自旋阀中的各向异性磁电阻效应

采用平面霍尔效应测量方法，对Ta(8nm)/NiFe(7nm)/Cu(24nm)/NiFe(44nm)/FeMn(14nm)/Ta(6nm)自旋阀多层膜进行了研究.结果表明，在样品中存在着自由层和被钉扎层之间的各向异性磁电阻的“混合”效应.与通常所采用的磁电阻测量方法相结合，平面霍尔效应的测 量可以给出自旋阀中各向异性磁电阻以及自由层和被钉扎层的磁矩随外场变化的更多信息. 关键词： 自旋阀 各向异性磁电阻 平面霍尔效应     

磁电阻效应的研究进展

介绍了磁电阻效应的研究状况和进展,总结了铁磁金属的磁电阻效应、磁性多层膜和颗粒膜的巨磁阻效应、磁隧道电阻效应及氧化物铁磁体的超大磁阻效应的理论模型,并简要分析了磁电阻效应的物理机制。     

Co/CoO双层膜的各向异性磁电阻与交换偏置行为研究

本文系统研究了Co/CoO双层膜的各向异性磁电阻(AMR)与交换偏置行为,并给出了外加微扰场对交换偏置磁锻炼效应恢复程度影响的实验结果.结果表明磁锻炼效应发生后,施加0.15T的倾斜微扰场可致使铁磁畴分裂进而诱导磁锻炼效应的恢复,揭示磁锻炼效应恢复程度与微扰场的角度有紧密关联.在微扰场作用下FM自旋在两个方向分裂,一部分自旋沿微扰场方向,另一部则被冷却场的AFM自旋钉扎住而沿原来方向不变.当微扰场和冷却场夹角大于30°时,FM畴被分裂,磁锻炼效应开始恢复,表明一个磁畴内的铁磁自旋偏离夹角最大为30°,而磁锻炼效应发生后,部分AFM自旋偏离冷却场方向的角度则小于30°,实验结果与相应的理论计算结果一致.此外,恢复程度随微扰场角度的增加而增加,最大恢复程度时角度为90°.同时,磁锻炼效应的恢复增加了交换偏置值,为器件设计提供理论支持,在自旋电子学基础和应用研究方面具有重要的指导意义.     

81NiFe/Cr多层膜磁电阻单向各向异性与交换耦合

采用电子束蒸发法制备的８１ＮｉＦｅ／Ｃｒ多层膜具有单向各向异性，磁滞回线非轴对称，相当存在１Ｏｅ数量级的交换偏场。磁电阻回线的上升和下降两枝差别明显，其中以横向磁电阻回线最为显著。有的试样上升枝与下降枝相应的最大横向磁电阻率之差已高达０．７８％，其最大各向异性磁电阻率（Ｒ_ｍａｘ－Ｒ_ｍｉｎ）／Ｒ为４．７２％，甚高于Ｍｉｙａｚａｋｉ等^[１］的优质８２ＮｉＦｅ合金单层膜的报道值３％。可以认为这类多层膜的磁电阻效应除主要来源于自旋－轨道耦合机制外， 关键词：     

真空退火对周期性界面掺杂Ni80Co20薄膜磁性的影响

用磁控溅射方法制备了两个具有不同Fe层厚度的［Ni₈₀Co₂₀(L)/Fe(t_Fe)］_N多层膜系列样品,其中t_Fe=0.1和2nm.研究了两个系列样品的磁及输运性质随Ni₈₀Co₂₀层厚度L的变化关系.在退火态［Ni₈₀Co₂₀(L)/Fe(0.1nm)］_N系列样品中,发现各向异性磁电阻( 关键词： 多层膜 各向异性磁电阻 界面效应 退火     

铁磁金属薄膜纳米点连接的各向异性磁电阻

首次运用电子束光刻技术和真空沉积技术在硅片表面制备了宽度在20纳米Ni80Fe20薄膜铁磁金属纳米点连接,通过对铁磁金属薄膜纳米点连接样品在不同温度下的磁电阻和I~V的研究,得出宽度在20纳米的铁磁金属薄膜纳米点连接中所观察到的磁电阻现象是各向异性磁电阻,其导电行为主要是金属导体导电行为,受量子化电导作用较小;通过对宽...     

Pt插层对Co/FeMn界面的影响

采用磁控溅射的方法制备了Co/FeMn/Co多层膜,研究了Co（底部）/FeMn和FeMn/Co（顶部）界面插入Pt层后磁矩的变化情况．通过测量磁滞回线可知,Co（底部）/FeMn界面的Pt插层改变了体系的饱和磁化强度Ｍ_s,随着Co层厚度（t_Co）的增加Ｍ_s不断趋近于Co块体结构理论值1440 kA/m．这是因为Co（底部）/FeMn界面产生了净磁矩,而界面处的Pt插层可以减少这种净磁矩的产生．但是 关键词： 磁性多层膜 垂直磁各向异性 交换耦合     

真空退火对周期性界面掺杂Ni80Co20薄膜磁性的影响

用磁控溅射方法制备了两个具有不同Fe层厚度的[Ni80Co20(L)/Fe(tFe)]N多层膜系列样品,其中tFe=0.1和2nm.研究了两个系列样品的磁及输运性质随Ni80Co20层厚度L的变化关系.在退火态[Ni80Co20(L)/Fe(0.1nm)]N系列样品中,发现各向异性磁电阻(AMR)和横向磁电阻(TMR)在L为10nm附近存在一较宽的增强峰,其峰位与制备态[Ni80Co20(L)/Fe(2nm)]25多层膜TMR的增强峰位一致.当L小于Ni80Co20合金的电子平均自由程时,制备态[Ni80Co20(L)/Fe(0.1nm)]N样品的各向异性磁电阻(Δρ)和零场电阻率ρ都随L的减小而增加,且ρ的增量超过Δρ的增量.ρ随L的依赖关系可采用Fuchs-Sondheimer理论描述.在L小于10nm时,制备态界面掺杂[Ni80Co20(L)/Fe(0.1nm)]N系列样品的矫顽力Hc随L近似直线上升,在L大于10nm后趋于饱和.退火后Hc显著下降.实验结果表明,在多层膜结构中,界面散射可导致ρ和Δρ的增强;磁性合金界面层还可导致畴结构的改变及TMR和AMR的增强.     

巨磁电阻效应实验仪的研制与应用

阐述了巨磁电阻效应实验原理、实验内容和实验方法,该仪器可测量巨磁电阻阻值与磁感应强度关系,并与正常磁电阻、坡莫合金磁电阻特性进行比较,仪器还提供巨磁电阻传感器特性测量及系列应用实验供教学使用.     

铁磁多层膜中的力致磁电阻效应

通过研究外应力场下铁磁多层膜系统中的自旋结构,讨论了系统磁电阻对外应力的依赖关系.结果表明,外应力能够诱发磁电阻效应,且其磁电阻紧密依赖于外应力的大小和方向.一般地对铁磁性层间耦合,其磁电阻与外应力之间的关系紧密地依赖于两铁磁层的磁致伸缩系数以及磁晶各向异性之差异.具体地,大小一定的外应力由磁易轴向磁难轴旋转的过程中,磁电阻先缓慢增大后急剧减小,在磁难轴附近变化较敏锐,并出现峰值.外应力方向一定时,磁电阻随应力的增大先敏锐增强后缓慢减小,且应力方向偏离磁易轴越远,变化趋势越显著.特别地,当外应力完全垂直于磁易轴时,应力大小的变化会引起磁电阻翻倍.而外应力场介于8πM/5≤H_λ≤18πM/5时,磁电阻会随应力的旋转单调上升,并在磁难轴附近急剧增强,产生GMR效应;对反铁磁性层间耦合,其GMR效应对应力大小和方向的响应近似地相反于铁磁性层间耦合情形. 关键词： 铁磁/非磁/铁磁三层膜 自旋结构 磁电阻 应力场     

Anomalous anisotropic magnetoresistance in single-crystalline Co/SrTiO3(001) heterostructures

The anisotropic magnetoresistances (AMRs) in single crystalline Co(6 nm)/SrTiO₃(001) heterostructures from 5 K to 300 K with the current direction setting along either Co[100] or Co[110] are investigated in this work. The anomalous (normal) AMR is observed below (above) 100 K. With the current along Co[100] direction, the AMR shows negative longitudinal and positive transverse magnetoresistances at T< 100 K, while the AMR is inverse with the current along Co[110]. Meanwhile, the amplitude ratio between Co[110] and Co[100] is observed to be as large as 29 at 100 K. A crystal symmetry-adapted model of AMR demonstrates that interplay between the non-crystalline component and crossed AMR component results in the anomalous AMR. Our results may reveal more intriguing magneto-transport behaviors of film on SrTiO₃ or other perovskite oxides.     

溅射条件对Ni80Fe20薄膜各向异性磁电阻的影响

研究了基片温度和溅射气压对磁控溅射方法制备的Ni80Fe20磁性薄膜各向异性磁电阻的影响.实验发现基片温度是影响Ni80Fe20薄膜各向异性磁电阻最重要的因素.在较高的基片温度下,溅射气压对Ni80Fe20薄膜各向异性磁电阻也有较大的影响.基片温度在150~180℃,溅射气压在0.3~0.5 Pa范围内制备的Ni80Fe20薄膜有较大的各向异性磁电阻(3.7%~4.3%).     

Temperature-dependent formation and shrinkage of hollow shells in hemispherical Ag/Pd nanoparticles

It is shown that both the growth and shrinkage of hollow shells in Ag/Pd hemispherical core-shell nanostructures take place at the same temperature. The crossover time, t _cr, between these regimes is shifted to lower values with increasing temperature. This result confirms that the growth and shrinkage regimes are controlled by the faster and slower diffusion coefficients (D _Ag and D _Pd), respectively. The pore radius, confirming recent theoretical predictions, linearly depends on the initial particle radius, and the slope of this straight line increases with the average composition of the faster component.     

缓冲层Ta对FePt薄膜L10有序相转变及矫顽力的影响

制备了Ta/FePt/C系列多层膜，研究了样品在不同温度退火后的磁特性和微结构.实验结果表明，不同厚度的Ta缓冲层具有不同的微结构特征，显著影响FePt层的L1₀有序相的形成及相应的矫顽力.当Ta缓冲层较薄，Ta层为非晶态，且较为粗糙，由此使FePt在界面处产生较多的缺陷并导致较高密度的晶界，在退火过程中，受束缚相对较弱的非晶态的Ta原子比较容易沿FePt的缺陷和晶界处向FePt层扩散，使FePt在相变过程中产生的应力比较容易释放，同时，Ta在扩散过程中产生的缺陷，降低了FePt有序 关键词： FePt薄膜 0相')" href="#">L1₀相 原子扩散     

Sign reversal of anisotropic magnetoresistance and anomalous thickness-dependent resistivity in Sr2CrWO6/SrTiO3 films

High-quality Sr₂CrWO₆ (SCWO) films have been grown on SrTiO₃ (STO) substrate by pulsed laser deposition under low oxygen pressure. With decrease of the film thickness, a drastic conductivity increase is observed. The Hall measurements show that the thicker the film, the lower the carrier density. An extrinsic mechanism of charge doping due to the dominance of oxygen vacancies at SCWO/STO interfaces is proposed. The distribution and gradient of carrier concentration in SCWO films are considered to be related to this phenomenon. Resistivity behavior observed in these films is found to follow the variable range hopping model. It is revealed that with increase of the film thickness, the extent of disorder in the lattice increases, which gives a clear evidence of disorder-induced localization charge carriers in these films. Magnetoresistance measurements show that there is a negative magnetoresistance in SCWO films, which is considered to be caused by the magnetic scattering of magnetic elements Cr³⁺ and W⁵⁺. In addition, a sign reversal of anisotropic magnetoresistance (AMR) in SCWO film is observed for the first time, when the temperature varies across a characteristic value, T_M. Magnetization—temperature measurements demonstrate that this AMR sign reversal is caused by the direction transition of easy axis of magnetization from the in-plane ferromagnetic order at T > T_M to the out-of-plane at T < T_M.     

Direct comparison of anisotropic magnetoresistance and planar Hall effect in epitaxial Fe3O4 thin films

The angular dependence of anisotropic magnetoresistance (AMR) and planar Hall effect (PHE) were studied as a function of temperatures from the same epitaxial Fe₃O₄ film on MgO(001) substrates. The PHE contains only a twofold angular dependence, but the AMR below 200 K is constituted with both twofold and fourfold symmetric terms. Our results also prove that the origin of the fourfold symmetry of AMR is related to the lattice symmetry rather than the spin scattering near the antiphase boundaries.     

Enhancement of magnetoresistance sensitivity in Co/Cu/NiFe trilayers by softening the Co hard layer

Co/Cu/NiFe trilayers were prepared by sputtering without magnetic field applied. We have found that the Co(2 nm)Cu(1 nm)NiFe(2 nm) trilayer using Ta as buffer layer exhibits an enhanced magnetoresistance (MR) sensitivity by a factor of more than 6 and a low saturation field of 9.3 Oe. Experimental results have demonstrated that the low saturation field is attributed to the softening of the Co layer by depositing the Co(2 nm)Cu(1 nm)NiFe(2 nm) sandwich on Ta layer. The decrease of the coercivity of the Co layer also plays an important role in the enhancement of MR sensitivity by reducing the effective coercivity of the NiFe layer, which is discussed in terms of the change in interlayer coupling.     

In situ resistivity and magnetoresistance studies of Co/Au(111) single layers and bilayers

We report here on resistance and magnetoresistance (MR) studies of ultrathin Co/Au(111) single sandwiches and bilayers with perpendicular magnetization. Resistance of the films was measured in situ in ultrahigh vacuum, during depositions and as a function of a perpendicular applied magnetic field. A large MR variation with the thickness of Au coverage was observed and compared to calculations. The coercive field of the Co films shows a drastic variation with the Au coverage thickness, which reflects the theoretical anisotropy variation. It was measured as a function of temperature. For the first time, the effect of interlayer interaction on the resistivity of a Co bilayer during the growth of Co top layer, is evidenced and compared to calculations. Finally, hysteresis loops of strongly antiferromagnetically coupled bilayers are investigated. Received 3 November 1998 and Received in final form 18 January 1999     

Influence of the roughness on the exchange bias effect of NiFe/FeMn/NiFe trilayers

We have studied the effect of roughness on the exchanged biased NiFe/FeMn/NiFe trilayers system. The samples were prepared under three different argon working pressures (2, 5 and 10 mTorr) to obtain different roughness degrees. The root mean square roughness of the NiFe/FeMn interfaces enhances as the argon working pressure during the deposition increases from 2 to 10 mTorr. High-angle X-ray diffraction reveals that the samples have 1 1 1 texture and besides, possible changes in grain size could be an extra contribution to the interfacial roughness. Magnetometry measurements have shown that the coervive field enhances as the root mean square roughness of the NiFe/FeMn interfaces increases, while the dependence of the exchange bias field runs in the opposite way.     

Effect of nano-oxide layers on giant magnetoresistance in pseudo-spin-valves using Co2FeAl electrodes

We studied the pseudo-spin-valves (PSVs) with a structure of Ta/Co₂FeAl/NOL₁/Co₂FeAl/Cu/Co₂FeAl/NOL₂/Ta, where NOL represents the nano-oxide layer. Compared with the normal Co₂FeAl (CFA) PSV with a structure of Ta/Co₂FeAl/Cu/Co₂FeAl/Ta, which shows only a current-in-plane (CIP) giant magnetoresistance (GMR) of 0.03%, the CFA PSV with NOLs shows a large CIP-GMR of 5.84%. The enhanced GMR by the NOLs inserted in the CFA PSV is due to the large specular reflection caused by [(CoO)(Fe₂O₃)(Al₂O₃)] in NOL₁ and [(Fe₂O₃)(Al₂O₃)(Ta₂O₅)] in NOL₂. Another reason is that the roughness of the interface between Ta and CFA is improved by the oxidation procedure.