用扫描近场光学显微镜技术研究金膜表面等离体子共振

表面等离体子波(SPW)可与入射光横磁波极化能量耦合并被共振激发,这种现象被称为表面等离体子共振现象(SPR)。主要利用扫描近场光学显微镜(SNOM)技术和表面等离体子共振现象技术相结合,来研究金膜表面等离体子共振。设计并建立了结构独特的新型Kretschmann型表面等离体子共振现象耦合装置,同时又设计了具有厚度梯度的表面等离体子的制备方法。在此基础上,测量了改变入射角条件下的表面等离体子共振曲线,测得该装置的等离体子共振角灵敏度为1°。并且对金膜表面进行表面等离体子共振条件下的扫描近场光学显微成像。实验结果表明,在共振时金膜表面的扫描成像比不共振时清晰,而且增加了很多细节。应用表面等离体子共振现象技术将可以明显提高扫描近场光学显微镜的信噪比、分辨力等性能。     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像

本文结合近场扫描结构和纳米线-微光纤耦合技术,提出了一种基于硫化镉纳米线/锥形微光纤探针结构的被动近场光学扫描成像系统.该系统采用被动式纳米探针,保留了纳米探针对样品表面反射光的强约束优势.其理论收集效率为4.65‰,相比于传统的金属镀膜近场探针收集效率提高了一个数量级,可有效地提高扫描探针对样品形貌信息的检测能力;而后通过硫化镉纳米线与微光纤之间高效的倏逝场耦合,将检测的光强信号传输到远场进行光电探测,最终实现对目标样品形貌的分析成像,其样品宽度测量误差在7.28%以内.该系统不需要外部激发光路,利用显微镜自身光源进行远场照明,被动扫描探针仅作为样品表面反射光的被动收集系统.本文基于半导体纳米线/锥形微光纤探针的被动式近场光学扫描成像方案,可有效地降低探针的制备难度和目标光场的检测难度,简化扫描成像的结构,为近场光学扫描显微系统之后的发展提供新的思路.     

基于纳米光学天线的扫描近场光学探针研究

提出了一种基于纳米光学天线的新型扫描近场光学探针,基本结构是在传统光学探针的下端面集成金属偶极纳米光学天线,当入射光照射金属纳米偶极天线时激发金属表面等离激元共振,在天线间隙处产生了巨大的局域场增强,既提高耦合进入探针的光信号强度,又提高信噪比,实现高分辨率。利用时域有限差分(FDTD)法研究了不同孔径(50,100,130,150,170和200 nm)的新型探针对同一样品的探测结果。照明光源为830 nm平面波,TE极化,扫描高度10 nm。研究结果表明新型探针分辨率随孔径增大时变化规律是先增加后减小,在孔径150 nm时分辨率最高,达45 nm,比同样孔径传统探针分辨率提高近4倍。对比分析了当探针位于样品中心时不同孔径探针端面光场分布图,认为新型探针分辨率变化规律是纳米天线在探针上的有效长度不同所致。对其灵敏度和对比度也进行了初步分析。     

入射光的偏振特性对反射式近场光学显微镜成像结果的影响

用偶极子-自洽场理论模拟计算了反射式近场光学扫描显微镜中入射光的偏振特性对近场成像结果的影响(包括系统分辨率和相关的成像特性)，并给予了相应的分析和解释。分析计算结果表明，入射光偏振性的选择将影响近场光学显微镜的成像质量。在近场区域，用垂直于样品表面偏振的入射光(即x方向偏振)照明成像将得到优于相应水平偏振(即x方向偏振)的入射光照明的系统分辨率。用x方向偏振的入射光照明时，所得光学图像会发生局部的光强对比度反转。     

用扫描近场光学显微镜观察铁电畴

本文利用电畴的双折射随电畴的自发极化的取向而异的特性，采用反射式扫描近场光学显微镜，观察了铁电单晶的畴结构。横向分辨率约为50nm。对原有的Topometrix Aurora NSOM系统作了较大的改进。采用音叉（tunning fork）检测光纤探针与样品间的剪切力，取代了原有的光学法振动检测。对硫酸三甘氨酸[NH3CH2COOH）3．H2SO4）]（简称TGS）的观察说明，反工扫描近场光学显微镜，适合研究垂直b轴切割的TGS（010）面的自发极化。对这种180极化的多畴，可获得光学衬度较好电畴分布图像。与形貌图像相比，发现电畴与形貌无关。无论是新鲜解理的原子级光滑表面和表面水解的较为粗糙表面均可观察到分布较为均匀的电畴分布。     

照明模式SNOM中样品对近场光场分布的影响

在同时考虑样品的形貌及材料光学参量和入射光偏振模式的情况下,利用基于边界元方法编写的二维矢量电磁场计算程序,对工作在照明模式下的扫描近场光学显微镜（Scanning Near-field Optical Microscope,SNOM）的近场矢量电磁场分布进行了数值计算模拟研究.结果表明,在没有表面形貌特征时,探针的光能量透射率随样品材料的折射率和损耗角的增加而增大,而样品表面光斑尺寸受折射率和损耗角的影响很小;对有形貌特征的探针扫描像研究结果表明,SNOM的分辨率随着样品的折射率和损耗角的增加而提高;对SNOM不同的工作模式的扫描成像信号进行的计算结果表明,恒定间距扫描方式比恒定高度扫描方式对样品表面的细节有较强的分辨能力.     

“禁戒光”近场光学显微镜原理与系统

扫描近场光学显微术是８０年代后期发展起来的一种分辨率超过衍射极限的新型光学显微镜技术。本文介绍了国外最近出现的“禁戒光”近场光学显微镜系统的工作原理及结构。透射式ＳＮＯＭ中部分光沿着光轴向前传播；部分光沿着大于全内反射临界角的方向传播。前者称为允许光；后者称为禁戒光。应用“禁戒光”近场光学显微镜可同时获得三幅图像，即允许光像、禁戒光像和反映样品表面形貌的剪切力图像。禁戒光图像能够提供很好的对比度和分辨率。     

透射式扫描近场光学显微镜探针光场分布及其受激荧光分子光场分布研究

通过利用经Grober发展的Bethe模型,计算了透射式近场光学显微镜探针针尖附近及进入样 品后的光场分布,研究了它的横向分辨率、透射深度、透射系数等问题.模拟在光学近场激 发下生物荧光分子成像的过程,研究了荧光分子的极化方向和入射光偏振方向对信号收集的影响,发现荧光图像是偏振极性和荧光分子极性共同作用的结果. 关键词： 近场光学 光场分布 荧光分子成像     

扫描显微探针

 随着１９８２年世界上第一台原子分辨的隧道扫描显微镜（ＳＴＭ）问世,掀起了对物质表面微结构研究的热潮,而且蔓延到表面化学以及生物大分子等领域．同时对ＳＴＭ原理及检测技术的推广,促使了原子力显微镜（ＡＦＭ）、近场光学显微镜（ＳＮＯＭ）的发明．现在,以ＳＴＭ、ＡＦＭ、ＳＮＯＭ为代表的高分辨显微镜已经形成了一类新的显微成像技术──扫描探针显微术（ＳＰＭ）．ＳＰＭ最显著的特点就是采用一个极微小的探针（针尖一般在纳米尺度）,在样品表面极小的距离内移动,同时获得样品表面信息．当这极小的探针与样品表面的相互作用强烈依赖于极小的距离（大约是指数关系）,仪器的稳定性则是获得理想图像的关键.     

Image dipole approach and polarization effects in scanning near-field optical microscopy

A coupled-dipole approach is proposed in order to study the coupling between the probe tip and the rough sample in SNOM. In the present model both the optical probe tip and the sample protrusions are represented by polarizable dipole spheres. The induced polarization effects on the sample surface can be replaced by the image dipoles in the circumstance of quasi-static electromagnetic field approximation. Applying the radiation theory of the dipole, we have established a set of self-consistent equations to describe the field distribution at the sites of the probe tip and the sample protrusions. The results are completely the same as those obtained by means of the dyadic electromagnetic propagator formalism and also the derivation procedure is relatively simple. This method permits us to analyze the physical mechanisms of the interaction between the probe tip and the rough surface in SNOM intuitively. Based on this approach, we further discuss the influence of polarization of the incident light on the imaging quality. The calculating result shows that the shape and the contrast of the images of the sample are both sensitive to the field polarization, and the z-polarized mode is proved to give better resolution in SNOM.     

Internal reflection mode scanning near-field optical microscopy with the tetrahedral tip on metallic samples

An internal reflection mode is introduced for scanning near-field optical microscopy (SNOM) with the tetrahedral tip. A beam of light is coupled into the tip and the light specularly reflected out of the tip is detected as a photosignal for SNOM. An auxiliary STM mode is used to control the distance during the scanning process and to record the topography of the sample simultaneously with the SNOM image. Images were obtained of different metallic samples which show a contrast in the order of 10% of the total reflected photosignal. In images of metallic samples an inverted contrast is consistently obtained compared to images previously obtained of comparable samples in a transmission mode. The contrast shows a pronounced dependence on the polarization of the incident beam with respect to the orientation of the edges of the tip. In the case of gold surfaces, the photosignal as a function of distance between the tip and the surface shows a pronounced peak in the near-field range of 0–20 nm which is tentatively attributed to the excitation of surface plasmons on the gold surface. The pronounced near-field effects and the strong contrast in the near-field images and the resolution well below 50 nm are an indication of a highly efficient coupling of the incident beam to a local excitation of the tip apex which is essential for the function of the tip as a probe for SNOM. Received: 17 May 1999 / Accepted: 18 May 1999 / Published online: 21 October 1999     

Theoretical Analyses on the Resolution of Collection Mode Scanning Near-Field Optical Microscopy

Numerical simulations have been carried out in the framework of waveguide theory to model collection mode scanning near-field optical microscopy (SNOM). The theoretical model includes the optical fiber end and describes the metal coated aperture on the probe tip. The developed formalism goes beyond the existing Bethe-Bouwkamp theories for electromagnetic transmission of subwavelength apertures. The finite coating and optical fiber end are now taken into account. The new features enable us to simulate the near-field probes that are widely used in the collection mode SNOM. The emphases of the numerical analyses have been mainly on the resolution mechanism of the microscopy. Influence on the resolution from important parameters of the probe tips, such as the size of the apertures and the probe-sample distance, is extensively studied. The resolution dependence has been analyzed in the light of the near-field coupling efficiency of the probe tip. An optimum tip size has been found which is balanced between the significant signal transmission and the resolution of the device.     

Development of Scanning Near-Field Optical Microscope Working under Cryogenic Temperature and Strong Magnetic Field

We report on the development of a cantilever-based scanning near-field optical microscope (SNOM) working in an extreme environment, at cryogenic temperature around 10 K and under strong magnetic field up to 7 T. We designed a new optical system based on an infinite conjugate microscope, which extracts the near-field signal from a small aperture through a narrow chamber into free space as collimated light. Using this system, we successfully measured near-field and topographical images of a metal-hole sample simultaneously. Combining the local optical accessing technique with the external control of the electronic state, this SNOM system will be a powerful tool to study optical properties of semiconductor nanostructures.     

Optical polarization response at gold nanosheet edges probed by scanning near-field optical microscopy

Optical properties of metallic edge-like structures known as knife-edges are a topic of interest and possess potential applications in enhanced Raman scattering, optical trapping, etc. In this work, we investigate the near-field optical polarization response at the edge of a triangular gold nanosheet, which is synthesized by a wet chemical method. A homemade scanning near-field optical microscope(SNOM) in collection mode is adopted, which is able to accurately locate its probe at the edge during experiments. An uncoated straight fiber probe is used in the SNOM, because it still preserves the property of light polarization though it has the depolarization to some extent. By comparing near-field intensities at the edge and glass substrate, detected in different polarization directions of incident light, the edge-induced depolarization is found,which is supported by the finite differential time domain(FDTD) simulated results. The depolarized phenomenon in the near-field is similar to that in the far-field.     

金属覆层光纤探针近场特性研究

采用有限积分法对用于近场光学显微镜的旋转对称光纤探针进行了数值模拟计算,研究了光纤探针开口附近亚波长范围的电磁场及其能量密度的分布.计算结果表明,在探针外,光场为沿探针轴线方向的近逝波,其空间光场的分布与激励光场及其极化方向有关,在激励光场的极化方向出现了由感应电荷引起的边缘增强效应.同时研究了近场光纤探针的空间分辨率和样品处的电磁场能量,结果表明光纤探针孔的尺寸及其与样品的作用距离是影响探针的分辨率和样品内电磁场能量的重要因素.     

飞秒时间分辨近场光学系统实现及其应用

结合飞秒光脉冲和近场光学显微镜，成功实现了飞秒时间分辨近场光学系统.系统通过高频声光调制和差频锁相探测，极大提高了信噪比并消除了抽运、探测光本底信号，从而在收集模式下测得了飞秒时间分辨的透射光微弱信号变化.同时获得了80nm的空间分辨和小于200fs的时间分辨测量.利用该实验系统，研究了金纳米结构的热电子弛豫动力学过程，观察到不同位置间热电子弛豫动力学的差异. 关键词： 飞秒近场 扫描近场光学显微镜 飞秒光脉冲 金纳米颗粒     

光纤探针型近场光镊光阱力特性研究

基于动量守恒原理,结合麦克斯韦应力张量和三维时域有限差分方法,建立了近场空间内激光光镊对纳米微粒的光阱力计算模型.分析了光纤探针型近场光镊的近场分布以及操作纳米微粒时各轴向光阱力的分布情况,并探讨了光纤探针尖端的捕获尺寸、捕获位置和操作稳定性.结果表明:微粒应处于光纤探针针尖的近场空间内才可实现稳定可靠的纳米操作,不同尺寸的微粒具有不同的捕获效果,且随初始位置的不同微粒的捕获位置亦不同.计算结果为激光近场光镊纳米操作装置的设计和制造提供了理论基础.