Measurement of background components in wavelength dispersive X‐ray fluorescence spectrometry

Three components of the background have been investigated: first, characteristic radiation of the lamellas of the collimator excited by secondary x‐ray beam; second, secondary x‐ray beam scattered by the lamellas of the collimator; third, diffusive and incoherent scattering of the secondary x‐ray beam by the focusing crystal. The relationships between chemical content of the specimen and the intensity of the first and the second components were determined by a wavelength‐dispersive x‐ray spectrometer that has an energy‐dispersive x‐ray detector. The intensity of the third component was very low. It was not found in this experiment. Copyright © 2006 John Wiley & Sons, Ltd.     

Trace elemental determination by portable total reflection X‐ray fluorescence spectrometer with low wattage X‐ray tube

A specimen containing nanograms of Sb, rare earth elements, Pb, and Bi and a specimen containing a few nanograms each of As and Pb were measured using a portable total reflection X‐ray fluorescence spectrometer. Nanograms of Sb, rare earth elements, Pb, and Bi were detected. Although the As Kα line (10.54 keV) overlapped with the Pb Lα line (10.55 keV) in a spectrum of the specimen containing nanograms of As and Pb, the Pb Lβ line was detected. Therefore, the net intensity of the As Kα line was calculated using the Pb Lα/Lβ intensity ratio in a spectrum of a Pb standard solution and the net intensity of the Pb Lβ line in the spectrum of the specimen containing As and Pb. This result indicates that these two elements can be quantified by using the portable spectrometer. Commercially available bottled drinking water was also measured. The portable spectrometer detected several tens of ppb of V in the drinking water sample. Copyright © 2013 John Wiley & Sons, Ltd.     

X‐ray fluorescence spectrometry in Dar es Salaam

Energy‐dispersive x‐ray fluorescence (EDXRF) analysis has been established at the University of Dar es Salaam, Faculty of Science, Department of Physics. Calibration was conducted using thin films from Micromatter (USA) for secondary target XRF. We report on the performance of the spectrometer including the detection limits attained, which range from 0.01 to 10 ng cm^?2 using collimators of 6 and 8 mm diameter under excitation conditions of 50 kV, 35 mA. The accuracy of the measurements was checked using IAEA SOIL‐7 and NIST 3087a Certified Reference Materials. The experimental values differed by <5% from the certified values. The total reflection x‐ray fluorescence (TXRF) facility added as a module to the existing XRF system provides detection limits between 0.1 and 100 pg for most of the elements measured. Copyright © 2005 John Wiley & Sons, Ltd.     

Trace element determinations in uranium by total reflection X‐ray fluorescence spectrometry using polychromatic X‐ray excitation

Suitability of polychromatic X‐rays has been assessed for the total reflection X‐ray fluorescence (TXRF) trace elemental determinations in aqueous solutions as well as uranium oxide certified reference materials. The method involves total reflection of X‐rays below a certain energy level on the TXRF sample support and exciting the analytes present in ng amount on these supports, measuring the TXRF spectra, processing the spectra, and finally determining the elemental concentrations. For uranium‐based samples, the samples were dissolved, main matrix uranium was separated from these solutions using solvent extraction, and trace elements were determined using aqueous phase following above approach. The method is simple and easier to implement compared with the monochromatic excitation but has similar or in some cases better detection limits compared with those obtained using monochromatic excitation. The details of the methodology, quality of analytical results, and detection limits are described and compared with those obtained using monochromatic excitation. Copyright © 2017 John Wiley & Sons, Ltd.     

Microfluidic sample preparation for elemental analysis in liquid samples using micro X‐ray fluorescence spectrometry

The integration of microfluidic devices with micro X‐ray fluorescence (micro‐XRF) spectrometry offers a new approach for the direct characterization of liquid materials. A sample presentation method based on use of small volumes (<5 µl) of liquid contained in an XRF‐compatible device has been developed. In this feasibility study, a prototype chip was constructed, and its suitability for XRF analysis of liquids was evaluated, along with that of a commercially produced microfluidic device. Each of the chips had an analytical chamber which contained approximately 1 µl of sample when the device was filled using a pipette. The performance of the chips was assessed using micro‐XRF and high resolution monochromatic wavelength dispersive X‐ray fluorescence, a method that provides highly selective and sensitive detection of actinides. The intended application of the device developed in this study is for measurement of Pu in spent nuclear fuel. Aqueous solutions and a synthetic spent fuel matrix were used to evaluate the devices. Sr, which has its Kα line energy close to the Pu Lα line at 14.2 keV, was utilized as a surrogate for Pu because of reduced handling risks. Between and within chip repeatability were studied, along with linearity of response and accuracy. The limit of detection for Sr determination in the chip is estimated at 5 ng/µl (ppm). This work demonstrates the applicability of microfluidic sample preparation to liquid characterization by XRF, and provides a basis for further development of this approach for elemental analysis within a range of sample types. Copyright © 2014 John Wiley & Sons, Ltd.     

Chemical analysis of very small‐sized samples by wavelength‐dispersive X‐ray fluorescence

The chemical characterisation of very small‐sized samples is often of major interest in forensic analysis, studies of artworks, particulate matter on filters, raw materials impurities, and so on, although it generally poses considerable problems owing to the difficulty of obtaining precise and accurate results. This study was undertaken to develop a set of methods for the chemical characterisation of very small‐sized samples by wavelength‐dispersive X‐ray fluorescence. To conduct the study, sample preparation (as beads and pellets) and measurement conditions were optimised to reach the necessary detection and quantification limits and to obtain the appropriate measurement uncertainty for characterising the types of materials involved. The measurements were validated by using reference materials. Three test methods were developed. In two methods, the samples were prepared in the form of beads (one method being for geological materials and the other for the analysis of nongeological materials such as particulate matter on filters, glasses, frits, and ceramic glazes and pigments). In the third method, the samples were prepared in the form of pellets for the analysis of volatile elements in geological materials. In the three methods, detection limits, quantification limits and measurement uncertainties were obtained similar to those found when a bead or pellet is prepared by the usual methods from 0.5 g sample. However, in this study, sample size was between 30 and 40 times smaller in the case of beads and 100 times smaller in the case of pellets, thus broadening the range of possible wavelength‐dispersive X‐ray fluorescence applications in the chemical characterisation of materials. Copyright © 2012 John Wiley & Sons, Ltd.     

Analysis of engine motor oils by X‐ray absorption and X‐ray fluorescence spectroscopies

The molecular structure of lubricating motor oils is investigated by X‐ray absorption fine structure spectroscopy measurements. Both fresh and used oils are studied. Although the Zn K‐edge spectra gave information about the degradation of the antiwear/antioxidant zinc dialkyl dithiophosphate (ZDDP) additives within the oil, Fe K‐edge spectra are representatives for iron species dispersed in the oil during operation at elevated temperatures and pressures in the engine. The detailed analysis of the measured data shows that substantial differences are detectable in the spectra of the fresh and used oil. Our results show that the Zn–S bonds of the ZDDP are decomposed during the operation, resulting in Zn–O bonds instead. Furthermore, sixfold Fe–O bonds similar to those in Fe₂O₃ are found within the used oil, suggesting the presence of debris from the antiwear film of lubricated motor parts in the used oil. Copyright © 2014 John Wiley & Sons, Ltd.     

Using chemometric methods for overlap correction of sodium–zinc spectral lines generated by wavelength dispersive X‐ray fluorescence in mineral samples

Partial least squares, principal component regression and support vector machine multivariate methods were used for overlap correction of sodium–zinc (Na(Kα)–Zn(Lα)) spectral lines generated by means of wavelength dispersion X‐ray fluorescence (WDXRF) combined with standard‐less software (IQ+) technique for the analyses of mineral samples. This methodology uses one scan channel using PX1 analyzer crystal, 550‐µm collimator, flow detector (Ar + CH₄), and rhodium (Rh) tube for determination of Na and Zn in mineral compositions in minimum time. The calibration matrix was made up of 35 samples containing different amounts of Na₂O and ZnO. The considered concentration ranges were 0–5% for both Na₂O and ZnO. The values for 2θ angle were recorded between 25° and 29.9° at every 0.1°. Variable tube powers (kV ? mA) were used to investigate the effect of tube power on the analyses of elements. The validation of the multivariate methods was realized by analyzing soil samples. Atomic absorption and flame photometry methods were used as reference methods for analyzing Zn and Na in the soil samples, respectively. The results of using chemometric methods, WDXRF (standard‐less software) and reference method determined partial least squares and support vector machine models obtained more acceptable results for Na₂O in presence of ZnO than those of WDXRF (standard‐less software). Copyright © 2013 John Wiley & Sons, Ltd.     

Determining the elemental composition of Calotropis procera using X‐ray Analytical Microscopy

Caloptropis procera (Oshar) is a desert plant that did not receive much attention from the science community. The objective of this study was to investigate the elemental composition of the different parts of the plant using an X‐ray analytical microscope, to identify the elements naturally present in the plant and in the future detect the presence of any contaminants absorbed by the plants from the surrounding environment. Stalks, leaves and flowers from three Oshar plants were qualitatively and quantitatively analyzed. Leaves were scanned to establish the elemental spatial distribution within individual leaves. Subsequently, parts of the plants were dried, crushed and pulverized, then analyzed to determine elemental concentrations. The major elements present throughout the plant were Cl, K and Ca with varied concentrations. Other elements (Mg, Si, P, Fe, Sr, Mn and Br) are present in the leaf with various low concentrations of <5%. Major, minor and trace elements present in the various plant parts were determined. The outcome of this study will be used as a pilot for further investigations pertaining to the utilization of the Oshar plant for environmental cleaning purposes. Copyright © 2012 John Wiley & Sons, Ltd.     

Application of energy dispersive X‐ray fluorescence spectrometry for the characterization of plastic materials in synthetic polymer conservation work

Plastic artifacts archived in museums deteriorate with time and require proper care by conservators to prevent their degradation and to maintain the objects in good condition. Degradation processes depend on the type of plastic and conditions of storage. Knowledge of the chemical composition of plastic artifacts is thus very important and facilitates conservation work. The capabilities of energy dispersive X‐ray fluorescence spectrometry with monochromatic excitation were investigated for possible characterization of the plastic materials used in artifacts from museum collections. For this purpose, a simple and suitable nondestructive analytical protocol was developed on the basis of the intensity of the coherent and the incoherent scattered excitation radiation from artifacts, compared with scattering from typical plastic materials such as polyethylene, polyvinyl chloride, and polypropylene. Fifteen plastic artifacts, such as souvenirs, household wares, and toys, were characterized in this way according to their chemical composition. Copyright © 2012 John Wiley & Sons, Ltd.     

Plant elemental composition and portable X‐ray fluorescence (pXRF) spectroscopy: quantification under different analytical parameters

Emergence of portable X‐ray fluorescence (pXRF) systems presents new opportunities for rapid, low‐cost plant analysis, both as a lab system and in situ system. Numerous studies have extolled the virtues of using pXRF for a wide range of plant applications, however, for many such applications, there is need for further assessment with regards to analytical parameters for plant analysis. While pXRF is a potential powerful research tool for elemental composition analysis, its successful use in plant analysis is made more likely by having an understanding of X‐ray physics, calibration process, and ability to test a variety of homogenous and well‐characterized materials for developing a matrix‐specific calibration. Because potential pXRF users may often underestimate the complexity of proper analysis, this study aims at providing a technical background for plant analysis using pXRF. The focus is on elemental quantification under different analytical parameters and different methods of sample presentation: direct surface contact under vacuum, placement in a sample cup with prolene as a seal, and without the aid of a vacuum. Direct analysis on the surface of a pXRF provided highest sensitivity and accuracy (R² > 0.90) for light elements (Mg to P). Sulfur, K, and Ca can be reliably measured without the aid of a vacuum (R² > 0.99, 0.97, and 0.93 respectively), although lower detection limits may be compromised. pXRF instruments provide plant data of sufficient accuracy for many applications and will reduce the overall time and budget compared with the use of conventional techniques. Sensitivity and accuracy are dependent on the instrument's settings, make, and model. © 2015 The Authors. X‐Ray Spectrometry published by John Wiley & Sons, Ltd.     

Background estimation based on Fourier Transform in the energy‐dispersive X‐ray fluorescence analysis

This paper discusses a new method of background estimation in the energy‐dispersive X‐ray fluorescence (EDXRF) analysis, which is based on Fourier Transform (in this paper, we call it Fourier Transform background estimation method). Compared with the Sensitive Nonlinear Iterative Peak method, the new method has the feature of FWHM independence. It has been proved that a background can be estimated automatically and accurately by the new method in the synthesized spectrum and the spectra from measurement. Fourier Transform background estimation method can estimate the background accurately in the EDXRF spectrum using an X‐ray tube source. Copyright © 2011 John Wiley & Sons, Ltd.     

Application of X‐ray fluorescence spectrometry on quality control of scintillation crystals

The major components PbO and WO₃ in PWO crystals, Bi₂O₃ and GeO₂ in BGO crystals, as well as Gd, La, Nb, Mg, Mo, Bi, Sb and Y doped in PWO crystals and Eu doped in BGO crystals were successfully determined with X‐ray fluorescence spectroscopy (XRF) using fusion techniques. Calibration standards were synthesized with high‐purity oxides and standard solutions. The analysis results can meet the general requirements of the quality control of the crystal growth and research purpose. The relative standard deviations for Bi₂O₃, GeO₂, PbO and WO₃ are 0.21%, 0.18%, 0.25% and 0.22%, respectively (k = 8). The detection limits for dopants in PWO are below 5 µg/g for Gd, La, Nb, Mo, Sb and Y and below 20 µg/g for Mg and Bi. The detection limits for Eu doped in BGO are 8 µg/g. The testing results of XRF were compared with those of inductively coupled plasma optical emission spectroscopy. It was found that the relative differences of the testing results between the two methods are less than 10% for most dopants in PWO crystals. Copyright © 2011 John Wiley & Sons, Ltd.     

Determination of effective atomic numbers and mass attenuation coefficients of samples using in‐situ energy‐dispersive X‐ray fluorescence analysis

The matrix effect has a major impact on energy‐dispersive X‐ray fluorescence analysis (EDXRFA) and is difficult to be evaluated due to that the contents of some low‐atomic‐number elements cannot be identified by in‐situ EDXRFA. Up to today, the fundamental parameter algorithm proposed by Rousseau has been widely applied to correct the matrix effect. Accordingly, determining the matrix and mass attenuation coefficient (μ/ρ) of sample is a key issue for the fundamental parameter algorithm. In present work, the method to deduce μ/ρ by effective atomic number (Z_eff) was studied. First, the relationship between Z_eff and coherence to Compton scatting ratio (R) of the incident X‐ray was determined by standard samples. Then, we deduce Z_eff and their μ/ρ. The value of μ/ρ deduced by our method is in good agreement with that calculated by WinXCOM, and the relative change (Δ) is less than 7%. We also deduced Z_eff and their μ/ρ of Chinese national standard soil samples employing our method and good agreement with the calculated values were also obtained. We found that the agreement between experimental values of μ/ρ with theoretical values by WinXCOM still exists when the energy of the incident X‐ray is greater than 4 keV, and the Δ is less than 10%. The result indicates that our method may be applied directly to in‐situ EDXRFA.     

X‐ray tube spectral measurement method for quantitative analysis of X‐ray fluorescence analysis

Lα and Lβ X‐ray fluorescence spectra of a lead metallic sheet were measured using an energy dispersive X‐ray spectrometer by changing the X‐ray tube voltage and the material of the primary filter. The Lα to Lβ intensity ratio changed from Lα: Lβ = 3: 1 at 15 kV to Lα: Lβ = 1: 1 at 50 kV depending on the X‐ray tube voltage and the filter. The scattered X‐ray spectra of an acrylic slab instead of the sample in the sample holder were measured by changing the applied voltage and the material of the primary filter. The calculated values of the Pb Lα/Lβ intensity ratio of the metallic sheet using the Shiraiwa–Fujino formula by inserting the scattered X‐ray spectra of an acrylic plate as incident X‐ray spectra and the fundamental parameters taken from the Elam database were in good agreement with the experimental ones. We conclude that we can obtain an incident X‐ray spectrum approximately by measuring the scattered X‐ray spectrum without measuring the direct incident beam. Copyright © 2010 John Wiley & Sons, Ltd.     

Determination of Cr(III) and Cr(VI) in water by wavelength‐dispersive X‐ray fluorescence spectrometry after preconcentration with an ion‐exchange resin disk

A rapid and simple method using an ion‐exchange resin disk combined with wavelength‐dispersive X‐ray fluorescence (WDXRF) spectrometry was developed for the determination of Cr(III) and Cr(VI) in water. A 100‐ml water sample was first adjusted to pH 3 with nitric acid and then passed through an anion‐exchange resin disk placed on top of a cation‐exchange resin disk at a flow rate of 1 ml min^?1 to separate Cr(III) and Cr(VI). Anionic Cr(VI) was preconcentrated on the upper anion‐exchange resin disk, whereas cationic Cr(III) was preconcentrated on the lower cation‐exchange resin disk. Each ion‐exchange resin disk was dried at 100 °C for 30 min in an electric oven and coated with a commercially available laminate film. The specimens were measured using a WDXRF spectrometer. The calibration curves of Cr(III) and Cr(VI) showed good linearity in the range 1–10 µg. The detection limits corresponding to three times the standard deviation (n = 5) of blank values were 0.17 µg for Cr(III) and 0.16 µg for Cr(VI). If a 1‐l water sample is used, these limits would be 0.17 and 0.16 µg l^?1, respectively. A spike test for 50 µg l^?1 Cr(III) and Cr(VI) in tap water and river water showed quantitative recoveries (94–114%), although this was not observed for mineral drinking water owing to the overlap of V Kβ with Cr Kα. The recovery after overlap correction was satisfactory (115%). Copyright © 2011 John Wiley & Sons, Ltd.     

X‐ray fluorescence analysis with a pyroelectric x‐ray generator

Several types of handy x‐ray fluorescence spectrometers are presented. The results obtained with a Niton spectrometer are presented as a goal to develop a laboratory‐made spectrometer using an Amptek Cool‐X pyroelectric x‐ray generator. A small and cheap charge‐up x‐ray emitting device and its spectrum are also presented. Handy x‐ray spectrometers are now progressing rapidly and the detection limits are in the range of a few ppm for certain elements. Copyright © 2005 John Wiley & Sons, Ltd.     

Energy dispersive X‐ray fluorescence analysis of archeological metal artifacts from the Final Bronze Age

Energy dispersive X‐ray fluorescence (EDXRF) is widely used in the study of archeological metal artifacts, heritage and art history, where the fragile nature of the objects requires the use of noninvasive techniques such as the EDXRF, which in addition, is fast and very affordable. An EDXRF analysis of copper‐based artifacts from Late Bronze Age metal hoards from Central Portugal is presented. The EDXRF measurements were carried out by using an X‐ray tube with a Mo anode and a commercial Si‐PIN detector. The data acquisition was performed by keeping small distances between the X‐ray window, the sample and the detector. Both patinated and polished areas were analyzed: the relative composition of the artifacts was inferred from the fluorescence spectra obtained. Copyright © 2012 John Wiley & Sons, Ltd.