共查询到18条相似文献,搜索用时 78 毫秒
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扫描隧道显微镜和原子力显微镜 总被引:2,自引:0,他引:2
在微观领域对物质进行观察和研究中,人们发明了各种显微镜。但是光学显微镜由于受到光的波长的限制而无法达到很高的分辨率,X射线衍射技术则要求观察样品必须是晶体,透射电镜则需要对观察样品进行超薄切片。所有这些要求使人们的观察受到了限制,因此人们开始研制更加先进的显微镜。1982年宾尼格、罗雷尔及其同事们成功地研制出世界上第一台扫描隧道显微镜(STM),导致了显微领域中的一场革命,并在它的基础上研制出一系列的扫描探针显微镜,如原子力显微镜、磁力显微镜和激光力显微镜等。STM的出现使人类第一次可以实时地观测单个原子在物质表面的排列状态和与表面电子行为有关的物理性质和化学性质。 相似文献
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扫描探针显微镜主要包括扫描隧道显微镜和原子力显微镜,其利用尖锐的针尖逐点扫描样品,可在原子和分子尺度上获取表面的形貌和丰富的物性,改变了人们对物质的研究范式和基础认知。近年来,qPlus型高品质因子力传感器的出现将扫描探针显微镜的分辨率和灵敏度推向了一个新的水平,为化学结构、电荷态、电子态、自旋态等多自由度的精密探测和操控提供了前所未有的机会。文章首先简要介绍原子力显微镜的发展历史和基本工作原理,然后重点描述qPlus型原子力显微镜技术的优势及其在单原子、单分子和低维材料体系中的应用,最后展望该技术的未来发展趋势和潜在应用。 相似文献
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原子力与光子扫描隧道组合显微镜 总被引:3,自引:0,他引:3
介绍了超高分辨光于扫描隧遭显微镜(PSTM)的计冗历程,为解决第一代(单光束照明)光千扫捕隧逼显傲镜中存在人为假象和样品光学图像与形貌图像难于分离两个难题,用“对称双光束照明方法消假象,用原子力与光子扫描隧道组合显微镜(AF/PSTM)图像分解方法分离样品光学透过率、折射率与形貌图像。研制成功新一代原子力与光子扫描隧道组合显微镜(AF/PSTM)样机。该样机在一次扫描中已获得两幅原子力显微镜图像(形貌与相位)和两幅光学图像(透过率和折射率),有效地减少了假象,分解了样品光学折射率、透过率与形貌图像。 相似文献
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扫描探针显微镜在工业产品检测中的应用前景 总被引:3,自引:0,他引:3
讨论了扫描探针显微镜(SPM)的应用领域和SPM的发展现状,重点探讨了国产SPM应用于信息产业、能源产业以及航空航天等工业领域中高新技术产品质量检测的存在、的问题、以及应用的前景。 相似文献
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红外光探针是扫描近场红外显微镜(SNIM)中的关键部件,由于探针的种类和材料不同,制作的方法也不同.一般制作光纤探针有两种方法,即热拉伸法和化学腐蚀法.这里叙述了一种化学腐蚀方法,介绍了怎么去除砷硒碲中红外光纤的聚酰胺表层和硫化硒夹层,以及芯层腐蚀成针尖状的具体方法和过程,并对短锥针探针制法进行了探索.最后用此探针在近场范围内探测了氮化镓样品的自由电子激光(FEL)反射谱.
关键词:
扫描探针显微镜(SPM)
近场红外扫描显微镜(SNIM)
光纤探针 相似文献
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点衍射干涉术在扫描力显微镜中的应用 总被引:1,自引:0,他引:1
目前在扫描力显微镜中经常用到的氮化硅三角形探针本身可以作为一个基于点微射干涉的微干涉元件。本文讨论了一种根据这一原理设计的用于扫描力显微镜的干涉光探针,它利用微探针表面几何反身波与后向点衍射波之间的干涉来检测微探针的形变,其纵向分辨率达到0.01nm。 相似文献
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轻敲模式原子力显微镜高次谐波信号包含待测样品表面纳米力学特性等方面的信息, 但是传统原子力显微镜的高次谐波信号非常微弱. 里兹法证明在探针悬臂的特定位置打孔可以实现探针的内共振从而增强高次谐波信号强度. 本文通过有限元仿真计算获得探针第一共振频、第二共振频及其比值随着孔的尺寸和位置变化的规律. 在实验上通过聚焦离子束在探针悬臂上打孔使其第二共振频约为第一共振频的6倍, 提高了第6次谐波信号的信噪比, 并在实验室研制的高次谐波成像实验装置上获得了6次谐波图像.
关键词:
轻敲模式原子力显微镜
探针悬臂几何结构
高次谐波
聚焦离子束加工 相似文献
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Lipid membrane: inelastic deformation of surface structure by an atomic force microscope 总被引:2,自引:0,他引:2 下载免费PDF全文
The stability of the 1,2-Dioleoyl-sn-Glycero-3-[phospho-rac-1-Glycerol-Na] liposome in the liquid crystalline state have been investigated using an atomic force microscope (AFM). We have observed the inelastic deformation of the sample surface. The AFM tip causes persistent deformation of the surface of the lipid membrane, in which some of the lipid molecules are eventually pushed or dragged by the AFM tip. The experiment shows how the surface structure of the lipid membrane can be created by the interaction between the AFM tip and lipid membrane. When the operating force exceeds 10-8 N, it leads to large deformations of the surface. A square region of about 1×1μm2 is created by the scanning probe on the surface. When the operating force is between 10-11N and 10-8N, it can image the topography of the surface of the lipid membrane. The stability of the sample is related to the concentration of the medium in which the sample is prepared. 相似文献
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用原子力显微镜(AFM)研究了1,2二油酸甘油3磷酸1甘油(DOPG)脂质体胞囊的形态和脂双层膜结构.报道了AFM探针与吸附在氧化硅膜上脂质体的相互作用结果.实验结果表明,在液晶态的DOPG中,AFM图像是一些球形或椭球形颗粒.这些球形或椭球形颗粒与液晶态的DOPG脂质体的结构特性有关.当AFM的探针与脂质体表面相互作用力超过某临界值时,脂质体胞囊破裂,变成脂双层结构.从图上可以看到,第二层的DOPG膜吸附在第一层上,膜的厚度约为5nm.
关键词:
原子力显微镜
脂质体
纳米结构 相似文献
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Masayuki Abe Takayuki Uchihashi Masahiro Ohta Hitoshi Ueyama Yasuhiro Sugawara Seizo Morita 《Optical Review》1997,4(1):A232-A235
Using the noncontact mode atomic force microscope (AFM) with frequency modulation detection method, force gradient acting
on the AFM tip induced by the evanescent field was measured in a high vacuum. Exponential distance dependence of the force
gradient by the evanescent field was successfully measured for the first time. Decay lengths of the force gradient were estimated
to be 40±3 nm and 43±3 nm for Ar and He-Ne lasers, respectively, and independent of wavelength within the experimental error.
The minimum detectable force was estimated to be about 0.1 pN. There was a tendency for the measured decay length to become
shorter at a distance less than z=10 nm in many cases. The force gradient induced by the evanescent field inp-polarization was larger than that ins-polarization.
This paper was originally presented at the first Asia-Pacific Workshop on Near Field Optics, which was held on August 17 and
18, 1996 at Seoul Education and Culture Center, Seoul, Korea, organized by the Condensed Matter Research Institute, Seoul
National University. 相似文献
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We have observed three-dimensional sponge-like structures as well as strips of connecting pits on the surface of the LR 115 detector after etching, which can be confused with the small tracks formed after short etching time. We have employed an atomic force microscope (AFM) to study these “damages” as well as genuine alpha tracks for short etching time. It was found that while the track and damage openings could be similar in size and shape, the depths for the damages were consistently smaller. Therefore, the depth of the pits will serve as a clear criterion to differentiate between tracks and other damages. The ability to discriminate between genuine tracks from other damages is most important for etching for short time intervals. 相似文献