共查询到19条相似文献,搜索用时 203 毫秒
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运用溶胶-凝胶法在Pt/Ti/SiO2/Si基片上旋涂制备了2-2型CoFe2O4/Pb(Zr0.53Ti0.47)O3磁电复合薄膜.制备的磁电薄膜结构为基片/PZT/CFO/PZT*/CFO/PZT,通过改变中间层PZT*溶胶的浓度,改变磁性层间距以及静磁耦合的大小.SEM结果表明,复合薄膜结构致密,呈现出界面清晰平整的多层结构.制备的复合薄膜具有较好的铁电与铁磁性能.实验还研究了静磁耦合对薄膜磁电性能的影响,结果表明,随着复合薄膜磁性层间距的减小,静磁耦合效应的增加,磁电电压系数有逐渐增大的趋势. 相似文献
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随着能源危机的加剧,太阳能电池作为开发和利用太阳能的一种普遍形式, 日益受到世界各国的重视.随着太阳能电池向着高效率、薄膜化、无毒性和原材料丰富的方向发展, 单纯的硅系太阳能电池已经无法达到这样的要求,因此新的材料和工艺的开发利用迫在眉睫. 本文研究了碳材料在硅异质节上实现光伏效应的改善及其可能在太阳能电池上的应用. 采用脉冲激光沉积方法制备的Co2-C98/Al2O3/Si异质结构在标准日光照射 (AM1.5, 100 mW/cm2)条件下,可获得0.447 V的开路电压和18.75 mA/cm2的电流密度, 转换效率可达3.27%.通过电容电压特性和暗条件下的电输运性能测量, 证明了氧化铝层的引入不但对单晶硅的表面起到了物理钝化作用,减小了反向漏电流, 使异质结界面缺陷、界面能级和复合中心减少,还起到了场效应钝化作用, 增加了异质结界面的势垒高度,增加了开路电压,使异质结的光伏效应显著增强. 相似文献
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Al2O3介质薄膜与纳米Ag颗粒构成的复合结构,被应用于表面增强Raman散射探测实验中,其中Al2O3介质薄膜对纳米Ag颗粒的吸收谱及增强Raman散射光谱的影响被特别关注.该复合结构的光学特性表征出纳米Ag颗粒的偶极振荡特性.从光吸收谱中可以看到,其共振吸收谱随Al2O3介质薄膜厚度增加而在整个谱域上发生红移,表明纳米Ag颗粒的周围介电常数随Al2O3介质薄膜厚度的增加而增大.采用罗丹明6G作为探针原子,6个Raman特征峰的平均增益值作为表征表面增强Raman散射衬底增益程度的量度.实验结果表明,Al2O3介质薄膜层的引入提高了纳米Ag颗粒的衬底介电常数,并引起了散射共振的增强,从而使表面增强Raman散射强度提高. 相似文献
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采用金属有机分解法在p型Si衬底上制备了SrTiO3(STO)薄膜.研究了STO薄膜金属 绝缘体 半导体(MIS)结构的介电和界面特性.结果表明,STO薄膜显示出优异的介电性能,在10kHz处的介电常数约为105,损耗低于001,这来源于多晶结构和良好的结晶性;MIS结构中的固定电荷密度Nf和界面态密度Dit分别约为15×1012cm-2和(14—35)×1012cm-2eV-1,这主要与Si/STO界面处形成的低介电常数界面层有关.
关键词:
SrTiO3薄膜
MIS结构
介电性能
Si/STO界面 相似文献
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采用固相合成反应技术制备纳米Cu0.5Zn0.5Fe2-xAlxO2(x=0.0,0.1,0.2,0.3,0.4和0.5)铁氧体材料,研究Al3+含量对结构,电学和磁学性质的影响. 采用X射线衍射研究单相立方尖晶石结构. 利用Scherrer公式估算晶粒尺寸. 测定了温度依赖的直流电阻率.结果表明随Al3+含量的增加,晶格常数减小,孔隙度增加,饱和磁化强度值降低,Al3+对铁氧体的介电常数、介电损耗角的正切值和介质损耗因子等介电性能有明显影响,这可能与空间电荷极化有关. 相似文献
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应用X射线异常散射技术研究了[Ni70Co30(25A)/Cu(20A)]20多层膜的界面结构, 结果表明, 退火前后Cu/Ni70Co30和Ni70Co30/Cu界面的温度行为不同.对于制备态样品, 界面结构是非对称的, 在Cu/Ni70Co30界面, 存在一个8A厚的CuNi3过渡层和一个4A厚的NiCo层. 然而, Ni70Co30/Cu界面却不存在任何扩散. 285\textcelsius 2h退火后,Ni70Co30/Cu界面开始发生扩散, 产生了一个12A厚的CuNi2Co过渡层. X射线能量分别在Co, Ni, Cu K吸收边附近的X射线漫散射实验, 揭示了在Ni70Co30/Cu多层膜的界面处,
Cu与Ni和Co具有不同的横向关联长度, 显示了不均匀的横向分布. 相似文献
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The CaCu3Ti4O12/SiO2/CaCu3Ti4O12 (CCTO/SiO2/CCTO) multilayered films were prepared on Pt/Ti/SiO2/Si substrates by pulsed laser deposition method. It has been demonstrated that the dielectric loss and the leakage current density were significantly reduced with the increase of the SiO2 layer thickness, accompanied with a decrease of the dielectric constant. The CCTO film with a 20 nm SiO2 layer showed a dielectric loss of 0.065 at 100 kHz and the leakage current density of 6×10−7 A/cm2 at 100 kV/cm, which were much lower than those of the single layer CCTO films. The improvement of the electric properties is ascribed to two reasons: one is the improved crystallinity; the other is the reduced free carriers in the multilayered films. 相似文献
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Koppole C. SekharSung Hun Key Kyung Pyo HongChan Su Han Jong Min YookDong Soo Kim Jun Chul KimJong Chul Park Yong Soo Cho 《Current Applied Physics》2012,12(3):654-658
The thickness-dependent dielectric properties and tunability of pulsed laser deposited (Ba0.5Sr0.5)0.925K0.075TiO3 (BSKT) thin films with different thickness ranging from 80 to 300 nm has been investigated. Dielectric properties of the BSKT thin films are substantially improved as the BSKT film thickness increases, which can be explained by the model of a low-permittivity dead layer that is connected in series with the bulk region of the film. The estimated values of thickness and the average dielectric constant for the dead layer are 2.4 nm and 23.5, respectively, in a Pt/BSKT/Pt capacitor structure. The tunability and figure of merit increased with increasing film thickness, which are attributed to the change in lattice parameter and the dead layer effect. 相似文献
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Bi1.5Zn1.0Nb1.5O7/Ba0.6Sr0.4TiO3/Bi1.5Zn1.0Nb1.5O7 tunable multilayer thin film has been fabricated by pulsed laser ablation and characterized. Phase composition and microstructure of multilayer films were characterized by X-ray diffraction, scanning electron microscopy (SEM) and atomic force microscopy (AFM). The film has very smooth surface with RMS roughness of 1.5-2 nm and grain size of 100-150 nm. Total film thickness has been measure to be 375 nm. The BZN thin films at 300 K, on Pt(1 1 1)/SiO2/Si substrate showed zero-field dielectric constant of 105 and dielectric loss tangent of 0.002 at frequency of 0.1 MHz. Thin films annealed at 700 °C shows the dielectric tunability of 18% with biasing field 500 kV/cm at 0.1 MHz. The multilayer thin film shows nonferroelectric behavior at room temperature. The good physical and electrical properties of multilayer thin films make them promising candidate for tunable microwave device applications. 相似文献
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The difficulties in synthesizing phase pure BaTiO3 doped-(Na0.5Bi0.5)TiO3 are known. In this work, we reporting the optimized pulsed laser deposition (PLD) conditions for obtaining pure phase 0.92(Na0.5Bi0.5)TiO3-0.08BaTiO3, (BNT-BT0.08), thin films. Dielectric, ferroelectric and piezoelectric properties of BNT-BT0.08, thin films deposited by PLD on Pt/TiO2/SiO2/Si substrates are investigated in this paper. Perovskite structure of BNT-BT0.08 thin films with random orientation of nanocrystallites has been obtained by deposition at 600 °C. The relative dielectric constant and loss tangent at 100 kHz, of BNT-BT0.08 thin film with 530 nm thickness, were 820 and 0.13, respectively. Ferroelectric hysteresis measurements indicated a remnant polarization value of 22 μC/cm2 and a coercive field of 120 kV/cm. The piezoresponse force microscopy (PFM) data showed that most of the grains seem to be constituted of single ferroelectric domain. The as-deposited BNT-BT0.08 thin film is ferroelectric at the nanoscale level and piezoelectric. 相似文献
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用溶胶-凝胶方法在Pt/Ti/SiO2/Si衬底上制备了Na+的不同浓度均匀掺杂和成分梯度掺杂(上梯度)钛酸锶钡(Ba0.25Sr0.75TiO3)薄膜.电性能测试表明随着均匀掺杂浓度的增加,薄膜介电常数和损耗都减小,而漏电流先减小(掺杂浓度小于2.5mol%时)后又逐渐增加.场发射扫描电镜分析表明,均匀掺杂浓度增加到2.5mol%后薄膜表面呈疏松多孔状结构,这可能是导致漏电流又逐渐增大的原因.Na+的上梯度掺杂避免了掺杂浓度增加到2.5mol%后薄膜生长过程中出现的孔洞现象,于是薄膜的综合电性能得到了进一步提高.深入、系统地分析了杂质不同分布方式对薄膜结构和性能有不同影响的原因. 相似文献
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Hongwei Chen Chuanren Yang Chunlin Fu Li Zhao Zhiqiang Gao 《Applied Surface Science》2006,252(12):4171-4177
Barium strontium titanate (BST) thin films were prepared by RF magnetron sputtering. The dielectric constant-voltage curves and the hysteresis loops of BST thin films with different grain sizes and film thicknesses were investigated. When the grain size increases from 12 nm to 35 nm, remarkable increases in dielectric constant and tunability were observed. Above 12 nm, the BST films exhibited size effects, i.e. a decrease in maximal polarization (Pm) and an increase in coercive electric field (Ec) with reduction in grain size. In our investigation, the dielectric constant, tunability and maximal polarization increased as the film thickness increased. Furthermore, the size dependence of the dielectric constant and tunability of Ba0.6Sr0.4TiO3 thin films is determined by that of the maximal polarization and the coercive electric field. 相似文献
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Yun Hoe Kim Jong-Han SongJin Sang Kim Seok-Jin YoonKyung Bong Park Ji-Won Choi 《Applied Surface Science》2011,258(2):843-847
The dielectric properties of MgO-Ta2O5 continuous composition spread (CCS) thin films were investigated. The MgO-Ta2O5 CCS thin films were deposited on Pt/Ti/SiO2/Si substrates by off-Axis RF magnetron sputtering system, and then the films were annealed at 350 °C with rapid thermal annealing system in vacuum. The dielectric constant and loss of MgO-Ta2O5 CCS thin films were plotted via 1500 micron-step measuring. The specific point of Ta2O5-MgO CCS thin film (post annealed at 350 °C) showing superior dielectric properties of high dielectric constant (k ∼ 28) and low dielectric loss (tan δ < 0⋅004) at 1 MHz were found in the area of 3-5 mm apart from Ta2O5 side on the substrate. The cation's composition of thin film was Mg:Ta = 0.4:2 at%. 相似文献
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Jiagang Wu Dingquan Xiao Jiliang Zhu Jianguo Zhu Junzhe Tan 《Applied Surface Science》2007,253(20):8365-8370
The (Pb0.90La0.10)Ti0.975O3/PbTiO3 (PLT/PT), PbTiO3/(Pb0.90La0.10)Ti0.975O3/PbTiO3 (PT/PLT/PT) multilayered thin films with a PbOx buffer layer were in situ deposited by RF magnetron sputtering at the substrate temperature of 600 °C. With this method, highly (1 0 0)-oriented PLT/PT and PT/PLT/PT multilayered thin films were obtained. The PbOx buffer layer leads to the (1 0 0) orientation of the films. The dielectric, ferroelectric and pyroelectric properties of the PLT multilayered thin films were investigated. It is found that highly (1 0 0)-oriented PT/PLT/PT multilayered thin films possess higher remnant polarization 2Pr (44.1 μC/cm2) and better pyroelectric coefficient at room temperature p (p = 2.425 × 10−8 C/cm2 K) than these of PLT and PLT/PT thin films. These results indicate that the design of the PT/PLT/PT multilayered thin films with a PbOx buffer layer should be an effective way to enhance the dielectric, ferroelectric and pyroelectric properties. The mechanism of the enhanced ferroelectric properties was also discussed. 相似文献
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D.S.L. Pontes F.M. Pontes M.S. Galhiane L.S. Santos 《Journal of Physics and Chemistry of Solids》2008,69(8):1951-1956
Strontium and calcium-modified lead titanate (Pb0.70Ca0.15Sr0.15)TiO3 soft chemistry-derived thin films were prepared on platinum-coated silicon substrate by spin-coating method. Investigations were made on the structure, surface morphology and electrical properties of the film. The results by XRD and FE-SEM showed that the film exhibits a pure tetragonal perovskite phase and an average grain size of about 50-60 nm, respectively. Electrical measurements of a metal-ferroelectric-metal type capacitor exhibited a stable and switchable electrical polarization in the film. The structure of the Au/PCST/Pt capacitor showed well-saturated hysteresis loops at an applied voltage of 300 kV/cm with remanent polarization and coercive field values of 22 μC/cm2 and 100 kV/cm, respectively. At 100 kHz, the dielectric constant and the dielectric loss of the (Pb0.70Ca0.15Sr0.15)TiO3 thin film with thickness 240 nm were 528 and 0.05, respectively. 相似文献