Dark electrical conductivity and photoconductivity of Ga4Se3S layered single crystals

Ga₄Se₃S layered crystals were studied through the dark electrical conductivity, and illumination- and temperature-dependent photoconductivity in the temperature region of 100-350 K. The dark electrical conductivity reflected the existence of two energy states located at 310 and 60 meV being dominant above and below 170 K, respectively. The photoconductivity measurements revealed the existence of another two energy levels located at 209 and 91 meV above and below 230 K. The photoconductivity was observed to increase with increasing temperature. The illumination dependence of photoconductivity was found to exhibit linear and supralinear recombination above and below 280 K, respectively. The change in recombination mechanism was attributed to the exchange in the behavior of sensitizing and recombination centers.     

Energy band gap and oscillator parameters of Ga4Se3S single crystals

The optical properties of the Bridgman method grown Ga₄Se₃S crystals have been investigated by means of room temperature, transmittance and reflectance spectral analysis. The optical data have revealed an indirect allowed transition band gap of 2.08 eV. The room temperature refractive index, which was calculated from the reflectance and transmittance data, allowed the identification of the dispersion and oscillator energies, static dielectric constant and static refractive index as 21.08 and 3.85 eV, 6.48 and 2.55, respectively.     

Trapping centers and their distribution in Tl2Ga2Se3S layered single crystals

Thermally stimulated current (TSC) measurements with current flowing perpendicular to the layers were carried out on Tl₂Ga₂Se₃S layered single crystals in the temperature range of 10-260 K. The experimental data were analyzed by using different methods, such as curve fitting, initial rise and isothermal decay methods. The analysis revealed that there were three trapping centers with activation energies of 12, 76 and 177 meV. It was concluded that retrapping in these centers was negligible, which was confirmed by the good agreement between the experimental results and the theoretical predictions of the model that assumes slow retrapping. The capture cross section and the concentration of the traps have been also determined. An exponential distribution of electron traps was revealed from the analysis of the TSC data obtained at different light illumination temperatures. This experimental technique provided values of 10 and 88 meV/decade for the traps distribution related to two different trapping centers.     

Enhancement of minority carrier lifetime in GaAs1? x P x ( x =0.4; 0.65) by nitrogen implantation

Minority carrier lifetimes in nitrogen implanted GaAs_1-x P _x (x=0.4; 0.65) were measured at 77K by an optical phase shift method as a function of nitrogen dose and annealing temperature in order to investigate the dependence of the lifetime on the concentration of nitrogen isoelectronic traps. A large increase in the lifetime was observed after nitrogen implantation followed by annealing at and above 800°C. The maximum lifetimes were 22ns for GaAs_0.35P_0.65 and 6.7 ns for GaAs_0.6P_0.4. They were obtained by implantation to a dose of 5×10¹³ cm⁻² in GaAs_0.35P_0.65 and 10¹³ cm⁻² in GaAs_0.6P_0.4. The lifetime after nitrogen implantation followed by annealing was longer by a factor of 6–7 than that of the unimplanted sample.     

Jahn--Teller Distortion of the Zinc Vacancy in ZnGeP2

A symmetry analysis and a simple dangling bond model are presented for the VZn^- in ZnGeP2, identifying a possible Jahn-Teller distortion mechanism which could naturally explain the localization of the defect wavefunction on two of the nearest-neighbouring P atoms, as deduced for the electron nuclear double resonance experiments.     

Effect of Pb on the electrical properties of a-Ge20Se80 glasses

The present paper reports the effect of Pb impurity (low ∼2 at% and high ∼10 at%) on the ac conductivity (σ_ac) of a-Ge₂₀Se₈₀ glass. Frequency-dependent ac conductance and capacitance of the samples over a frequency range ∼100 Hz to 50 kHz have been taken in the temperature range ∼268 to 358 K. At frequency 2 kHz and temperature 298 K, the value of σ_ac increases at low as well as at higher concentration of Pb. σ_ac is proportional to ω^s for undoped and doped samples. The value of frequency exponent (s) decreases as the temperature increases. The static permittivity (ε_s) increases at both Pb concentrations. These results have been explained on the basis of some structural changes at low and higher concentration of Pb impurity.     

Electro-optic properties of LiKSO4 and LiK1-xRbxSO4 crystals

1-x Rb_xSO₄ for x varying between 0 and 0.50 were investigated by an ac modulation method based upon the Sénarmont arrangement. The electro-optic coefficient r_c, and for the first time the coefficients r₄₁ and r₅₁ were determined with good accuracy in pure LiKSO₄ around room temperature at a wavelength of 633 nm. The frequency dependence of the electro-optic coefficient r_c was measured in the frequency range from 1 kHz up to 1 MHz. The values of the factor of merit n_e ³r_c of the mixed crystals LiK_1-xRb_xSO₄ were obtained for the first time, for the concentrations x=0.05, 0.10, 0.20, and 0.50. The electro-optic properties are shown to be affected by the random presence of the rubidium ions in this disordered system. Received: 16 March 1998/Revised version: 2 June 1998     

Sol-gel preparation and characterization of CoFe2O4-SiO2 nanocomposites

Magnetic nanocomposites formed by cobalt ferrite particles dispersed in a silica matrix were prepared by a sol-gel process. The effects of the thermal treatment temperature and the salt concentration on the structural and magnetic properties of the composites were investigated. By controlling these parameters, CoFe₂O₄/SiO₂ nanocomposites with different crystallite size and magnetic properties were obtained. By increasing the annealing temperature and salt concentration, composites with a progressive increase in the coercive field and of the density of magnetization were produced. In particular, a nanocomposite, with a Fe/Si molar concentration of 21%, obtained by drying the gel at 150 °C and further annealing at 800 °C, has a coercivity of 2000 Oe, which is more than twice higher than the coercivity of bulk cobalt ferrite.     

Trap levels in layered semiconductor Ga2SeS

Trap levels in nominally undoped Ga₂SeS layered crystals have been characterized by thermally stimulated current (TSC) measurements. During the measurements, current was allowed to flow along the c-axis of the crystals in the temperature range of 10-300 K. Two distinct TSC peaks were observed in the spectra, deconvolution of which yielded three peaks. The results are analyzed by curve fitting, peak shape and initial rise methods. They all seem to be in good agreement with each other. The activation energies of three trapping centers in Ga₂SeS are found to be 72, 100 and 150 meV. The capture cross section of these traps are 6.7×10⁻²³, 1.8×10⁻²³ and 2.8×10⁻²² cm² with concentrations of 1.3×10¹², 5.4×10¹² and 4.2×10¹² cm⁻³, respectively.     

Van der Pauw resistivity measurements on evaporated thin films of cadmium arsenide, Cd3As2

Cadmium arsenide is a II-V semiconductor, exhibiting n-type intrinsic conductivity with high mobility and narrow bandgap. It is deposited by thermal evaporation, and has shown the Schottky and Poole-Frenkel effects at high electric fields, but requires further electrical characterisation. This has now been extended to low-field van der Pauw lateral resistivity measurements on films of thickness up to 1.5 μm. Resistivity was observed to decrease with increasing film thickness up to 0.5 μm from about 3 × 10⁻³ Ω m to 10⁻⁵ Ω m, where the crystalline granular size increases with film thickness. This decrease in resistivity was attributed to a decrease in grain boundary scattering and increased mobility. Substrate temperature during deposition also influenced the resistivity, which decreased from around 10⁻⁴ Ω m to (10⁻⁵ to 10⁻⁶) Ω m for an increase in substrate deposition temperature from 300 K to 423 K. This behaviour appears to result from varying grain sizes and ratios of crystalline to amorphous material. Resistivity decreased with deposition rate, reaching a minimum value at about 1.5 nm s⁻¹, before slowly increasing again at higher rates. It was concluded that this resulted from a dependence of the film stoichiometry on deposition rate. The dependence of resistivity on temperature indicates that intercrystalline barriers dominate the conductivity at higher temperatures, with a hopping conduction process at low temperatures.     

Dielectric properties of P2O5-Na2O-Li2O glasses containing WO3, CoO or Fe2O3

The aim of this work was to study some polarization mechanisms in phosphate glasses containing different transition metal oxides, performed at radio frequency (100 kHz) and in the microwave region (9 GHz). Cobalt, iron and tungsten oxides were chosen for the present investigation. The results show that the dielectric constant increases linearly with increasing Co concentration, whereas for iron and tungsten ions, the dielectric constant values were found to decrease up to a given concentration and further, increase for higher concentration of W and Fe. This anomaly was observed both at 100 kHz and 9.00 GHz and was attributed to the valence state of the transition metal ions in the glass structure. The dielectric constant is lower in the microwave region, due to structural relaxation mechanisms.     

Comment on `Electronic Properties of Red P-Type Tl2S5 Single Crystals'

Recently, Gamal et al. [Chin. Phys. Lett. 22 (2005) 1530] reported the results of electrical conductivity, Hall effect and thermoelectric measurements on p-type Tl₂S₅ single crystals. From the experimental data for the temperature dependence of differential thermoelectric power, Gamal et al. determined thevalues of 2.66×10^-41kg and 2.50×10^-41kg, respectively, for the effective masses of electrons and holes in p-type Tl₂S₅, which are about ten orders of magnitude smaller than the free electron mass (9.11×10^-31kg). We argue that the anomalously small values obtained for the effective mass of chargecarriers in Tl₂S₅ have no physical significance.     

AgGaSe2 : A highly photoconductive material

High resistivity single crystals of AgGaSe₂ were grown by the horizontal Bridgman technique. The near band edge photoconductivity of the grown crystal at room temperature was found to be up to 2×10⁴ times higher than the dark conductivity, under the illumination of 10⁻³ W/cm². The photoconductivity spectrum consists primarily of three peaks, which are attributed to the transitions from Γ₇(A), Γ₆(B) and Γ₇(C) states of valence band to the conduction band Γ₆. The crystal field splitting and the spin-orbit splitting were determined from these peak energy positions of the photoconductivity spectrum.     

Changes in optical and electrical properties and surface recombination velocity of n-type GaN due to (NH4)2Sx treatment

We have employed the photoluminescence (PL), surface photovoltage spectroscopy (SPS) and Hall effect measurements to study the effects of (NH₄)₂S_x treatment on the optical and electrical properties of n-type GaN (n-GaN) in this study. (NH₄)₂S_x treatment of n-GaN led to the decrease of the surface recombination velocity and the increase of the band-edge emission intensity, due to the accumulation of majority carriers and the repulsion of minority carriers near the (NH₄)₂S_x-treated n-GaN surface, the removal of the native oxide existed on the n-GaN, and sulfur passivation.     

On photoluminescence in HgGa2S4

In this paper, we investigate the kinetics of photoluminescence in excited crystals of HgGa₂S₄ which have recently been proposed for implementing tunable luminescent devices. From photoluminescence experiments, performed at various temperatures and excitation powers, it appears that two kinds of radiative recombination processes take place during crystal excitation. These originate two bands in emission spectra which were resolved by means of a fitting procedure. The dependencies of these bands on temperature and excitation power density are explained by means of a specific kinetic model. A broad band, peaking at about 1.8 eV, is ascribed to electron-hole tunnel recombinations occurring in associated donor-acceptor pairs, according to a Prener-Williams scheme. The second narrow band, peaking at about 2.3 eV, is ascribed to electron-hole recombinations occurring in centres presenting short () and long-life () excited states. At room temperature, owing to thermally activated relaxation from short- to long-life states, these centres saturate under relatively low excitation powers. The tunability of photoluminescence is a consequence of competition between monomolecular and bimolecular recombination processes.     

Enhancement of carrier mobility in pentacene thin-film transistor on SiO2 by controlling the initial film growth modes

Pentacene thin-film transistors (TFTs) were fabricated on thermally grown SiO₂ gate insulator under the conditions of various pre-cleaning treatments. Initial nucleation and growth of the material films on treated substrates were observed by atomic force microscope. The performance of fabricated TFT devices with different surface cleaning approaches was found to be highly related to the initial film morphologies. In contrast to the three-dimensional island-like growth mode on SiO₂ under an organic cleaning process, a layer-by-layer initial growth occurred on the SiO₂ insulator cleaned with ammonia solution, which was believed to be the origination of the excellent electrical properties of the TFT device. Field effect mobility of the TFT device could achieve as high as 1.0 cm²/Vs on the bared SiO₂/Si substrate and the on/off ratio was over 10⁶.     

Hall mobility of amorphous Ge2Sb2Te5

The electrical conductivity, Seebeck coefficient, and Hall coefficient of three-micron-thick films of amorphous Ge₂Sb₂Te₅ have been measured as functions of temperature from room temperature down to as low as 200 K. The electrical conductivity manifests an Arrhenius behavior. The Seebeck coefficient is p-type with behavior indicative of multi-band transport. The Hall mobility is n-type and low (near 0.07 cm²/V s at room temperature).     

Atomic topology and radial distribution functions of a-SiNx alloys: ab initio simulations

Random structures of amorphous silicon-nitrogen alloys, a-SiN_x, are obtained for several values of x from 0 to the nearly stoichiometric composition of x=1.29, using a new ab initio thermal procedure based on a Harris-functional code and periodically continued cells with 64 atoms. Partial radial features are reported with no experimental counterparts for comparison, whereas the total radial distribution functions agree very well with the few existing experiments. Our average coordination numbers also agree very well with experiment. These results, being predictive, may stimulate further experimental and theoretical studies.     

NMR and magnetic studies on 7 K anomaly in Tl3H(SO4)2

Measurements of the spin-lattice relaxation time, NMR absorption line and magnetization have been carried out on the Tl₃H(SO₄)₂ crystal below 50 K. The anomaly at around 7 K was: (1) the spin-lattice relaxation times of ¹H and ²⁰⁵Tl nuclei increase steeply with decreasing temperature below 7 K, (2) the NMR absorption lines below 7 K shift to the high-magnetic field side in comparison with that above 7 K, and (3) the ¹H NMR line width exhibits a drastic increase of the line width with decreasing temperature below 7 K. These results indicate that the magnetic dipole fluctuation of the proton changes at 7 K. On the other hand, there are no remarkable anomalies of magnetic susceptibility at around 7 K. From these results it is deduced that the anomaly at around 7 K is caused by the change in quantum mechanical process of the proton from proton tunneling to zero-point vibration of hydrogen in the hydrogen bond with the decrease of temperature.     

Thermoelectric properties of the Bi2−xYxRu2O7 (x=0-2) pyrochlores

Electrical conductivity and Seebeck coefficient for the Bi_2−xY_xRu₂O₇ pyrochlores with x=0.0,0.5,1.0,1.5,2.0 were measured in the temperature range of 473-1073 K in air. With increasing Bi content, the temperature dependence of the electrical conductivity changed from semiconducting to metallic. The signs of the Seebeck coefficient were positive in the measured temperature range for all the samples, indicating that the major carriers were holes. The temperature dependence of the Seebeck coefficient for the Y₂Ru₂O₇ indicated the thermal activation-type behavior of the holes, while that for the Bi_2−xY_xRu₂O₇ with x=0.0-1.5 indicated the itinerant behavior of the holes. The change in the conduction behavior from semiconductor to metal with increasing Bi content is consistent with the increase in the overlap between the Ru4d t_2g and O2p orbitals, but the mixing of Bi6s, 6p states at E_F may not be ruled out. The thermoelectric power factors for the Bi_2−xY_xRu₂O₇ with x=1.5 and 2.0 were lower than 10⁻⁵ W m⁻¹ K⁻² and those with x=0.0,0.5,1.0 were around 1-3×10⁻⁵ W m⁻¹ K⁻².