities. In the present work, the synthesis and properties of low-dimensional silicon structures in SiO₂ will be analyzed. All of these structures present a strong room temperature optical emission, tunable in the visible by changing the crystal size. Moreover, Si nanocrystals (nc) embedded in SiO₂ together with Er ions show a strong coupling with the rare earth. Indeed each Si nc absorbs energy which is then preferentially transferred to the nearby Er ions. The signature of this interaction is the strong increase of the excitation cross section for an Er ion in the presence of Si nc with respect to a pure oxide host. We will show the properties of Er-doped Si nc embedded within Si/SiO₂ Fabry–Pérot microcavities. Very narrow, intense and highly directional luminescence peaks can be obtained. Moreover, the electroluminescence (EL) properties of Si nc and Er-doped Si nc in MOS devices are investigated. It is shown that an efficient carrier injection at low voltages and quite intense room temperature EL signals can be achieved, due to the sensitizing action of Si nc for the rare earth. These data will be presented and the impact on future applications discussed.     

Fine structure effects and phase transition of Xe nanocrystals in Si

We report on an X-ray diffraction study performed on Xe agglomerates obtained by ion implantation in a Si matrix. At low temperature, Xe nano-crystals were formed in Si with different average sizes according to the preparation procedure. High resolution diffraction spectra were detected as a function of the temperature, in the range 15–300 K, showing evidence of fine structure effects in the growth mode of the Xe nanocrystals. We report the first experimental observation of fcc crystalline agglomerates with a lattice parameter expanded by the epitaxial condensation on the Si cavities, whereas for small agglomerates randomly oriented evidence of a contracted lattice was found. For these nanocrystals, a solid-to-liquid transition temperature, size dependent, was detected; above the transition temperature, a fluid phase was observed. Neither overpressurized clusters were detected at any temperature, nor preferential binary size distribution as reported for a metal matrix.     

Microscopic phonon theory of Si/Ge nanocrystals

Microscopic phonon theory of semiconductor nanocrystals (NCs) is reviewed in this paper. Phonon modes of Si and Ge NCs with various sizes of up to 7 nm are investigated by valence force field theory. Phonon modes in spherical SiGe alloy NCs approximately 3.6 nm (containing 1147 atoms) in size have been investigated as a function of the Si concentration. Phonon density-of-states, quantum confinement effects, as well as Raman intensities are discussed.      

Ag纳米颗粒对富Ag二氧化硅薄膜电致发光谱的影响

利用磁控溅射和热退火在硅衬底上制备了Ag纳米颗粒镶嵌的氧化硅薄膜(SiO2∶ Ag),制作了电致发光结构ITO/SiO2∶Ag/p-Si,观测到了可见区的电致发光.发现薄膜中的Ag纳米颗粒不仅成倍地提高器件的发光强度,还明显地移动电致发光的峰位.Ag含量越高,颗粒越大,发光峰位越红移.氧化硅中的发光中心与纳米Ag间的电...     

Photo-induced charge transport in SiO2films containing Si nanocrystals

Photo-induced charge transport is reported in metal–insulator–semiconductor structures containing Si nanocrystals produced by ion implantion and annealing. Successive shifts in current–voltage (I–V) and capacitance–voltage (C–V) curves are shown to be induced by ultra-violet (UV) light exposure under no bias. These shifts are shown to be enhanced by the application of a negative bias voltage during illumination. The application of a positive bias voltage during illumination is shown to reverse the direction of the shifts in both the I–V and C–V curves. This behaviour can be explained by charging of the nanocrystals induced by photoionization of electrons and charge movements in the insulator layer.     

中子嬗变掺杂前后Ge纳米晶的结构和性质

采用第一性原理计算模拟Ge纳米晶在中子嬗变掺杂(NTD)后受空位、O和As杂质的影响.结果表明,退火方法引入的O并不能消除纳米晶中的辐照致空位缺陷的影响,而NTD 产生的As掺杂能补偿这些空位缺陷并消除禁带中产生的杂质能级,从而改善半导体掺杂性能.计算还发现,由于较高的电负性,纳米晶中O对Ge原子较强的吸附作用阻止了空位的形成,导致与缺陷相关的非辐射发光中心的浓度减小,发光效率提高,因此中子辐照掺杂前的高温退火处理是非常有必要的.计算较好地解释了已报道的实验结果. 关键词： Ge纳米晶 中子嬗变掺杂 第一性原理 空位缺陷