共查询到19条相似文献,搜索用时 93 毫秒
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使用新型的WSM-T-Ⅱ型台式迈克尔逊干涉仪可以测量氦氖激光波长,传统的数据处理方法是逐差法,计算量大,既繁琐又容易出错。用Matlab软件的编程法处理实验测得的数据,程序运行后可以直接得到氦氖激光波长及相应的误差分析,无需进行运算,准确而快捷,是大学物理实验教学中实验数据处理的一种新方法。 相似文献
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用逐差法和Origin7.0软件分别对用迈克尔逊干涉仪测量氦氖激光的波长的实验数据进行处理,结果表明,利用Origin7.0软件处理实验数据,快捷而且准确,避免了人为因素所造成的误差,是大学物理实验数据处理上方法上的一种创新。 相似文献
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迈氏干涉仪测光波长的系统误差 总被引:1,自引:0,他引:1
迈氏干涉仪测光波长的系统误差王澜涛,郑乔(石家庄铁道学院,050043)在迈克尔逊干涉仪上,利用点光源的非定域干涉圆条纹测激光波长,测值往往偏大.这一偏大的系统误差主要是由反射镜M1与M2的像不平行[1]以及M1与精密丝杠的轴线不垂直这两方面共同产生... 相似文献
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利用光学拍频法可实现稳频He-Ne激光波长稳定度的测量以及波长不确定度的评定。报道了一种可应用于测量现场的便携式633nm激光波长评价系统,介绍了拍频测量技术原理、激光波长评价系统的基本构成以及与非便携式的传统拍频系统测量激光波长的比对结果。波长评价系统对传统光学拍频光路部分进行了改进并集成为一个便携测量系统,系统采用了全新设计的集成式光学拍频模块、小型化高精度频率计以及频谱监测仪器实现了高信噪比拍频信号的产生、计数与监测,并自主开发了拍频测量数据采集、处理与分析软件。实验结果表明该系统能够在测量现场实现激光波长的稳定度以及不确定度评价,提升了现场测量的便捷性以及测量效率。 相似文献
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We revealed that the phase function of a thin-film structure measured by a white-light spectral interferometric technique
depends on the path length difference adjusted in a Michelson interferometer. This phenomenon is due to a dispersion error
of a beam splitter cube, the effective thickness of which varies with the adjusted path length difference. A technique for
eliminating the effect in measurement of the phase function is described. In a first step, the Michelson interferometer with
same metallic mirrors is used to measure the effective thickness of the beam splitter cube as a function of the path length
difference. In a second step, one of the mirrors of the interferometer is replaced by a thin-film structure and its phase
function is measured for the same path length differences as those adjusted in the first step. In both steps, the phase is
retrieved from the recorded spectral interferograms by using a windowed Fourier transform applied in the wavelength domain. 相似文献
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This study proposes a modified dual-wavelength heterodyne Michelson interferometer for measuring the absolute distance that can avoid the influence of wavelength drifts. This modified interferometer consists of two conventional Michelson interferometers. A standard plate is introduced in one arm of one Michelson interferometer. The phase differences of p- and s- polarization test lights in the two interferometers can be measured accurately by dual-wavelength heterodyne interferometry. Hence, the absolute distance can be determined by substituting the phase differences into special derived equations. Meanwhile, the test lights suffer from the same wavelength drift effect. Therefore, the negative effect caused by the drift can be offset, and the measurement stability can be significantly increased. The feasibility of this method was demonstrated with a measurement resolution of about 1.36 μm. Additionally, this method has a simple structure, easy operation and rapid measurement. 相似文献
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We have applied wavelength scanning interferometry to Fizeau interferometer for surface profilometry. This interferometer is free from ambiguity of the sign in the measurement result. It is more compact in setup than the Michelson interferometer used previously. Experimental results from a step and a dip on a mirror surface are shown. In the focal depth of imaging system, we could measure a mirror surface with less than standard deviations of 20 μm including quantization error in frequency analysis. We also could measure the surface shape of a coin. Origins of the noises appearing in the results are also discussed. 相似文献
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A dual interferometric displacement measurement system is presented where a Wollaston prism interferometer is employed in conjunction with a normal Michelson interferometer. The system operates without the use of external polarizers, apart from those associated with the Wollaston prism interferometer itself. It is shown that an optical path difference induced in the Michelson interferometer can be detected using the Wollaston prism in a normal interferometer arrangement. Further, the interference pattern produced by the Wollaston prism interferometer changes in a measurable, linear fashion as the optical path difference from the Michelson interferometer alters. A simple theoretical analysis of the system is presented and used to derive a computer model of the optical arrangement. Results from an experimental implementation of the system, using a Wollaston prism with a beam separation of 0.5 degrees and a superluminescent diode, of wavelength 825 nm, as a light source, are included and compared to the results from the computer model. 相似文献
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We present a white-light spectral interferometric technique employing a low-resolution spectrometer for a direct measurement of the dispersion of the ordinary and extraordinary group refractive indices of a quartz crystal over the wavelength range approximately from 480 to 860 nm. The technique utilizes a dispersive Michelson interferometer with the quartz crystal of known thickness to record a series of spectral interferograms and to measure the equalization wavelength as a function of the displacement of the interferometer mirror from the reference position, which corresponds to a balanced non-dispersive Michelson interferometer. We confirm that the measured group dispersion agrees well with that described by the dispersion equation proposed by Ghosh. We also show that the measured mirror displacement depends, in accordance with the theory, linearly on the theoretical group refractive index and that the slope of the corresponding straight line gives precisely the thickness of the quartz crystal. 相似文献
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基于分步式压印光刻的激光干涉仪纳米级测量及误差研究 总被引:1,自引:1,他引:0
针对在未做隔离保护处理的环境中,基于Michelson干涉原理的激光干涉仪测量系统存在严重的干扰误差,不适合分步式压印光刻纳米级对准测量的要求.采用Edlen公式的分析及计算,不仅在理论上揭示出环境温度、湿度、气压等变化对激光干涉仪测量准确度的影响,而且证明影响测量准确度的最大干扰源是空气流动的结果.通过气流隔离措施和系统测量反馈校正控制器,能够实时补偿激光干涉仪两路信号的相差.最终,测量漂移误差在10 min内由13 nm降低到5 nm以内,满足压印光刻在100 mm行程中达到20 nm定位准确度要求. 相似文献
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针对拼接式大口径望远镜主镜,提出一种基于迈克尔逊干涉原理基础上的宽带光谱(白光)干涉检测方法,对拼接子镜间相位误差进行实时检测,进而对失调子镜进行相应校正,以实现拼接子镜的共面排布。子镜间相位误差通过干涉图形间的不匹配性进行提取。应用双中心波长组合白光源来提高白光中心条纹的可见度,通过理论仿真,对不同中心波长组合的白光中心条纹可见度进行比较,结果表明:该双中心波长组合白光源系统的应用,可以提高白光干涉中心条纹的信号分辨能力,借以提高检测精度,使得该白光干涉检测系统对拼接子镜间的相位失调误差进行高精度提取。 相似文献