Direct determination of trace rare earth elements in ancient porcelain samples with slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry

A method for the direct determination of trace rare earth elements in ancient porcelain samples by slurry sampling fluorinating electrothermal vaporization inductively coupled plasma mass spectrometry was developed with the use of polytetrafluoroethylene as fluorinating reagent. It was found that Si, as a main matrix element in ancient porcelain sample, could be mostly removed at the ashing temperature of 1200 °C without considerable losses of the analytes. However, the chemical composition of ancient porcelain sample is very complicated, which makes the influences resulting from other matrix elements not be ignored. Therefore, the matrix effect of ancient porcelain sample was also investigated, and it was found that the matrix effect is obvious when the matrix concentration was larger than 0.8 g l^− 1. The study results of particle size effect indicated that when the sample particle size was less than 0.057 mm, the particle size effect is negligible. Under the optimized operation conditions, the detection limits for rare earth elements by fluorinating electrothermal vaporization inductively coupled plasma mass spectrometry were 0.7 ng g^− 1 (Eu)–33.3 ng g^− 1(Nd) with the precisions of 4.1% (Yb)–10% (La) (c = 1 μg l^− 1, n = 9). The proposed method was used to directly determine the trace rare earth elements in ancient porcelain samples produced in different dynasty (Sui, Ming and Qing), and the analytical results are satisfactory.     

Direct determination of trace rare earth elements in high purity Y2O3 using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling

A new method for the determination of trace amounts of 14 rare earth elements in high purity Y₂O₃ using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling was developed. A polytetrafluoroethylene (PTFE) emulsion was used as a fluorinating reagent to promote the vaporization of the analytes from graphite furnace. The main factors affecting analytical signals were investigated systematically. The interference of matrix could be minimized in the presence of PTFE. Under optimum conditions, the detection limits for rare earth elements were 0.032 ng～2.52 ng and the relative standard deviations were in the range of 1.4% to 4.3%. The proposed method was applied to the direct analysis of high purity Y₂O₃ powder with satisfactory results.     

Direct solid sampling electrothermal vaporization of alumina for analysis by inductively coupled plasma optical emission spectrometry

A procedure based on electrothermal evaporation (ETV) and inductively coupled plasma atomic emission spectrometry (ICP-OES) for the determination of trace impurities in Al₂O₃ powders without any sample pretreatment is presented. With the aid of matrix modifier the transport and the evaporation efficiency for refractory compounds could be increased by forming halides with a lower boiling point. As calibration is still a problem in direct solid sample analysis, different calibration approaches including the use of certified reference materials from NIST and standard addition of aqueous solutions of analytes were discussed. The accuracy obtained with calibration and with the standard addition method was shown up for the elements Ca, Fe, Ga, Mg, Mn, Na, Ni and V for the case of Al₂O₃ NIST standard reference material (SRM 699). The ETV–ICP-OES method was used for the analysis of Al₂O₃ powders with impurities in the low μg/g range and the results for the elements Ca, Fe, Ga, Mg, Mn, Na, Ni and V obtained with evaporation of discrete powder amounts with ETV–ICP-OES and slurry evaporation under the use of ultrasonic homogenization during the sampling and ETV–ICP-MS were shown to be in a good agreement.     

Microhomogeneity assessments using ultrasonic slurry sampling coupled with electrothermal vaporization isotope dilution inductively coupled plasma mass spectrometry

Ultrasonic slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry (USS-ETV-ICP-MS) is a very powerful technique for the direct analysis of solid materials prepared as slurries. The use of isotope dilution USS-ETV-ICP-MS (USS-ETV-ID-ICP-MS) for micro-homogeneity characterization studies of powdered reference materials based on elemental analyses, was investigated. Slurry analysis conditions were optimized taking into consideration density, particle size, analyte extraction, slurry mixing, analyte transport and sampling depth. Slurries were prepared using 1–20 mg of material and adding 1.0 ml of 5% nitric acid diluent containing 0.005% Triton X-100®. Three reference materials were analyzed (RM 8431a Mixed Diet, SRM 1548a Typical Diet and SRM 2709 San Joaquin Soil). Cu and Ni were determined in each material and Fe was also determined in RM 8431a Mixed Diet. ETV conditions were optimized and the benefit of using Pd as a carrier to enhance transport, combined with oxygen ashing was demonstrated. The accuracy of the method was verified by comparing analytical results with certified values. The precision of the method was demonstrated by comparing R.S.D.'s for slurry samples and aqueous standards and elemental ‘homogeneity’ was quantified based on the slurry sampling variability. The representative sample mass analyzed was calculated taking into consideration extraction of analyte into the liquid phase of the slurry. Representative sample masses of approximately 4 mg of RM 8431a provided slurry sampling variabilities of 10% or less for Cu, Fe and Ni. Representative sample masses of approximately 10 mg of SRM 1548a provided slurry sampling variabilities of approximately 10% for Cu and Ni. Representative sample masses of approximately 0.3 mg of SRM 2709 resulted in total analytical variabilities of less than 7%, highlighting the fact that the San Joaquin Soil is clearly the most homogeneous of the materials characterized.     

Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique

A method has been developed for the determination of trace impurities in silicon nitride (Si₃N₄) powders by fluorination assisted electrothermal vaporization (ETV) /ICP-AES using the slurry sampling technique. Polytetrafluoroethylene (PTFE) emulsion as a fluorinating reagent not only effectively destroys the skeleton of Si₃N₄, but also carries out selective volatilization between the impurity elements (Cu, Cr) and the matrix (Si). The experimental parameters influencing fluorination reactions were optimized. The detection limits for Cu and Cr are 1.05 ng/mL ( Cu) and 1.58 ng/mL (Cr), the RSDs are in the range of 1.9–4.2%. The proposed method has been applied to the determination of Cu and Cr in Si₃N₄ ceramic powders. The analytical results were compared with those obtained by independent methods.     

Direct determination of trace copper and chromium in silicon nitride by fluorinating electrothermal vaporization inductively coupled plasma atomic emission spectrometry with the slurry sampling technique

A method has been developed for the determination of trace impurities in silicon nitride (Si₃N₄) powders by fluorination assisted electrothermal vaporization (ETV) /ICP-AES using the slurry sampling technique. Polytetrafluoroethylene (PTFE) emulsion as a fluorinating reagent not only effectively destroys the skeleton of Si₃N₄, but also carries out selective volatilization between the impurity elements (Cu, Cr) and the matrix (Si). The experimental parameters influencing fluorination reactions were optimized. The detection limits for Cu and Cr are 1.05 ng/mL ( Cu) and 1.58 ng/mL (Cr), the RSDs are in the range of 1.9–4.2%. The proposed method has been applied to the determination of Cu and Cr in Si₃N₄ ceramic powders. The analytical results were compared with those obtained by independent methods. Received: 8 December 1998 / Revised: 1 February 1999 / Accepted: 3 February 1999     

Determination of refractory elements in atmospheric particulates using slurry sampling electrothermal vaporization inductively coupled plasma optical emission spectrometry and inductively coupled plasma mass spectrometry with polyvinylidene fluoride as chemical modifier

Electrothermal vaporization (ETV) inductively coupled plasma optical emission spectrometry (ICP-OES) and inductively coupled plasma mass spectrometry (ICP-MS) with polyvinylidene fluoride (PVDF) as chemical modifier are critically compared for the determination of refractory elements in coal fly ash and airborne particulates. The atmospheric particulates that collected on a PVDF filter were introduced into the graphite furnace in the form of a slurry by dissolving the filter in dimethylformamide, and the dissolved filter PVDF, along with additional added PVDF powder, was used as a chemical modifier for subsequent ETV-ICP-OES and ETV-ICP-MS determination. The vaporization behaviors of analytes (Ti, Zr, V, Mo, Cr, La) in ETV-ICP-OES/MS were studied in detail, and the optimal ETV operating parameters were obtained. Under the optimized operating conditions, the detection limits of target elements were 0.08-2.7 ng m(-3) for ETV-ICP-OES and 0.5-50 pg m(-3) for ETV-ICP-MS, respectively, with analytical precisions of 3.5-7.3% for ETV-ICP-OES and 3.9-9.6% for ETV-ICP-MS, respectively. The tolerable amounts of matrix elements for ETV-ICP-OES are higher than for ETV-ICP-MS. Both ETV-ICP-OES and ETV-ICP-MS were used to directly determine the trace refractory elements in coal fly ash and airborne particulates and the analytical results are comparable.     

Direct analysis of tantalum powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry

A direct inductively coupled plasma atomic emission method for the determination of Ag, Al, As, Ca, Cd, Co, Cu, Fe, Ga, K, Li, Mg, Na and Pb in high-purity tantalum powders has been developed. The electrothermal vaporization technique using a modified longitudinally-heated Grün-ETAAS furnace with sample introduction on a platform and an automated sampling workstation provided the possibility of in situ analyte-matrix separation, freedom of blank, and applicability to routine analysis. Hard- and software were modified to allow signal recording and data processing independent of the spectrometer software. The extent of spectral interferences by Ta-emission at the analyte wavelengths used was determined and the analyte signals of each sample run were automatically corrected. Limits of detection ranging from 5 ng/g (Ag, Cu) to 250 ng/g (K, Pb) were obtained using optimized furnace and spectrometer conditions. The method was applied to the analysis of two tantalum samples and the results for Cu, Fe, K, Mg and Na were compared with those obtained by liquid and solid-samping ETAAS, showing satisfactory agreement.     

Direct determination of trace rare earth elements in high purity Y2O3 using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling

A new method for the determination of trace amounts of 14 rare earth elements in high purity Y₂O₃ using fluorination assisted electrothermal vaporization inductively coupled plasma atomic emission spectrometry with slurry sampling was developed. A polytetrafluoroethylene (PTFE) emulsion was used as a fluorinating reagent to promote the vaporization of the analytes from graphite furnace. The main factors affecting analytical signals were investigated systematically. The interference of matrix could be minimized in the presence of PTFE. Under optimum conditions, the detection limits for rare earth elements were 0.032 ng∼2.52 ng and the relative standard deviations were in the range of 1.4% to 4.3%. The proposed method was applied to the direct analysis of high purity Y₂O₃ powder with satisfactory results. Received: 19 June 1999 / Revised: 10 December 1999 / Accepted: 16 December 1999     

Analysis of aluminium-based ceramic powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a tungsten coil and slurry sampling

Slurry sampling followed by electrothermal vaporization was used as sample introduction technique for digestion-free analysis of aluminium nitride and aluminium oxide by inductively coupled plasma atomic emission spectrometry. The vaporizer consisted of a tungsten coil in a quartz chamber. Spectral interferences and background emission caused by tungsten ablation from the coil were reduced by coating it with tungsten carbide. Different approaches for background correction techniques were considered. The analytes Ca, Cd, Co, Cr, Cu, Fe, Mg, Ni and Zn were determined simultaneously, whereas Mn and Na were determined in the sequential mode. Calibration was performed using the standard additions method. The accuracy was checked by comparison of the results with those of independent methods. Detection limits between 0.01 (Mg) and 8.5 μg/g (Co) were achieved.     

Analysis of aluminium-based ceramic powders by electrothermal vaporization inductively coupled plasma atomic emission spectrometry using a tungsten coil and slurry sampling

Slurry sampling followed by electrothermal vaporization was used as sample introduction technique for digestion-free analysis of aluminium nitride and aluminium oxide by inductively coupled plasma atomic emission spectrometry. The vaporizer consisted of a tungsten coil in a quartz chamber. Spectral interferences and background emission caused by tungsten ablation from the coil were reduced by coating it with tungsten carbide. Different approaches for background correction techniques were considered. The analytes Ca, Cd, Co, Cr, Cu, Fe, Mg, Ni and Zn were determined simultaneously, whereas Mn and Na were determined in the sequential mode. Calibration was performed using the standard additions method. The accuracy was checked by comparison of the results with those of independent methods. Detection limits between 0.01 (Mg) and 8.5 μg/g (Co) were achieved. Received: 21 September 1998 / Revised: 30 October 1998 / Accepted: 3 November 1998     

Direct determination of major elements in solid plant materials by electrothermal vaporization inductively coupled plasma atomic emission spectrometry

The present work demonstrates the capability of electrothermal vaporization (ETV) to become an important tool of solid sample introduction in ICP-AES for plant sample analysis. Direct determination of Al, Ca, Fe, K, Mg, Mn, Na and Zn was investigated in powdered plant samples. Obtaining good results for major elements in plant samples was governed by some special operating conditions. The sensitivity of the method necessitated the use of ICP in radial view configuration. The behavior of elements during vaporization was studied between 500 and 2600 °C. External calibration was carried out using solid external (cellulose) spiked with aqueous standard solutions. However, performances of the analytical method were found dependent of argon flow rates. Analytical accuracy of the method was tested in three reference materials. Analytical results agreed with certified values when cellulose was used in calibration. However, K could not be determined because of excessive sensitivity. Without cellulose, it was found that Fe results were underestimated and Zn results overestimated. Relative standard deviations varied from 3 to 23%. Limits of detection varied from 1 to 80 ng g⁻¹ from one element to the other for a typical mass sample of 2 mg.     

Electrothermal vaporization in inductively coupled plasma atomic emission spectrometry for direct multielement analysis of food samples with slurry sampling

Slurry sampling followed by electrothermal vaporization (ETV) was used as sample introduction technique in inductively coupled plasma atomic emission spectrometry (ICP-AES) for the direct determination of trace elements in food samples. A polytetrafluoroethylene (PTFE) emulsion was used as a fluorinating reagent to promote vaporization and the transportation of analytes. The main factors affecting the analytical signals were investigated in detail. Under optimum operating conditions, the detection limits (DL) for this method varied from 1.8 (Cu) to 215 ng/mL (Zn), while the relative standard deviations (RSD) were in the range 2.6% (Cu)-7.2% (Zn). The proposed method was successfully applied to the direct determination of trace amounts of V, Cu, Cr, Fe, Zn, and La in rice without any chemical pretreatment. The precision was evaluated by analyzing a standard reference material (tea leaves, GBW 07605) and comparing the results from this method with results obtained by pneumatic nebulization (PN) ICP-AES after the wet-chemical decomposition of the same sample.From Zhurnal Analiticheskoi Khimii, Vol. 60, No. 3, 2005, pp. 286–290.Original English Text Copyright © 2005 by Chen.This article was submitted by the author in English.     

Determination of trace impurities in boron nitride by graphite furnace atomic absorption spectrometry and electrothermal vaporization inductively coupled plasma optical emission spectrometry using solid sampling

Two digestion-free methods for trace analysis of boron nitride based on graphite furnace atomic absorption spectrometry (GFAAS) and electrothermal vaporization inductively coupled plasma spectrometry optical emission (ETV-ICP-OES) using direct solid sampling have been developed and applied to the determination of Al, Ca, Cr, Cu, Fe, Mg, Mn, Si, Ti and Zr in four boron nitride materials in concentration intervals of 1–23, 54–735, 0.05–21, 0.005–1.3, 1.6–112, 4.5–20, 0.03–1.8, 6–46, 38–170 and 0.4–2.3 μg g^− 1, respectively. At optimized experimental conditions, with both methods, effective in-situ analyte/matrix separation was achieved and calibration could be performed using calibration curves measured with aqueous standard solutions. In solid sampling GFAAS, before sampling, the platform was covered with graphite powder and, for determination of Si, also the Pd/Mg(NO₃)₂ modifier was used. In the determination of all analyte elements by solid sampling ETV-ICP-OES, Freon R12 was added to argon carrier gas. For solid sampling GFAAS and ETV-ICP-OES, the achievable limits of detection were within 5 (Cu)–130 (Si) ng g^− 1 and 8 (Cu)–200 (Si) ng g^− 1, respectively. The results obtained by these two methods for four boron nitride materials of different purity grades are compared each with the other and with those obtained in analysis of digests by ICP-OES. The performance of the two solid sampling methods is compared and discussed.     

A comparison of slurry sampling electrothermal vaporization and slurry nebulization inductively coupled plasma mass spectrometry for the direct determination of trace impurities in titanium dioxide powder

A comparison of slurry sampling (SS)-ETV-ICP-MS and slurry nebulization (SN)-ICP-MS for direct determination of trace impurities in titanium dioxide powder is made. The particle size effect, matrix effect and analytical characteristics of SSETV-ICP-MS and SN-ICP-MS are compared. The results have shown that SSETV-ICP-MS has a lower particle size effect and matrix effect compared to SN-ICP-MS. The analytical performance of the two methods reveals that SSETV-ICP-MS and SN-ICP-MS have similar relative detection limits (in the nanogram per liter level); however, the former has a lower absolute detection limit than the latter. Although the precision for SSETV-ICP-MS is a little worse than that for SN-ICP-MS, it is still acceptable for real sample analysis. The two methods were successfully applied for the determination of trace impurities in titanium dioxide powder samples with particle sizes of less than 50 nm, but only SSETV-ICP-MS could be applied for the determination of trace impurities in titanium dioxide powder samples with a particle size of 1 microm.     

Analytical evaluation of electrothermal vaporization/low-pressure inductively coupled plasma atomic emission spectrometry for trace elemental analysis in microliter samples

A novel method for the determination of trace elements in microliter samples using the tantalum filament electrothermal vaporization/low-pressure inductively coupled plasma (ETV/LP-ICP) atomic emission spectrometry has been developed. An improved tantalum filament ETV was directly coupled with LP-ICP system for efficient vaporization of microliter samples and further quantitative analysis. The experimental parameters including ETV current, rf power and mass flow rate of argon carrier gas were optimized using the copper emission signal produced by 5 μl of standard solution (5 μg/ml). Under the optimized condition, the analytical performances including linearity, precision and detection limit for the developed system were investigated. Absolute detection limits in the range of 22–391 pg for selected eight elements (Fe, Cu, Cr, Mn, Pb, K, Zn and Mg) were obtained with satisfactory precision (<8.9% RSD). The feasibility of the developed system has been demonstrated by analyzing wheat gluten NIST standard sample.     

Possibilities of inductively coupled plasma atomic emission spectrometry with electrothermal vaporization in the analysis of high-purity reagents

Possibilities of electrothermal sample vaporization in inductively coupled plasma atomic emission spectrometry (ETV-ICP-AES) in the analysis of high-purity reagents were studied on an example high-purity waters, acid solutions, and trace impurity concentrates. The analytical and background signals in the injection of solutions into inductively coupled plasma (ICP) by pneumatic nebulization and electrothermal vaporization were compared and the of limits of detection in the analysis of high-purity reagents with impurity preconcentration by evaporation were estimated and compared.     

Feasibility of isotope dilution calibration for the determination of thallium in sediment using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry

Isotope dilution (ID) calibration was investigated as a means to establish accurate values for thallium in a variety of sediment reference materials using slurry sampling electrothermal vaporization inductively coupled plasma mass spectrometry (ETV-ICP-MS) as the analytical tool. The pyrolysis curve, as well as the analysis of SRM 2704 Buffalo River Sediment, suggested that a pyrolysis temperature of 700°C could be used for this determination. The analytical results for a number of river sediment reference materials confirmed this finding; however, the results for marine sediments were far too high, indicating a serious problem with these samples. Careful investigation revealed the following interference mechanism as the most likely one. The chloride content of marine sediments is some two orders of magnitude higher than that of river sediments, and the chloride leaches out very easily into the aqueous phase of the slurry. The thallium that is in solution forms TlCl upon drying, which is easily volatilized and lost at pyrolysis temperatures >400°C. As the enriched isotope spike was added in solution, and the ‘original’ thallium is retained, at least in part, in the sediment particles, the spiked thallium is preferentially lost, leading to the excessively high analytical results. Accurate results for Tl in marine and river sediments could be obtained using pyrolysis temperatures of 400 and ≤700°C, respectively. The detection limit calculated from 3×S.D. (n=5) of the sediment with the lowest thallium content (HISS-1) was found to be 0.003 μg g⁻¹. The precision at the 0.5–1.0-μg g⁻¹ Tl level based on five consecutive readings was 1.3–4.0% R.S.D.     

电感耦合等离子体原子发射光谱法测定自来水中的8种元素

采用电感耦合等离子体原子发射光谱法(ICP-AES)测定了化学实验室自来水中铝、钾、锶、钡、锰、钴、钼、硒8种元素的含量;对仪器的工作条件进行了优化,确定了各元素的分析波长和检出限.结果表明,所述方法可以方便地用于测定化学实验室自来水样品中的8种元素,相对标准偏差为0.08%～6.90%.