Carrier Scattering Mechanisms in GaS0.5Se0.5 Layered Crystals

Systematic dark electrical resistivity and Hall mobility measurements have been carried out in the temperature range 150‐400 K on n‐type GaS_0.5Se_0.5 layered crystals. The analysis of temperature dependent electrical resistivity and carrier concentration reveals the extrinsic type of conduction with a donor impurity level located at 0.44 eV, donor and acceptor concentrations of 3.4 ×10¹⁷ and 4.1×10¹⁶ cm^‐3, respectively, and an electron effective mass of 0.41 m₀. The Hall mobility is limited by the electron‐phonon short‐range interactions scattering at high temperatures combined with the ionized impurity scattering at low temperatures. The electron‐phonon short‐range interactions scattering mobility analysis reveals an electron‐phonon coupling constant of 0.25 and conduction band deformation potential of 5.57 eV/Å.     

Semiconducting Properties of TI2Te3 Single Crystals

Electrical conductivity and Hall effect measurements were performed on single crystals of TI₂Te₃ to have the general semiconducting behaviour of this compound. The measurements were done at the temperature range 160–350 K. All crystals were found to be of p-type conductivity. The values of the Hall coefficient and the electrical conductivity at room temperature were 1.59 × 10³ cm³/coul and 3.2 × 10⁻² ω⁻¹ cm⁻¹, respectively. The hole concentration at the same temperature was driven as 39.31 × 10¹¹ cm⁻³. The energy gap was found to be 0.7 eV where the depth of impurity centers was 0.45 eV. The temperature dependence of the mobility is discussed.     

Crystal Data,Electrical Resisitivity and Mobility in Cu3In5Se9 and Cu3In5Te9 Single Crystals

X-ray powder diffraction data were obtained for Cu₃In₅Se₉ and Cu₃Te₉, which were found to crystallize in orthorhombic and tetragonal systems, respectively. The electrical resistivities and Hall mobilities of these compounds were investigated in the temperature range 35–475 K. Cu₃In₅Se₉, was identified to be n-type with a room temperature resistivity of 3 × 10³ Ω·cm which decreases with increasing temperature. For T < 65 K impurity activation energy of 0.03 eV and for T > 350 K onset of intrinsic conduction yielding a band gap energy of 0.99eV were detected. The neutral impurity scattering was found to dominate at low temperatures, while in the high temperature region thermally activated mobility was observed. Cu₃In₅Te₉ exhibits p-type conduction with a room temperature resistivity of 8.5 × 10⁻³ Ω·cm decreasing sharply above 400 K and yielding an impurity ionization energy of 0.13 eV. The temperature dependence of mobility indicates the presence of lattice and ionized impuritiy scattering mechanisms above and below 160 K, respectively.     

Electrical properties of p-Type GaAs

Relations for the effective drift mobility, the Hall coefficient, and the Hall mobility in p-type group IV and III–V compounds are derived accounting for the degenerate valence band structure and acting scattering mechanisms. Improved deformation potentials are determined for holes in p-type GaAs. Zn-doped and Ge-doped p-type GaAs samples with hole concentrations in the range from 4 · 10¹⁷ to about 10²⁰ cm⁻³ were analysed with regard to the temperature dependence of the Hall mobility, and it was found that the Brooks-Herring formula is inadequate to describe ionized impurity scattering in p-type GaAs.     

Electron‐phonon short‐range interactions mobility and p‐ to n‐type conversion in TlGaS2 crystals

The conductivity type conversion from p ‐ to n ‐type at a critical temperature of 315 K in TlGaS₂ crystals is observed through the Hall effect measurements in the temperature range of 200–350 K. The analysis of the temperature‐dependent electrical resistivity, Hall coefficient and carrier concentration data reveals the extrinsic type of conduction with donor impurity levels that behave as acceptor levels when are empty. The data analysis allowed the calculation of hole and electron effective masses of 0.36m ₀ and 0.23m ₀, respectively. In addition, the temperature‐dependent Hall mobility is found to decrease with temperature following a logarithmic slope of ∼1.6. The Hall mobility in the n ‐region is limited by the electron‐phonon short‐range interactions scattering with an electron‐phonon coupling constant of 0.21. (© 2006 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Empirical relationship between hall mobility and hole concentration in heavily doped p-type GaAs

Using Matthiessens' rule and assuming a constant mobility contribution due to lattice scattering an empirical relation is derived for the Hall mobility at room temperature in p-type GaAs as a function of the hole concentration in the range from 10¹⁸ to 10²⁰ cm⁻³. The resulting empirical concentration dependence of the mobility due to ionized impurity scattering is compared with the Brooks-Herring formula. The degree of compensation of p-type GaAs liquid phase epitaxial layers doped with germanium is estimated from the measured Hall mobility and compared with corresponding data obtained from an analysis of the temperature dependence of the hole concentration.     

Anisotropy of Electrical Resistivity and Hole Mobility in InTe Single Crystals

The temperature dependences of the electrical resistivity and Hall mobility of p-type InTe chain single crystals in parallel and perpendicular directions to c-axis have been investigated in the temperature range of 28–260 K. The high anisotropy between ∂‖ and ∂⟂ which depends on temperature is attributed to high concentration of stacking faults due to weak interchain bonding. The mobility parallel to c-axis was found to vary with temperature asμ α Tⁿ where n = -0.6 due to hole scattering on polar optical phonons. The mobility perpendicular to c-axis above 140 K increases with temperature exponentially with an activation energy of 0.03 eV which is attributed to the hopping mechanism due to the barriers between the chains.     

Electrical properties of nitrogen implanted GaSe single crystal

N‐implantation to GaSe single crystals was carried out perpendicular to c‐axis with ion beam of 6 × 10¹⁵ ions/cm² dose having energy values 30 keV and 60 keV. Temperature dependent electrical conductivities and Hall mobilities of implanted samples were measured along the layer in the temperature range of 100‐320 K. It was observed that N‐implantation decreases the resistivity values down to 10³ Ω‐cm depending on the annealing temperature, from the room temperature resistivity values of as‐grown samples lying in the range 10⁶‐10⁷ Ω‐cm. The temperature dependent conductivities exhibits two regions (100‐190 and 200‐320 K) with the activation energies of 234‐267 meV and 26‐74 meV, for the annealing temperatures of 500 and 700 °C, respectively. The temperature dependence of Hall mobility for the sample annealed at 500 °C shows abrupt increase and decrease as the ambient temperature increases. The analysis of the mobility‐temperature dependence in the studied temperature range showed that impurity scattering and lattice scattering mechanisms are effective at different temperature regions with high temperature exponent. Annealing of the samples at 700 °C shifted impurity scattering mechanism toward higher temperature regions. In order to obtain the information about the defect produced by N‐implantation, the carrier density was analyzed by using single donor‐single acceptor model. We found acceptor ionization energy as E_a = 450 meV, and acceptor and donor concentration as 1.3 × 10¹³ and N_d = 3.5 × 10¹⁰ cm⁻³, respectively. (© 2003 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Electric Characterization of Indium Sesquiselenide Single Crystals

Conductivity, Hall-effect measurements were performed on δ-phase In₂Se₃ single crystals, grown by the Bridgman method over the temperature range 150–428 K, in the directions perpendicular and parallel to the c-axis. The anisotropy of the electrical conductivity and of the Hall coefficient of n-type In₂Se₃ had been investigated. The values of the Hall coefficient and electrical conductivity at room temperature spreads from an order of R_H11 = 1.36 × 10⁴ cm³/coul, σ₁₁ = 4.138 × 10⁻³ Ω⁻¹ cm⁻¹ and R_H = 66.55 × 10⁴ cm³/coul, σ = 0.799 × 10⁻³ Ω⁻¹ cm⁻¹ for parallel and perpendicular to c-axis, respectively. The temperature dependence of Hall mobility and carrier concentration are also studied.     

Electrical and optical properties of CuGaTe2

The electrical and optical properties of CuGaTe₂ single crystals were investigated by resistivity and Hall effect measurements in the temperatur range T = 77… 300 K and optical transmission measurements in the temperature range T = 20… 300 K at photon energies hν = 1.15…1.50 eV. All samples were p-type conducting due to shallow acceptors with ionization energies E_A1 ≈︁ 10⁻³ eV and concentrations N_A1 ≈︁ p = (2…4). 10¹⁸ cm⁻³. The absorption spectra could be described by simultaneous consideration of acceptor - to - conduction band transitions with E_A2 = 360 meV and N_A2 ≈︁ 10²² cm⁻³ and valence band - to - conduction band transitions with E_G = 1.24 eV at room temperaure. The temperature coefficient of the fundamental edge is dE_G/dT = −4.0. 10⁻⁴ eV/K. The results are discussed with regard to some general trends found in the Cu-III–VI₂ compounds.     

Electrical and photoconductive properties of GaS0.75Se0.25 mixed crystals

The conductivity, mobility, photoconductivity and photo response measurements in GaS_0.75Se_0.25 mixed crystals were carried out in the temperature range of 150‐450 K. The room temperature conductivity, mobility and electron concentration values were 10^‐9 (Ω‐cm)^‐1, 48 cm²V^‐1s^‐1 and ∼10⁹ cm^‐3, respectively. Two donor levels were obtained from temperature‐dependent conductivity and carrier concentration, located at energies of about 755 and 465 meV below the conduction band. Single donor‐single acceptor analysis yields the same donor level at 465 meV with donor and acceptor concentrations of 8.7 × 10¹⁴ and 5.3 × 10¹³ cm^‐3, respectively. The mobility‐temperature dependence shows that ionized impurity scattering dominates the conduction up to the temperature 310 K with different temperature exponent, while above this critical temperature; the phonon scattering is dominant conduction mechanism. From the photo‐response spectra, the maximum photocurrent was observed for all the samples at 2.42 eV, and varied slightly with temperature. Moreover, the photocurrent‐light intensity dependence in these crystals obeys the power law, I_ph ∝ ϕ^γ with γ between 1.7 and 2.0 for various applied fields and temperatures. (© 2005 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Carrier Transport Properties of InS Single Crystals

The electrical resistivity and Hall effect of indium sulfide single crystals are measured in the temperature range from 25 to 350 K. The donor energy levels located at 500, 40 and 10 meV below the conduction band are identified from both measurements. The data analysis of the temperature‐dependent Hall effect measurements revealed a carrier effective mass of 0.95 m₀, a carrier compensation ratio of 0.9 and an acoustic deformation potential of 6 eV. The Hall mobility data are analyzed assuming the carrier scattering by acoustic and polar optical phonons, and ionized impurities.     

Liquid phase epitaxial growth of undoped gallium arsenide from bismuth and gallium melts

Electrical properties of undoped GaAs layers grown from Ga and Bi melts under identical conditions are compared as a function of growth temperature and pregrowth baking time. Identification of residual shallow donors and acceptors is performed by means of laser photoelectrical magnetic spectroscopy and low temperature photoluminescence. It is shown that a change of solvent metal results in complete alteration of major background impurities in grown epilayers due, mainly, to changes of distribution coefficients of these impurities. High purity, low compensation n-GaAs layers can be grown from Bi melt (epilayers with the Hall mobility of electrons μ77K ≈ 150000 cm²/V · sat n = 2.5 · 10¹⁴ cm⁻³ has been grown).     

Temperature dependences of the electrical conductivity and hall coefficient of indium telluride single crystals

Conductivity type, carrier concentration and carrier mobility of InTe samples grown by Bridgmann technique were determined by the Hall effect and electrical conductivity measurements. The study was performed in the temperature range 150–480 K. Two samples with different growth rate were used in the investigation. The samples under test were P-type conducting, in accordance with previous measurements of undoped material. The Hall coefficient was found to be isotropic yielding room temperature hole concentration in the range 10¹⁵ – 10¹⁶ cm⁻³. The hole mobilities of InTe samples were in the range 1.17 × 10³ – 2.06 × 10³ cm²/V · sec at room temperature. The band – gap of InTe determined from Hall coefficient studies has been obtained equal to 0.34 ev. The scattering mechanism was checked, and the electrical properties were found to be sensitive to the crystal growth rate.     

Investigation of carrier scattering mechanisms in TlInS2 single crystals by Hall effect measurements

TlInS₂ single crystals are studied through the conductivity and Hall effect measurements in the temperature regions of 100‐400 and 170‐400 K, respectively. An anomalous behavior of Hall voltage, which changes sign below 315 K, is interpreted through the existence of deep donor impurity levels that behave as acceptor levels when are empty. The hole and electron mobility are limited by the hole‐ and electron‐phonon short range interactions scattering above and below 315 K, respectively. An energy level of 35 meV and a set of donor energy levels located at 360, 280, 220 and 170/152 meV are determined from the temperature dependencies of the carrier concentration and conductivity. A hole, electron, hole‐electron pair effective masses of 0.24 m_o, 0.14 m_o and 0.09 m_o and hole‐ and electron‐phonon coupling constants of 0.50 and 0.64, respectively, are obtained from the Hall effect measurements. The theoretical fit of the Hall coefficient reveals a hole to electron mobility ratio of 0.8. (© 2004 WILEY‐VCH Verlag GmbH & Co. KGaA, Weinheim)     

Impurity diffusion of 114In in Cu

Using the tracer-standard sectioning technique the impurity diffusion of indium in copper has been investigated in the temperature range from 798.1 to 1081.0°C. For the frequency factor and the activation energy, respectively, the following values were determined: D₀₂ = 1.87 cm² · s⁻¹; Q₂ = 2.034 eV. The results are compared with predictions of theoretical models of the impurity diffusion in metals.     

Single Crystal Growth and Electrical Properties of Gallium Monotelluride

Single crystals of GaTe were prepared in our laboratory by a special modified Bridgman technique method. Measurements of the electrical conductivity and Hall effect between 210 and 450 K were carried out on GaTe samples in two crystallographic directions. The Hall coefficient is positive and varies with the crystallographic direction. A unique mobility behaviour and strong anistropy in the carrier mobility were observed. The Hall mobilities parallel and perpendicular to the C-axis, at room temperature, were 12 cm/V · s and 25.12 cm²/V ·s, respectively. The free carrier concentration lies between 10¹³ − 10¹⁴ cm⁻³ at room temperature.     

Crystal Data,Photoconductivity and Carrier Scattering Mechanisms in CuIn5S8 Single Crystals

The X‐ray diffraction has revealed that CuIn₅S₈ is a single phase crystal of cubic spinel structure. The value of the unit cell parameter for this crystal is 1.06736 nm. The crystal is assigned to the conventional space group Fd3m. The photocurrent is found to have the characteristic of monomolecular and bimolecular recombination at low and high illumination intensities, respectively. The electrical resistivity and Hall effect of CuIn₅S₈ crystals are measured in the temperature range of 50‐400 K. The crystals are found to be intrinsic and extrinsic above and below 300 K, respectively. An energy band gap of ∼1.35 eV at 0 K, a carrier effective mass of 0.2 m₀ , an acceptor to donor concentration ratio of 0.9, an acoustic phonon deformation potential of 10 eV and a nonpolar optical phonon deformation potential of 15 eV are identified from the resistivity and Hall measurements. The Hall mobility data are analyzed assuming the carrier scattering by polar optical phonons, acoustic combined with nonpolar optical phonons, and ionized impurities.     

Crystallization and Thermoelectric Power of Tl2Te3 Single Crystals

Thermoelectric power (TEP) of Tl₂Te₃ was measured in the temperature range from 150 to 480 K. The crystal was found to have a p-type conductivity throughout the whole range of temperature. The effective masses of holes and electrons were determined at room temperature and found to be m = 1.1 × 10⁻³⁴ kg and m = 1.72 × 10⁻³⁵ kg, respectively. Also at the same temperature the mobility μ_p was found to be 1737.8 cm²/V.s and μ_n was 3962.2 cm²/V.s. The hole and electron diffusion coefficients were obtained as 44.84 cm²/s, and 102.23 cm²/s. The relaxation times for holes and electrons were calculated and yielded the values τ_p = 1.19 × 10¹² s and τ_n = 4.25 × 10¹³ s, respectively.     

On a Hypothesis on the Molecule Vacancies in PbTe

The temperature dependence of the current carriers mobility in SnTe(I) and PbTe (I) synthesized in presence of SnI₂ or PbI₂ respectively was studied. An experimental formula was established, showing that current carriers scattering in SnTe(I) is due to vacancies at constant Hall coefficient. For PbTe (I) crystallized from tellurium solution by traveling heater method the mobility is high (between 2.10⁴ and 4.10⁴ cm²/Vs) and the Hall coefficient is constant within the interval 77 K–450 K. Only within 77 K–160 K interval the current carriers scattering is due to vacancies. A hypothesis is proposed based on the presence of molecular vacancies (V_pbTe). These vacancies do not change electron gas concentration but do change the carriers mobility. Specimens with a negligibly low lead atoms vacancies Concentration were investigated. An empirical expression is established which shows that their mobility depends on molecular vacancies concentration and explains observed weak temperature influence upon carriers mobility. These results are obtained only from Hall coefficient and electric conductivity measurements within the 77 K–160 K temperature interval.