利用激光超声技术研究表面微裂纹缺陷材料的低通滤波效应

利用激光激发声表面波的理论模型,研究了被激发宽带声表面波在具有表面微裂纹缺陷金属材料上的传播特性.对具有不同形状的表面缺陷模型进行了数值分析.结果表明:表面微裂纹缺陷有明显的低通效应,缺陷深度越大高频截止频率就越低,缺陷深度与低通滤波的截止频率呈近似线性关系;缺陷的宽度增大对表面波透射能量有明显的衰减作用. 关键词： 激光超声 声表面波 有限元方法 低通滤波器     

A model study of the electronic structure changes due to impurities with Z ≠ 4, vacancy and carbon at the silicon (111) surface

A tight-binding model for point defects at the silicon (111) surface is developed. It verifies a sum rule and exhibits a great flexibility to study different types of defects. The migration of donors and acceptors to the surface and the role played by surface point defects in surface instabilities are discussed.     

光学元件表面缺陷的显微散射暗场成像及数字化评价系统

根据国际ISO10110-7的表面缺陷标准及惯性约束聚变(ICF)工程标准,提出了一种新颖的光学元件表面缺陷的光学显微散射成像及数字化评价系统,多束光纤冷光源呈环状分布并以一定角度斜入射到数毫米视场的被检表面,形成适合数字图像二值化处理的暗背景上的亮疵病图像。对X,Y两方向进行子孔径图像扫描成像,利用模板匹配原理对获得的子孔径图像进行拼接得到全孔径表面疵病图像信息。基于数学形态学建立了可用于大口径表面检测扫描的图像处理的模式识别软件体系,并应用二元光学制作了标准对比板,以获得疵病正确的评价依据。最终利用该变倍光学显微镜散射成像系统得到能分辨微米量级表面疵病的图像,其单个子孔径物方视场约为3 mm,对X,Y两方向进行5×5子孔径图像扫描成像,并给出了与标准比对的定量数据结果。实验结果表明,本系统完全可以实现光学元件表面缺陷的数字化评价。     

Study on incident laser modulation using surface micro-defects on KH₂PO₄ crystal

KH2PO4 crystal is a crucial optical component of inertial confinement fusion.Modulation of an incident laser by surface micro-defects will induce the growth of surface damage,which largely restricts the enhancement of the laser induced damage threshold.The modulation of an incident laser by using different kinds of surface defects are simulated by employing the three-dimensional finite-difference time-domain method.The results indicate that after the modulation of surface defects,the light intensity distribution inside the crystal is badly distorted,with the light intensity enhanced symmetrically.The relations between modulation properties and defect geometries(e.g.,width,morphology,and depth of defects) are quite different for different defects.The modulation action is most obvious when the width of surface defects reaches 1.064 μm.For defects with smooth morphology,such as spherical pits,the degree of modulation is the smallest and the light intensity distribution seems relatively uniform.The degree of modulation increases rapidly with the increase of the depth of surface defects and becomes stable when the depth reaches a critical value.The critical depth is 1.064 μm for cuboid pits and radial cracks,while for ellipsoidal pits the value depends on both the width and the length of the defects.     

Study of modulation property to incident laser by surface micro-defects on KH2PO4 crystal

KH₂PO₄ crystal is a crucial optical component of inertial confinement fusion. Modulation of an incident laser by surface micro-defects will induce the growth of surface damage, which largely restricts the enhancement of the laser induced damage threshold. The modulation of an incident laser by using different kinds of surface defects are simulated by employing the three-dimensional finite-difference time-domain method. The results indicate that after the modulation of surface defects, the light intensity distribution inside the crystal is badly distorted, with the light intensity enhanced symmetrically. The relations between modulation properties and defect geometries (e.g., width, morphology, and depth of defects) are quite different for different defects. The modulation action is most obvious when the width of surface defects reaches 1.064 μ. For defects with smooth morphology, such as spherical pits, the degree of modulation is the smallest and the light intensity distribution seems relatively uniform. The degree of modulation increases rapidly with the increase of the depth of surface defects and becomes stable when the depth reaches a critical value. The critical depth is 1.064 μ for cuboid pits and radial cracks, while for ellipsoidal pits the value depends on both the width and the length of the defects.     

精密表面疵病检测美标数字化评价实现算法

采用美国军用标准MIL-PRF-13830B（简称美标）对光学元件表面疵病进行数字化评价,其难点主要在于美标中表面疵病密集度的判定。针对该难点,提出了一种表面疵病密集度判定算法。该算法采用权重域叠加的方法,通过为表面疵病赋予相应的权重域来确定疵病密集圆域,并将权重域间的叠加转换成了矩阵间位置关系的判断和计算,有效的利用了矩阵运算的便利性。实验中通过对已知表面疵病信息的石英标准板进行判定,其得到的圆域即为疪病密集圆域,与预期结果一致,验证了该算法的正确性。目前该算法已经运用于光学车间精密光学元件表面疵病的美标数字化评价。     

A necessary condition for the appearance of damage-induced surface-topography during particle bombardment

A first approach to the establishment of an “order-of-magnitude” criterion for the initiation of damage-induced surface topography on clean and well-polished metal single crystals is proposed. It is based on a model proposing a mechanism of preferential erosion of parts from the sample surface due to a local increase of sputtering yield above “extensive defects”. These “extensive defects”, resulting of the migration of the point-defects, created during the collision-cascade started by the incoming ions, can indeed influence the sputtering yield if they are located close under the surface, i.e. when the surface has regressed, due to sputtering, to the level where these “extensive defects” have been formed.

The condition implies that the formation of “extensive defects” must have taken place before the surface reaches them. The condition is written in terms of the irradiation parameters and quantities characteristic for the migration of point-defects due to the presence of a potential gradient related to the “extensive defects” under formation.     

Probing defect species on real surfaces from the analysis of the spectral profile of admolecules

The analysis of changes in the vibrational spectrum of infrared active molecules adsorbed on a ionic surface containing point or extended defects can be an efficient method to determine the nature and density of surface defects. We study the infrared response of ammonia molecules deposited on a ionic surface of MgO containing charge vacancies and dipolar defects in various concentrations and distributions and show significant changes assigned to the defects signature. A Monte Carlo approach is used to randomly deposit the probe molecules on the surface displaying random or regularly arranged defects at low temperature.     

A Hierarchy of Defects in Biaxial Nematics

We study the topological properties of the manifolds which describe uniaxial and biaxial nematics in order to compare and classify all types of bulk and surface defects that can arise in a nematic liquid crystal. We explain how topological charges can be assigned both to isotropic defects in uniaxial nematics and to uniaxial defects in biaxial nematics; we further see how it is possible to distinguish between isolated surface defects and surface defects which extend in the bulk, and between surface defects which can relax in the bulk and defects forced to stay on the surface. Received: 28 November 1994 / Accepted: 30 September 1996     

Nondestructive image detection of surface and sub-surface defects of solid materials by OBD

The measurement principle for detecting surface and sub-surface defects in solid materials by the optical beam deflection method (OBD) is described. The detectable depth of sub-surface defects is predicted through calculating the dependence of the surface temperature distribution of a solid sample, typically metal Al, on the thickness of the solid material and modulation frequencies of a pump laser. The defects in surface and sub-surface of some samples such as carbon film coated on glass, C/C composite material and metallic Al, etc., experimentally detected and directly displayed by grey image or 3D image.     

Investigation of native-oxide growth on HF-treated Si(111) surfaces by measuring the surface-state distribution

The evaluation of the surface state distribution of differently HF-treated Si(111) surfaces during the native-oxide growth in air is investigated by the large-signal field-modulated photovoltage technique. The surface state distribution consisting of intrinsic and extrinsic Si dangling bond defects is directly related to the state of oxidation of the Si surface. It is shown that the kind of HF treatment strongly influences the concentration of extrinsic defects with a lower state of oxidation. Special HF preparations for H termination of the Si(111) surface result in a nearly intrinsic surface state distribution. During the oxidation process three typical phases can be distinguished each characterized by specific defect structures. It was found that native-oxide growth is highly sensitive to the concentration of extrinsic defects directly after HF treatment.     

基于深度学习的光学元件表面疵病识别北大核心CSCD

精密光学元件表面疵病的人工检测分类方法效率低,且准确率易受疲劳等人工因素影响,而基于传统机器学习方法的分类准确率有待进一步提高。提出了一种基于深度学习卷积神经网络的光学大尺寸元件表面疵病识别方法。首先,通过现场实验采集并整理了大尺寸镜面疵病样本;接着,基于单通道灰度图像构建融合梯度的三通道图像,挖掘更深入的特征表达;最后,基于经典的LeNet网络,提出了面向激光惯性约束聚变(ICF)的光学元件表面疵病识别网络ICFNet,该网络不需要复杂的手工特征设计和提取,仅使用原始灰度图像就实现高效的疵病识别。实验结果表明:针对包含麻点、划痕和灰尘的三类疵病数据,ICFNet相较于使用多项特征和支持向量机的传统方法拥有较好的分类准确率。     

大口径氘化磷酸二氢钾晶体离线亚纳秒激光预处理技术

大口径氘化磷酸二氢钾(DKDP)晶体抗激光损伤性能偏低严重地制约着大型高功率激光装置输出水平.本研究利用离线亚纳秒激光预处理技术有效地提升了大口径DKDP晶体抗激光损伤性能.实际使用情况表明,采用离线亚纳秒激光预处理后,DKDP晶体在9 J/cm²激光通量辐照下的表面平均损伤密度得到大幅下降,由未处理前的5.02 pp/cm²(1pp表示1个百分点)降至0.55 pp/cm²,降幅为一个数量级.同时,激光预处理对晶体损伤尺寸具有一定的抑制作用,预处理后晶体损伤点尺寸分布曲线向尺寸减小的方向平移,尺寸分布峰值由预处理前的25μm降至预处理后的18—20μm.     

On the influence of defects on the magnetization processes taking place on the surface of polycrystalline Fe-Si samples

In work with the magnetooptical method, using Kerr's transverse effect, magnetization processes on the surfaces of polycrystalline Fe-Si sheets near to the (110) planes are studied. The influence of defects and the degree of the defects of the surface on the course of the surface hysteresis loops are studied in particular. It is found that the presence of defects on the surface of a ferromagnet influence the course of surface magnetization processes in a pronounced and varying way.     

AlGaN表面坑状缺陷及GaN缓冲层位错缺陷对AlGaN/GaN HEMT电流崩塌效应的影响

利用金属有机气相外延(MOVPE)技术生长了具有不同AlGaN表面坑状缺陷和GaN缓冲层位错缺陷密度的AlGaN/GaN 高电子迁移率晶体管(HEMT)样品,并对比研究了两种缺陷对器件栅、漏延迟电流崩塌效应的影响.栅延迟测试表明,AlGaN表面坑状缺陷会引起栅延迟电流崩塌效应和源漏电阻的增加,而且表面坑状缺陷越多,栅延迟电流崩塌程度和源漏电阻的增加越明显.漏延迟测试显示,AlGaN表面坑状缺陷对漏延迟电流崩塌影响不大,而GaN缓冲层位错缺陷主要影响漏延迟电流崩塌.研究结果表明,AlGaN表面坑状缺陷和Ga 关键词： AlGaN/GaN HEMT 电流崩塌 坑状缺陷 位错缺陷     

Distribution of Topological Defects on Axisymmetric Surface

We propose a general method of determining the distribution of topological defects on axisymmetric surface,and study the distribution of topological defects on biconcave-discoid surface, which is the geometric configuration of red blood cell. There are three most possible cases of the distribution of the topological defects on the biconcave surface:four defects charged with 1/2, two defects charged with 1, or one defect charged with 2. For the four defect charged with 1/2, they sit at the vertices of a square imbedded in the equator of biconcave surface.     

高斯光束经表面有缺陷的厚非线性介质的传输特性

光学元件上存在的缺陷会对传输光束产生局域振幅和位相调制. 基于衍射理论模型和分步傅里叶算法,模拟分析了高斯光束经过表面有缺陷的非线性介质的传输过程中于介质内及从介质出射后在自由空气的传输特性, 并详细研究了在厚介质前表面有缺陷的情况下,介质中和自由空气中的光强分布演化规律. 研究表明,介质厚度越长、介质的非线性折射率越大,光束整体聚焦越厉害, 聚焦点离介质后表面越近.光束受调制点的位置离中心越近,光束分裂成丝产生的局部光强越大, 且介质表面存在缺陷将使通过的光束在介质后表面处产生一个很大的光强, 相位调制型缺陷产生的这一光强点比振幅调制型缺陷产生的光强点更强.     

复合材料脱粘缺陷的红外热像无损检测

以固体火箭发动机中的玻璃纤维复合材料壳体/绝热层试件的脱粘缺陷为研究对象,利用脉冲闪光灯热激励方式对试件进行加热,用红外热像仪实时监测试件的表面温度场,由表面温度差异来判定试件内部缺陷,然后通过对热像图进行图像增强处理和分割以定量识别缺陷。将实验结果与超声C扫描检测结果进行的对比分析表明:红外热像无损检测方法能够快速直观地发现深度5 mm以内、直径10 mm以上的脱粘缺陷,而超声C扫描检测更适合于对特定缺陷进行准确定量检测。     

Instability of an elastically compressed silicon surface under etching

An unusual relief in the form of linear defects resembling quasicracks or grooves was observed on a compressionally stressed surface of a bent silicon surface subjected to chemical etching. The average distance between the forming defects was determined by the magnitude of the surface mechanical strain. The reason for this is assumed to be an Asaro-Tiller-Srolovitz instability in the compressed-surface-etching-agent system. A simple technique is proposed for producing considerable mechanical strains, up to 0.5%, in a silicon surface at room temperature. Fiz. Tverd. Tela (St. Petersburg) 41, 1416–1418 (August 1999)     

Ising films with surface defects

The influence of surface defects on the critical properties of magnetic films is studied for Ising models with nearest-neighbour ferromagnetic couplings. The defects include one or two adjacent lines of additional atoms and a step on the surface. For the calculations, both density-matrix renormalization group and Monte Carlo techniques are used. By changing the local couplings at the defects and the film thickness, non-universal features as well as interesting crossover phenomena in the magnetic exponents are observed. Received 27 July 2000 and Received in final form 5 October 2000