Cluster ions in the secondary ion mass spectrometry of choline and acetylcholine halides

Liquid secondary ion mass spectra of choline and acetylcholine halides exhibit several series of cluster ions whose origins were investigated using B/E and B²/E linked-scan techniques. In the case of choline halides three series of cluster ions were identified as (Me₃$ \mathop {\rm N}\limits^ + $CH₂CH₂OH + nM), (Me₃$ \mathop {\rm N}\limits^ + $CH₂CH₂OMe + nM) and (Me₃N$ \mathop {\rm N}\limits^ + $CH₂CH₂OH · Me₃$ \mathop {\rm N}\limits^ + $CH₂CH₂O^? + nM), while (CH₃COOCH₂CH₂$ \mathop {\rm N}\limits^ + $Me₃ + nM), (Me₃$ \mathop {\rm N}\limits^ + $CH₂CH₂OH + nM) and (CH₂ = CH$ \mathop {\rm N}\limits^ + $Me₃ + nM) were observed in the spectra of acetylcholine halides. For these cluster ions, bimolecular reactions induced on ion bombardment under secondary ion mass spectrometric conditions are discussed.     

Characterization of beam-induced reactions occurring in liquid secondary ion mass spectrometry/fast-atom bombardment by tandem mass spectrometry

Department of General and Physical Chemistry, University of Liege, Liege, Belgium A specific beam-induced secondary reaction involving the condensation of hydroxylic matrices with some organic groups (aldehydes, ketones, etc.) accompanied by the loss of a water molecule was investigated by liquid secondary ion mass spectrometry/fast-atom bombardment (LSIMS/FAB). A mechanistic scheme and a structure of the induced product are proposed. The features of this secondary reaction were studied and the influence of the types of solutes, acidic additives, and matrices analyzed. Rather than a drawback, LSIMS/FAB mass spectrometry can take advantage of this matrix effect to infer analytical information through tandem mass spectrometry experiments. Specific neutral loss scans can be conducted to highlight beam-induced reactive molecules, even when the detection of these species is prevented in normal scan spectra by other surface-active components.     

Image processing in secondary ion mass spectrometry

The application of image processing in secondary ion mass spectrometry is discussed. The Cameca 4f SIMS uses a single microchannel plate and a highly sensitive camera in combination with an image processor with real time capabilities (Kontron IBAS). An automation procedure with image integration, extended dynamic range image acquisition and retro depth profiling is presented and illustrated with practical applications.     

Method for improved secondary ion yields in cluster secondary ion mass spectrometry

A method to increase useful yields of organic molecules is investigated by cluster secondary ion mass spectrometry (SIMS). Glycerol drops were deposited onto various inkjet‐printed arrays and the organic molecules in the film were rapidly incorporated into the drop. The resulting glycerol/analyte drops were then probed with fullerene primary ions under dynamic SIMS conditions. High primary ion beam currents were shown to aid in the mixing of the glycerol drop, thus replenishing the probed area and sustaining high secondary ion yields. Integrated secondary ion signals for tetrabutylammonium iodide and cocaine in the glycerol drops were enhanced by more than a factor of 100 compared with an analogous area on the surface, and a factor of 1000 over the lifetime of the glycerol drop. Once the analyte of interest is incorporated into the glycerol microdrop, the solution chemistry can be tailored for enhanced secondary ion yields, with examples shown for cyclotrimethylenetrinitramine (RDX) chloride adduct formation. In addition, depositing localized glycerol drops may enhance analyte secondary ion count rates to high enough levels to allow for site‐specific chemical maps of molecules in complex matrices such as biological tissues. Published in 2010 by John Wiley & Sons, Ltd.     

Electrospray droplet impact/secondary ion mass spectrometry (EDI/SIMS) for silver halides

Electrospray droplet imact/secondary ion mass spectrometry (EDI/SIMS) was applied to many materials such as synthetic polymers, metals, semiconductors, and biological tissues. Little surface modification was observed for these samples by in situ XPS analysis. In this work, silver halides AgX (X = F, Cl, Br, and I) were examined by EDI/SIMS. The preferential etching of F for AgF was observed for the first time. This is due to the highly reactive F atoms generated at the colliding interface that are quickly annihilated by the reaction with water molecules. The selective etching of fluorine results in the enrichment of silver on the sample surface leading to the abundant Ag⁺ ion formation. It was suggested that metal fluorides may be useful as the cationization matrices in EDI/SIMS. Copyright © 2014 John Wiley & Sons, Ltd.     

A discussion on mass resolution in secondary ion mass spectrometry

Mass resolution is a very important parameter for mass spectrometry. It is necessary to compare the mass resolution between the newly developed TOF-SIMS and the conventionally high-performance magnetic SIMS. However, the definitions of mass resolution for these two types of instruments are quite different. Whether it is possible to compare mass resolution and how to do such comparison is a challenge. This problem was raised officially during the 2012 ISO/TC 201 meeting at Tampa, Florida, the United States and the long-term cooperation with ISO started afterwards. The definition of mass resolution is one of the most important and fundamental problems for mass spectrometry and should attract significant attention. Here, some detail discussions on mass resolution as well as the related experimental studies in the past few years, including the collaborations with ISO/TC 201/SC6 and SC1 are summarized. This summary covers the common problem for almost all the current existing and still used definitions of mass resolution. A reasonable new definition for mass resolution considering the peak shape or resolution function has been proposed, which has also been confirmed by using experimental studies of the mass resolution comparison between TOF and magnetic SIMS. This study lays a foundation for the future mass resolution comparisons between different mass spectrometry.     

Liquid secondary ion mass spectrometry of porphyrin dimers: reduction reactions and structural characterisation

New synthesised porphyrin dimers, with an amide or ester linkage between the two porphyrin units, were studied using liquid secondary ion mass spectrometry (LSIMS). The formation of reduced species was observed for all the compounds and it was found that the extent of reduction is dependent on the matrix used and on the structure of the porphyrin dimer. The main fragmentation pathways lead to monomer fragments resulting from cleavage of the amide or ester linkage between the two porphyrin units. The consistency of the fragmentations for all the dimers studied leads to the proposal of a common designation for the fragment ions. LSIMS, in addition to molecular weight determination, can provide important structural information for this type of compound.     

Organic reactions at surfaces: A study of carnitine by secondary ion mass spectrometry

Carnitine inner salt, (CH₃)₃N⁺ CH₂CH(OH)CH₂COO^?, and carnitine hydrochloride, (CH₃)₃N⁺CH₂CH (OH)CH₂COOH Cl^?, in the solid state undergo ion-beam-induced intermolecular methyl transfer reactions as shown by (CH₃)₃N⁺ CH₂CH(OH)CH₂COOCH₃ ions at m/z 176 in their positive ion spectra. In the case of carnitine HCl, the product ion is three times as abundant as the intact cation. For the inner salt however, the product is less than one-tenth as abundant as [M + H] ⁺. In both cases, the reaction can be precluded by dissolution of the sample, supporting an intermolecular mechanism. The negative ion spectra for these compounds contain no [M ? CH₃]^? ions, suggesting that simple transmethylation does not occur. Rather it is proposed that the inner salt abstracts a methyl group from the intact carnitine cation to yield [M + CH₃]⁺ and a neutral species, the driving force being a minimization of the total number of charges desorbed into the gas phase. Thermodynamic data favor this mechanism as do data for other carnitine salts. The reaction appears to be inhibited when one reactant is present in excess. This is the case for carnitine HNO₃ and CH₃SO₃H, which tend to liberate the intact cation since the anions are large and polarizable. It is also the case for small, hard anions like fluoride, which appear to favor release of the inner salt, hence the cation at m/z 162 is of low abundance and the transmethylation product (m/z 176) is absent. The extent of the reaction is also dependent on the methods of preparation of the sample, and deposition of the salts from solution greatly reduces the extent of methyl transfer. [M ? CH₃]^? is observed when glycerol is used as a matrix, possibly due to a matrix-analyte methyl transfer reaction.     

Organic ion imaging beyond the limit of static secondary ion mass spectrometry

Secondary ion mass spectra and images were obtained from spikes of choline chloride, acetylcholine chloride, and methylphenylpyridinium iodide deposited onto specimens of porcine brain tissue. Samples were subsequently subjected to a dose of 10-keV Cs⁺ sufficient to suppress secondary ion emission characteristic of the targeted analytes. Following ablation of the samples by massive glycerol clusters generated by electrohydrodynamic emission, secondary ion mass spectra and images could be obtained that reflected the identity and location of the spiked analytes. The absolute intensity of secondary ion emission that followed ablation was found to be between 30 and 100% of the intensity obtained prior to exposure to the high dose of Cs’. Not all chemical noise is removed by ablation, however, so that the signal-to-noise ratios after ablation correspond to between 10 and 85% of their values observed under conditions of low primary ion dose.     

Depth profile measurement by secondary ion mass spectrometry

The possibilities of measuring depth profiles by secondary ion mass spectrometry are evaluated. The influence of different instrumental and experimental parameters on depth resolution in the profiles are studied: the effects of primary ion beam characteristics, reactive gas adsorption and mechanical aperturing in secondary ion extraction are discussed. Beam effects are studied from the point of view of surface damage. The effects of secondary processes, such as crater edge effects, element mixing, preferential sputtering, background signals, (residual) gas contamination and ion-induced topographical and compositional changes are studied for thin metal and binary materials.     

Alpha spectrometry and secondary ion mass spectrometry of electrodeposited uranium films

Electrodeposited natural uranium films prepared by electrodeposition from solution of uranyl nitrate UO₂(NO₃)₂·6H₂O on stainless steel discs in electrodeposition cell. Solutions of NaHSO₄, and Na₂SO₄ and electric current from 0.50 up to 0.75 A were used in this study. Recalculated weights and surface’s weights of ²³⁸U from the alpha activities and secondary ion mass spectrometry (SIMS) intensities resulted in a linear regression. A dependency between of ²³⁸U surface’s weights recalculated from alpha activities and signal intensity of ²³⁸U in SIMS was investigated in order to determine a potential of SIMS in quantitative analysis of surface samples containing uranium. In the SIMS spectra of electrodeposited uranium films we found that upper layer consist not only from isotopes of uranium (ions ²³⁴U⁺, ²³⁵U⁺, and ²³⁸U⁺). In the positive polarity SIMS spectra, various molecules ions of uranium were suggested as UH⁺, UH₂ ⁺, UO⁺, UOH⁺, UO₂ ⁺, UO₂H⁺, UO₂H₂ ⁺, as well as possibly ions UNO⁺ and UNOH⁺.     

Prediction of secondary ion currents for trace elements in gallium arsenide in secondary ion mass spectrometry

A direct estimate of dopant concentrations in GaAs can be obtained from secondary ion mass spectrometry through the use of one fitting parameter. Knowledge of this parameter also permits a priori predictions of secondary ion currents.     

Study on ion formation in electrospray droplet impact secondary ion mass spectrometry

A new type of cluster secondary ion mass spectrometry (SIMS), named electrospray droplet impact (EDI), has been developed in our laboratory. In general, rather strong negative ions as well as positive ions can be generated by EDI compared with conventional SIMS. In this work, various aspects of ion formation in EDI are investigated. The Brønsted bases (proton acceptor) and acids (proton donor) mixed in the analyte samples enhanced the signal intensities of deprotonated molecules (negative ions) and protonated molecules (positive ions), respectively, for analytes. This suggests the occurrence of heterogeneous proton transfer reactions (i.e. M + M′ → [M+H]⁺ + [M′? H]^?) in the shockwave‐heated selvedge of the colliding interface between the water droplet and the solid sample deposited on the metal substrate. EDI‐SIMS shows a remarkable tolerance to the large excess of salts present in samples. The mechanism for desorption/ionization in EDI is much simpler than those for MALDI and SIMS because only very thin sample layers take part in the shockwave‐heated selvedge and complicated higher‐order reactions are largely suppressed. Copyright © 2007 John Wiley & Sons, Ltd.     

Application of pattern recognition methods in secondary ion mass spectrometry

Pattern recognition methods were applied to SIMS spectra of aluminum and manganese borides to test if proper feature selection and distinction between the various compounds on the basis of the evaluation of cluster ions is possible. It was found that the features selected on an empirical basis could be reduced for practical application from 13 and 11 to 2–3 and 5–8 for aluminum borides and manganese borides, respectively, and that identification of the different compounds is possible by evaluation of the fragmentation pattern. Furthermore, there is evidence that this approach does not only work for pure compounds but also for specimens, where the interesting species is only a minor fraction in the analysed volume.     

Soft-sputtering of insulin films in argon-cluster secondary ion mass spectrometry

In secondary ion mass spectrometry (SIMS) of organic substances, the dissociation of the sample molecules is crucial. We have developed SIMS equipment capable of bombardment, where the primary ions are argon cluster ions with kinetic energy per atom controllable down to 1 eV. We previously reported the detection of intact ions of insulin and cytochrome C using this equipment. In this paper, we present a detailed characterization of the emission of secondary ions from insulin, focusing on the difference in secondary ion yield between intact ions and fragment ions by varying the incident angle of the cluster ions. The emission intensity of the intact ions was changed drastically due to the exposed dosage and incident angle of the cluster ions in contrast to the fragment ions. We discuss these results based on the manner in which the argon-cluster ions collide with the organic solid.     

Microscopical speciation analysis with laser microprobe mass spectrometry and static secondary ion mass spectrometry

This paper presents a set of data which compares the potential and limitations of laser microprobe mass spectrometry (TOF-LMMS and FT-LMMS) and static secondary ion mass spectrometry (S-SIMS) for inorganic speciation at a microscopical level. In general LMMS yields prominent signals of adduct ions consisting of the intact molecule combined with a stable ion, which allows a direct identification of the analyte. S-SIMS also yields abundant diagnostic signals to specify the molecular composition. However, adduct ions are not always present, which means that the identification often relies on fingerprinting. Results further indicate that the potential and the application area of S-SIMS and FT-LMMS are complementary to one another.     

A pulsed time-of-flight mass spectrometer for liquid secondary ion mass spectrometry

The design and performance of a new time-of-flight mass spectrometer is reported. The instrument combines the advantages of a pulsed drawout TOF analyzer with a liquid secondary ion source. Differences from commercially available pulsed TOF analyzers (Wiley/McLaren type) are discussed with regard to operation with ion desorption from a liquid matrix.