共查询到20条相似文献,搜索用时 15 毫秒
1.
2.
3.
4.
5.
6.
Zeitschrift für Physik A Hadrons and nuclei - Aus Sondenmessungen an synthetischen Einkristallen im Temperaturbereich von ?183 bis + 300° C folgt eine Herabsetzung der beobachteten... 相似文献
7.
8.
9.
10.
A. v. v. Bassewitz G. v. v. Minnigerode 《Zeitschrift für Physik A Hadrons and Nuclei》1964,181(4):368-390
An apparatus is described, which enables us to measure the thicknesses of films immediately after condensation at low temperatures and in different stages of annealing by means of a multiple beam interferometry technique (Tolansky). The film thicknesses are also measured by the temperature dependence of the electrical resistance. Measurements of Pb- and Cu-films are given as an example, and the sources of errors are discussed. In the case of Pb-films both the methods give the same thicknesses at any condensation temperature. This leads to the conclusion that Pb-films have a density of the compact material. At low condensation temperatures the disorder in the films turns out to be thickness dependent, and the distribution of defects seems to be inhomogeneous. Cu-films condense at low temperatures with high porosity. This may be the cause of the often observed getter effect of freshly condensed Cu-films. The filling factor of Cu-films is studied at different condensation temperatures. The temperature dependence of the resistivity of thin metallic films is discussed in the appendix of this paper. 相似文献
11.
12.
13.
14.
15.
16.
17.
18.
19.