Synthesis and magnetic properties of size-selected CoPt nanoparticles

CoPt nanoparticles are widely studied, in particular for their potentially very high magnetic anisotropy. However, their magnetic properties can differ from the bulk ones and they are expected to vary with the particle size. In this paper, we report the synthesis and characterization of well-defined CoPt nanoparticle samples produced in ultrahigh vacuum conditions following a physical route: the mass-selected low energy cluster beam deposition technique. This approach relies on an electrostatic deviation of ionized clusters which allows us to easily adjust the particle size, independently from the deposited equivalent thickness (i.e. the surface or volume particle density in a sample). Diluted samples made of CoPt particles, with different diameters, embedded in amorphous carbon are studied by transmission electron microscopy and superconducting interference device magnetometry, which gives access to the magnetic anisotropy energy distribution. We then compare the magnetic properties of two different particle sizes. The results are found to be consistent with an anisotropy constant (including its distribution) which does not evolve with the particle size in the range considered.     

基于多光束干涉原理的相移算法研究

针对多光束干涉原理的相移算法包括算法误差及步长优化等问题，以菲索干涉仪精密测长为 应用背景进行了研究.利用干涉光学的基本原理导出了在多束光干涉(经光学面多次反射、透 射)的情况下干涉光强随相位分布的精确公式；在此基础上，通过数值分析的方法得出了利 用菲索干涉仪精密测长的相移步长的优化取值范围和干涉光束最佳初相位差的范围；对余弦 依赖算法所引起的光强误差分别就四步法、五步法得出了不同的依赖关系；并对多光束干涉 算法中几种主要的误差来源进行了不确定度评估. 关键词： 相移算法 多光束干涉 精密测长 不确定度     

Spiral interferometry

We present a surprising modification of optical interferometry. A so-called spiral phase element in the beam path of a standard microscope results in an interferogram of phase samples, for which the interference fringes have the shape of spirals instead of closed contour lines as in traditional interferograms. This configuration overrides the basic problem of interferometry, i.e., that elevations and depressions cannot be distinguished. Therefore a complete sample profile can be reconstructed from a single exposure, promising, e.g., high-speed metrology with a single laser pulse. The method is easy to implement, it does not require a spatially separated reference beam, and it is optimally stable against environmental noise.     

Direct Observation of Magnetic Vortices in Superconductors Using Electron Waves

The development of a coherent field-emission electron beam has made it possible to observe microscopic magnetic lines of force by detecting the electron-wave phase shifts that are due to vector potentials. Electron-holographic interference microscopy has been used to observe magnetic lines of force of magnetic vortices in superconductors, and Lorentz microscopy has been used to observe the dynamics of the vortices. The observation of vortices not only helps us understand the microscopic mechanism of flux pinning, which holds the key to practical applications of superconductors, but also clarifies fundamental phenomena of superconductivity which have implications for more general physical phenomena.     

基于单一分光棱镜干涉仪的双通路定量相位显微术

仅仅使用一个单独的分光棱镜(BS),实现了一种用于生物细胞三维成像的双通路定量相位显微术.不同于传统的使用方法,将BS倾斜放置,使中央半反射层与入射光光轴之间存在一个非常小的角度.这样基于BS的分光特性,经过BS后的透射光束和反射光束将会叠加在一起并形成干涉.调节样品位置,利用相机拍摄同时获得了存在π相移的双通路干涉图.这种离轴干涉模式,只需要记录单幅干涉图就可以获得真实的相位信息,方法结构简单,易于操作,适用于微小透明样品的三维形貌测量.     

光学渡越辐射理论及其在直线感应加速器脉冲电子束诊断中的应用

匀速运动的带电粒子在穿过具有不同介电常数的两种媒质界面时要产生所谓光学渡越辐射。该辐射在粒子的入射平面上呈偏振行为;从辐射强度的角分布可以确定入射粒子的能量。在入射到双膜系统的情况下,由于干涉的发生,在第二膜前表面的强度角分布有振荡行为。利用这些现象,可对脉冲电子束包络半径、束电流密度的横向分布,束能量以及横向散角进行测量,依照这一原理在各LIA加速器上进行的脉冲电子束参数测量,获得的有效数据极大地提高了加速器的调试效率。     

基于电子束剪切干涉的PIE成像技术研究

提出了基于M?llenstedt电子双棱镜的电压扫描剪切干涉全场ptychographic iterative engine(PIE)显微成像技术.从低到高逐步改变电子双棱镜的电压,并同时记录所形成的剪切干涉条纹,待测样品透射电子束的强度和相位分布就可以用PIE算法得以快速重建,而且双棱镜的方向、位置和实际电场强度分布等诸多实验中不可避免地偏差都可以在迭代过程中自动得以更正.所提技术能够克服现阶段用电子束进行PIE成像的诸多技术困扰,从而有望推动PIE技术在电子显微成像领域的发展和应用.     

SEM扫描云纹法的相移技术研究

提出一种扫描电镜(SEM)扫描云纹法的相移新技术,通过SEM系统控制电镜电子束扫描线移动,对获取的云纹图像实现0-2π范围内的四步相移,从而获得了更高的位移测量灵敏度。同时对SEM扫描云纹法的测量原理以及相移实验技术的原理进行了详细的阐述。并将该技术应用到电子封装试件栅的相移分析中。实验结果证明了该方法的可行性,该方法为微米云纹法的条纹处理提供了一种新途径。     

Polarimetric Measurement of Plasma Poloidal Magnetic Field via Heterodyne Phase Shift Methods

The rotation of the plane of polarization of radiation propagating through a magnetized plasma (Faraday effect) yields the line integral of the electron density times the longitudinal magnetic field component. A commonly used technique for this measurement senses the change in intensity of a laser beam after passing through a linear polarizer. Two methods often employed to facilitate detection are 1) to mix the transmitted beam with a frequency-offset reference beam to allow heterodyne detection and 2) to oscillate the polarization direction of the laser beam. In addition to being sensitive to spurious amplitude variations, such amplitude measurements are sensitive to small polarization ellipticities introduced by optical components as well as by transverse magnetic fields within the plasma. By the addition of a quarter wave plate, the Faraday rotation can alternatively be sensed as a phase shift of the heterodyne beat of two frequency-offset input beams relative to the case of no plasma. This scheme has the advantage of phase modulation over amplitude modulation, i.e., independence of absolute amplitude and weak dependence on amplitude change. We demonstrate with Jones matrix algebra how the measured phase shift depends only weakly on imperfections and angular alignments of the optical components. Moreover, the phase shifts can be increased more than an order of magnitude by deliberate modifications in the basic optical configuration at a sacrifice of comparable amounts of the amplitude modulation of the carrier from which the phase shift is determined.     

切伦科夫辐射“双成像法”测量电子束发射度

利用切伦科夫辐射,OTR或荧光靶等光学诊断方法进行发射度测量,国内外绝大部分实验是用CCD相机观测电子束打靶产生的光斑,变化四极透镜的磁场梯度,应用“三梯度法”计算出发射度.文中提出了一种新的“双成像法”测量方法,使切伦科夫辐射光通过一长焦距的消色差薄透镜,分别在焦平面和像平面获取图像.通过图像处理,前者可分析出电子束散角分布,后者可分析出电子束径向分布,从而直接得到均方根发射度.该方法对束流相空间和电荷密度分布无需假设,无需借助“三梯度法”,较其他常规测量方法具有实验装置更简便、测量精度更高和适用性更广等优点.文中给出了该测量方法对北京大学DC?SC光阴极注入器的发射度测量进行计算机模拟实验的结果和分析.     

8 mm三次谐波潘尼管大回旋电子枪设计

根据现有磁体条件和工艺设计了一过渡区较长的倒向磁场系统,其主磁场为0.396 T,反向磁场为-0.033 T,并给出了一种实用8 mm三次谐波潘尼管电子枪的设计结果。该大回旋电子枪工作在43.5 kV,1.45 A下,阴极可置于轴向磁场幅值渐减区域。该结构电子枪不追求在通过反转点之前形成薄的环形电子束,不利用突变倒向磁场,不需要刻意控制磁力线与电子注包络走向的一致性,显著降低了调试的难度和要求。最终优化所得电子注的纵向速度零散为4.78%,偏心率为7.18%,速度比高达2.2,而速度比的零散仅为4.88%,满足三次谐波潘尼管的要求。经大信号模拟计算,在该电子枪驱动下,潘尼管器件功率可达31.9 kW,效率高达49.4%,总体参量仍具有吸引力且建立在可实现的电子光学系统基础上。     

利用切伦科夫进行电子束发散角测量的模拟研究北大核心CSCD

利用切伦科夫辐射方向性极好的特性进行电子束发散角的测量是一个比较有希望的方法,但转换靶材料对电子的库伦作用力等因素又使得电子束散角展宽,对发散角的测量产生影响。在将转换靶划分成多重薄片并以串联的形式构建了靶模型,考虑了库仑力、多重散射、轫致辐射、电离等全物理过程作用效果的情况下,利用蒙特卡罗模拟软件相关程序对电子在靶材料中的发散过程进行了仿真。基于电子束散角分布与切伦科夫辐射光子分布相对应的原理,完成了对电子束发散角测量技术的模拟,获得了转换靶材料及其厚度、电子束能散、测量系统光学带宽等对电子束发散角测量的影响规律,为测量系统的设计及数据反演处理工作提供了指导性的建议。模拟结果显示,基于切伦科夫辐射进行电子束发散角测量的方法具有可行性,具有一定的对电子束发散角分布进行测量的能力。     

大散射角散斑场中有关相位奇异新特性的研究

利用散斑场和参考光的干涉提取散斑场复振幅和相位, 研究了不同散射角下散斑场相位的分布规律以及相位奇异处光波复振幅实部零值线和虚部零值线夹角、光强等值线离心率的统计特性. 在大散射角散斑中发现了一种新的相位奇异现象, 即相位奇异线; 研究了相位在跨越奇异线时的突变规律及涡旋状相位的分布特征, 发现在相位奇异线处存在着呈双曲线或抛物线状的光强等值线.     

A New Measurement of Electron Beam Emittance with Cerenkov Radiation “Double Imaging” Method

A new way in electron beam emittance measurement with Cerenkov radiation "double imaging" method is proposed in this paper. In the standard emittance measurements with optical diagnostics such as Cerenkov radiation, OTR (Optical Transition Radiation), fluorescence screen or BMP (beam profile monitor) etc., the emittance is indirectly calculated through quadrupole-scanning technique, with the prior ssumption that the beam phase space density distribution is ellipse, which will certainly induce systematic error when the beam profile is quite irregular or the space-charge effects can not be omitted. In proposed method, the Cerenkov radiation pass through a 1-meter focal-length thin convex lens, and a CCD camera is used to capture two images of Cerenkov radiation at the focal plane and at the image plane of the lens respectively. Then, with image processing technique, we acquire the angular divergence information of the electron beam from the image of the focal plane and the radial distribution information from the image of the image plane, which we call Cerenkov radiation "double imaging" method. Therefore, the emittance can be directly attained according to the definition of the RMS emittance. By this method, we can measure the actual phase space distributions without making any prior assumptions about the density distributions. Compared with other general measurements, this "double imaging" method has advantages of simpler equipment, higher precision and wider application. This paper also presents the computer simulation results of emittance measurement on the DC-SC (DC-Superconducting) photocathode injector of PKU-SCAF (Peking University Superconducting Accelerator Facility) being built at Peking University.     

Shape identification using phase shifting interferometry and liquid-crystal phase modulator

A phase shifting technique using a Michelson interferometry system is presented and applied to surface contour measurement. Hyperbolic fringes are produced by the interference of two spherical wavefronts expanded from a beam expander. The fringe pattern is projected on an object surface and the deformed grating image is captured by a CCD camera for subsequent analysis by a PC. Phase variation is achieved by a liquid-crystal device incorporated in the Michelson interferometry system. Results obtained using the proposed method for objects of various shapes and sizes compared well with those from a conventional profilometer.     

Time-resolved measurement technique for pulsed electron beam envelope basing on framing and streaking principle

The time-resolved electron beam envelope parameters, including cross sectional distribution and beam centroid position, are very important for the study of beam transmission characteristics in a magnetic field and for verifying the rationality of the magnetic field parameters employed. One kind of high time-resolved beam envelope measurement system has recently been developed, constituted of a high-speed framing camera and a streak camera.It can obtain three panoramic images of the beam and time continuous information along the given beam profile simultaneously. Recently obtained data has proved that several fast vibrations of the beam envelope along the diameter direction occur during the front and the tail parts of the electron beam. The vibration period is several nanoseconds. The effect of magnetic field on the electron beam is also observed and verified. Beam debugging experiments have proved that the existing beam transmission design is reasonable and viable. This beam envelope measurement system will establish a good foundation for beam physics research.     

三种高密度强流束亮度测量技术

利用已经建成的4 MeV LIA注入器,结合时间分辨测量系统研究了三种测量技术:发射度测量法、无场准直器和磁场准直器测量法。介绍了强流束亮度定义和典型方法理论分析及测量技术的物理概念,提出了用于猝发多脉冲电子束发射度测量装置的设计与调试,通过对时间分辨测量系统的分幅相机记录的光强度分布信息处理,得到电子束束斑均方根半径和发射角,分析某一时刻数据,即可得到电子束某一时刻发射度,从而获得多脉冲电子束时间分辨发射度。在4 MeV LIA注入器上对多脉冲电子束流的发射度进行测量,得到电子束归一化均方根发射度约为114 mmmrad、双脉冲456 mmmrad的归一化发射度。最后结合电子束的高斯分布初步分析并给出均方根发射度、实测发射度和边发射度的关系。     

一种在线式电子束能量测量方法

针对直线感应电子加速器中的束流特点,设计了一种在线式电子束能量测量方法。该方法使用分析磁铁和束位置探测器对电子束团切片平均能量进行测量,避免了束团取样带来的误差及测量过程对束流的影响,可以实现电子能量的在线测量。使用该方法对某强流直线感应电子加速器的电子束团能量进行了测量,获得了电子束团切片平均能量随时间变化的曲线,能量测量不确定度为0.177 MeV,能散度测量不确定度为0.39%。     

相干衍射辐射在超短电子束团长度测量中的应用

利用相干衍射辐射(CDR)光学自相关技术在线无阻拦频域测量超短电子束团的长度是当前国际束测领域的研究热点. 文中分析和数值计算了利用上海应用物理研究所(SINAP)飞秒电子束装置提供的超短电子束团产生的宽带连续强CDR，介绍了超短电子束团长度测量的实验原理和装置示意，并研究了分束器对束团长度测量的影响. 结果表明，该束团可直接用于产生覆盖远红外至毫米波段的宽带连续强CDR；辐射能量主要集中在轴线附近，宏脉冲辐射能量可达毫焦耳量级；利用光学自相关技术研制的远红外Michelson干涉仪和Golay探测仪组成束团长度测量系统，通过实验测量CDR干涉图FWHM可近似求得超短束团长度；干涉图籍助傅立叶变换光谱法，可推算求得束团电子密度分布的信息.     

Faraday-rotation self-interference method for electron beam duration measurement in the laser wakefield accelerator

Real-time single-shot measurement of the femtosecond electron beam duration in laser wakefield accelerators is discussed for both experimental design and theoretical analysis that combines polarimetry and interferometry.The probe pulse polarization is rotated by the azimuthal magnetic field of the electron beam and then introduced into a Michelson-type interferometer for self-interference. The electron beam duration is obtained from the region size of the interference fringes, which is independent of the pulse width of the probe laser. Using a larger magnification system or incident angle, the measurement resolution can be less than 1 fs.