波片对斜入射光波产生相位延迟的两种计算方法

作为常见的偏振光学元件之一的波片,如1/4波片、1/2波片和全波片,被广泛应用于高数值孔径(NA)成像系统(偏光显微镜和浸没式光刻机)的偏振检测技术中。随着系统NA的日益增大,正确分析和精确计算大角度斜入射光波经过波片后产生的相位延迟变得至关重要。目前的分析方法主要是基于电磁波传播理论和光线追迹法两种。由于前人在使用上述两种方法时,不仅计算过程较为复杂,没有最终表达式,而且计算结果存在较大的差异。首先推导波片中e光波法线的折射率表达式,然后再推导e光光线的折射率表达式,最后分别利用电磁波传播理论和光线追迹法导出斜入射光波通过波片后的o光与e光之间的相位延迟。计算结果显示,利用这两种方法得到的相位延迟最终表达式完全一致。准确地描述了波片的相位延迟特性,为波片的设计和误差分析提供了严格的理论依据,具有重要的理论意义和应用价值。     

分振幅型全Stokes同时偏振成像系统波片相位延迟误差分析

分振幅型全Stokes同时偏振成像仪具有实时性好、空间分辨率高、精度高等优点,有很高的应用价值.分振幅型全Stokes同时偏振成像系统利用偏振分束器、1/2波片和1/4波片将入射光Stokes矢量调制在4幅图像中,可解析入射光Stokes矢量. 1/2波片和1/4波片的相位延迟误差对Stokes矢量测量精度有着不可忽略的影响.建立了包含上述两种误差的Stokes矢量测量误差方程,分析了1/2波片和1/4波片相位延迟耦合误差对自然光、0°/45°线偏光、左旋圆偏光等典型基态入射光的Stokes矢量测量误差的影响,推导了任意偏振态的Stokes矢量测量误差的表征方法.在邦加球球面和球内选取不同偏振度的Stokes矢量作为入射光进行仿真.结果表明, Stokes矢量测量误差和偏振度测量误差均随着入射光偏振度的增大而增大.选取入射光偏振度为1时的偏振测量精度评估系统.为满足2%的偏振测量精度, 1/2波片相位延迟误差应在±1.6°内, 1/4波片相位延迟误差应在±0.5°内.这对提高系统的偏振测量精度具有重要意义,为系统设计和研制提供了重要的理论指导.     

消色差λ/4波片的系统级标定方法研究

消色差/4波片具有一定的二向色性和相位延迟量误差,导致仪器偏振测量产生误差。从考虑全偏振CCD相机自身偏振效应的辐射模型入手,借助积分球辐射源和高精度辅助旋转偏振器,研究系统级非理想消色差/4波片的标定方法。结果发现:消色差/4波片的二向色性和相位延迟量参数随仪器的工作波长与带宽发生变化,波段650 nm（相位延迟量88.90）和750 nm（相位延迟量88.65）消色差效果相对较好,而波片在波段850 nm（相位延迟量84.33）相位量偏差较大;通过相位延迟量的标准误差分析,得出消色差/4波片的系统级标定方法精度优于0.8。     

椭偏法测量云母波片相位延迟量及双折射率

为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400~770 nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.     

椭偏法测量云母波片相位延迟量及双折射率(英文)

为了得到云母波片的相位延迟量和双折射率随波长的变化关系,利用椭偏光谱仪连续测量了云母波片在400～770nm光谱范围内的延迟量.在对云母波片进行校准后,测量的数据被光电探测器收集并输送到计算机,根据输出的数据可以得到云母波片的相位延迟量随波长的变化.利用测得的延迟量计算出了云母波片在一定光谱范围内的双折射率,得到了云母波片的双折射率色散曲线,并通过拟合得到了双折射率色散公式.该方法能测量任意波片的相位延迟量,并且具有测量方便、周期短、精度高等特点.     

共孔径偏振耦合分光的旋转四分之一波片相位补偿技术

 在地平式折轴望远镜中开展自适应光学激光导星实验，研究了共孔径发射接收信标激光束偏振耦合分光效率随望远镜方位角和天顶角变化的补偿技术。提出了一种由四分之一波片和法拉第旋光器构成的相位补偿器，通过旋转四分之一波片以实时补偿由于望远镜旋转导致的光路相位延迟量的变化。数值计算表明，望远镜处于任意方位角和天顶角位置时，通过1°步长旋转四分之一波片，可使补偿后的偏振分光效率理论上达到99.90％以上。实验从原理上定性地验证了该方法的有效性。只要测量出镜面的相位延迟，便可计算得到望远镜处于不同方位角和天顶角情况下有效补偿所需的四分之一波片旋转角度，据此可建立实用的旋转波片偏振补偿装置。     

共孔径偏振耦合分光系统中反射镜造成的相位延迟差的测量

 激光信标共孔径发射接收偏振分光系统的动态相位补偿需要测量望远镜各反射镜对s光和p光的相位延迟差。利用Stokes矢量和Mueller矩阵建立了物理模型，并推导出用测得的回光功率计算相位延迟差的解析式。提出一种通过实验测量回光功率计算反射镜相位延迟差的方法，解决了在0～2p范围内唯一确定反射镜相位延迟差的问题。实际测量了两块反射镜的相位延迟差，并将测量结果用于动态相位补偿偏振分光实验，验证了该方法的正确性。分析了偏振分光棱镜、法拉第旋光器以及近似计算这3个主要的测量误差源，并估计总测量误差约为1°。     

基于双弹光级联差频调制的波片参数测量研究

为了实现对波片快轴方位角和延迟量参数快速、高精度测试,提出了一种基于双弹光级联差频调制的波片参数测量方案。选用两个工作频率不相同的弹光调制器级联,构成偏振分析测量装置。波片的两个参数被加载到偏振分析装置的调制信号中,采用数字锁相技术同时提取调制信号的基频项和差频项,然后完成波片全部参数求解。按照原理分析,搭建了实验系统,并完成了系统初始偏移值定标,完成了632.8 nm的1/4波片,532 nm的1/4波片和1/2波片实验测量。实验结果表明,本文方案的快轴方位角测量最大偏差为0.2°,角度测量标准偏差为0.02°;波片的相位延迟量标准偏差优于5.64×10^-4 rad,单点数据测量时间仅为200 ms。考虑到波片材料的双折射色散,根据检测激光波长下测量的相位延迟量,进一步计算出应用波长的波片延迟量。测量值与理论值最大偏差不超过1.17 nm,延迟精度优于λ/300。本文方案实现了高速、高精度和高灵敏的波片参数测量,可为波片加工测试和实验定标提供有效手段。     

激光遥感偏振成像系统光学元件调整及误差分析

改进了利用双旋转波片方法进行偏振成像的实验装置,提出了通过一次测量获得目标偏振度和强度编码图像的方法.运用光强法对激光遥感偏振成像装置的光学元件进行调整,通过斯托克斯和穆勒矩阵在偏振光学元件中的应用,给出了相应光学元件的调整原理、方法及过程.分析了激光器中心波长变动、偏振片的角度误差和波片的相位延迟及角度误差对整个系统的影响.结果表明,由偏振片角度和波片角度误差造成的出射光斯托克斯误差较小,不超过0.001,可以忽略;由波片相位延迟不精确造成的误差在0.02左右,所以应采用延迟精度较高的波片;激光器中心波长变化的影响最大,不能忽略,必须加滤光片使接收光的中心波长控制在808nm;镀有铝膜望远镜对接收到的散射光偏振度影响较小,适于激光遥感偏振成像系统的应用.     

基于光弹调制技术的波片相位延迟量测量方法

提出了一种基于光弹调制技术的波片相位延迟量测量方法,利用米勒矩阵对其进行了理论推导和误差分析。测量光路包括激光器、起偏器、光弹调制器、被测波片、检偏器和光电探测器,利用探测信号的归一化基频分量和二次谐波分量精确计算出被测波片的相位延迟量。该方法能测量紫外到红外光谱范围内任意相位延迟量的波片,误差分析表明其误差小于0.05°。实验验证了该测量方法的有效性,波片相位延迟量的重复测量精度为0.0048°。     

Single layer homogeneous model for surface roughness by polarized light scattering

In this paper a homogeneous single layer model for surface roughness by polarized light has been developed. It has been shown that the reflectance change in non-absorbing layer is directly proportional to the refractive index of the ambient and substrate media for s polarization but inversely proportional to the p polarization and it is directly proportional to the square of the thickness of the layer for both the polarization. In an absorbing layer, it has been shown that the thickness of the layer is equal to the twice of surface roughness of the single layer identical system for s polarization but it is ratio of twice of surface roughness to the square of refractive index of thin film for p polarization. The extinction coefficient of the layer is directly proportional to the thickness of that layer for both the polarization. The consequence of the scattered light on the specular reflectance and transmittance for oblique incidence shows that there is reduction in reflectance (in both non-absorbing and absorbing cases) and transmittance (in the absorbing case for p polarization only), due to roughness on the surface under the Drude effective-medium approximation. Thus such an absorbing layer provides a valid model for the effect of scatter on the transmittance for p polarization only.     

Optical reflectance of blue bronze crystals near the Peierls transition

We report on the reflectance of blue bronze crystals in the visible frequency range as a function of temperature. The observed large oscillations in the reflectance at all wavelengths at temperatures near the Peierls transition are interpreted as interference effects stemming from a surface layer. It is found that the surface layer, which appears to be tied to fluctuations, can be as much as 1.6 microns thick.     

An acoustic model for microresonator in on-beam quartz-enhanced photoacoustic spectroscopy

The effect of air impurity layer on the reflection spectrum of one-dimensional holographic photonic crystals was investigated in two forms. One form is the band-edge oscillation phenomenon when the air impurity layer is near the surface of the structure; the other form is the defect mode appearing in the band gap when the air impurity layer is near the center of the structure. For the defect mode, its central wavelength will nonlinearly change with some repeatability with the defect size, not as the result of the step-index photonic crystal. Moreover, the depth of the defect mode in the band gap can be modulated by the intensity ratio of the two construction beams. And the reflectance at the central wavelength of the defect mode can be almost zero with appropriate optical intensity ratio. The corresponding experimental results were also demonstrated.     

Bi-directional reflectance study on particulate layers: Effects of pore liquid absorption coefficient

We have made bi-directional reflectance distribution function (BRDF) measurements on particulate layers wetted by absorbing liquids. The measurement results indicate that the BRDF tends to become more Lambertian as the interstitial pore liquid becomes more absorbing. The directional hemispherical reflectance, or albedo, of such a layer decreases nonlinearly with a wetting liquid's absorption coefficient. This behavior may be fit by two empirical relationships which independently treat the reflectance from the front surface and reflectance from the bulk material.     

Spectral indices to assess the carotenoid/chlorophyll ratio from adaxial and abaxial leaf reflectance

The ratio between the carotenoid and chlorophyll concentrations can indicate the physiology and phenology of plants. Most of the vegetation indices related to the ratio between the carotenoid and chlorophyll contents only consider the reflectance from the adaxial leaf surface. In this study, it was found that the leaf reflectance from the abaxial surface is lower than that of the adaxial surface in the visible wavelength region. On the contrary, the reflectance is higher on the adaxial surface in the near-infrared wavelength region. The difference ratio index resulted in the best correlation with the carotenoid/chlorophyll ratio and was the most robust among all the spectral indices studied when the spectral information on the adaxial and abaxial surfaces was pooled. The result indicated that this index can accurately estimate the carotenoid/chlorophyll ratio because of the insensitivity to the differences between adaxial and abaxial leaf surfaces.     

Homogeneous model for surface roughness in identical double layer system

In this paper a homogeneous model for surface roughness in the identical double layer system has been presented. It has been shown that the reflectance change in non-absorbing layers is directly proportional to the square of the total thickness of the layers. In an absorbing layer, it has been shown that the thickness of each layer is equal to the surface roughness of the identical double layer system. The extinction coefficients of both layers are directly proportional to the thickness of that layer.     

Random thickness errors-effect on reflectance of multilayer

In this paper the effect of thickness errors on the reflectance of multilayer is investigated. Using the matrix method, we deduced an expression for describing the dependence of reflectance on the film thickness errors. It is found that the degree of the thickness error-effect is affected by the ratio of low refractive index with high refractive index and the number of layer of multilayer. The computer simulations show that the degree of this effect is very small when the ratio is small and the number of layer is large. The thickness error hardly influences the reflectance of short-wave multilayer.     

颜料层微观形貌对古代壁画褪色及显现影响

文物壁画在自然环境下产生褪色现象具有复杂性,严格意义上讲,人们无法重现自然环境下这种褪色发生的条件,但这并不妨碍人们研究其褪色原因的可能性和途径。通过实验来验证所提出机制的合理性,这也符合自然科学普遍采用的研究方法。提出颜料层微观形貌变化是引起壁画褪色的一种重要原因。胶料作为颜料层的连续相,当胶料分解时,颜料层微观形貌必然产生变化,为证明这种变化会引起颜料层褪色,而非颜料变化所致。建立了以具有较高热稳定性的赭石为颜料,以明胶作为粘接剂制成模拟的壁画颜料层。然后通过加热处理使胶料发生氧化分解,从而造成颜料层微观形貌发生变化,但赭石颜料依然稳定,期望证明在颜料赭石不发生变化时,由于颜料层微观形貌变化也可引起颜料褪色。实验通过煅烧壁画颜料层模拟样获得胶料降解的壁画模型,分别以SEM及多角度反射率光谱等技术,考察模拟样胶料降解前后表面微观形貌和光学性质变化。结果表明：壁画模拟样煅烧后,颜料层表面产生空隙结构,样品表面多角度反射率光谱表明煅烧后样品颜料层对可见光的反射增加而吸收降低,并观察到模拟样颜色淡化。以无色,难挥发,且不与颜料层发生化学反应的离子液体涂覆褪色样品表面,以上述技术表征涂覆处理前后颜料层表面微观形貌和表面光学性质变化,结果表明：离子液体填充了褪色样品表面颗粒间空隙,检测到样品表面对可见光的反射降低而吸收增加,观察到褪色样品的颜色加深。以上实验结果证明了推测合理性,即微观形貌变化确实会引起颜色变化。依据此原理以唐代墓室褪色壁画为例,进行了显现修复应用研究,其颜色显现效果显著。     

对称膜堆定值监控的反射率圆图技术

已知对称膜堆[A2BA]~m的大体结构和基底反射率,通过反射率圆图技术和简单算术运算,可得到膜堆的确切结构和定值监控的参数.并给出了监控模式的设计步骤和实验结果.     

基于冠层辐射传输模型的地表反射率光谱重建方法

针对基于多光谱数据有限光谱信息重建地表反射率光谱的病态求解难题,提出一种基于冠层辐射传输物理机理并充分考虑像元异质性的地表反射率光谱重建方法,该方法假设混合像元由植被和土壤两种地物类型组成,利用冠层辐射传输模型构造端元光谱查找表,进而通过组分比例因子估算实现基于多光谱图像的高光谱地表反射率模拟。以Landsat ETM+多光谱图像为例的地表反射率超光谱重建验证实验结果表明,模拟的反射率光谱能够较好的反映不同地物特征信息。进一步地,利用模拟的地表反射率拟合Landsat ETM+图像和MODIS图像,各波段模拟图像与实际观测图像之间具有较高的相关系数(Landsat: 0.90~0.99, MODIS: 0.74~0.85),进一步验证了该方法的可行性。