利用预失真条纹校正PMP系统投影仪畸变的研究*

依据摄像机畸变模型提出了一种投影条纹相位畸变校正方法来简化相位-高度映射关系.该方法首先通过投两套互相垂直的相移正弦条纹,以相位值代替投影仪像素坐标,将投影仪当成摄像机看待,标定出投影仪的内参量.然后根据标定出的投影仪镜头畸变参量对理想相位施加反向的畸变,在投影时反向畸变的光栅通过镜头畸变,又成为理想的光栅,从而简化了相位-高度映射关系.实验中,虽然由于测量误差的影响,校正后的投影仪径向畸变系数还是比原来小了1个数量级.     

一种新的基于条纹投影的三维轮廓测量系统模型

提出一种新的光栅条纹投影轮廓测量术系统模型,新模型不要求测量系统满足光心连线平行于参考面、成像系统光轴垂直于参考面以及两光轴相交于参考面上等约束条件,只需投射至参考平面的正弦光栅条纹之间相互平行,简化了系统校准过程,有利于现场测量。得到的高度相位映射关系式中,待标定的系数与像点的坐标无关,不需要对每一个像点进行采样,能够减少系统标定所需的时间。实验表明:所提方法使投影装置和成像系统的位置校准过程简单,提高了系统标定的速度,且具有较高的测量精度,能够测量复杂面形的物体,增强了光栅投影三维测量系统的实用性。     

基于相位标靶的投影仪畸变测量与校正

针对传统的投影仪畸变标定方法系统结构和理论推导复杂等问题,提出一种基于相位标靶的投影仪畸变测量和校正方法.该方法以附有全息投影膜的液晶显示屏作为相位标靶,液晶显示屏依次显示水平和垂直方向的正弦条纹图像,投影仪向相位标靶依次投射水平和垂直方向的正弦条纹图像,并分别计算显示条纹和反射条纹的绝对相位.利用两组相位在相机像素上...     

PMD光学元件面形测量中的镜头畸变校正研究

相位测量偏折术(PMD)是近几年在光学测量领域内普遍使用的一种非接触式的高精度测量方法,该方法需要CCD相机拍摄经被测光学元件反射的在显示屏上显示的条纹图,而CCD自身存在的镜头畸变会对测量精度产生一定的影响。为避免这一影响,提出了在梯形畸变和镜头畸变同时存在的情况下保留梯形形状而只校正镜头畸变的矢量Zernike多项式校正方法。该方法首先利用光轴与被拍摄面的交点及相机和被拍摄面的相对位置来求取与光轴垂直的辅助面上的标准图,然后利用矢量Zernike多项式拟合标准图与畸变图的坐标得到二者的映射关系,接着运用得到的映射关系对畸变图进行校正。实验结果表明:提出的畸变校正方法可以有效地降低测量误差,提高测量精度。     

新的基于条纹投影轮廓测量的系统标定方法

提出一种新的光栅条纹投影轮廓测量术系统标定模型,新模型不要求投影装置和成像系统的光心连线与参考面平行、成像系统的光轴垂直于参考面及投影装置和成像系统的光轴相交。基于该模型得出了新的相位高度映射关系,其待定系数与成像点的坐标无关。实际测量中只需2个高度不同的标准块便可以求得待定系数。对4个标准块进行高度测量,得到的最大相对误差为0.6%。实验证明:该标定方法简单有效,提高了系统标定的可操作性和测量精度。     

新的基于条纹投影轮廓测量的系统标定方法

提出一种新的光栅条纹投影轮廓测量术系统标定模型,新模型不要求投影装置和成像系统的光心连线与参考面平行、成像系统的光轴垂直于参考面及投影装置和成像系统的光轴相交。基于该模型得出了新的相位高度映射关系,其待定系数与成像点的坐标无关。实际测量中只需2个高度不同的标准块便可以求得待定系数。对4个标准块进行高度测量,得到的最大相对误差为06%。实验证明:该标定方法简单有效,提高了系统标定的可操作性和测量精度。     

基于载频条纹相位分析的畸变测量和校正

为了对图像畸变进行测量和校正,利用纵向朗奇(Ronchi)载频条纹作为测量模板,通过成像系统获取畸变光栅条纹.运用傅里叶变换对畸变条纹图像进行频谱分析、滤波提取基频信息,直接从畸变图像的中心无畸变区域提取理想条纹像信息.通过相位分析提取包裹相位并解包,获得畸变光栅条纹的径向畸变相位分布规律.将该分布规律转化为径向位置畸变分布规律,并结合双线性插值灰度重建对畸变图像进行校正.实验结果证明该方法是有效的.     

正交光栅相移轮廓术的相位误差分析及其校正

正交光栅投影的相移轮廓术(PSP),可通过某一特定方向的相移(常利用相移调节因子来控制相移方向),获取两个相互正交的相位.但该方法对系统的非线性响应敏感,且目前尚未被深入讨论.为此,分析了系统的非线性响应对正交光栅相移轮廓术测量的影响,推导了带有非线性误差的相位表达式,并分析了两个方向相位相互串扰的原因.在此基础上,分...     

基于概率密度函数的彩色相位测量轮廓术校正

在彩色相位测量轮廓术中,光电器件多个光通道之间的颜色串扰、强度响应不均等因素的影响,使得所获取的相移条纹图像失真,因此采用传统的相位技术求解相位会产生极大的相位误差。从彩色条纹图像的数学模型出发,分析了彩色成像器件所获取的红绿蓝三通道条纹图像特性,提出一种两步校正方法：第一步是基于三通道均值及标准差实现对各颜色通道图像强度的归一化处理;第二步是使用概率密度函数曲线搜索失真后的实际相移量,抑制相移量不准确对测量结果的影响。所提方法不需要对系统的耦合系数和相移偏移量进行预校正,可实现简便、快速的相位误差补偿。模拟及实验结果验证了该方法的有效性。     

采用条纹分析的镜头畸变测量与校正

针对目前条纹模板测量法在图像畸变校正中所存在的过校正问题,文章采用载频条纹相位解调分析结合畸变模型实现对镜头桶形畸变的测量与校正.以载频条纹图像作为校正模板,使用广角镜头相机进行拍摄,获得畸变条纹图像;采用具有高空间局域特性的四步相移分析方法进行相位解调,获得畸变中心位置以及径向畸变量分布;根据桶形径向畸变的偶数阶多项...     

Flexible digital projector calibration method based on per-pixel distortion measurement and correction

When a digital projector is applied in high precision applications, the intrinsic parameters and distortion characteristics should be calibrated precisely. In this paper, a flexible full-field projector calibration method is proposed without any approximate distortion model. With planar homography theory and fringe projection technique, the projector distortion characteristic on each pixel can be measured independently and an initial distortion map is generated. The intrinsic parameters are calibrated afterwards. Then, the initial distortion map can be refined by correcting the non-perpendicularity between the optical axis and image plane. The original pattern to be projected is corrected with the refined distortion map. Thus, the calibrated projector can be regarded as an ideal projector conforming to the pinhole model. Experimental results show a nearly ideal residual map for the corrected projection pattern. In addition, the proposed calibration method is flexible without any sophisticated ancillary equipment or complicated procedure.     

Lens distortion elimination for improving measurement accuracy of fringe projection profilometry

Fringe projection profilometry (FPP) is a powerful method for three-dimensional (3D) shape measurement. However, the measurement accuracy of the existing FPP is often hindered by the distortion of the lens used in FPP. In this paper, a simple and efficient method is presented to overcome this problem. First, the FPP system is calibrated as a stereovision system. Then, the camera lens distortion is eliminated by correcting the captured images. For the projector lens distortion, distorted fringe patterns are generated according to the lens distortion model. With these distorted fringe patterns, the projector can project undistorted fringe patterns, which means that the projector lens distortion is eliminated. Experimental results show that the proposed method can successfully eliminate the lens distortions of FPP and therefore improves its measurement accuracy.     

Analysis of phase distortion in phase-shifted fringe projection

This paper describes the analysis of phase distortion in phase-shifted fringe projection method. A phase distortion occurs when the phase shifting technique is applied to extract the phase values from projected fringe patterns in surface contouring. The phase distortion will induce measurement errors especially in the measurement of micro-components. The cause of such phase distortion is investigated and the influence of phase distortion on the measurement of micro-components is discussed. To eliminate the phase distortion, a continuous wavelet transform (CWT) is employed to extract phase values from object surface modulated fringe patterns. Principle of the proposed CWT phase extraction method is described and experiments are conducted to verify the proposed method. It is shown that by the use of CWT phase extraction method phase distortion induced in conventional phase-shifting technique can be completely eliminated.     

An improved stair phase encoding method for absolute phase retrieval

An improved phase unwrapping method is proposed to reduce the projection fringes in three-dimensional (3D) surface measurement. Color fringe patterns are generated by encoding with sinusoidal fringe and stair phase fringe patterns in red and blue channels. These color fringe patterns are projected onto the tested objects and then captured by a color CCD camera. The recorded fringe patterns are separated into their RGB components. Two groups of four-step phase-shifting fringe patterns are obtained. One group of the stripes are four sinusoidal patterns, which are used to determine the wrapped phase. The other group of stripes are four sinusoidal patterns with the codeword embedded into stair phase, whose stair changes are perfectly aligned with the 2π discontinuities of sinusoidal fringe phase, which are used to determine the fringe order for the phase unwrapping. The experimental results are analyzed and compared with those of the method in Zheng and Da (2012. Opt Express 20(22):24139–24150). The results show that the proposed method needs only four fringe patterns while having less error. It can effectively reduce the number of projection fringes and improve the measuring speed.     

Transformation of phase to (x,y,z)-coordinates for the calibration of a fringe projection profilometer

In this work we present a phase to (x,y,z)-coordinates transformation method for the calibration of a fringe projection profilometer. Our technique is divided in two parts: (1) phase to z transformation (for axial calibration) based on the typical polynomial fitting which uses a flat plane placed at several z positions to measure the phase of the projected fringes. (2) Phase to x and y transformation (for transverse calibration) based on the use of a crossed gratings pattern and a Fourier phase measurement method to determine x and y coordinates at several z positions. As will be shown the use of the crossed gratings pattern and the Fourier phase measurement method for transverse calibration is advantageous in several aspects: an unique image can give us x and y information at once. It provides x and y coordinates at each pixel in the image avoiding the use of interpolation methods. We present some experimental results and explain the viability of the proposed technique.     

Application of robust color composite fringe in flip-chip solder bump 3-D measurement

This study developed a 3-D measurement system based on flip-chip solder bump, used fringes with different modulation intensities in color channels, in order to produce color composite fringe with robustness, and proposed a multi-channel composite phase unwrapping algorithm, which uses fringe modulation weights of different channels to recombine the phase information for better measurement accuracy and stability. The experimental results showed that the average measurement accuracy is 0.43μm and the standard deviation is 1.38 µm. The results thus proved that the proposed 3-D measurement system is effective in measuring a plane with a height of 50 μm. In the flip-chip solder bump measuring experiment, different fringe modulation configurations were tested to overcome the problem of reflective coefficient between the flip-chip base board and the solder bump. The proposed system has a good measurement results and robust stability in the solder bump measurement, and can be used for the measurement of 3-D information for micron flip-chip solder bump application.     

Measurement of transparence topography based on principal component analysis

An algorithm based on the principal component analysis (PCA) is proposed to measure transparent surface topography. First, many frames of random phase shifted fringe patterns are captured. Second, the first and second principal components are extracted from the phase shifted fringe patterns by PCA. Then, the phase is calculated from principal components. Finally, the correct global phase sign is determined by the clustering method considering local fringe phase monotonicity. The experimental results show that the proposed method can directly extract the three-dimensional (3D) shape, which does not need to determine the amount of phase shift, without precise phase shifter. It reduces the experimental hardware requirements and improves its adaptability in profilometry.     

铁掺杂PMP泡沫制备工艺研究

 以聚-4-甲基-1-戊烯为泡沫骨架，二茂铁为掺杂材料，通过热诱导倒相技术制备出铁掺杂聚合物泡沫。掺杂泡沫的实际密度均高于理论密度，且沿轴向从上至下逐渐增大。在理论密度不变的情况下，掺杂泡沫实际密度随掺杂元素原子百分含量的升高而呈降低趋势。与PMP泡沫相比，掺杂泡沫的孔洞直径分布变宽且网络骨架尺寸有变大的趋势。