X射线荧光光谱分析

本文评述了我国在2005年至2006年X射线荧光光谱,包括粒子激发的X射线光谱的发展和应用,内容包括仪器研制、激发源、探测器、软件、仪器改造、仪器维护和维修、样品制备技术、分析方法研究和应用.     

X射线荧光光光谱分析

评述了我国在2007～2008年X射线荧光光谱,包括质子激发的X射线光谱的发展和应用,内容包括仪器、软件、仪器改造、仪器维护和维修、基础研究和分析方法研究及其应用.     

X射线荧光光谱分析

本文评述了我国在2002年7月～2004年6月间X射线荧光光谱, 包括粒子激发的X射线光谱的发展和应用, 内容包括仪器的研制、维护和维修、样品制备技术、 X射线荧光光谱基础研究、谱处理、分析方法研究和应用.     

Total reflection X-ray fluorescence and grazing incidence X-ray spectrometry — Tools for micro- and surface analysis. A review

A review of Total Reflection X-ray Spectrometry and related methods covering literature of four decades is presented. History, theory, instrumentation, sample preparation, and applications are summarized and some examples are given. New developments and trends are discussed with respect to emerging nano-technologies in all fields of sciences.     

X射线荧光光谱法快速测定费托蜡中铁

通过对费托蜡(合成蜡、渣蜡)创新制样与装样、测试条件优化,利用仪器自带的基本参数法无标样半定量分析软件,建立了X射线荧光光谱(XRF)测定费托蜡中Fe的方法。测定的相对标准偏差<1%、典型分析时间10 min/样,无需标样。与ICP-AES测定结果相比较,相对误差低于10%,同时降低了蜡样测试对仪器真空度或分光晶体产生的不良影响。     

Study of biofilm formation by total-reflection X-ray fluorescence spectrometry

A total reflection X-ray fluorescence spectrometric method was developed for elemental analysis of natural biofilms grown on polycarbonate substrates in the Lake Velence. For the duration of 9 weeks long growing period, two substrates were removed weekly from the lake and investigated by analytical and algological methods. The total biomass production achieved its highest value after 7 weeks. Ca, Sr and Ti, as well as Fe, Mn, K and Zn showed their maximum concentrations in the biofilms after 5 and 6-7 weeks, respectively. The enrichment factors of the 6 weeks old biofilm for the detected seven elements amounted to 10³-10⁴. The recommended colonization time for biomonitoring of the Lake Velence is 6 weeks applying polycarbonate substrates.     

X-ray ionization and fragmentation for use with time-of-flight mass spectrometry

In this paper, we introduce laser desorption X-ray ionization for producing ions from the previously undetected neutral species present during laser desorption mass spectrometry. Studies involving the laser desorption of simple sugars were conducted to illustrate the differences between spectra with and without the X-ray source. Ionization was made possible by placing a 200 mCi Am X-ray source directly into the ionization chamber of a time-of-flight mass spectrometer.     

Application of total-reflection X-ray fluorescence spectrometry in material analysis

X-ray fluorescence spectrometry with total reflection conditions is applied in the qualitative and quantitative determination of impurities in thin layers of Ti, TiO₂, and HfO₂ prepared by evaporation and of SiO₂, TiO₂, and Ta₂O₅ prepared by ion beam sputtering. The same method is used to examine stainless steel discs, which have to be used as reference materials,Dedicated to Professor Günther Tölg on the occasion of his 60th birthday     

钕-铁系稀土永磁合金的X射线荧光光谱分析

采用X射线荧光光谱测定Nd—Fe系稀土永磁合金中La,Ce,Pr,Nd,Fe,Co成份。该方法既能克服基体效应又能解决标准样品的制备问题,分析方法简便、快速、准确。对于体系较复杂的Nd—Fe系稀土永磁合金,采用本方法RSD小于2％,方法的加标回收率97％-105．8％之间。     

Evaluation of analytical instrumentation. Part XXIII. Instrumentation for portable X-ray fluorescence spectrometry

The reports of this series tabulate a number of features of analytical instruments that should be considered when making comparison between various systems. Scoring these features in a rational manner allows a scientific comparison to be made between instruments as an aid to selection. This is the XXIII report of the series and deals with instrumentation for portable X-ray fluorescence spectrometry. The Analytical Methods Committee has received and approved the following report from the Instrumental Criteria Sub-Committee.     

X射线荧光光谱法结合多元统计学对热敏纸的检验研究

为建立一种快速且无损检验热敏纸的科学有效的方法,利用能量色散型X射线荧光光谱(XRF)对38个不同商家,不同规格的热敏纸样品进行检验,首先根据每个样品所测量得到的元素的不同,将38个样品分成四大类,同时采用SPSS25.0软件中的系统聚类法对38个样品的元素数据进行聚类分析处理,结果分成了12小组,再结合SPSS25....     

Evaluation of analytical instrumentation. Part XX Instrumentation for energy dispersive X-ray fluorescence spectrometry

The reports of this series tabulate a number of features of analytical instruments that should be considered when making comparison between various systems. Scoring these features in a rational manner allows a scientific comparison to be made between instruments as an aid to selection. This is the XXth report of the series and deals with instrumentation for energy dispersive X-ray fluorescence spectrometry.     

Determination of sulphur in uranium matrix by total reflection X-ray fluorescence spectrometry

The possibility of sulphur determination in uranium matrix by total reflection x-ray fluorescence spectrometry (TXRF) has been studied. Calibration solutions and samples of sulphur in uranium matrix were prepared by mixing uranium in form of a standard uranyl nitrate solution and sulphur in the form of Na₂SO₄ standard solution, prepared by dissolving Na₂SO₄ in Milli-Q water. For major element analysis of sulphur, it was determined without separation of uranium whereas for the trace level determinations, uranium was first separated by solvent extraction using 30% tri-n-butyl phosphate (TBP) in dodecane as an extractant. In order to countercheck the TXRF results, a few samples of Rb₂U(SO₄)₃, a chemical assay standard for uranium, were diluted to different dilutions and sulphur content in these solutions were determined. The TXRF determined results for trace determinations of sulphur in these diluted solutions were counterchecked after addition of another uranium solution, so that sulphur is at trace level compared to uranium, separating uranium from these solution mixtures using TBP extraction and determining sulphur in aqueous phase by TXRF. For such TXRF determinations, Co was used as internal standard and W Lα was used as excitation source. The precision and accuracy of the method was assessed for trace and major element determinations and was found to be better than 8% (1σ RSD) and 15% at a concentration level of 1 μg/mL of sulphur measured in solutions whereas for Rb₂U(SO₄)₃, these values were found to be better than 4 and 13%, respectively.     

X射线荧光光谱法测定Zn镀层质量厚度及计算谱线选择问题研究

用X射线荧光光谱法测定了Fe基上Zn镀层的质量厚度；研究了厚度不同时选用不同谱线计算对测定结果的影响，发现在镀层质量厚度较小时（约〈14mg／cm^2）测量Zn元素的Kα线，质量厚度较大时选择Zn的Kα和Fe的Kα线共同计算，用纯元素和相似标样校正测定结果之间的偏差最小；用纯元素作校正标样测定了3个标准样品的Zn镀层质量厚度，计算结果与标准值符舍得较好。     

钽内标X射线荧光光谱法测定钨精矿中WO_3

提出了以钽为内标波长色散X射线荧光光谱法测定钨精矿中WO3的新方法。以Na2B4O7和Li2B4O7(质量比65:35)的混合物作为熔剂,Ta2O5为内标,同时加入LiNO3为氧化剂,在1200℃下进行熔融制样,最后将本方法应用于实际样品的分析,结果表明,以钽作为内标测定WO3,不仅可以在很大程度上降低实验操作和仪器测量带来的偏差,也可以消除基体效应的影响。方法用于测定白钨精矿和黑钨精矿中WO3,其准确度和精密度优于重量分析法。     

X-ray fluorescence spectrometry on paper characterization: A case study on XVIII and XIX century documents

Paper documents from XVIII and XIX centuries were analyzed by energy dispersive X-ray fluorescence. The presence of Co (400 µg g^− 1), Ni (300 µg g^− 1), As (2000 µg g^− 1) and Bi (200 µg g^− 1) in Dutch papers and a Hespe watermarked paper allowed distinguishing them from the rest of the papers. The elemental composition of the ink present in these documents was also studied with the same technique and it was concluded that these elements could not be originated from ink dissemination. Strong positive Spearman correlations between Co, Ni, As and Bi were found in all Dutch and Hespe watermarked papers. Potassium and Ca are the predominant elements in all analyzed papers. Their concentration levels also allowed differentiating between Dutch and Hespe papers and the rest of the papers. Other elements such as Ti, Fe, Cu, Zn, Ba and Pb were also found. In this work a bibliographic research about the possible origin of each one of the mentioned elements present in the papers is also reported.     

Direct determination of trace elements in boron nitride powders by slurry sampling total reflection X-ray fluorescence spectrometry

The use of slurry sampling total reflection X-ray fluorescence spectrometry (SlS-TXRF) for the direct determination of Ca, Cr, Cu, Fe, Mn and Ti in four boron nitride powders has been described. Measurements of the zeta potential showed that slurries with good stabilities can be obtained by the addition of polyethylenimine (PEI) at a concentration of 0.1 wt.% and by adjusting the pH at 4. For the optimization of the concentration of boron nitride in the slurries the net line intensities and the signal to background ratios were determined for the trace elements Ca and Ti as well as for the internal standard element Ga in the case of concentrations of boron nitride ranging from 1 to 30 mg mL⁻¹. As a compromise with respect to high net line intensities and high signal to background ratios, concentrations of 5 mg mL⁻¹ of boron nitride were found suitable and were used for all further measurements. The limits of detection of SlS-TXRF for the boron nitride powders were found to range from 0.062 to 1.6 μg g^– 1 for Cu and Ca, respectively. Herewith, they are higher than those obtained in solid sampling and slurry sampling graphite furnace atomic absorption spectrometry (SoS-GFAAS, SlS-GFAAS) as well as those of solid sampling electrothermal evaporation inductively coupled plasma optical emission spectrometry (SoS-ETV-ICP-OES). For Ca and Fe as well as for Cu and Fe, however, they were found to be lower than for GFAAS and for ICP-OES subsequent to wet chemical digestion, respectively. The universal applicability of SlS-TXRF to the analysis of samples with a wide variety of matrices could be demonstrated by the analysis of certified reference materials such as SiC, Al₂O₃, powdered bovine liver and borate ore with a single calibration. The correlation coefficients of the plots for the values found for Ca, Fe and Ti by SlS-TXRF in the boron nitride powders as well as in the before mentioned samples versus the reference values for the respective samples over a concentration range from 2.5 to 1470 μg g^– 1 were found to be 0.995, 0.991 and 0.997, respectively.     

A comparison of different analytical techniques (energy dispersive X-ray fluorescent spectrometry, bomb calorimetry combined with ion chromatography and inductively coupled plasma-optical emission spectrometry) for the determination of the bromine and antimony content of samples

In recent years, there has been intensive research into the use of pyrolysis to process toxic plastics from waste electrical and electronic equipment (WEEE). During pyrolysis, the fate of the bromine and antimony content of the plastics is critical therefore, new and improved analytical techniques for analysing these elements in the pyrolysis products are being sought. In this work, the effectiveness of energy dispersive x-ray fluorescent spectrometry (EDXRFS) for the determination of bromine and antimony content of pyrolysis oils from waste electrical and electronic equipment have been tested. Samples were obtained by the pyrolysis of brominated high-impact polystyrene (Br-HIPS) and brominated acrylonitrile-butadiene-styrene (Br-ABS) at temperatures from 360 to 440 °C. The concentration range of both the bromine and antimony in the samples was very broad (0.05-17.94 wt% and 0.03-8.54 wt% respectively). The results from EDXRFS to those of more traditional and time consuming methods; bomb calorimetry combined with ion chromatography (EPA method 5050) for bromine and acid digestion combined with inductively coupled plasma-optical absorption spectrometry for antimony were compared.Based on our measurements, different statistical parameters were calculated for each analytical technique, which demonstrated that EDXRFS had been successfully applied to the determination of bromine and antimony concentration in the pyrolysis oils of Br-HIPS and Br-ABS. Errors resulting from matrix effects did occur, in particular correlations were found between the nitrogen content of the samples and the difference in bromine and antimony measured by EDXRFS and other methods (ion-chromatography and ICP-OES). However, these differences were found to be statistically insignificant, so we could conclude that EDXRFS is a suitable technique for analysing the bromine and antimony content of pyrolysis oils.     

Determination of Te,Bi, Ni,Sb and Au by X-ray fluorescence spectrometry following electroenrichment on a copper cathode

The electrodepositons of Te, Bi, Ni, Sb and Au from aqueous solution of pH = 1 on the cathode surface have been studied for X-ray fluorescence analysis (XRF). A special holder for a copper electrode has been constructed to perform the electrodeposition process on only one side of the electrode. After electrolysis, the copper electrode can be easily removed from the holder; after rinsing it with water and drying it can be analyzed by XRF. The proposed method of sample preparation and preconcentration of Te, Bi, Ni, Sb, Au provides suitable samples which are devoid of the negative and undesirable effects of XRF analysis, such as particle size and matrix effects. The influence of time on the deposition yield has been examined. The method of preconcentration is efficient. The inhomogeneity of the prepared specimens has been studied using internal standard method. The calibration is based on using synthetic standards, certified reference materials and standard addition method. The best results are achieved by the standard addition method. The agreement between results obtained with XRF analysis and certified values is satisfactory and indicates the usefulness of the proposed method for determination of Te, Bi, Ni, Sb and Au in anode slime.