End point of the rp process on accreting neutron stars

We calculate the rapid proton ( rp) capture process of hydrogen burning on the surface of an accreting neutron star with an updated reaction network that extends up to Xe, far beyond previous work. In both steady-state nuclear burning appropriate for rapidly accreting neutron stars (such as the magnetic polar caps of accreting x-ray pulsars) and unstable burning of type I x-ray bursts, we find that the rp process ends in a closed SnSbTe cycle. This prevents the synthesis of elements heavier than Te and has important consequences for x-ray burst profiles, the composition of accreting neutron stars, and potentially galactic nucleosynthesis of light p nuclei.     

Characterization of biological thin films at the solid-liquid interface by x-ray reflectivity

We demonstrate that 18 keV x-rays can be used to study organic thin films at the solid-liquid interface by x-ray reflectivity. We establish that this is a powerful technique for investigating biological systems in a previously inaccessible manner. Our measurements enabled the density distribution of single phospholipid bilayer membranes in bulk water to be measured with unprecedented precision. Previously, characterization of biomimetic structures normal to a "buried" interface was a domain of neutron reflectivity.     

Refinement of hydrogen positions in (NH4)2SeO4

The crystal structure of ammonium selenate has been studied by means of single crystal x-ray and neutron diffraction with the purpose of the refinement of hydrogen positions. The refined hydrogen positions obtained by single crystal neutron diffraction show that N-H bond lengths form a regular tetrahedron in an ammonium ion. The single crystal x-ray diffraction data show that N-H bond lengths are shorter than those obtained by neutron diffraction and are not equal between themselves. Thus, the comparison of the results of x-ray and neutron diffraction allows one to suggest that the shorter N-H bond lengths obtained by x-ray diffraction reflect the distribution of the electron charge density of ammonium ions within the (NH₄)₂SeO₄ crystal lattice. The text was submitted by the authors in English.     

Alloy-ceramic oxide multilayer mirrors for water-window soft x rays

Alloy-ceramic oxide multilayers of Ni(80)Nb(20)- MgO with 3.56-nm period have been made by use of the pulsed-laser deposition technique and characterized by means of grazing-incidence x-ray reflectivity. The interface roughness was found to be only ~0.35 nm at the two interfaces, Ni(80)Nb(20)- MgO and MgO-Ni(80)Nb(20), leading to a peak reflectivity of ~38% at the first order. The atomic structure in the two individual layers, Ni(80)Nb(20) and MgO, is found to be amorphous, in agreement with the deposition conditions. These multilayers can be used as mirrors for soft x rays in the angular range 18 degrees to 39 degrees , depending on the actual wavelength of radiation in the water-window region.     

Far ultraviolet absorption spectrum of the K+ ion in KCl

The reflectivity of KCl has been measured up to 45 eV with synchrotron radiation extending the range of previous measurements. The absorption coefficient is compared with an ab initio calculation using an orthogonalized-plane-wave expansion for the final states of the excited electron and including excitonic and crystalline effects. The distribution of the oscillator strength and its modulations are well reproduced by the theory.     

Structure and morphology of Cu/Ni film grown by electrodeposition method: A study of neutron reflectivity and AFM

We present detailed study of structure and interface morphology of an electrodeposited Cu/Ni film using X-ray diffraction, X-ray reflectivity, neutron reflectivity and atomic force microscopy (AFM) techniques. The crystalline structure of the film has been determined by X-ray diffraction, which suggest polycrystalline growth of the film. The depth profile of density in the sample has been obtained from specular X-ray and neutron reflectivity measurements. AFM image of the air-film interface shows that the surface is covered by globular islands of different sizes. The AFM height distribution of the surface clearly shows two peaks and the relief structure (islands) on the surface in the film, which can be treated as a quasi-two-level random rough surface structure. We have demonstrated that the detailed morphology of air-film interfaces, the quasi-two-level surface structure as well as morphology of the buried interfaces can be obtained from off-specular neutron reflectivity data. AFM and off-specular neutron reflectivity measurements also show that the morphologies of electrodeposited surface is distinctively different as compared to that of sputter-deposited surfaces in the sample.     

Anomalous x-ray reflectivity characterization of ion distribution at biomimetic membranes

Anomalous x-ray reflectivity measurements provides detailed information on ion binding to biomembrane surfaces. Using a monochromatic beam tuned to various x-ray energies at the Argonne National Laboratory Advanced Photon Source and utilizing a newly commissioned x-ray liquid surfaces reflectometer, measurements at and away from ion absorption edges allow determination of the distribution of these ions as they accumulate near lipid membranes. As a model, the interaction of Ba2+ ions with DMPA- (1,2-dimyristoyl-sn-glycero-3-phosphatidic acid) monolayers at the aqueous surface is studied. We find an unexpectedly large concentration of barium at the interface, approximately 1.5 per DMPA-, forming a Stern layer of bound ions and a cloud of less densely bound ions near the lipid headgroups. This result can be understood only if one assumes that bound cations are partially speciated, e.g., as BaOH+.     

In situ and interrupted-growth studies of the self-assembly of octadecyltrichlorosilane monolayers

We have examined the self-assembly process of octadecyltrichlorosilane on silicon using x-ray reflectivity. By comparing the commonly used "interrupted-growth" characterization technique with results obtained in situ, we have determined that quenching the growth and then rinsing and drying the sample introduces free area into the film, presumably by removal of non-cross-linked (physisorbed) molecules. Reintroduction of a quenched and rinsed film to solvent does not restore the thickness of the film to its previous value. We have also performed in situ growth studies over a range of concentrations. For all concentrations, we observe growth of islands of vertical molecules. The growth follows Langmuir kinetics, except at short times for low concentration solutions.     

Depth-dependent magnetism in epitaxial MnSb thin films: effects of surface passivation and cleaning

Depth-dependent magnetism in MnSb(0001) epitaxial films has been studied by combining experimental methods with different surface specificities: polarized neutron reflectivity, x-ray magnetic circular dichroism (XMCD), x-ray resonant magnetic scattering and spin-polarized low energy electron microscopy (SPLEEM). A native oxide ～4.5?nm thick covers air-exposed samples which increases the film's coercivity. HCl etching efficiently removes this oxide and in situ surface treatment of etched samples enables surface magnetic contrast to be observed in SPLEEM. A thin Sb capping layer prevents oxidation and preserves ferromagnetism throughout the MnSb film. The interpretation of Mn L(3,2) edge XMCD data is discussed.     

Abrasion-ablation model for neutron production in heavy ion collisions

In intermediate energy nucleus-nucleus collisions, neutron production at forward angles is observed to occur with a Gaussian shape that is centered near the beam energy and extends to energies well above that of the beam. This paper presents an abrasion-ablation model for making quantitative predictions of the neutron spectrum. To describe neutrons produced from the abrasion step of the reaction where the projectile and target overlap, we use the Glauber model and include effects of final-state interactions. We then use the prefragment mass distribution from abrasion with a statistical evaporation model to estimate the neutron spectrum resulting from ablation. Measurements of neutron production from Ne and Nb beams are compared with calculations, and good agreement is found.     

Hydrogen spectrum of SS433 system

We propose that the hydrogen spectrum in intense magnetic fields will help clarify the mechanisms which govern the SS433 system. In ultra high magnetic fields the standard hydrogen spectrum is superimposed on the Landau levels. There is, however, one deep-lying level in hydrogen at an energy of 50 eV to greater than 200 eV, depending on the magnetic field strength typical of neutron stars in x-ray binaries. When this level manifests itself it will give an indication of the magnetic field strength at the location of the radiating material; it could thus support the infall model SS433.     

Interstitial position of hydrogen in metals from entropy of solution

Using recent neutron scattering data for the change in the acoustical spectrum due to hydrogen in Nb, Ta, Pd and including experimental data on the localized mode frequencies and the change in electronic specific heat, it is possible to calculate the entropy of solution of H in Nb and Ta and H and D in Pd absolutely and its temperature dependence. A comparison with experimental values for the entropy of solution suggests the occupation of the tetrahedral sites for H in Nb and Ta and the octahedral sites for H and D in Pd.     

完整布拉格反射型晶体衍射特性的理论研究

利用x射线衍射动力学理论研究了完整布拉格反射型晶体衍射特性,给出晶体衍射强度分布图,并计算了完整晶体积分反射强度和衍射强度分布半高宽。结果表明:在相同的能量下,不同类型晶体的衍射强度分布不同;在相同的布拉格角条件下,不同类型晶体积分反射强度和衍射强度分布半高宽也不同;当布拉格角大于45°时,晶体的积分反射强度与衍射强度分布的半高宽随着布拉格角的增大而迅速增大。     

Neutron diffraction study of ammonium tartrate (NH4)2C4H4O6

A neutron diffraction study of ammonium tartrate has been carried out. Using the diffractometer in symmetrical setting, intensities of 750 reflections have been measured. The positions of all the hydrogen atoms have been determined. A good agreement is noticed between the present neutron and the earlier x-ray heavy atom parameters. The tartrate ion consists of two nearly identical planar halves, with an interplanar angle of 62°. Tre structure is stabilized by a net-work of hydrogen bonds. Details of hydrogen bonding and the ammonium ions environment are discussed.     

Cu3Nb2O8: a multiferroic with chiral coupling to the crystal structure

By combining bulk properties, neutron diffraction, and nonresonant x-ray diffraction measurements, we demonstrate that the new multiferroic Cu(3)Nb(2)O(8) becomes polar simultaneously with the appearance of generalized helicoidal magnetic ordering. The electrical polarization is oriented perpendicularly to the common plane of rotation of the spins-an observation that cannot be reconciled with the conventional theory developed for cycloidal multiferroics. Our results are consistent with coupling between a macroscopic structural rotation, which is allowed in the paramagnetic group, and magnetically induced structural chirality.     

Resonant soft x-ray scattering from stepped surfaces of SrTiO3

We studied the resonant diffraction signal from stepped surfaces of SrTiO(3) at the Ti 2p → 3d (L(2,3)) resonance in comparison with x-ray absorption (XAS) and specular reflectivity data. The steps on the surface form an artificial superstructure suitable as a model system for resonant soft x-ray diffraction. A small step density on the surface is sufficient to produce a well defined diffraction peak. We determined the optical parameters of the sample across the resonance and found that the differences between the energy dependence of the x-ray absorption signal, the specular reflectivity and the step-related peak reflect the different quantities probed in these signals. When recorded at low incidence or detection angles, XAS and specular reflectivity spectra are strongly distorted by the changes of the angle of total reflection with energy. The resonant diffraction spectrum is less affected and can be used as a spectroscopic probe even in less favorable geometries.     

Organization of cyanobiphenyl liquid crystal molecules in prewetting films spreading on silicon wafers

We observe prewetting films of 8CB (4'-n-octyl-4-cyanobiphenyl) spreading at room temperature on silicon wafers by ellipsometry and x-ray reflectivity. Ellipsometry indicates the formation of a nondense monolayer spreading in front of a 45-A-thick film. X-ray reflectivity, performed using a ribbon geometry for the liquid crystal (LC) reservoir, allows us to determine the organization of the 8CB molecules in the homogenous film. It consists of a trilayer stacking with a smecticlike bilayer standing above a polar monolayer with tilted molecules. We show that the thickness of the bilayer is equal to the smectic periodicity in the bulk material and that the tilt angle of the molecules in contact with the solid surface is close to 60 degrees, in good agreement with second-harmonic generation studies reported by other groups. Such organization can be precisely determined using x-ray reflectivity because it induces a modulation of the electron density along the normal to the surface. Furthermore, a study of the ellispometric profile of a drop heated in the nematic phase, where we observe a complete spreading of the LC, shows the complex structuration of the LC close to the solid interface. In particular, the spreading behavior of the trilayer compared to the subsequent smecticlike bilayers indicates the existence of specific interaction between the trilayer and silicon wafer.     

Absence of a vestigial vapor pressure paradox

The enigmatic but much accepted vapor pressure paradox for oriented lipid bilayer samples was recently justified theoretically. Subsequently, recent experiments have shown that there is no vapor pressure paradox. The first result of this paper is to consider another degree of freedom that reverses the previous theoretical conclusion, so that theory and experiment are now in agreement that there is no vapor pressure paradox. However, this analysis also suggests the possibility of a vestigial vapor pressure paradox that would rationalize why the vapor pressure paradox was historically so persistent and that would have led to an improved protocol for obtaining bilayer structure. This vestigial vapor pressure paradox would involve a phase transition as a function of applied osmotic pressure. We test this possibility experimentally using combined neutron and x-ray scattering data. The conclusion from these experiments is that there is not even a vestigial vapor pressure paradox. However, this negative result validates an improved method for calibrating osmotic pressure in x-ray studies of oriented samples.     

Magnetic depth profiling of Fe/Au multilayer using neutron reflectometry

We present unpolarized and polarized neutron reflectometry data on Fe/Au multilayer sample for characterizing the layer structure and magnetic moment density profile. Fe/Au multilayer shows strong spin-dependent scattering at interfaces, making it a prospective GMR material. Fe/Au multilayer with bilayer thickness of 130 Å was grown on Si substrate by RF magnetron sputtering technique. Unpolarized neutron reflectivity measurement yields nuclear scattering length density profile. The magnetic scattering length density profile has been obtained from polarized neutron reflectivity measurements.     

X-ray reflectivity data analysis using Bayesian inference: The study of induced Pt magnetization in Pt/Co/Pt

The induced Pt magnetization in a Pt/Co/Pt thin film structure is studied. The normally nonmagnetic Pt acquires a magnetic moment due to the magnetic proximity effect at the Co–Pt interfaces. Element specific Pt structural and magnetic properties are characterized by synchrotron-based resonant x-ray reflectivity and x-ray resonant magnetic reflectivity measurements. An advanced analysis method based on Bayesian inference is used for model fitting of the x-ray data. Using this method, we retrieve the best fit values of material parameters (e.g., thickness, interfacial roughness) from the data. Analysis of x-ray reflectivity data of this specific system shows that the Pt magnetization and Co–Pt interfacial roughness is significantly different between the top and bottom Pt layers, with both values being larger in the top Pt. The successful application of this Bayesian method to study the magnetic and structural properties of a thin film system demonstrates its effectiveness for x-ray reflectivity data analysis.