单原子作为保护基团实现石墨双炔纳米线的表面合成（英文）

由于在贵金属表面的双炔单元具有高反应活性,表面合成半导体性质的石墨双炔纳米线通常会受到副反应的严重影响,难以分立的纳米线的高质量制备.本文利用化学气相沉积1,4-bis(4-bromophenyl)-1,3-butadiyne分子到表面发生Ullmann偶联反应,可实现无支链的石墨双炔纳米线[-C≡C-Ph_2-C≡C-]_n (PYP)的高产率合成.进一步的单化学键分辨的非接触原子力显微镜表征揭示了单个金增原子与双炔键之间形成了π-ligand键,有效地充当了反应过程中双炔单元的保护基团,避免了偶联过程中的副反应,从而实现了分立的超长石墨双炔纳米线的合成.这项研究将启发对在表面反应中各类表面增原子所起保护作用的更深入研究.     

理论研究过渡金属原子修饰石墨炔材料的功能性

采用基于密度泛函理论中第一性原理方法分别对石墨炔负载过渡金属原子(M-gra)体系的稳定构型以及对多种气体小分子的灵敏度和选择性进行理论研究.计算结果表明金属原子吸附在孔洞结构的H2位具有高稳定性,不同种类的金属原子能够有效调控石墨炔体系的电子特性和具有不同的磁矩.比较气体分子的吸附能大小,M-gra衬底对O和OH表现出高的灵敏度,单个NO、NO₂和O₂的稳定性高于CO分子.此外,小分子吸附的M-gra体系具有金属、半金属和半导体特性,在电子和气敏器件领域具有潜在应用.     

石墨单晶表面原子的扫描隧道显微象

扫描隧道显微镜(STM)是近几年发展起来的一种直接观察物质表面微观结构的仪器.利用量子隧道效应,将极细的金属针尖接近样品表面扫描,从而获得样品表面的三维图象,可以反映表面原子排列和原子形态.图1是我们设计制造的扫描隧道显微镜原理图.采用压电陶瓷管P作为x,y和z方向的三维扫描器件.管表面等分为相邻90°的四个电极,针尖T固定在其中的一个电极上.尖端曲率半径为100nm左右的金属针尖,可用化学腐蚀法制备.两对电极上施加扫描电压时,针尖便在垂直于管轴z的x-y方向扫描,而z方向的高低变化则由加在内管壁上的电     

卤素驱动石墨二炔带隙的打开以实现光催化全解水

本文通过杂化密度泛函理论研究了卤素(F、Cl和Br)功能化的石墨二炔的能带结构. 结果表明修饰的石墨二炔的带隙能随着卤素原子对的增加而增加;同时,价带顶的位置受卤素原子电负性大小的影响：当石墨二炔表面的卤素原子数目相同时,卤素原子的电负性越大,改性后石墨二炔的价带顶的位置越深. 另外,计算结果表明石墨二炔的带隙可以通过不同卤素原子的适当混合修饰来有效调节,不同卤素原子混合修饰的石墨二炔的价带底和导带顶跨越了水的氧化还原电位. 通过热力学分析进一步证明,不同卤素原子混合修饰的石墨二炔比单一卤素修饰的石墨二炔表现出更好的光催化水全解反应活性. 这项工作对于如何设计更高效的全解水光催化剂提供了洞见.     

N掺杂对α-石墨炔表面吸附H_2O,H,O和OH的电子性质和磁性的影响

石墨炔是一种新型的二维(2D)碳的同素异形体,炔键单元的高活性使其在小分子吸附方面相比石墨烯更具优势.本文基于密度泛函理论(DFT),研究了H_2O和H、O及OH分别在原始的和掺杂了N原子的α-石墨炔上的相互作用.研究结果表明,N掺杂和小分子吸附能够改变α-石墨炔的电子结构和磁性. N原子掺杂后α-石墨炔对小分子的吸附能力明显增强. H、O原子和OH吸附在N原子掺杂体系前后表现出明显的磁性差异:H原子和OH吸附在纯净的α-石墨炔上体系显示磁性,N原子掺杂后,磁性消失;而O原子则是吸附在纯净的α-石墨炔上未表现出磁性,N原子掺杂后,体系出现磁性.此外,α-石墨炔对水分子的吸附作用较弱,受范德瓦耳斯作用影响较大,属于物理吸附.本研究将为α-石墨炔中N杂质检测以及α-石墨炔基气体传感器的设计研究提供新的思路.     

用表面生长CVD金刚石的石墨合成高压金刚石

 用热灯丝CVD方法在多晶石墨衬底表面制备CVD金刚石颗粒，并用这种石墨在高温高压条件下采用六面顶压机合成出高压金刚石。初步实验结果表明：采用其表面生长CVD金刚石颗粒的石墨合成高压金刚石，可以提高金刚石的转化率和降低合成压力。     

ZnO纳米线薄膜的合成参数、表面形貌和接触角关系研究

水浴法合成ZnO纳米线薄膜的工艺参数直接影响其表面形貌, 并使其接触角及润湿性能发生变化. 本文仿真分析了轮廓算数平均偏差、偏斜度、峭度、相关长度等特征参数对随机粗糙表面特性的影响规律; 改变生长时间、种子层溶液和生长液的浓度, 批量制备了表面形貌不同的ZnO纳米线薄膜; 提出了取样长度的确定方法, 并基于扫描电镜图像和Matlab图像处理算子对ZnO纳米线薄膜表面形貌的特征参数进行了提取; 将表面形貌高度和水平方向的特征参数引入Wenzel模型, 分析了合成参数、表面形貌特征参数与接触角的影响关系. 结果表明, 合成参数变化时, 选择取样长度5.0 μm为宜; 生长液浓度大于0.125 mol/L时, ZnO纳米线之间发生重结晶, 并呈现疏水性; 改变种子层溶液浓度和生长时间, 均得到超亲水表面. 上述结论可用于不同氧化酶、细胞等在ZnO纳米线薄膜上的有效吸附及相应传感器测试性能的进一步提高. 关键词： ZnO纳米线 水浴合成 表面形貌 接触角     

中性原子的表面双磁光阱及其应用

提出了一种新的采用载流导线的表面双磁光阱(MOT)方案(即双U型导线磁光阱方案)。通过改变中间U型导线中的电流大小,即可将一个双磁阱连续地合并为一个单磁阱,反之亦然。详细计算和分析了上述双U型载流导线磁光阱方案的磁场及其梯度的空间分布,研究发现当导线中的电流为600 A,z方向均匀偏置磁感应强度为-4.0×10-3 T时,双U型导线方案产生的两个磁阱中心的磁场梯度约为1.5×10-3~2.5×10-3 T/cm,结合通常制备磁光阱时所用的三维粘胶(Molasses)光束即可在基底表面附近形成一双磁光阱。理论分析表明在弱光近似下,每个磁光阱中所能俘获的85Rb原子数约为106 量级,相应的磁光阱温度约为270μK。由于双磁光阱可以独立制备,所以双U型导线方案特别适用于制备双样品磁光阱,并用于研究双原子样品的冷碰撞性质。     

Ca和Ce双原子复合填充P型CamCenFexCo4-xSb12化合物的合成及热电性能

用高温熔融法合成了Ca和Ce复合填充的单相p型CamCenFexCo4-xSb12化合物,探索了两种原子复合填充对其热电性能的影响规律.研究结果表明,填充分数相同时,Ca和Ce两种原子复合填充的p型CamCenFexCo4-xSb12化合物的载流子浓度和电导率介于Ca或Ce一种原子单独填充的化合物之间,且随两种原子填充分数m+n的增加而降低;赛贝克系数随两种原子填充总量,尤其是Ce填充分数m的增加以及温度的上升而增加;在相同填充分数时,两种原子复合填充的p型CamCenFexCo4-xSb12化合物的晶格热导率较Ca或Ce一种原子单独填充的化合物的晶格热导率低,当总填充分数m+n为0.3左右,且Ca和Ce的填充量大致相等时,化合物的晶格热导率最低.p型Cao18Ce0.12Fe1.45Co2.55Sb12.21化合物的最大热电性能指数ZT值在750K时达到1.17.     

Ca和Ce双原子复合填充p型CamCenFexCo4－xSb12化合物的合成及热电性能

用高温熔融法合成了Ca和Ce复合填充的单相p型Ca_mCe_nFe_{xCo4-xSb12化合物，探索了两种原子复合填充对其热电性能的影 响规律.研究结果表明，填充分数相同时，Ca和Ce两种原子复合填充的p型CamCe nFexCo4-xSb12化合物的载流子浓度和电 导率介于Ca或Ce一种原子单独填充的化合物之间，且随两种原子填充分数m+n的增加而降低 ；赛贝克系数随两种原子填充总量，尤其是Ce填充分数m的增加以及温度的上升而增加；在 相同填充分数时，两种原子复合填充的p型CamCenFexC o4-xSb12化合物的晶格热导率较Ca或Ce一种原子单独填充的化合物 的晶格热导率低，当总填充分数m+n为0.3左右，且Ca和Ce的填充量大致相等时，化合物的晶 格热导率最低.p型Ca0.18Ce0.12Fe1.45Co2.55Sb12.21化合物的最大热电性能指数ZT值在750K时达到1.17. 关键词： skutterudite化合物 双原子复合填充 合成 热电性能}     

Noncontact atomic force microscopy: Bond imaging and beyond

It was a long-cherished dream for chemists to take a direct look at chemical bonding, a fundamental component of chemistry. This dream was finally accomplished by the state-of-the-art noncontact atomic force microscopy (NC-AFM) equipped with qPlus force sensors and carbon monoxide (CO) functionalized tips. The resolved interconnectivity between atoms and molecules in NC-AFM frequency shift images is interpreted as chemical bonding, providing essential knowledge of the bond length, bond angle and even bond order. The featured contrast of different chemical bonds can serve as fingerprints for further interpretation of chemical structures toward unknown species synthesized on surfaces. This breakthrough enriches characterization tools for surface science and brings our understanding of on-surface reactions to a new level. Beyond bond imaging, the application of NC-AFM has been extended to quantifying interatomic interactions, identifying three-dimensional nanostructures, manipulating molecules and reactions, as well as determining molecular electronic characteristics. Moreover, some recent efforts address the improvement of the usability and versatility of the bond-resolved NC-AFM technique, including high-resolution molecular investigation on bulk insulators, application-specific tip modification, stable bond imaging above liquid helium temperature and autonomous experimentation implemented by artificial intelligence.     

Kinetic effects in the self-assembly of pure and mixed tetradecyl and octadecylamine molecules on mica

The self-assembly of tetradecylamine (C14) and of mixtures of tetradecyl and octadecylamine (C18) molecules from chloroform solutions on mica has been studied using atomic force microscopy (AFM). For pure components self-assembly proceeds more slowly for C14 than for C18. In both cases after equilibrium is reached islands of tilted molecules cover a similar fraction of the surface. Images of films formed by mixtures of molecules acquired before equilibrium is reached (short ripening time at room temperature) show only islands with the height corresponding to C18 with many pores. After a long ripening time, when equilibrium is reached, islands of segregated pure components are formed.     

Calculation of the optimal imaging parameters for frequency modulation atomic force microscopy

True atomic resolution of conductors and insulators is now routinely obtained in vacuum by frequency modulation atomic force microscopy. So far, the imaging parameters (i.e., eigenfrequency, stiffness and oscillation amplitude of the cantilever, frequency shift) which result in optimal spatial resolution for a given cantilever and sample have been found empirically. Here, we calculate the optimal set of parameters from first principles as a function of the tip–sample system. The result shows that the either the acquisition rate or the signal-to-noise ratio could be increased by up to two orders of magnitude by using stiffer cantilevers and smaller amplitudes than are in use today.     

A simplified but intuitive analytical model for intermittent-contact-mode force microscopy based on Hertzian mechanics

The forces acting on the substrate in intermittent-contact-mode (IC mode, tapping mode) atomic force microscopy are not accessible to a direct measurement. For an estimation of these forces, a simple analytical model is developed by considering only the shift of the cantilever resonance frequency caused by Hertzian (contact) forces. Based on the relationship between frequency shift and tip–sample force for large-amplitude frequency-modulation atomic force microscopy, amplitude and phase versus distance curves are calculated for the intermittent contact mode, and the forces on the substrate are calculated. The results show a qualitative agreement with numerical calculations, yielding typical maximal forces of 50–150 nN. When working above the unperturbed resonance, forces are found to be significantly larger than below the resonance.     

Atomic force microscopy for the investigation of molecular and cellular behavior

The present review details the methods used for the measurement of cells and their exudates using atomic force microscopy (AFM) and outlines the general conclusions drawn by the mechanical characterization of biological materials through this method. AFM is a material characterization technique that can be operated in liquid conditions, allowing its use for the investigation of the mechanical properties of biological materials in their native environments. AFM has been used for the mechanical investigation of proteins, nucleic acids, biofilms, secretions, membrane bilayers, tissues and bacterial or eukaryotic cells; however, comparison between studies is difficult due to variances between tip sizes and morphologies, sample fixation and immobilization strategies, conditions of measurement and the mechanical parameters used for the quantification of biomaterial response. Although standard protocols for the AFM investigation of biological materials are limited and minor differences in measurement conditions may create large discrepancies, the method is nonetheless highly effective for comparatively evaluating the mechanical integrity of biomaterials and can be used for the real-time acquisition of elasticity data following the introduction of a chemical or mechanical stimulus. While it is currently of limited diagnostic value, the technique is also useful for basic research in cancer biology and the characterization of disease progression and wound healing processes.     

AFM of Metallic Nano-Particles and Nano-Structures in Heavily Irradiated NaCl

AFM investigations are reported for heavily, electron irradiated NaCl crystals in ultra high vacuum (UHV) in the non-contact mode with an UHV AFM/STM Omicron system. To avoid chemical reactions between the radiolytic Na and oxygen and water, the irradiated samples were cleaved and prepared for the experiments in UHV. At the surface of freshly cleaved samples, we have observed sodium nano-precipitates with shapes, which depend on the irradiation dose and the volume fraction of the radiolytic Na. It appears that the nano-struchires consist of (i) isolated nano-particles, (ii) more or less random aggregates of these particles, (iii) fractally shaped networks and (iv) “fabrics” consisting of bundles of Quasi-1D arrays forming polymeric networks of nano-particles. Almost independent of the concentration of the metallic Na in the samples the size of the individual nano-particles is in the range 1–3nm. Our new AFM results are fully in line with our CESR and previous Raman scattering results.     

AFM analysis of MgB2 films and nanostructures

For the fabrication of superconducting devices based on nanostructured thin films, the quality of the starting surface is often of crucial importance. For example, the transport properties of superconducting nanobridges are strongly affected by the geometry and the edge definition of the nanostructures. In this work, we report about AFM characterization of magnesium diboride films and nanobridges fabricated in view of application in superconducting electronics. MgB₂ films, obtained by co-deposition method followed by annealing in situ on silicon nitride substrate, have been nanostructured by electron beam lithography and ion milling. The analysis of the AFM images by the height-height correlation function shows that the films have a self-affine smooth textured surface with a RMS roughness of 20 nm. Furthermore, the nanobridges are continuous, with a well-defined geometry and a rounded profile, and the nanostructuration process does not significantly affect the film morphology.     

Investigations of C60 molecules deposited on Si(111) by noncontact atomic force microscopy

We demonstrated the high resolution imaging of the organic molecules using noncontact atomic force microscopy in ultrahigh vacuum. The sample was C₆₀ molecules deposited on the Si(111)-7×7 reconstructed surface. When the thickness of the C₆₀ film was submonolayer, we could image some isolated C₆₀ molecules and the reconstructed Si surface simultaneously. However, the imaging was highly unstable not only because of the large structure but also due to the large difference between the interaction forces on the molecules and on the Si surface. On the other hand, when the thickness of the C₆₀ molecules was almost monolayer, individual molecules could be stably imaged.     

Growth instability and surface phase transition of Ti thin film on Si(1 1 1): An atomic force microscopy study

Evolution of surface structure during the annealing of e-beam evaporated Ti films is studied by means of atomic force microscopy (AFM). Image variography and power spectral density analysis are used to study scaling properties of the films, ranging from 50 nm to 20 μm length scale. No particular grain size is observed up to 473 K. At 673 K, grain size of ∼250 nm are formed and coalesced to form bigger grain size upon further annealing. At 473 K, RMS roughness dropped at all length scale and became rougher at 673 K with an increasing trend up to 873 K. Clustering at 673 K indicates Kosterlitz-Thaouless [J.M. Kosterlitz, D.J. Thaouless, J. Phys. Chem. 6 (1973) 1181] type phase transition at the surface. The observed transition is also consistent with existing scaling laws.     

Fabrication of rubrene nanowires on vicinal (0 0 0 1) sapphire surfaces

Morphology of high-vacuum deposited rubrene thin films on the annealed (0 0 0 1) vicinal sapphire surfaces was studied by atomic force microscopy in non-contact mode. Atomic force microscopy images of rubrene thin films indicate that a regular array of steps on the sapphire surface acts as a template for the growth of the arrays of rubrene nanosize wires. To further demonstrate that morphological features of a substrate are crucial in determining the morphology of rubrene layers we have grown rubrene on the sapphire surfaces that were characterized by the terrace-and-step morphology with islands. We have found preferential nucleation of rubrene molecules at the intersection between a terrace and a step, as well as around the islands located on terraces.